ASTM E722-14

Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics

SIGNIFICANCE AND USE
5.1 This practice is important in characterizing the radiation hardness of electronic devices irradiated by neutrons. This characterization makes it feasible to predict some changes in operational properties of irradiated semiconductor devices or electronic systems. To facilitate uniformity of the interpretation and evaluation of results of irradiations by sources of different fluence spectra, it is convenient to reduce the incident neutron fluence from a source to a single parameter—an equivalent monoenergetic neutron fluence—applicable to a particular semiconductor material.  
5.2 In order to determine an equivalent monoenergetic neutron fluence, it is necessary to evaluate the displacement damage of the particular semiconductor material. Ideally, this quantity is correlated to the degradation of a specific functional performance parameter (such as current gain) of the semiconductor device or system being tested. However, this correlation has not been established unequivocally for all device types and performance parameters since, in many instances, other effects also can be important. Ionization effects produced by the incident neutron fluence or by gamma rays in a mixed neutron fluence, short-term and long-term annealing, and other factors can contribute to observed performance degradation (damage). Thus, caution should be exercised in making a correlation between calculated displacement damage and performance degradation of a given electronic device. The types of devices for which this correlation is applicable, and numerical evaluation of displacement damage are discussed in the annexes.  
5.3 The concept of 1-MeV equivalent fluence is widely used in the radiation-hardness testing community. It has merits and disadvantages that have been debated widely  (9-12). For these reasons, specifics of a standard application of the 1-MeV equivalent fluence are presented in the annexes.
SCOPE
1.1 This practice covers procedures for characterizing neutron fluence from a source in terms of an equivalent monoenergetic neutron fluence. It is applicable to neutron effects testing, to the development of test specifications, and to the characterization of neutron test environments. The sources may have a broad neutron-energy range, or may be mono-energetic neutron sources with energies up to 20 MeV. This practice is not applicable in cases where the predominant source of displacement damage is from neutrons of energy less than 10 keV. The relevant equivalence is in terms of a specified effect on certain physical properties of materials upon which the source spectrum is incident. In order to achieve this, knowledge of the effects of neutrons as a function of energy on the specific property of the material of interest is required. Sharp variations in the effects with neutron energy may limit the usefulness of this practice in the case of mono-energetic sources.  
1.2 This practice is presented in a manner to be of general application to a variety of materials and sources. Correlation between displacements (1-3)2 caused by different particles (electrons, neutrons, protons, and heavy ions) is beyond the scope of this practice. In radiation-hardness testing of electronic semiconductor devices, specific materials of interest include silicon and gallium arsenide, and the neutron sources generally are test and research reactors and californium-252 irradiators.  
1.3 The technique involved relies on the following factors: (1) a detailed determination of the fluence spectrum of the neutron source, and (2) a knowledge of the degradation (damage) effects of neutrons as a function of energy on specific material properties.  
1.4 The detailed determination of the neutron fluence spectrum referred to in 1.3 need not be performed afresh for each test exposure, provided the exposure conditions are repeatable. When the spectrum determination is not repeated, a neutron fluence monitor shall be used for each test expo...

General Information

• Status: Historical
• Publication Date: 31-May-2014
• ICS: 31.080.01 - Semiconductor devices in general
• Technical Committee: E10 - Nuclear Technology and Applications
• Drafting Committee: E10.07 - Radiation Dosimetry for Radiation Effects on Materials and Devices

Relations

• Replaces: ASTM E722-09e1 - Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
• Effective Date: 01-Jun-2014
• Replaced By: ASTM E722-19 - Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
• Effective Date: 01-Oct-2019
• Referred By: ASTM E721-22 - Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
• Effective Date: 01-Jun-2014
• Referred By: ASTM E1854-19 - Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
• Effective Date: 01-Jun-2014
• Referred By: ASTM E3084-17(2022)e1 - Standard Practice for Characterizing Particle Irradiations of Materials in Terms of Non-Ionizing Energy Loss (NIEL)
• Effective Date: 01-Jun-2014
• Referred By: ASTM E261-16(2021) - Standard Practice for Determining Neutron Fluence, Fluence Rate, and Spectra by Radioactivation Techniques
• Effective Date: 01-Jun-2014
• Referred By: ASTM F980-16 - Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
• Effective Date: 01-Jun-2014
• Referred By: ASTM E1855-20 - Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
• Effective Date: 01-Jun-2014
• Referred By: ASTM E2450-23 - Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
• Effective Date: 01-Jun-2014
• Referred By: ASTM E170-23 - Standard Terminology Relating to Radiation Measurements and Dosimetry
• Effective Date: 01-Jun-2014
• Referred By: ASTM F1190-18 - Standard Guide for Neutron Irradiation of Unbiased Electronic Components
• Effective Date: 01-Jun-2014

Standards Content (Sample)

NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation: E722 − 14
Standard Practice for
Characterizing Neutron Fluence Spectra in Terms of an
Equivalent Monoenergetic Neutron Fluence for Radiation-
1
Hardness Testing of Electronics
This standard is issued under the fixed designation E722; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
This standard has been approved for use by agencies of the U.S. Department of Defense.
1. Scope neutron source, and (2) a knowledge of the degradation
(damage)effectsofneutronsasafunctionofenergyonspecific
1.1 This practice covers procedures for characterizing neu-
material properties.
tron fluence from a source in terms of an equivalent monoen-
1.4 The detailed determination of the neutron fluence spec-
ergetic neutron fluence. It is applicable to neutron effects
trum referred to in 1.3 need not be performed afresh for each
testing, to the development of test specifications, and to the
testexposure,providedtheexposureconditionsarerepeatable.
characterizationofneutrontestenvironments.Thesourcesmay
When the spectrum determination is not repeated, a neutron
have a broad neutron-energy range, or may be mono-energetic
fluence monitor shall be used for each test exposure.
neutron sources with energies up to 20 MeV. This practice is
not applicable in cases where the predominant source of
1.5 The values stated in SI units are to be regarded as
displacement damage is from neutrons of energy less than 10
standard. No other units of measurement are included in this
2
keV. The relevant equivalence is in terms of a specified effect
standard, except for MeV, keV, eV, MeV·mbarn, rad(Si)·cm ,
2
on certain physical properties of materials upon which the
rad(GaAs)·cm .
source spectrum is incident. In order to achieve this, knowl-
1.6 This standard does not purport to address all of the
edge of the effects of neutrons as a function of energy on the
safety concerns, if any, associated with its use. It is the
specific property of the material of interest is required. Sharp
responsibility of the user of this standard to establish appro-
variations in the effects with neutron energy may limit the
priate safety and health practices and determine the applica-
usefulness of this practice in the case of mono-energetic
bility of regulatory limitations prior to use.
sources.
2. Referenced Documents
1.2 This practice is presented in a manner to be of general
3
2.1 ASTM Standards:
application to a variety of materials and sources. Correlation
2
E170Terminology Relating to Radiation Measurements and
between displacements (1-3) caused by different particles
Dosimetry
(electrons, neutrons, protons, and heavy ions) is beyond the
E265Test Method for Measuring Reaction Rates and Fast-
scope of this practice. In radiation-hardness testing of elec-
Neutron Fluences by Radioactivation of Sulfur-32
tronic semiconductor devices, specific materials of interest
E693Practice for Characterizing Neutron Exposures in Iron
include silicon and gallium arsenide, and the neutron sources
and Low Alloy Steels in Terms of Displacements Per
generally are test and research reactors and californium-252
Atom (DPA), E 706(ID)
irradiators.
E720Guide for Selection and Use of Neutron Sensors for
1.3 The technique involved relies on the following factors:
Determining Neutron Spectra Employed in Radiation-
(1) a detailed determination of the fluence spectrum of the
Hardness Testing of Electronics
E721Guide for Determining Neutron Energy Spectra from
1
This practice is under the jurisdiction of ASTM Committee E10 on Nuclear
Neutron Sensors for Radiation-Hardness Testing of Elec-
Technology and Applicationsand is the direct responsibility of Subcommittee
tronics
E10.07 on Radiation Dosimetry for Radiation Effects on Materials and Devices.
Current edition approved June 1, 2014. Published October 2014. Originally
ε1 3
approved in 1980. Last previous edition approved in 2009 as E722–09 . DOI: For referenced ASTM standards, visit the ASTM website, www.astm.org, or
10.1520/E0722-14. contact ASTM Customer Service at [e-mail]. For Annual Book of ASTM
2
The boldface numbers in parentheses refer to a list of references at the end of Standards volume information, refer to the standard’s Document Summary page on
this practice. the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
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E722 − 14
E844Guide for Sensor Set Design and Irradiation for atom is used, instead of per unit mass, as in the term kerma
Reactor Surveillance, E 706 (IIC) factor defined in E
...

This document is not an ASTM standard and is intended only to provide the user of an ASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
´1
Designation: E722 − 09 E722 − 14
Standard Practice for
Characterizing Neutron Fluence Spectra in Terms of an
Equivalent Monoenergetic Neutron Fluence for Radiation-
1
Hardness Testing of Electronics
This standard is issued under the fixed designation E722; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
This standard has been approved for use by agencies of the U.S. Department of Defense.
1
ε NOTE—Editorial changes were made throughout in October 2009.
1. Scope
1.1 This practice covers procedures for characterizing neutron fluence from a source in terms of an equivalent monoenergetic
neutron fluence. It is applicable to neutron effects testing, to the development of test specifications, and to the characterization of
neutron test environments. The sources may have a broad neutron-energy range, or may be mono-energetic neutron sources with
energies up to 20 MeV. This practice is not applicable in cases where the predominant source of displacement damage is from
neutrons of energy less than 10 keV. The relevant equivalence is in terms of a specified effect on certain physical properties of
materials upon which the source spectrum is incident. In order to achieve this, knowledge of the effects of neutrons as a function
of energy on the specific property of the material of interest is required. Sharp variations in the effects with neutron energy may
limit the usefulness of this practice in the case of mono-energetic sources.
1.2 This practice is presented in a manner to be of general application to a variety of materials and sources. Correlation between
2
displacements (1-3) caused by different particles (electrons, neutrons, protons, and heavy ions) is beyond the scope of this
practice. In radiation-hardness testing of electronic semiconductor devices, specific materials of interest include silicon and gallium
arsenide, and the neutron sources generally are test and research reactors and californium-252 irradiators.
1.3 The technique involved relies on the following factors: (1) a detailed determination of the fluence spectrum of the neutron
source, and (2) a knowledge of the degradation (damage) effects of neutrons as a function of energy on specific material properties.
1.4 The detailed determination of the neutron fluence spectrum referred to in 1.3 need not be performed afresh for each test
exposure, provided the exposure conditions are repeatable. When the spectrum determination is not repeated, a neutron fluence
monitor shall be used for each test exposure.
1.5 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this
2 2
standard.standard, except for MeV, keV, eV, MeV·mbarn, rad(Si)·cm , rad(GaAs)·cm .
1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory
limitations prior to use.
2. Referenced Documents
3
2.1 ASTM Standards:
E170 Terminology Relating to Radiation Measurements and Dosimetry
E265 Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32
E693 Practice for Characterizing Neutron Exposures in Iron and Low Alloy Steels in Terms of Displacements Per Atom (DPA),
E 706(ID)
1
This practice is under the jurisdiction of ASTM Committee E10 on Nuclear Technology and Applicationsand is the direct responsibility of Subcommittee E10.07 on
Radiation Dosimetry for Radiation Effects on Materials and Devices.
Current edition approved June 1, 2009June 1, 2014. Published August 2009October 2014. Originally approved in 1980. Last previous edition approved in 20042009 as
ε2ε1
E722 – 04E722 – 09 . DOI: 10.1520/E0722-09E01.10.1520/E0722-14.
2
The boldface numbers in parentheses refer to a list of references at the end of this practice.
3
For referenced ASTM standards, visit the ASTM website, www.astm.org, or contact ASTM Customer Service at [e-mail]. For Annual Book of ASTM Standards
volume information, refer to the standard’s Document Summary page on the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1

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