ASTM F1262M-95(2002)
(Guide)Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits
Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits
SIGNIFICANCE AND USE
Digital logic circuits are used in system applications where they are exposed to pulses of radiation. It is important to know the minimum radiation level at which transient failures can be induced, since this affects system operation.
SCOPE
1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 103 Gy (Si)/s.
1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
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Standards Content (Sample)
NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
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Designation:F 1262M–95 (Reapproved 2002)
Standard Guide for
Transient Radiation Upset Threshold Testing of Digital
1
Integrated Circuits (Metric)
This standard is issued under the fixed designation F 1262M; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
1. Scope mined by the logic signals at its inputs at the same time (except
for small time delays caused by the propagation delay of
1.1 This guide is to assist experimenters in measuring the
internal logic elements).
transient radiation upset threshold of silicon digital integrated
3
3.1.1.1 Discussion—Combinational circuits contain no in-
circuits exposed to pulses of ionizing radiation greater than 10
ternal storage elements. Hence, the output signals are not a
Gy (Si)/s.
functionofanysignalsthatoccurredatpasttimes.Examplesof
1.2 This standard does not purport to address all of the
combinational circuits include gates, adders, multiplexers and
safety concerns, if any, associated with its use. It is the
decoders.
responsibility of the user of this standard to establish appro-
3.1.2 complex circuit response mechanisms—For medium
priate safety and health practices and determine the applica-
scale integration (MSI) and higher devices it is useful to define
bility of regulatory limitations prior to use.
three different categories of devices in terms of their internal
2. Referenced Documents design and radiation response mechanisms.
2
3.1.3 over-stressed device—A device that has conducted
2.1 ASTM Standards:
more than the manufacturer’s specified maximum current, or
E 666 Practice for Calculating Absorbed Dose From
dissipated more than the manufacturer’s specified maximum
Gamma or X Radiation
power.
E 668 Practice for Application of Thermoluminescence-
3.1.3.1 Discussion—In this case the DUT is considered to
Dosimetry(TLD)SystemsforDeterminingAbsorbedDose
be overstressed even if it still meets all of the manufacturer’s
in Radiation-Hardness Testing of Electronic Devices
specifications. Because of the overstress, the device should be
F 867M Guide for Ionizing Radiation Effects (Total Dose in
3
evaluated before using it in any high reliability application.
Radiation-Hardness Testing of Electronic Devices
4
3.1.4 sequential logic—A digital logic system with the
2.2 Military Standards:
property that its output state at a given time depends on the
Method 1019 in MIL-STD-883. Steady-State Total Dose
sequence and time relationship of logic signals that were
Irradiation Procedure
previously applied to its inputs.
Method 1021 in MIL-STD-883. Dose Rate Threshold for
3.1.4.1 Discussion—Examples of sequential logic circuits
Upset of Digital Microcircuits.
include flip-flops, shift registers, counters, and arithmetic logic
3. Terminology
units.
3.1.5 state vector—A state vector completely specifies the
3.1 Definitions:
logic condition of all elements within a logic circuit.
3.1.1 combinational logic—A digital logic system with the
3.1.5.1 Discussion—For combinational circuits, the state
property that its output state at a given time is solely deter-
vector includes the logic signals that are applied to all inputs:
for sequential circuits, the state vector must also include the
1
This guide is under the jurisdiction of ASTM Committee F01 on Electronics
sequence and time relationship of all input signals. In this
and is the direct responsibility of Subcommittee F01.11 on Nuclear and Space
guide the output states will also be considered part of the state
Radiation Effects.
Current edition approved Dec. 10, 2002. Published May 2003. Originally vector definition. For example, an elementary 4-input NAND
approved in 1995. Last previous edition approved in 1995 as F 1262M – 95.
gate has 16 possible state vectors, 15 of which result in the
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
same output condition (“1” state). A 4-bit counter has 16
contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
possible output conditions, but many more state vectors be-
Standards volume information, refer to the standard’s Document Summary page on
the ASTM website.
cause of its dependence on the dynamic relationship of various
3
Discontinued. Replaced by F 1893. See 1997 Annual Book of ASTM Standards,
input signals.
Vol 10.04.
4 3.1.6 upset response—The electrical response of a circuit
Available from Standardization Documents Order Desk, Bldg. 4, Section D,
when it is exposed to a pulse of transient ionizing radiation.
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