ASTM E722-09

Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics

SIGNIFICANCE AND USE
This practice is important in characterizing the radiation hardness of electronic devices irradiated by neutrons. This characterization makes it feasible to predict some changes in operational properties of irradiated semiconductor devices or electronic systems. To facilitate uniformity of the interpretation and evaluation of results of irradiations by sources of different fluence spectra, it is convenient to reduce the incident neutron fluence from a source to a single parameter—an equivalent monoenergetic neutron fluence—applicable to a particular semiconductor material.
In order to determine an equivalent monoenergetic neutron fluence, it is necessary to evaluate the displacement damage of the particular semiconductor material. Ideally, this quantity is correlated to the degradation of a specific functional performance parameter (such as current gain) of the semiconductor device or system being tested. However, this correlation has not been established unequivocally for all device types and performance parameters since, in many instances, other effects also can be important. Ionization effects produced by the incident neutron fluence or by gamma rays in a mixed neutron fluence, short-term and long-term annealing, and other factors can contribute to observed performance degradation (damage). Thus, caution should be exercised in making a correlation between calculated displacement damage and performance degradation of a given electronic device. The types of devices for which this correlation is applicable, and numerical evaluation of displacement damage are discussed in the annexes.
The concept of 1-MeV equivalent fluence is widely used in the radiation-hardness testing community. It has merits and disadvantages that have been debated widely (9-12). For these reasons, specifics of a standard application of the 1-MeV equivalent fluence are presented in the annexes.
SCOPE
1.1 This practice covers procedures for characterizing neutron fluence from a source in terms of an equivalent monoenergetic neutron fluence. It is applicable to neutron effects testing, to the development of test specifications, and to the characterization of neutron test environments. The sources may have a broad neutron-energy range, or may be mono-energetic neutron sources with energies up to 20 MeV. This practice is not applicable in cases where the predominant source of displacement damage is from neutrons of energy less than 10 keV. The relevant equivalence is in terms of a specified effect on certain physical properties of materials upon which the source spectrum is incident. In order to achieve this, knowledge of the effects of neutrons as a function of energy on the specific property of the material of interest is required. Sharp variations in the effects with neutron energy may limit the usefulness of this practice in the case of mono-energetic sources.
1.2 This practice is presented in a manner to be of general application to a variety of materials and sources. Correlation between displacements (1-3) caused by different particles (electrons, neutrons, protons, and heavy ions) is beyond the scope of this practice. In radiation-hardness testing of electronic semiconductor devices, specific materials of interest include silicon and gallium arsenide, and the neutron sources generally are test and research reactors and californium-252 irradiators.
1.3 The technique involved relies on the following factors: (1) a detailed determination of the fluence spectrum of the neutron source, and (2) a knowledge of the degradation (damage) effects of neutrons as a function of energy on specific material properties.
1.4 The detailed determination of the neutron fluence spectrum referred to in 1.3 need not be performed afresh for each test exposure, provided the exposure conditions are repeatable. When the spectrum determination is not repeated, a neutron fluence monitor shall be used for each test exposure.
1.5 The val...

General Information

• Status: Historical
• Publication Date: 31-May-2009
• ICS: 31.080.01 - Semiconductor devices in general
• Technical Committee: E10 - Nuclear Technology and Applications
• Drafting Committee: E10.07 - Radiation Dosimetry for Radiation Effects on Materials and Devices

Relations

• Replaces: ASTM E722-04e2 - Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
• Effective Date: 01-Jun-2009
• Replaced By: ASTM E722-09e1 - Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
• Effective Date: 01-Jun-2009
• Referred By: ASTM E721-22 - Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
• Effective Date: 01-Jun-2009
• Referred By: ASTM E2450-23 - Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
• Effective Date: 01-Jun-2009
• Referred By: ASTM F1190-18 - Standard Guide for Neutron Irradiation of Unbiased Electronic Components
• Effective Date: 01-Jun-2009
• Referred By: ASTM F980-16 - Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
• Effective Date: 01-Jun-2009
• Referred By: ASTM E3084-17(2022)e1 - Standard Practice for Characterizing Particle Irradiations of Materials in Terms of Non-Ionizing Energy Loss (NIEL)
• Effective Date: 01-Jun-2009
• Referred By: ASTM E1854-19 - Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
• Effective Date: 01-Jun-2009
• Referred By: ASTM E261-16(2021) - Standard Practice for Determining Neutron Fluence, Fluence Rate, and Spectra by Radioactivation Techniques
• Effective Date: 01-Jun-2009
• Referred By: ASTM E170-23 - Standard Terminology Relating to Radiation Measurements and Dosimetry
• Effective Date: 01-Jun-2009
• Referred By: ASTM E1855-20 - Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
• Effective Date: 01-Jun-2009

Standards Content (Sample)

NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation:E722–09
Standard Practice for
Characterizing Neutron Fluence Spectra in Terms of an
Equivalent Monoenergetic Neutron Fluence for Radiation-
1
Hardness Testing of Electronics
This standard is issued under the fixed designation E722; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
This standard has been approved for use by agencies of the Department of Defense.
1. Scope 1.4 The detailed determination of the neutron fluence spec-
trum referred to in 1.3 need not be performed afresh for each
1.1 This practice covers procedures for characterizing neu-
test exposure, provided the exposure conditions are repeatable.
tron fluence from a source in terms of an equivalent monoen-
When the spectrum determination is not repeated, a neutron
ergetic neutron fluence. It is applicable to neutron effects
fluence monitor shall be used for each test exposure.
testing, to the development of test specifications, and to the
1.5 The values stated in SI units are to be regarded as
characterizationofneutrontestenvironments.Thesourcesmay
standard. No other units of measurement are included in this
have a broad neutron-energy range, or may be mono-energetic
standard.
neutron sources with energies up to 20 MeV. This practice is
1.6 This standard does not purport to address all of the
not applicable in cases where the predominant source of
safety concerns, if any, associated with its use. It is the
displacement damage is from neutrons of energy less than 10
responsibility of the user of this standard to establish appro-
keV. The relevant equivalence is in terms of a specified effect
priate safety and health practices and determine the applica-
on certain physical properties of materials upon which the
bility of regulatory limitations prior to use.
source spectrum is incident. In order to achieve this, knowl-
edge of the effects of neutrons as a function of energy on the
2. Referenced Documents
specific property of the material of interest is required. Sharp
3
2.1 ASTM Standards:
variations in the effects with neutron energy may limit the
E170 TerminologyRelatingtoRadiationMeasurementsand
usefulness of this practice in the case of mono-energetic
Dosimetry
sources.
E265 Test Method for Measuring Reaction Rates and Fast-
1.2 This practice is presented in a manner to be of general
Neutron Fluences by Radioactivation of Sulfur-32
application to a variety of materials and sources. Correlation
2 E693 PracticeforCharacterizingNeutronExposuresinIron
between displacements (1-3) caused by different particles
andLowAlloySteelsinTermsofDisplacementsPerAtom
(electrons, neutrons, protons, and heavy ions) is beyond the
(DPA), E 706(ID)
scope of this practice. In radiation-hardness testing of elec-
E720 Guide for Selection and Use of Neutron Sensors for
tronic semiconductor devices, specific materials of interest
Determining Neutron Spectra Employed in Radiation-
include silicon and gallium arsenide, and the neutron sources
Hardness Testing of Electronics
generally are test and research reactors and californium-252
E721 Guide for Determining Neutron Energy Spectra from
irradiators.
Neutron Sensors for Radiation-Hardness Testing of Elec-
1.3 The technique involved relies on the following factors:
tronics
(1) a detailed determination of the fluence spectrum of the
E844 Guide for Sensor Set Design and Irradiation for
neutron source, and (2) a knowledge of the degradation
Reactor Surveillance, E 706(IIC)
(damage)effectsofneutronsasafunctionofenergyonspecific
E944 Guide for Application of Neutron Spectrum Adjust-
material properties.
ment Methods in Reactor Surveillance, E 706 (IIA)
2.2 International Commission on Radiation Units and
1
This practice is under the jurisdiction of ASTM Committee E10 on Nuclear
Measurements (ICRU) Reports:
Technology and Applications and is the direct responsibility of Subcommittee
E10.07 on Radiation Dosimetry for Radiation Effects on Materials and Devices.
Current edition approved June 1, 2009. Published August 2009. Originally
´2 3
approved in 1980. Last previous edition approved in 2004 as E722–04 . DOI: For referenced ASTM standards, visit the ASTM website, www.astm.org, or
10.1520/E0722-09. contact ASTM Customer Service at [e-mail]. For Annual Book of ASTM
2
The boldface numbers in parentheses refer to a list of references at the end of Standards volume information, refer to the standard’s Document Summary page on
this practice. the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
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This document is not anASTM standard and is intended only to provide the user of anASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
´2
Designation:E722–04 Designation:E722–09
Standard Practice for
Characterizing Neutron Energy Fluence Spectra in Terms of
an Equivalent Monoenergetic Neutron Fluence for
1
Radiation-Hardness Testing of Electronics
This standard is issued under the fixed designation E722; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
This standard has been approved for use by agencies of the Department of Defense.
1
´ NOTE—Table A1.1 and A2.1 were corrected editorially in February 2005.
2
´ NOTE—An = sign was added in Eq 1 in April 2007.
1. Scope
1.1 This practice covers procedures for characterizing a neutron fluence from a source in terms of an equivalent monoenergetic
neutron fluence. It is applicable to neutron effects testing, to the development of test specifications, and to the characterization of
neutron test environments. The sources may have a broad neutron-energy spectrum,range, or may be mono-energetic neutron
sourceswithenergiesupto20MeV.Thispracticeisnotapplicableincaseswherethepredominantsourceofdisplacementdamage
isfromneutronsofenergylessthan10keV.Therelevantequivalenceisintermsofaspecifiedeffectoncertainphysicalproperties
ofmaterialsuponwhichthesourcespectrumisincident.Inordertoachievethis,knowledgeoftheeffectsofneutronsasafunction
of energy on the specific property of the material of interest is required. Sharp variations in the effects with neutron energy may
limit the usefulness of this practice in the case of mono-energetic sources.
1.2 Thispracticeispresentedinamannertobeofgeneralapplicationtoavarietyofmaterialsandsources.Correlationbetween
2
displacements (1-3) caused by different particles (electrons, neutrons, protons, and heavy ions) is beyond the scope of this
practice.Inradiation-hardnesstestingofelectronicsemiconductordevices,specificmaterialsofinterestincludesiliconandgallium
arsenide, and the neutron sources generally are test and research reactors and californium-252 irradiators.
1.3 The technique involved relies on the following factors: (1) a detailed determination of the energyfluence spectrum of the
neutron source, and (2) a knowledge of the degradation (damage) effects of neutrons as a function of energy on specific material
properties.
1.4 The detailed determination of the neutron energyfluence spectrum referred to in 1.3 need not be performed afresh for each
testexposure,providedtheexposureconditionsarerepeatable.Whenthespectrumdeterminationisnotrepeated,aneutronfluence
monitor shall be used for each test exposure.
1.5
1.5 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory
limitations prior to use.
2. Referenced Documents
3
2.1 ASTM Standards:
E170 Terminology Relating to Radiation Measurements and Dosimetry
E265 Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32
E693 PracticeforCharacterizingNeutronExposuresinIronandLowAlloySteelsinTermsofDisplacementsPerAtom(DPA),
E 706(ID)
E720 Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness
Testing of Electronics
1
This practice is under the jurisdiction of ASTM Committee E10 on Nuclear Technology and Applications and is the direct responsibility of Subcommittee E10.07 on
Radiation Dosimetry for Radiation Effects on Materials and Devices.
Current edition approved Feb. 15, 2005. Published July 2004. Originally approved in 1980. Last previous edition approved in 2002 as E722–94(2002).
´2
Current edition approved June 1, 2009. Published August 2009. Originally approved in 1980. Last previous edition approved in 2004 as E722–04 .
2
The boldface numbers in parentheses refer to a list of references at the end of this practice.
3
ForreferencedASTMstandards,visittheASTMwebsite,www.astm.org,[e-mail] Annual Book of ASTM Standards
volume information, refer to the standard’s Document Summary page on the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-295
...