EN IEC 62433-1:2019

EMC IC modelling - Part 1: General modelling framework

IEC 62433-1:2019(E) specifies the framework and methodology for EMC IC macro-modelling. Terms that are commonly used in IEC 62433 (all parts), different modelling approaches, requirements and data-exchange format for each model category that is standardized in this series are defined in this document. IEC 62433-1 cancels and replaces IEC TS 62433-1 published in 2011. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to IEC TS 62433 1:2011: Incorporation of a data exchange format for an integrated circuit’s model representation.

EMV-IC-Modellierung - Teil 1: Allgemeine Modellierungsstruktur

Modèles de circuits intégrés pour la CEM - Partie 1: Cadre de modèle général

L'IEC 62433-1:2019 spécifie le cadre et la méthodologie pour des macromodèles de circuits intégrés pour la CEM (EMC IC). Les termes couramment utilisés dans l'IEC 62433 (toutes les parties), différentes approches pour la modélisation, des exigences et un format d’échange de données pour chaque catégorie de modèle normalisée dans cette série sont définis dans le présent document. L’IEC 62433-1 annule et remplace l’IEC TS 62433-1 parue en 2011. Cette édition constitue une révision technique. L'IEC 62433-1 inclut les modifications techniques majeures suivantes par rapport à l'IEC TS 62433-1:2011: – Introduction d’un format d’échange de données pour la représentation d’un modèle de circuit intégré

Modeliranje integriranih vezij (IC) za elektromagnetno združljivost (EMC) - 1. del: Splošni modelirni okvir (IEC 62433-1:2019)

Ta del standarda IEC 62433 določa okvir in metodologijo za makro modeliranje integriranih vezij (IC) za elektromagnetno združljivost (EMC). V tem dokumentu so opredeljeni izrazi, ki se pogosto uporabljajo v standardu IEC 62433 (vsi deli), različni pristopi z modeliranjem, zahteve in format za izmenjavo podatkov za vsako modelno kategorijo, ki je standardizirana v tej skupini standardov.

General Information

• Status: Published
• Publication Date: 25-Apr-2019
• Withdrawal Date: 11-Apr-2022
• ICS: 31.200 - Integrated circuits. Microelectronics
• Technical Committee: CLC/TC 47X - Semiconductor devices and trusted chips
• Drafting Committee: IEC/SC 47A - IEC_SC_47A
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 26-Apr-2019
• Completion Date: 26-Apr-2019
• Ref Project: SIST EN IEC 62433-1:2019 - EMC IC modelling - Part 1: General modelling framework (IEC 62433-1:2019)

Relations

• Corrected By: EN IEC 62433-1:2019/AC:2020-07 - EMC IC modelling - Part 1: General modelling framework
• Effective Date: 03-Aug-2020

Standards Content (Sample)

SLOVENSKI STANDARD
01-julij-2019
Modeliranje integriranih vezij (IC) za elektromagnetno združljivost (EMC) - 1. del:
Splošni modelirni okvir (IEC 62433-1:2019)
EMC IC modelling - Part 1: General modelling framework (IEC 62433-1:2019)
EMV-IC-Modellierung - Teil 1: Allgemeine Modellierungsstruktur
Modèles de circuits intégrés pour la CEM - Partie 1: Cadre de modèle général
Ta slovenski standard je istoveten z: EN IEC 62433-1:2019
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
33.100.01 Elektromagnetna združljivost Electromagnetic compatibility
na splošno in general
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN IEC 62433-1

NORME EUROPÉENNE
EUROPÄISCHE NORM
April 2019
ICS 31.200
English Version
EMC IC modelling - Part 1: General modelling framework
(IEC 62433-1:2019)
Modèles de circuits intégrés pour la CEM - Partie 1: Cadre EMV-IC-Modellierung - Teil 1: Allgemeine
de modèle général Modellierungsstruktur
(IEC 62433-1:2019) (IEC 62433-1:2019)
This European Standard was approved by CENELEC on 2019-04-12. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2019 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 62433-1:2019 E

European foreword
The text of document 47A/1042/CDV, future edition 1 of IEC 62433-1, prepared by SC 47A "Integrated
circuits" of IEC/TC 47 "Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and
approved by CENELEC as EN IEC 62433-1:2019.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2020-01-12
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2022-04-12
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

Endorsement notice
The text of the International Standard IEC 62433-1:2019 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following note has to be added for the standard indicated:
CISPR 17 NOTE Harmonized as EN 55017

Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1  Where an International Publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
NOTE 2  Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 62433 series EMC IC modelling EN 62433 series
ISO 8879 -  Information processing - Text and office - -
systems - Standard Generalized Markup
Language (SGML)
ANSI INCITS 4 1986 Information Systems - Coded Character - -
Sets - 7-Bit American National Standard
Code for Information Interchange (7-Bit
ASCII)
IEC 62433-1 ®
Edition 1.0 2019-03
INTERNATIONAL
STANDARD
colour
inside
EMC IC modelling –
Part 1: General modelling framework

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.200 ISBN 978-2-8322-6601-4

– 2 – IEC 62433-1:2019 © IEC 2019
CONTENTS
FOREWORD . 5
1 Scope . 7
2 Normative references . 7
3 Terms, definitions, abbreviated terms and conventions . 7
3.1 Terms and definitions . 7
3.2 Abbreviated terms . 10
3.3 Conventions . 11
4 Definition of models . 11
4.1 General . 11
4.2 Conducted emission model . 11
4.3 Radiated emission model . 11
4.4 Conducted immunity model . 12
4.5 Radiated immunity model . 12
4.6 Conducted pulse immunity model . 12
5 Modelling approaches . 12
5.1 General . 12
5.2 Black box modelling approach . 13
5.3 Equivalent circuit modelling approach . 13
5.4 Other modelling approaches . 14
5.4.1 General . 14
5.4.2 Electromagnetic modelling approach . 14
5.4.3 Statistical modelling approach . 14
6 Requirements of model description . 14
7 Model data exchange format . 14
7.1 General . 14
7.2 IC_EMCML structure . 15
7.3 IC_EMCML components . 16
7.3.1 Root element . 16
7.3.2 Global element . 16
7.3.3 Header section . 16
7.3.4 Lead element . 17
7.3.5 Lead_definitions section . 17
7.3.6 Macromodels section . 17
7.3.7 Frequency section . 18
7.3.8 Validity section . 19
7.3.9 Pdn section . 20
7.3.10 Nlb section . 21
7.3.11 Ibc section . 21
7.3.12 Ia section . 21
7.3.13 Ib section . 22
7.3.14 Fb section . 22
7.3.15 Voltage, Current and Power sections . 23
7.3.16 Table section . 23
7.3.17 Coordinate_system section . 24
7.3.18 Reference section . 24
Annex A (normative) Requirements for EMC IC models . 25

IEC 62433-1:2019 © IEC 2019 – 3 –
Annex B (normative)  Preliminary definitions for XML representation . 26
B.1 XML basics . 26
B.1.1 XML declaration . 26
B.1.2 Basic elements . 26
B.1.3 Root element . 26
B.1.4 Comments . 26
B.1.5 Line terminations . 27
B.1.6 Element hierarchy . 27
B.1.7 Element attributes . 27
B.2 Keyword requirements . 27
B.2.1 General . 27
B.2.2 Keyword characters . 27
B.2.3 Keyword syntax . 28
B.2.4 File structure . 28
B.2.5 Values . 30
Annex C (normative) IC_EMCML valid keywords and usage . 32
C.1 Root element keywords . 32
C.2 Global keywords . 33
C.3 File header keywords . 33
C.4 Lead keyword attributes . 35
C.5 Submodel element attributes . 36
C.6 Vector element keywords . 36
C.7 Lead_definitions section attributes . 37
C.7.1 General . 37
C.7.2 Lead element attributes . 38
C.8 Validity section keywords . 38
C.9 Subckt section attributes .
...