Process measurement and control devices - General methods and procedures for evaluating performance - Part 1: General considerations

Prozessmess-, -steuer- und -regelgeräte - Allgemeine Methoden und Verfahren für die Bewertung des Betriebsverhaltens - Teil 1: Allgemeine Betrachtungen

Dispositifs de mesure et de commande de processus - Méthodes et procédures générales d'évaluation des performances - Partie 1: Généralités

Naprave za merjenje in nadzor procesa - Splošne metode in postopki za ocenjevanje lastnosti - 1. del: Splošne naprave

General Information

Status
Not Published
Public Enquiry End Date
24-Nov-2024
Current Stage
4020 - Public enquire (PE) (Adopted Project)
Start Date
10-Sep-2024
Due Date
28-Jan-2025

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SLOVENSKI STANDARD
01-november-2024
Naprave za merjenje in nadzor procesa - Splošne metode in postopki za
ocenjevanje lastnosti - 1. del: Splošna načela pristopov
Process measurement and control devices - General methods and procedures for
evaluating performance - Part 1: General considerations
Prozessmess-, -steuer- und -regelgeräte - Allgemeine Methoden und Verfahren für die
Bewertung des Betriebsverhaltens - Teil 1: Allgemeine Betrachtungen
Dispositifs de mesure et de commande de processus - Méthodes et procédures
générales d'évaluation des performances - Partie 1: Généralités
Ta slovenski standard je istoveten z: prEN IEC 61298-1:2024
ICS:
25.040.40 Merjenje in krmiljenje Industrial process
industrijskih postopkov measurement and control
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

65B/1269/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 61298-1 ED3
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2024-09-06 2024-11-29
SUPERSEDES DOCUMENTS:
65B/1245/CD, 65B/1258/CC
IEC SC 65B : MEASUREMENT AND CONTROL DEVICES
SECRETARIAT: SECRETARY:
United States of America Mr Wallie Zoller
OF INTEREST TO THE FOLLOWING COMMITTEES: HORIZONTAL FUNCTION(S):

ASPECTS CONCERNED:
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft
for Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.
This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of
which they are aware and to provide supporting documentation.
Recipients of this document are invited to submit, with their comments, notification of any relevant “In Some
Countries” clauses to be included should this proposal proceed. Recipients are reminded that the CDV stage is the
final stage for submitting ISC clauses. (SEE AC/22/2007 OR NEW GUIDANCE DOC).

TITLE:
Process measurement and control devices - General methods and procedures for evaluating
performance - Part 1: General considerations

PROPOSED STABILITY DATE: 2028
NOTE FROM TC/SC OFFICERS:
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
permission in writing from IEC.

– 2 – IEC 61298-1 2024 IEC:2024
1 CONTENTS
2 FOREWORD . 4
3 INTRODUCTION . 6
4 1 Scope . 7
5 2 Normative references . 7
6 3 Terms and definitions . 7
7 4 Test categories . 9
8 5 General criteria . 10
9 5.1 Realistic operating conditions . 10
10 5.2 Economic aspects . 10
11 5.3 Replication of the tests and comparability of the results . 10
12 5.3.1 Standardization of test methods . 10
13 5.3.2 Influence factors . 10
14 5.3.3 Documentation of the test methods . 10
15 5.4 Processing the results . 10
16 5.5 Independence of the results of a test from the effects of other tests . 11
17 6 General conditions for tests and samples . 11
18 6.1 Environmental test conditions . 11
19 6.1.1 Recommended limits of ambient conditions for test measurements . 11
20 6.2 Supply conditions . 11
21 6.2.1 Reference values. 11
22 6.2.2 Tolerances . 11
23 6.3 Load conditions . 12
24 6.4 Mounting position . 12
25 6.5 Externally induced vibrations . 12
26 6.6 External mechanical constraints . 12
27 6.7 Selection . 13
28 6.7.1 Criteria . 13
29 6.7.2 Selection procedures . 13
30 6.8 Delivery of the devices . 13
31 6.9 Identification and inspection . 13
32 7 General testing procedures and precautions . 13
33 7.1 Test laboratory . 13
34 7.2 Preparation for the tests . 14
35 7.3 Choice of reference measuring equipment . 14
36 7.3.1 Criteria . 14
37 7.3.2 Uncertainty of the measuring system . 14
38 7.3.3 Traceability . 14
39 7.4 Input variable quality . 14
40 7.5 Tapping . 15
41 7.6 Checking of calibration made as delivered . 15
42 7.7 Sequence of tests . 15
43 7.8 Interruption and duration of each series of measurements . 15
44 7.9 Anomalies and failures during tests . 15
45 7.9.1 General . 15
46 7.9.2 Procedures . 15
47 7.10 Re-start of a test . 15

61298-1  IEC:2024 – 3 –
48 7.11 Setting of adjustments . 16
49 7.12 Preconditioning . 16
50 7.12.1 Criteria . 16
51 7.12.2 Procedure . 16
52 7.13 Calibration adjustments of lower range value and span . 16
53 Constancy of the operating conditions and settings . 16
7.14
54 7.15 Input/output variable relationships . 16
55 7.15.1 Criteria . 16
56 7.15.2 Procedure . 16
57 7.16 Error assessment . 17
58 7.17 Symbols and units of measurement . 17
59 Test report and documentation . 17
7.18
– 4 – IEC 61298-1 2024 IEC:2024
63 INTERNATIONAL ELECTROTECHNICAL COMMISSION
64 ____________
66 PROCESS MEASUREMENT AND CONTROL DEVICES –
67 GENERAL METHODS AND PROCEDURES FOR
68 EVALUATING PERFORMANCE –
70 Part 1: General considerations
73 FOREWORD
74 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
75 all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
76 international co-operation on all questions concerning standardization in the electrical and electronic fields. To
77 this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
78 Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
79 Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
80 in the subject dealt with may participate in this preparatory work. International, governmental and non-
81 governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
82 with the International Organization for Standardization (ISO) in accordance with conditions determined by
83 agreement between the two organizations.
84 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
85 consensus of opinion on the relevant subjects since each technical committee has representation from all
86 interested IEC National Committees.
87 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
88 Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
89 Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
90 misinterpretation by any end user.
91 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
92 transparently to the maximum extent possible in their national and regional publications. Any divergence
93 between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
94 the latter.
95 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
96 equipment declared to be in conformity with an IEC Publication.
97 6) All users should ensure that they have the latest edition of this publication.
98 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
99 members of its technical committees and IEC National Committees for any personal injury, property damage or
100 other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
101 expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
102 Publications.
103 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
104 indispensable for the correct application of this publication.
105 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
106 patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
107 International Standard IEC 61298-1 has been prepared by subcommittee 65B: Devices and
108 process analysis, of IEC technical committee 65: Industrial-process measurement, control and
109 automation.
110 This second edition cancels and replaces the first edition published in 1995 and constitutes a
111 technical revision.
112 This edition is a general revision with respect to the previous edition and does not include any
113 significant changes (see Introduction).
61298-1  IEC:2024 – 5 –
115 The text of this standard is based on the following documents:
FDIS Report on voting
65B/685/FDIS 65B/693/RVD
117 Full information on the voting for the approval of this standard can be found in the report on
118 voting indicated in the above table.
119 This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
120 A list of all parts
...

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