ASTM C485-83(2003)e1
(Test Method)Standard Test Method for Measuring Warpage of Ceramic Tile
Standard Test Method for Measuring Warpage of Ceramic Tile
SIGNIFICANCE AND USE
This test method provides a means for determining whether or not a lot of ceramic tile meets the warpage requirements that may appear in specifications to assure satisfactory tile installations. In accordance with this test method, warpage is calculated as a percentage of the length of the edge or diagonal being tested. It is realized that the percentage values based on the overall edge length, or on the overall diagonal length of a tile will be slightly lower than those based on the distance between reference points. However, the ratio of the overall lengths to the distance between reference points will be practically constant for any particular size of tile and, therefore, the percentage values will be comparable and equally indicative of warpage.
FIG. 1 Apparatus for Square Tile, Set Up for Measurement of 4 ¼- by 4¼ -in. (108- by 108-mm) Tile
FIG. 2 Apparatus as Shown in Fig. 1, Showing Arrangement of Stem Extender
SCOPE
1.1 This test method covers procedures for measuring diagonal and edge warpages of the following categories of ceramic tile:
1.1.1 Square Tile 2 by 2 in. (51 by 51 mm) or larger, that are nominally flat, of uniform overall thickness, and have a smooth face of one of the types: unglazed, bright glazed, matte glazed, or finely crystalline glazed.
1.1.2 Oblong Tile no facial dimension smaller than 2 in. (51 mm), that are flat, of uniform overall thickness, and have a smooth face of one of the types: unglazed, bright glazed, matte glazed, or finely crystalline glazed.
1.1.3 Square and Oblong Tileno facial dimension smaller than 2 in. (51 mm), that are flat, but have an irregular face such as embossed, sloped, bumpy, wavy, coarsely crystalline, or wire-cut textured.
1.1.4 Nonrectilinear Tilelarger than 4 in.2 (26 cm2), that are flat and of uniform body thickness with smooth or irregular face, such as hexagonal, diamond, Spanish type, and so forth.
1.1.5 Trim Tilemeeting one of the descriptions in except that only a part of the tile surface is flat. (Surface trim tile should be treated as flat tile whenever possible.)
1.1.6 Square or Oblong Tilewith facial area less than 4 in.2 (26 cm2) and at least two straight sides equal to or greater than 1.0 in. (25 mm) long. (Modular 1- by 1-in. tile are not in the scope of this test method.)
1.2 This test method is not applicable to tile having embossed surfaces that are not flat, or that have a combination of variable body thickness and an irregular face.
1.3 The values stated in the inch-pound units are to be regarded as the standard. The SI (metric) units given in parentheses are for information only.
This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
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e1
Designation: C 485 – 83 (Reapproved 2003)
Standard Test Method for
Measuring Warpage of Ceramic Tile
This standard is issued under the fixed designation C485; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
e NOTE—Adjunct references were corrected editorially in April 2006.
1. Scope priate safety and health practices and determine the applica-
bility of regulatory limitations prior to use.
1.1 This test method covers procedures for measuring di-
agonal and edge warpages of the following categories of
2. Referenced Documents
ceramic tile:
2.1 ASTM Standards:
1.1.1 Square Tile,2by2in.(51by51mm)orlarger,thatare
C242 Terminology of Ceramic Whitewares and Related
nominallyflat,ofuniformoverallthickness,andhaveasmooth
Products
face of one of the types: unglazed, bright glazed, matte glazed,
2.2 ASTM Adjuncts:
or finely crystalline glazed.
Warpage Gage for Ceramic Tile
1.1.2 Oblong Tile,nofacialdimensionsmallerthan2in.(51
mm), that are flat, of uniform overall thickness, and have a
3. Terminology
smoothfaceofoneofthetypes:unglazed,brightglazed,matte
3.1 Definitions:
glazed, or finely crystalline glazed.
3.1.1 tile—see Definitions C242.
1.1.3 Square and Oblong Tile, no facial dimension smaller
3.1.2 warpage—curvature of a flat tile measured as devia-
than2in.(51mm),thatareflat,buthaveanirregularfacesuch
tion of the tile surface from a true plane along the edges or the
as embossed, sloped, bumpy, wavy, coarsely crystalline, or
diagonals. The deviation is measured at the mid-length of an
wire-cut textured.
2 2
edgeordiagonal,expressedasapercentageofthelengthofthe
1.1.4 Nonrectilinear Tile, larger than 4 in. (26 cm ), that
edge or diagonal, and called convex or concave with respect to
areflatandofuniformbodythicknesswithsmoothorirregular
the face of the tile.
face, such as hexagonal, diamond, Spanish type, and so forth.
1.1.5 Trim Tile meeting one of the descriptions in 1.1.1-
4. Summary of Test Method
1.1.4 except that only a part of the tile surface is flat. (Surface
4.1 This test method consists of measuring the deviation
trim tile should be treated as flat tile whenever possible.)
fromastraightlineatthemidpointbetweenreferencepointson
1.1.6 Square or Oblong Tile with facial area less than 4
the face or back of a tile. Measurements are made along the
2 2
in. (26 cm ) and at least two straight sides equal to or greater
edges of a tile or along the diagonals, or both.The deviation is
than 1.0 in. (25 mm) long. (Modular 1- by 1-in. tile are not in
expressed as convex or concave warpage in relation to the tile
the scope of this test method.)
face, and its magnitude is calculated as a percentage of the
1.2 This test method is not applicable to tile having em-
length of the edge or diagonal.
bossed surfaces that are not flat, or that have a combination of
variable body thickness and an irregular face.
5. Significance and Use
1.3 The values stated in the inch-pound units are to be
5.1 This test method provides a means for determining
regarded as the standard. The SI (metric) units given in
whether or not a lot of ceramic tile meets the warpage
parentheses are for information only.
requirements that may appear in specifications to assure
1.4 This standard does not purport to address all of the
satisfactory tile installations. In accordance with this test
safety concerns, if any, associated with its use. It is the
method, warpage is calculated as a percentage of the length of
responsibility of the user of this standard to establish appro-
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
This method is under the jurisdiction of ASTM Committee C21 on Ceramic contactASTM Customer Service at service@astm.org. ForAnnual Book ofASTM
Whitewares and Related Products and is the direct responsibility of Subcommittee Standards volume information, refer to the standard’s Document Summary page on
C21.06 on Ceramic Tile. the ASTM website.
Current edition approved Oct. 1, 2003. Published October 2003. Originally Three drawings showing construction details are available from ASTM
approved in 1961. Last previous edition approved in 1999 as C485–83 (1999). Headquarters. Order ADJC0485.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
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C 485 – 83 (2003)
the edge or diagonal being tested. It is realized that the 6. Apparatus
percentage values based on the overall edge length, or on the
6.1 General Apparatus—The size and arrangement of the
overall diagonal length of a tile will be slightly lower than
apparatus for measuring the warpages vary, depending on the
those based on the distance between reference points. How-
size and shape of the tile to be measured. In general, the
ever, the ratio of the overall lengths to the distance between
apparatus consists of two stationary pins (reference pins)
reference points will be practically constant for any particular
spaced apart ⁄4 in. (19 mm) less than the length of the edge or
size of tile and, therefore, the percentage values will be
diagonal being tested, and a dial indicator tip midway between
comparable and equally indicative of warpage.
the stationary pins and in line with them.The pins and the dial
indicator are mounted firmly on the same rigid metal bar. The
pins may have a hemispherical tip, as described in 6.2.2,or
they may be conical to a point.Amore versatile apparatus for
standard sizes of tile consists of a metal plate having three
movable reference pins, three movable registry stops, and the
necessary number of dial indicators. See Fig. 1 and Fig. 2.
6.2 Apparatus for Square Tile:
6.2.1 Metal Plate—Aflatmetalplate,6by6in.(152by152
1 7
mm) square and ⁄4 in. (6.4 mm) thick, with a ⁄16-in. (11-mm)
wide slot starting at the midpoint of one side and running at
right angles to that side for a distance of 2 ⁄8 in. (67 mm)
toward the center of the plate. The plate also has a ⁄16-in.
diameter hole in the exact center of the plate. One side of the
1 1
plate has two ⁄8-in. (3.2-mm) thick, ⁄2-in. (13-mm) wide, and
1-in. (25-mm) high projections, located not more than ⁄2 in.
from the corners, and a similar projection located on an
adjacent side and not more than ⁄2 in. from one of the corners
of the first side. These projections serve as permanent registry
stops for 6- by 6-in. tile during measurement.
6.2.1.1 In addition, the plate has a series of tapped holes for
insertion of removable reference pins and removable registry
stops.Thecentersoftheholesforthereferencepinsarelocated
foreachnominalsizeoftilenearthreeofitscorners, ⁄8in.(9.5
mm) in from each side, when the tile is centered on the plate,
FIG. 1 Apparatus for Square Tile, Set Up for Measurement of 4 ⁄4- except that for 2- by 2-in. (51- by 51-mm) tile the distance in
by 4 ⁄4-in. (108- by 108-mm) Tile
from the edges is ⁄4 in. (6.4 mm). To receive the three registry
stops,thecentersoftwoholesarelocatedforeachnominalsize
1 1
of tile ⁄2 in. (13 mm) from the corners of one side and ⁄8 in.
(3.2 mm) from the edge of the tile, while the center of a third
hole is located on an adjacent side, ⁄2 in. from one of the
corners of the first side and ⁄8 in. from the edge of the tile.
6.2.2 Reference Pins—Three movable reference pins ⁄8 in.
(16mm)highand ⁄4in.(6.4mm)indiameter,withthefreeend
ground to a hemispherical tip and the other end threaded for a
distance of ⁄4 in. The reference pins are inserted in the metal
plate to support the tile during measurement.
6.2.3 Registry Stops—Three ⁄4-in. (6.4-mm) diameter and
1 ⁄4-in. (32-mm) high, movable, flat top registry stops with a
1 1
⁄16-in. (1.6-mm) wide and ⁄8-in. (3.2-mm) deep slot on one
endfortheinsertionofascrewdriverandthreadedontheother
endforadistanceof ⁄4in.Theregistrystopsareinsertedinthe
metal plate to fix the horizontal position of the tile during
measurement.
6.2.4 Dial Indicators—Two adjustable dial indicators, read-
ing in 0.001-in. (0.025-mm) increments and accurate to
60.001 in. One is inserted from the bottom through the ⁄16-in.
(11-mm) hole in the center of the plate, permanently fastened
to the underside of the metal plate, and used for measuring
FIG. 2 Apparatus as Shown in Fig. 1, Showing Arrangement of
diagonalwarpage.Theotherisinsertedintotheslotintheplate
Stem Extender
and fastened in any one of four positions which represent
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C 485 – 83 (2003)
midpoints between reference pins on one side of each of the 8. Procedure
different nominal sizes of tile. This dial indicator is used for
8.1 General—For nominally square tile use the apparatus
determining edge warpage.
described under 6.2. For oblong tile use the apparatus de-
6.2.5 True Reference Plates—Four ⁄8-in. (9.5-mm) thick
scribed under 6.3.
platesoftrueplanesurface,madeofsteelorpolishedglass,one
8.2 Procedure for Square Tile:
each of the same dimensions as the four nominal sizes of tile
8.2.1 Depending upon the size of tile to be tested, insert the
which can be measured on this apparatus.
3 three registry stops and the three reference pins into the proper
6.3 Apparatus for Oblong Tile:
tapped holes in the metal plate and fasten them. Move and
1 1
6.3.1 Metal Plate—Aflatrectangularmetalplate8 ⁄2by4 ⁄4
fasten the adjustable dial indicator in the slot so that its tip will
in. (216 by 108 mm) and ⁄4 in. (6.4 mm) thick, having two
fallatthemidpointbetweenthetworeferencepinsonthesame
⁄16-in. (11-mm) wide slots. One slot should start at the
side. Insert the proper reference plate and adjust the two dial
midpoint of one 4 ⁄4-in. side and run at right angles to that side
indicators to zero reading when the reference plate rests on the
for a distance of 2 ⁄4 in. (70 mm) towards the center of the
reference pins and is in contact with the three registry stops.
plate. The other slot should start at the midpoint of one 8 ⁄2-in.
8.2.2 Insertapieceoftilewithitsfacerestinguponthethree
side and run at right angles to that side for a distance of 1 ⁄4 in.
reference pins and its edges in contact with the three registry
(45 mm) towards the center of the plate. These slots are used
stops. Read the two dial indicators, turn the tile 90° clockwise,
for inserting the two dial indicators necessary to measure the
and repeat the procedure until all four sides and the two
edge warpage of one long and one short dimension of the tile
diagonals have been measured.
simultaneously. There is also a ⁄16-in. hole in the exact center
of the plate for insertion of the third dial indicator, which is 8.3 Procedure for Oblong Tile:
usedformeasuringdiagonalwarpage.Onesideoftheplatehas
8.3.1 Both diagonals of oblong tile cannot be measured for
1 1
two ⁄8-in. (3.2-mm) thick, ⁄2-in. (13-mm) wide, and 1-in.
warpage without changing one of the reference pins. Depend-
(25-mm) high projections, located not more than ⁄2 in. from
ing upon the size of tile to be tested, insert the three registry
thecornersandasimilarprojectionlocatedonanadjacentside
stops and the three reference pins into the proper tapped holes
and not more than ⁄2 in. from one of the corners of the first
in the metal plate and fasten them. Insert the two movable dial
side. These projections serve as permanent registry stops for
indicators, one in each slot of the plate and located so that the
1 1
8 ⁄2 by 4 ⁄4-in. tile during measurement.
stem of one is at the midpoint between reference pins of one
6.3.1.1 In addition, the plate has a series of tapped holes for
short dimension and the stem of the other at the midpoint
insertionofmovablereferencepinsandmovableregistrystops.
between reference pins of one long dimension. Using the
Thecenteroftheholesforthereferencepinsislocatedforeach
properreferenceplatesothatitrestsonthethreereferencepins
nominal size of tile near its four corners, ⁄8 in. (9.5 mm) in
and its sides are in contact with the registry stops, adjust the
from each side, when the tile is centered on the plate. The
three dial indicators to zero reading.
centersoftwooftheholestoreceivethethreeregistrystopsare
8.3.2 Place a tile face down on the reference pins so that its
located for each size of tile ⁄2 in. (13 mm) from the corners of
edges are in contact with the registry stops and read the three
onesideand ⁄8in.(3.2mm)fromtheedgeofthetile,whilethe
dialindicators.Turnthetile180°andreadtheedgewarpageof
center of the third hole is located on an adjacent side, ⁄2 in.
thesecondshortandsecondlongdimensionofthetile.Inorder
from one of the corners of the first side and ⁄8 in. from the
to determine the warpage of the second diagonal, change one
edges of the tile.
of the reference pins and read the warpage of the second
6.3.2 Reference Pins—See 6.2.2.
diagonal,afterfirstresettingthedialindicatorstozerowiththe
6.3.3 Registry Stops—See 6.2.3.
reference plate. (In practice it will be found more expedient to
6.3.4 Dial Indicators—Three adjustable dial indicators,
read the edge warpage and the warpage of one diagonal of all
reading in 0.001-in. (0.025-mm) increments and accurate to
the tile in a sample before changing the one reference pin to
60.001in.Oneofthem,usedforthedeterminationofdiagonal
determine the warpage of the second diagonal.)
warpage,ispermanentlyfastenedontheundersideoftheplate,
8.4 Procedure for Square or Oblong Tile with an Irregular
withitsstemprojectingthroughthe ⁄16-in.(11-mm)holeinthe
Face, as defined in 1.1.3.
center of the plate. The other two, used for measuring edge
8.4.1 Tile with an irregular face on which accurate warpage
warpage, are inserted, one into each of the two slots in the
measurements can not be made must be measured on the back,
plate, and fastened in any one of the various positions
if possible. If the back is also unsuitable, no warpage measure-
representing midpoints between reference pins on the same
ments can be made in accordance with this test method.
side of the various nominal sizes of tile. Because two of the
8.4.2 Asuitable back may be flat, embossed with a pattern,
dialindicatorsareinonelineforviewing,oneofthemmustbe
or ribbed if the following criteria are satisfied:
arranged at a different elevation than the other by using a stem
1 1
8.4.2.1 For diagonal warpage a flat area at least ⁄4 by ⁄4 in.
extender, so that both dials may be read simultaneously (Fig.
(6.4 mm) in or near the center of the back must be in the same
2).
nominal plane and in line with similar flat areas near the
6.3.5 True Reference Plates—See 6.2.5.
corners of the back.The points within these flat areas at which
7. Test Specimens
the sta
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