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ASTM F1263-99

(Guide)

Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts

Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts

SCOPE
1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of parts at a stress higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how overtesting may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary though exact knowledge may be replaced by over-conservative estimates of this distribution.

General Information

Status
Historical
Publication Date
09-Dec-1999
ICS
31.020 - Electronic components in general
Technical Committee
F01 - Electronics
Drafting Committee
F01.11 - Nuclear and Space Radiation Effects
Current Stage
Ref Project

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Replaced By
ASTM F1263-99(2005) - Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
Effective Date
10-Dec-1999

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ASTM F1263-99 - Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic PartsASTM F1263-99 - Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
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ASTM F1263-99 - Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
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NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation: F 1263 – 99
Standard Guide for
Analysis of Overtest Data in Radiation Testing of Electronic
Parts
This standard is issued under the fixed designation F 1263; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
1. Scope probability, P, will be rejected with confidence, C. In order to
infer a true confidence, it would require a Bayes Theorem
1.1 This guide covers the use of overtesting in order to
calculation. In many cases, the distinction between confidence
reduce the required number of parts that must be tested to meet
and rejection confidence is of little practical importance.
a given quality acceptance standard. Overtesting is testing a
However, in other cases (typically when a large number of lots
sample number of parts at a stress higher than their specifica-
are rejected) the distinction between these two kinds of
tion stress in order to reduce the amount of necessary data
confidence can be significant. The formulas given in this guide
taking. This guide discusses when and how overtesting may be
apply whether one is dealing with confidence or rejection
applied to forming probabilistic estimates for the survival of
confidence.
electronic piece parts subjected to radiation stress. Some
knowledge of the probability distribution governing the stress-
4. Summary of Guide
to-failure of the parts is necessary though exact knowledge
4.1 This guide is intended to primarily apply to sampling by
may be replaced by over-conservative estimates of this distri-
attribute plans typified by Lot Tolerance Percent Defective
bution.
(LTPD) tables given in MIL-PRF 38535 and MIL-PRF 19500,
2. Referenced Documents and contains the following:
4.1.1 An equation for estimating the effectiveness of over-
2.1 Military Standards:
testing in terms of increased probability of survival,
MIL-PRF 19500 Semiconductor Devices, General Specifi-
4.1.2 An equation for the required amount of overtesting
cations for
given a necessary survival probability, and
MIL-PRF 38535 Integrated Circuits (Microcircuit Manu-
4.1.3 Cautions and limitations on the method.
facturing)
5. Significance and Use
3. Terminology
5.1 Overtesting should be done when (a) testing by vari-
3.1 Description of Term:
ables is impractical because of time and cost considerations or
3.1.1 confidence—the probability, C, that at least a fraction,
because the probability distribution of stress to failure cannot
P, of the electronic parts from a test lot will survive in actual
be estimated with sufficient accuracy, and (b) an unrealistically
service; since radiation testing of electronic parts is generally
large number of parts would have to be tested at the specifi-
destructive, this probability must be calculated from tests on
cation stress for the necessary confidence and survival prob-
selected specimens from the lot.
ability.
3.1.2 rejection confidence—the probability, R, that a lot will
be rejected based on destructive tests of selected specimens if
6. Interferences
more than a specified fraction P of the parts in the lot will fail
6.1 Probability Distributions—In overtesting, a knowledge
in actual service.
of the probability distribution governing stress to failure is
3.1.3 Discussion of Preceding Terms—Strictly speaking,
required, though it need not be specified with the same
most lot acceptance tests (be they testing by attributes or
accuracy necessary for testing by variables. For bipolar tran-
variables) do not guarantee survivability, but rather that infe-
sistors exposed to neutron radiation, the failure mechanism is
rior lots, where the survival probability of the parts is less than
usually gain degradation and the stress to failure is known to
follow a lognormal distribution. For bipolar transistors ex
This guide is under the jurisdiction ofASTM Committee F-1 on Electronicsand posed to total dose the use of the lognormal distribution is also
is the direct responsibility of Subcommittee F01.11 on Quality and Hardness
Assurance.
Current edition approved Dec. 10, 1999. Published February 2000. Originally
published as F 1263 – 89. Last previous edition F 1263 – 94. Messenger, G. C., Steele, E. L., “Statistical Modeling of Semiconductor
AvailablefromStandardizationDocumentsOrderDesk,Bldg.4SectionD,700 Devices for the TREE Environment,’’ Transactions on Nuclear Science NS-15,
Robbins Ave., Philadelphia, PA 19111-5094, Attn: NPODS. 1968, p. 4691.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
F 1263
TABLE 1 Survival Probability at Specification Level VersusR and Survival Probability at Overtest Level
Specification Level Probability for:
Overtest Level R 5 0.5 R 5 1.0 R 5 1.5 R 5 2.0 R 5 3.0 R 5 5.0
Probability
0.50 0.691462 0.841345 0.933193 0.977250 0.998650 1.000000
0.80 0.910140 0.967235 0.990400 0.997756 0.999939 1.000000
0.90 0.962588 0.988742 0.997295 0.999484 0.999991 1.000000
0.95 0.984016 0.995913 0.999169 0.999866 0.999998 1.000000
¯
fairly good. For more complex electronics and other kinds of P 5 F@F 1 ln ~3!/ 0.5# 5 F@0.84 1 2.20# 5 0.999,
S
radiation stress, the lognormal distribution is widely used in
where we used the following facts governing the normal
estimating the failure probabilities of electronic piece parts,
distribution:
and therefore this standard governs the use of a lognor
...

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4.1 Absorbed dose in a material is an important parameter that can be correlated with radiation effects produced in electronic components and devices that are exposed to ionizing radiation. Reasonable estimates of this parameter can be calculated if knowledge of the source radiation field (that is, energy spectrum and particle fluence) is available. Sufficiently detailed information about the radiation field is generally not available. However, measurements of absorbed dose with passive dosimeters in a radiation test facility can provide information from which the absorbed dose in a material of interest can be inferred. Under certain prescribed conditions, TLDs are quite suitable for performing such measurements.
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5.1 Overtesting should be done when (a) testing by variables is impractical because of time and cost considerations or because the probability distribution of stress to failure cannot be estimated with sufficient accuracy, and (b) an unrealistically large number of parts would have to be tested at the specification stress for the necessary confidence and survival probability.
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5.2.1 Empirical correlations that permit calculation of automotive antiknock performance are based on the general equation:
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5.2.2 Motor O.N., in conjunction with Research O.N., defines the antiknock index of automotive spark-ignition engine fuels, in accordance with Specification D4814. The antiknock index of a fuel approximates the road octane ratings for many vehicles, is posted on retail dispensing pumps in the United States, and is referred to in vehicle manuals.
This is more commonly presented as:
5.3 Motor O.N. is used for measuring the antiknock performance of spark-ignition engine fuels that contain oxygenates.  
5.4 Motor O.N. is important in relation to the specifications for spark-ignition engine fuels used in stationary and other nonautomotive engine applications.  
5.5 Motor O.N. is utilized to determine, by correlation equation, the Aviation method O.N. or performance number (lean-mixture aviation rating) of aviation spark-ignition engine fuel.7
SCOPE
1.1 This laboratory test method covers the quantitative determination of the knock rating of liquid spark-ignition engine fuel in terms of Motor octane number, including fuels that contain up to 25 % v/v of ethanol. However, this test method may not be applicable to fuel and fuel components that are primarily oxygenates.2 The sample fuel is tested in a standardized single cylinder, four-stroke cycle, variable compression ratio, carbureted, CFR engine run in accordance with a defined set of operating conditions. The octane number scale is defined by the volumetric composition of primary reference fuel blends. The sample fuel knock intensity is compared to that of one or more primary reference fuel blends. The octane number of the primary reference fuel blend that matches the knock intensity of the sample fuel establishes the Motor octane number.  
1.2 The octane number scale covers the range from 0 to 120 octane number, but this test method has a working range from 40 to 120 octane number. Typical commercial fuels produced for automotive spark-ignition engines rate in the 80 to 90 Motor octane number range. Typical commercial fuels produced for aviation spark-ignition engines rate in the 98 to 102 Motor octane number range. Testing of gasoline blend stocks or other process stream materials can produce ratings at various levels throughout the Motor octane number range.  
1.3 The values of operating conditions are stated in SI units and are considered standard. The values in parentheses are the historical inch-pounds units. The standardized CFR engine measurements continue to be in inch-pound units only because of the extensive and expensive tooling that has been created for this equipment.  
1.4 For purposes of determining conformance with all specified limits in this standard, an observed value or a calculated value shall be rounded “to the nearest unit” in the last right-hand digit used in expressing the specified limit, in accordance with the rounding method of Practice E29.  
1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. For more specific hazard statements, see Section 8, 14.4.1, 15.5.1, 16.6.1, Annex A1, A2.2.3.1, A2.2.3.3(6) and (9), A2.3.5, X3.3.7, X4.2.3.1, X4.3.4.1, X4.3.9.3, X4.3.12.4, and X4.5.1.8. ...

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ASTM
ASTM E831-24(Test Method)
Standard Test Method for Linear Thermal Expansion of Solid Materials by Thermomechanical Analysis

SIGNIFICANCE AND USE
5.1 Coefficients of linear thermal expansion are used, for example, for design purposes and to determine if failure by thermal stress may occur when a solid body composed of two different materials is subjected to temperature variations.  
5.2 This test method is comparable to Test Method D3386 for testing electrical insulation materials, but it covers a more general group of solid materials and it defines test conditions more specifically. This test method uses a smaller specimen and substantially different apparatus than Test Methods E228 and D696.  
5.3 This test method may be used in research, specification acceptance, regulatory compliance, and quality assurance.
SCOPE
1.1 This test method determines the technical coefficient of linear thermal expansion of solid materials using thermomechanical analysis techniques.  
1.2 This test method is applicable to solid materials that exhibit sufficient rigidity over the test temperature range such that the sensing probe does not produce indentation of the specimen.  
1.3 The recommended lower limit of coefficient of linear thermal expansion measured with this test method is 5 μm/(m·°C). The test method may be used at lower (or negative) expansion levels with decreased accuracy and precision (see Section 12).  
1.4 This test method is applicable to the temperature range from −120 °C to 900 °C. The temperature range may be extended depending upon the instrumentation and calibration materials used.  
1.5 SI units are the standard. No other units of measurement are included in this standard.  
1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.7 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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