Standard Test Method for Measurement of Dry-Film Thickness of Organic Coatings Using Micrometers

SCOPE
1.1 This test method covers the measurement of film thickness of dried films of paint, varnish, lacquer, and related products using micrometers. Procedures A and B utilize stationary micrometers and Procedures C and D, hand-held micrometers. Procedures A and C are not recommended for films less than 0.5 mils (12.5 µm) in thickness. The minimum thickness required for Procedures B and D is a function of that required to enable removal of the sample as a free film.  
1.2 The procedures appear as follows:  
1.2.1 Procedure A--Stationary micrometer for measuring coatings applied to plane rigid surfaces.  
1.2.2  Procedure B--Stationary micrometer for measuring free films.  
1.2.3  Procedure C--Hand-held micrometer for measuring coatings applied to plane rigid surfaces.  
1.2.4 Procedure D --Hand-held micrometer for measuring free films.
1.3 The values stated in inch-pound units are to be regarded as the standard. The values given in parentheses are for information only.
1.4 This standard does not purport to address the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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31-Dec-2000
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ASTM D1005-95 - Standard Test Method for Measurement of Dry-Film Thickness of Organic Coatings Using Micrometers
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NOTICE: This standard has either been superseded and replaced by a new version or discontinued.
Contact ASTM International (www.astm.org) for the latest information.
Designation: D 1005 – 95
AMERICAN SOCIETY FOR TESTING AND MATERIALS
100 Barr Harbor Dr., West Conshohocken, PA 19428
Reprinted from the Annual Book of ASTM Standards. Copyright ASTM
Standard Test Method for
Measurement of Dry-Film Thickness of Organic Coatings
Using Micrometers
This standard is issued under the fixed designation D 1005; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
This standard has been approved for use by agencies of the Department of Defense.
1. Scope ment of films on laboratory test panels.
3.2 The accuracy and precision of the thickness measure-
1.1 This test method covers the measurement of film thick-
ments may be influenced by the deformability of the coating.
ness of dried films of paint, varnish, lacquer, and related
This test method is not applicable to coatings that are readily
products using micrometers. Procedures A and B utilize sta-
deformable under the load of the measuring instrument.
tionary micrometers and Procedures C and D, hand-held
3.3 The accuracy and precision of the thickness measure-
micrometers. Procedures A and C are not recommended for
ments are also influenced by the uniformity of the substrate
films less than 0.5 mils (12.5 μm) in thickness. The minimum
when the coatings are applied to laboratory test panels.
thickness required for Procedures B and D is a function of that
required to enable removal of the sample as a free film.
4. Apparatus
1.2 The procedures appear as follows:
4.1 Procedures A and B:
1.2.1 Procedure A—Stationary micrometer for measuring
4.1.1 The apparatus shall consist of a dial comparator, dial
coatings applied to plane rigid surfaces.
indicator, or micrometer. A rigid base is required for mounting
1.2.2 Procedure B—Stationary micrometer for measuring
the dial comparator or dial indicator gages. The presser foot of
free films.
1 1
the micrometer or dial indicator shall be circular, from ⁄16 to ⁄8
1.2.3 Procedure C—Hand-held micrometer for measuring
in. (1.5 to 3.0 mm) in diameter, and shall be flat on the bottom.
coatings applied to plane rigid surfaces.
The presser foot shall be fixed to an indicator that reads to 0.1
1.2.4 Procedure D—Hand-held micrometer for measuring
mil (2.5 μm). The load on the presser foot shall be between 20
free films.
and 40 psi (140 and 275 kPa). For Procedure B, a smooth
1.3 The values stated in inch-pound units are to be regarded
uncoated test plate is also required.
as the standard. The values given in parentheses are for
4.1.2 Verify the accuracy of instrument calibration by set-
information only.
ting to zero with the anvils closed followed by measuring
1.4 This standard does not purport to address the safety
shims of known thicknesses or standards specifically designed
concerns, if any, associated with its use. It is the responsibility
for this purpose. Record the standard thickness gage measure-
of the user of this standard to establish appropriate safety and
ment and the micrometer reading. Use these results to construct
health practices and determine the applicability of regulatory
a calibration curve.
limitations prior to use.
4.2 Procedures C and D—The apparatus shall consist of a
2. Referenced Documents hand-held micrometer. The anvils of the micrometer shall be
1 1
circular, from ⁄16 to ⁄8 in. (1.5 to 3.0 mm) in diameter, with flat
2.1 ASTM Standards:
bottoms. Verify the accuracy of instrument calibration by
D 823 Practices for Producing Films of Uniform Thickness
setting to zero with the anvils closed followed by measuring
of Paint, Varnish, and Related Products on Test Panels
shims of known thicknesses or standards specifically designed
D 2370 Test Method for Tensile Properties of Organic
for this purpose. Record the standard thickness gage measure-
Coatings
ment and the micrometer reading. Use these results to construct
3. Significance and Use
a calibration curve.
3.1 This test method is particularly applicable to the mea-
5. Test Specimen
surement of free films and is also satisfactory for the measure-
5.1 Procedures A and C—Apply test films to a suitable
1 plane, rigid base material from which the dried film may be
This test method is under the jurisdiction of ASTM Committee D-1 on Paint
and Related Coatings, Materials, and Applications and is the direct responsibility of satisfactorily removed. The panels shall be of sufficient size to
Subcommittee D01.23 on Physical Properties of Applied Paint Films.
permit film thickness measurements to be made 1 in. (25 mm)
Current edition approved Feb. 15, 1995. Published April 1995. Originally
from any edge.
e1
published 1949. Last previous edition D 1005 – 84 (1990) .
Annual Book of ASTM Standards, Vol 06.01.
D 1005
5.1.1 Coatings should be applied in accordance with Prac-
tices D 823 or as agreed upon between the purchaser and the
seller.
5.2 Procedures B and D—Free films of the test material are
required. Alternatively, the test materials can be applied to an
appropriate substrate in order that they can be removed as free
films without deformation. If the method of specimen prepa-
ration affects the film forming properties of the test material or
requires cutting or scraping to remove the free film, use
Procedures A or C instead.
5.2.1 Free films may be prepared in accordance with Test
Method D 2370.
6. Procedure
6.1 Procedure A:
6.1.1 Mount the test panel rigidly on a suitable base. Clamp
or hold it to the base in such a way that there will be no
movement or spring of the panel during the film thickness
measurement. FIG. 1
6.1.2 Close the gage slowly until contact is made, but
without visible distortion of the film. Read the gage, estimating film thickness to be measured.
to 0.1 mil (2.5μ m), and record the reading. 6.3.2 Place the coated base material between anvil contacts.
6.1.3 Open the gage and remove the film carefully from the Be sure to align the panel so that it is perpendicular to the
area where the measurement was taken. Any suitable means, contact points. Carefully bring the micrometer anvil into
chemical or mechanical, may be used to remove the film, contact with the film by releasing the spring tension or rotating
taking care not to distort the panel. Close the gage, slowly on the adjustment barrel. Do not compress the film.
the area from which the film was removed, and take a reading, 6.3.3 Record the film thickness to 0.1 mil (2.5 μm). For
estimating to 0.1 mil (2.5 μm). spring-loaded micrometers, record the value directly from the
6.1.4 The difference in the gage readings bef
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