EN IEC 63185:2021
(Main)Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method
Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method
IEC 63185:2020 relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes is taken into account accurately on the basis of the mode-matching analysis.
Messung der komplexen Dielektrizitätskonstante für verlustarme dielektrische Substrate nach dem symmetrischen Kreisscheibenresonatorverfahren
Méthode au résonateur à disque circulaire de type symétrique pour mesurer la permittivité complexe des substrats diélectriques à faible perte
l’IEC 63185:2020 traite d’une méthode de mesure de la permittivité complexe des substrats diélectriques aux hyperfréquences et aux fréquences à ondes millimétriques. Cette méthode a été élaborée pour évaluer les propriétés diélectriques des matériaux à faible perte utilisés dans les circuits et dispositifs hyperfréquences et à ondes millimétriques. Cette méthode utilise des modes d’ordre supérieur d’un résonateur à disque circulaire de type symétrique et permet d’effectuer, à l’aide d’un résonateur, des mesurages à large bande de substrats diélectriques, dont l’effet des trous d’excitation est pris en compte avec exactitude sur la base de l’analyse de couplage de mode.
Merjenje kompleksne permitivnosti dielektričnih substratov z uravnoteženo metodo krožnega diskovnega resonatorja (IEC 63185:2020)
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
01-marec-2021
Merjenje kompleksne permitivnosti dielektričnih substratov z uravnoteženo
metodo krožnega diskovnega resonatorja (IEC 63185:2020)
Measurement of the complex permittivity for low-loss dielectric substrates balanced-type
circular disk resonator method (IEC 63185:2020)
Messung der komplexen Dielektrizitätskonstante für verlustarme dielektrische Substrate
nach dem symmetrischen Kreisscheibenresonatorverfahren (IEC 63185:2020)
Méthode au résonateur à disque circulaire de type symétrique pour mesurer la
permittivité complexe des substrats diélectriques à faible perte (IEC 63185:2020)
Ta slovenski standard je istoveten z: EN IEC 63185:2021
ICS:
33.120.30 Radiofrekvenčni konektorji RF connectors
(RF)
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD EN IEC 63185
NORME EUROPÉENNE
EUROPÄISCHE NORM
January 2021
ICS 33.120.30
English Version
Measurement of the complex permittivity for low-loss dielectric
substrates balanced-type circular disk resonator method
(IEC 63185:2020)
Méthode au résonateur à disque circulaire de type Messung der komplexen Dielektrizitätskonstante für
symétrique pour mesurer la permittivité complexe des verlustarme dielektrische Substrate nach dem
substrats diélectriques à faible perte symmetrischen Kreisscheibenresonatorverfahren
(IEC 63185:2020) (IEC 63185:2020)
This European Standard was approved by CENELEC on 12 January 2021. CEN and CENELEC members are bound to comply with the
CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard
without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CEN and CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CEN and CENELEC member into its own language and notified to the CEN-CENELEC Management Centre
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© 2021 All rights of exploitation in any form and by any means reserved worldwide for CEN national Members and for
CEN/CENELEC CENELEC Members.
Ref. No. EN IEC 63185:2021 E
European foreword
The text of document 46F/523/FDIS, future edition 1 of IEC 63185, prepared by SC 46F "RF and
microwave passive components" of IEC/TC 46 "Cables, wires, waveguides, RF connectors, RF and
microwave passive components and accessories" was submitted to the IEC-CENELEC parallel vote
and approved by CENELEC as EN IEC 63185:2021.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2021-10-12
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2024-01-12
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Endorsement notice
The text of the International Standard IEC 63185:2020 was approved by CENELEC as a European
Standard without any modification.
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod),
the relevant EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available
here: www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 61338-1-3 1999 Waveguide type dielectric resonators - EN 61338-1-3 2000
Part 1-3: General information and test
conditions - Measurement method of
complex relative permittivity for dielectric
resonator materials at microwave
frequency
IEC 62810 2015 Cylindrical cavity method to measure the EN 62810 2015
complex permittivity of low-loss dielectric
rods
IEC 63185 ®
Edition 1.0 2020-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Measurement of the complex permittivity for low-loss dielectric substrates
balanced-type circular disk resonator method
Méthode au résonateur à disque circulaire de type symétrique pour mesurer la
permittivité complexe des substrats diélectriques à faible perte
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.120.30 ISBN 978-2-8322-9133-7
– 2 – IEC 63185:2020 © IEC 2020
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 Measurement parameters . 6
5 Theory and calculation equations . 6
6 Measurement system . 8
7 Measurement procedure . 9
7.1 Preparation of measurement apparatus. 9
7.2 Adjustment of measurement conditions . 9
7.3 Calibration of a vector network analyzer . 9
7.4 Measurement of complex permittivity of test sample . 10
7.5 Periodic checkup of metal in resonator. 10
Annex A (informative) Example of measurement results and associated uncertainties
for complex permittivity . 11
Bibliography . 13
Figure 1 – Structure of a circular disk resonator . 7
Figure 2 – Relations between resonant frequency and relative permittivity . 8
Figure 3 – Schematic diagram of a vector network analyzer measurement system . 9
Figure 4 – Frequency response of |S | of balanced-type circular disk resonator . 10
Table A.1 – Parameters of the cavity and the sheet sample . 11
Table A.2 – The resonant frequencies and unloaded Q-factors . 11
Table A.3 – Measurement results of complex permittivity . 12
IEC 63185:2020 © IEC 2020 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
MEASUREMENT OF THE COMPLEX PERMITTIVITY
FOR LOW-LOSS DIELECTRIC SUBSTRATES
BALANCED-TYPE CIRCULAR DISK RESONATOR METHOD
FOREWORD
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 63185 has been prepared by subcommittee 46F: RF and microwave
passive components, of IEC technical committee 46: Cables, wires, waveguides, RF connectors,
RF and microwave passive components and accessories.
The text of this International Standard is based on the following documents:
FDIS Report on voting
46F/523/FDIS 46F/531/RVD
Full information on the voting for the approval of this International Standard can be found in the
report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
– 4 – IEC 63185:2020 © IEC 2020
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct understanding
of its contents. Users should therefore print this document using a colour printer.
IEC 63185:2020 © IEC 2020 – 5 –
MEASUREMENT OF THE COMPLEX PERMITTIVITY
FOR LOW-LOSS DIELECTRIC SUBSTRATES
BALANCED-TYPE CIRCULAR DISK RESONATOR METHOD
1 Scope
This document relates to a measurement method for complex permittivity of a dielectric
substrates at microwave and millimeter-wave frequencies. This method has been developed to
evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave
circuits and devices. It uses higher-ord
...
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