High frequency inductive components - Electrical characteristics and measuring methods -- Part 1: Nanohenry range chip inductor

This part of IEC 62024 specifies electrical characteristics and measuring methods for the nanohenry range chip inductor that is normally used in high frequency (over 100 kHz) range.

Induktive Hochfrequenz-Bauelemente - Elektrische Eigenschaften und Messmethoden - Teil 1: Chipinduktivitäten im Nanohenry-Bereich

Composants inductifs à haute fréquence - Caractéristiques électriques et méthodes de mesure -- Partie 1: Inductance à puce de l'ordre du nanohenry

La CEI 62024-1:2008 spécifie les caractéristiques électriques et les méthodes de mesure pour l'inductance pastille de l'ordre du nanohenry qui est normalement utilisée dans la gamme des hautes fréquences (supérieures à 100 kHz). Par rapport à l'édition précédente, les principales modifications techniques sont les suivantes: a) tailles 0402 ajoutées dans le Tableau 1 et le Tableau 2; b) contenu de 4.4 révisé pour en faciliter la compréhension; c) erreurs de 3.1.4.2 corrigées.

Visokofrekvenčne induktivne komponente - Električne karakteristike in merilne metode - 1. del: Čipni induktor v območju nanohenrijev (IEC 62024-1:2008)

General Information

Status
Withdrawn
Publication Date
05-Jun-2008
Withdrawal Date
08-Feb-2021
Current Stage
9990 - Retro Withdrawal (Adopted Project)
Start Date
09-Feb-2021
Due Date
04-Mar-2021
Completion Date
09-Feb-2021

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SLOVENSKI STANDARD
SIST EN 62024-1:2008
01-julij-2008
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SIST EN 62024-1:2004
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High frequency inductive components - Electrical characteristics and measuring methods

- Part 1: Nanohenry range chip inductor (IEC 62024-1:2008)

Induktive Hochfrequenz-Bauelemente - Elektrische Eigenschaften und Messmethoden -

Teil 1: Chipinduktivitäten im Nanohenry-Bereich (IEC 62024-1:2008)

Composants inductifs à haute fréquence - Caractéristiques électriques et méthodes de

mesure - Partie 1: Inductance à puce de l'ordre du nanohenry (CEI 62024-1:2008)
Ta slovenski standard je istoveten z: EN 62024-1:2008
ICS:
29.100.10 Magnetne komponente Magnetic components
SIST EN 62024-1:2008 en

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------
EUROPEAN STANDARD
EN 62024-1
NORME EUROPÉENNE
May 2008
EUROPÄISCHE NORM
ICS 29.100.10 Supersedes EN 62024-1:2002
English version
High frequency inductive components -
Electrical characteristics and measuring methods -
Part 1: Nanohenry range chip inductor
(IEC 62024-1:2008)
Composants inductifs à haute fréquence - Induktive Hochfrequenz-Bauelemente -
Caractéristiques électriques Elektrische Eigenschaften
et méthodes de mesure - und Messmethoden -
Partie 1: Inductance à puce Teil 1: Chipinduktivitäten
de l'ordre du nanohenry im Nanohenry-Bereich
(CEI 62024-1:2008) (IEC 62024-1:2008)

This European Standard was approved by CENELEC on 2008-03-01. CENELEC members are bound to comply

with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard

the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on

application to the Central Secretariat or to any CENELEC member.

This European Standard exists in two official versions (English and German). A version in any other language

made by translation under the responsibility of a CENELEC member into its own language and notified to the

Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the

Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,

Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,

Sweden, Switzerland and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels

© 2008 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 62024-1:2008 E
---------------------- Page: 2 ----------------------
EN 62024-1:2008 - 2 -
Foreword

The text of document 51/908/FDIS, future edition 2 of IEC 62024-1, prepared by IEC TC 51, Magnetic

components and ferrite materials, was submitted to the IEC-CENELEC parallel vote and was approved by

CENELEC as EN 62024-1 on 2008-03-01.
This European Standard supersedes EN 62024-1:2002.

EN 62024-1:2008 includes the following significant technical changes with respect to EN 62024-1:2002:

– size 0402 added in Table 1 and Table 2;
– contents of 4.4 reviewed for easier understanding;
– errors in 3.1.4.2 corrected.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
(dop) 2008-12-01
national standard or by endorsement
– latest date by which the national standards conflicting
(dow) 2011-03-01
with the EN have to be withdrawn
Annex ZA has been added by CENELEC.
__________
Endorsement notice

The text of the International Standard IEC 62024-1:2008 was approved by CENELEC as a European

Standard without any modification.
__________
---------------------- Page: 3 ----------------------
- 3 - EN 62024-1:2008
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated

references, only the edition cited applies. For undated references, the latest edition of the referenced

document (including any amendments) applies.

NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD

applies.
Publication Year Title EN/HD Year
1) 2)
IEC 61249-2-7 - Materials for printed boards and other EN 61249-2-7 2002
interconnecting structures - + corr. September 2005
Part 2-7: Reinforced base materials, clad and
unclad - Epoxide woven E-glass laminated
sheet of defined flammability (vertical burning
test) copper-clad
ISO 6353-3 - Reagents for chemical analysis - - -
Part 3: Specifications - Second series
ISO 9453 - Soft solder alloys - Chemical compositions - -
and forms
Undated reference.
Valid edition at date of issue.
---------------------- Page: 4 ----------------------
IEC 62024-1
Edition 2.0 2008-02
INTERNATIONAL
STANDARD
High frequency inductive components – Electrical characteristics and measuring
methods –
Part 1: Nanohenry range chip inductor
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
ICS 29.100.10 ISBN 2-8318-9631-2
---------------------- Page: 5 ----------------------
– 2 – 62024-1 © IEC:2008(E)
CONTENTS

FOREWORD...........................................................................................................................4

1 Scope...............................................................................................................................6

2 Normative references .......................................................................................................6

3 Inductance, Q-factor and impedance ................................................................................6

3.1 Inductance ..............................................................................................................6

3.1.1 Measuring circuit .........................................................................................7

3.1.2 Mounting of the inductor to the test fixture ...................................................7

3.1.3 Measurement method and calculation..........................................................9

3.1.4 Notes on measurement................................................................................9

3.2 Quality factor.........................................................................................................10

3.2.1 Measurement method ................................................................................10

3.2.2 Measurement circuit ..................................................................................11

3.2.3 Mounting of the inductor ............................................................................11

3.2.4 Methods of measurement and calculation ..................................................11

3.2.5 Notes on measurement..............................................................................11

3.3 Impedance ............................................................................................................11

3.3.1 Measurement method ................................................................................11

3.3.2 Measurement circuit ..................................................................................11

3.3.3 Measurement method and calculation........................................................11

3.3.4 Notes on measurement..............................................................................12

4 Resonance frequency.....................................................................................................12

4.1 Self-resonance frequency......................................................................................12

4.2 Minimum output method ........................................................................................12

4.2.1 Measurement circuit ..................................................................................12

4.2.2 Mounting the inductor for test ....................................................................13

4.2.3 Measuring method .....................................................................................13

4.2.4 Note on measurement ...............................................................................14

4.3 Reflection method .................................................................................................14

4.3.1 Measurement circuit ..................................................................................14

4.3.2 Mounting the inductor for test ....................................................................14

4.3.3 Measurement method ................................................................................15

4.3.4 Notes on measurement..............................................................................15

4.4 Measurement by analyser......................................................................................16

4.4.1 Measurement by impedance analyser........................................................16

4.4.2 Measurement by network analyser.............................................................16

5 DC resistance.................................................................................................................16

5.1 Measuring circuit (Bridge method) .........................................................................16

5.2 Measuring method and calculation formula............................................................17

5.3 Precaution for measurement..................................................................................17

5.4 Measuring temperature..........................................................................................18

Annex A (normative) Mounting method for a surface mounting coil ......................................19

Figure 1 – Example of circuit for vector voltage/current method ..............................................7

Figure 2 – Fixture A ................................................................................................................8

---------------------- Page: 6 ----------------------
62024-1 © IEC:2008(E) – 3 –

Figure 3 – Fixture B ................................................................................................................8

Figure 4 – Short device shape ..............................................................................................10

Figure 5 – Example of test circuit for the minimum output method.........................................12

Figure 6 – Self-resonance frequency test board (minimum output method) ...........................13

Figure 7 – Example of test circuit for the reflection method ...................................................14

Figure 8 – Self-resonance frequency test board (reflection method)......................................15

Figure 9 – Suitable test fixture for measuring self-resonance frequency................................16

Figure 10 – Example of measuring circuit of d.c. resistance..................................................17

Table 1 – Dimensions of l and d..............................................................................................8

Table 2 – Short device dimensions and inductances .............................................................10

---------------------- Page: 7 ----------------------
– 4 – 62024-1 © IEC:2008(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
HIGH FREQUENCY INDUCTIVE COMPONENTS –
ELECTRICAL CHARACTERISTICS AND MEASURING METHODS –
Part 1: Nanohenry range chip inductor
FOREWORD

1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote

international co-operation on all questions concerning standardization in the electrical and electronic fields. To

this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,

Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC

Publication(s)“). Their preparation is entrusted to technical committees; any IEC National Committee interested

in the subject dealt with may participate in this preparatory work. International, governmental and non-

governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely

with the International Organization for Standardization (ISO) in accordance with conditions determined by

agreement between the two organizations.

2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international

consensus of opinion on the relevant subjects since each technical committee has representation from all

interested IEC National Committees.

3) IEC Publications have the form of recommendations for international use and are accepted by IEC National

Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC

Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any

misinterpretation by any end user.

4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications

transparently to the maximum extent possible in their national and regional publications. Any divergence

between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in

the latter.

5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any

equipment declared to be in conformity with an IEC Publication.

6) All users should ensure that they have the latest edition of this publication.

7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and

members of its technical committees and IEC National Committees for any personal injury, property damage or

other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and

expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC

Publications.

8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is

indispensable for the correct application of this publication.

9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of

patent rights. IEC shall not be held responsible for identifying any or all such patent rights.

International Standard IEC 62024-1 has been prepared by IEC technical committee 51:

Magnetic components and ferrite materials.

This second edition cancels and replaces the first edition published in 2002. This edition

constitutes a technical revision.

This edition includes the following significant technical changes with respect to the previous

edition:
a) sizes 0402 added in Table 1 and Table 2;
b) contents of 4.4 reviewed for easier understanding;
c) correct errors in 3.1.4.2.
---------------------- Page: 8 ----------------------
62024-1 © IEC:2008(E) – 5 –
The text of this standard is based on the following documents:
FDIS Report on voting
51/908/FDIS 51/915/RVD

Full information on the voting for the approval of this standard can be found in the report on

voting indicated in the above table.

This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

A list of all parts of IEC 62024 series, published under the general title High frequency

inductive components – Electrical characteristics and measuring methods, can be found on

the IEC website.

The committee has decided that the contents of this publication will remain unchanged until

the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in

the data related to the specific publication. At this date, the publication will be

• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.
---------------------- Page: 9 ----------------------
– 6 – 62024-1 © IEC:2008(E)
HIGH FREQUENCY INDUCTIVE COMPONENTS –
ELECTRICAL CHARACTERISTICS AND MEASURING METHODS –
Part 1: Nanohenry range chip inductor
1 Scope

This part of IEC 62024 specifies electrical characteristics and measuring methods for the

nanohenry range chip inductor that is normally used in high frequency (over 100 kHz) range.

2 Normative references

The following referenced documents are indispensable for the application of this document.

For dated references, only the edition cited applies. For undated references, the latest edition

of the referenced document (including any amendments) applies.

IEC 61249-2-7, Materials for printed boards and other interconnecting structures – Part 2-7:

Reinforced base materials clad and unclad – Epoxide woven E-glass laminated sheet of

defined flammability (vertical burning test) copper-clad

ISO 6353-3, Reagents for chemical analysis – Part 3: Specifications – Second series

ISO 9453, Soft solder alloys – Chemical compositions and forms
3 Inductance, Q-factor and impedance
3.1 Inductance
The inductance of an inductor is measured by the vector voltage/current method.
---------------------- Page: 10 ----------------------
62024-1 © IEC:2008(E) – 7 –
3.1.1 Measuring circuit
IEC 317/08
Components
R source resistance (50 Ω)
R resistor
L inductor under test
C distributed capacitance of inductor under test
L series inductance of inductor under test
R series resistance of inductor under test
phase reference signal
Ev , Ev vector voltmeter
1 2
G signal generator
Figure 1 – Example of circuit for vector voltage/current method
3.1.2 Mounting of the inductor to the test fixture

The inductor shall be measured in a test fixture as specified in the relevant standard. If no

fixture is specified, one of the following test fixtures A or B shall be used. The fixture used

shall be reported.
---------------------- Page: 11 ----------------------
– 8 – 62024-1 © IEC:2008(E)
3.1.2.1 Fixture A
The shape and dimensions of fixture A shall be as
...

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