ASTM E1588-07e1
(Guide)Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry
Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry
SCOPE
1.1 This guide covers the analysis of gunshot residue (GSR) by scanning electron microscopy/energy-dispersive X-ray spectrometry (SEM/EDS) by manual and automated methods. The analysis may be performed manually, with the operator manipulating the microscope controls and the EDS system software, or in an automated fashion, where some amount of the analysis is controlled by pre-set software functions.
1.2 Since software and hardware formats vary among commercial systems, guidelines will be offered in the most general terms possible. The software manual for each system should be consulted for proper terminology and operation.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
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Designation:E1588–07
Standard Guide for
Gunshot Residue Analysis by Scanning Electron
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Microscopy/ Energy Dispersive X-ray Spectrometry
This standard is issued under the fixed designation E 1588; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
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e NOTE—Editorial corrections were made in August 2007.
1. Scope 4. Significance and Use
1.1 This guide covers the analysis of gunshot residue (GSR) 4.1 This document will be of use to forensic laboratory
by scanning electron microscopy/energy-dispersive X-ray personnel who are involved in the analysis of GSR samples by
spectrometry (SEM/EDS) by manual and automated methods. SEM/EDS.
The analysis may be performed manually, with the operator 4.2 SEM/EDS analysis of GSR is a non-destructive method
,
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manipulating the microscope controls and the EDS system that provides both morphological information and the el-
software, or in an automated fashion, where some amount of emental profiles of individual particles. This contrasts with
the analysis is controlled by pre-set software functions. bulk sample methods, such as atomic absorption spectropho-
1.2 Since software and hardware formats vary among com- tometry, neutron activation analysis, inductively coupled
mercial systems, guidelines will be offered in the most general plasma atomic emission spectrometry, and inductively coupled
termspossible.Thesoftwaremanualforeachsystemshouldbe plasma mass spectrometry, where the sampled material is
consulted for proper terminology and operation. dissolved or extracted prior to the determination of total
1.3 This standard does not purport to address all of the element concentrations, thereby sacrificing morphological in-
safety concerns, if any, associated with its use. It is the formation and individual particle identification. In addition,
responsibility of the user of this standard to establish appro- x-ray fluorescence spectrometry (XRF) is a bulk analysis
priate safety and health practices and determine the applicabil- techniquethathasbeenusedfortheelementalanalysisofGSR.
ity of regulatory limitations prior to use. Unlike the solution-based bulk methods of analysis, XRF is
nondestructive; however, XRF still does not provide morpho-
2. Referenced Documents
logical information and is incapable of individual GSR particle
2.1 ASTM Standard:
identification.
E 876 Practice for Use of Statistics in the Evaluation of
2 5. Sample Preparation
Spectrometric Data
5.1 Once the evidence seal is broken, care should be taken
3. Summary of Practice
so that no object touches the surface of the adhesive SEM/EDS
3.1 From the total population of particles collected, those
sample collection stub and that the stub is not left uncovered
that are determined by SEM to be within the limits of certain any longer than is reasonable for transfer, mounting, or
parameters (e.g., atomic number, size, or shape) characteristic
labeling.
of or consistent with GSR are analyzed by EDS. Typically, 5.2 Label the sample collection stub in such a manner that it
particles composed of high mean atomic number elements are
is distinguishable from other sample collection stubs without
detected by their SEM backscattered electron signals and an compromising the sample; that is, label the bottom or side of
EDS spectrum is obtained from each. The EDS elemental
the stub.
profile is evaluated for constituent elements that may identify 5.3 If a non-conductive adhesive was used in the sample
the particle as being characteristic of or consistent with GSR.
collectionstub,thesamplewillneedtobecoatedtoincreaseits
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This guide is under the jurisdiction of ASTM Committee E30 on Forensic Krishnan, S. S., “Detection of Gunshot Residue: Present Status,” Forensic
Sciences and is the direct responsibility of Subcommittee E30.01 on Criminalistics. Science Handbook, Volume I, Prentice Hall, Inc., Englewood Cliffs, NJ, 1982.
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Current edition approved Feb. 15, 2007. Published April 2007. Originally Wolten, G. M., Nesbitt, R. S., Calloway, A. R., Loper, G. L., and Jones, P. F.,
approved in 1994. Last previous version approved in 2001 as E 1588 – 95(2001). “Final Report on ParticleAnalysis for Gunshot Residue Detection,” Report ATR-77
2
Withdrawn. (7915)-3, Aerospace Corporation, Segundo, CA, 1977.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
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E1588–07
electrical conductivity, unless an environmental SEM or low 7.2 Scanning Electron Microscope (SEM):
pressure/low vacuum - SEM is used for the analysis. Ca
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