EN 61193-2:2007
(Main)Quality assessment systems - Part 2: Selection and use of sampling plans for inspection of electronic components and packages
Quality assessment systems - Part 2: Selection and use of sampling plans for inspection of electronic components and packages
Applies to the inspection of electronic components, packages, and also modules (referred to as 'products in this standard) for use in electronic and electric equipment. It specifies sampling plans for inspection by attributes on the assumption that the acceptance number is zero (Ac = 0), including criteria for sample selection and procedures.
Qualitätsbewertungssysteme - Teil 2: Auswahl und Anwendung von Stichprobenanweisungen für die Prüfung elektronischer Bauelemente und Gehäuse
Système d'assurance de la qualité - Partie 2: Choix et utilisation des plans d'échantillonnages pour le contrôle des composants électroniques et des boîtiers
Sistemi ocenjevanja kakovosti - 2. del: Izbira in uporaba planov vzorčenja za pregledovanje elektronskih komponent in embalaže (IEC 61193-2:2007)
General Information
Standards Content (Sample)
SLOVENSKI STANDARD
01-junij-2008
6LVWHPLRFHQMHYDQMDNDNRYRVWLGHO ,]ELUDLQXSRUDEDSODQRYY]RUþHQMD]D
SUHJOHGRYDQMHHOHNWURQVNLKNRPSRQHQWLQHPEDODåH ,(&
Quality assessment systems -- Part 2: Selection and use of sampling plans for inspection
of electronic components and packages
Qualitätsbewertungssysteme -- Teil 2: Auswahl und Anwendung von
Stichprobenanweisungen für die Prüfung elektrischer Bauelemente und Gehäuse
Système d'assurance de la qualité -- Partie 2: Choix et utilisation des plans
d'échantillonnages pour le contrôle des composants électroniques et des boîtiers
Ta slovenski standard je istoveten z: EN 61193-2:2007
ICS:
03.120.99 Drugi standardi v zvezi s Other standards related to
kakovostjo quality
31.190 Sestavljeni elektronski Electronic component
elementi assemblies
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD
EN 61193-2
NORME EUROPÉENNE
November 2007
EUROPÄISCHE NORM
ICS 31.190
English version
Quality assessment systems -
Part 2: Selection and use of sampling plans for inspection
of electronic components and packages
(IEC 61193-2:2007)
Système d'assurance de la qualité - Qualitätsbewertungssysteme -
Partie 2: Choix et utilisation des plans Teil 2: Auswahl und Anwendung von
d'échantillonnages pour le contrôle
Stichprobenanweisungen für die Prüfung
des composants électroniques elektrischer Bauelemente und Gehäuse
et des boîtiers (IEC 61193-2:2007)
(CEI 61193-2:2007)
This European Standard was approved by CENELEC on 2007-11-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2007 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61193-2:2007 E
Foreword
The text of document 91/690/FDIS, future edition 1 of IEC 61193-2, prepared by IEC TC 91, Electronics
assembly technology, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC
as EN 61193-2 on 2007-11-01
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2008-08-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2010-11-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61193-2:2007 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following note has to be added for the standard indicated:
IEC 62421 NOTE Harmonized as EN 62421:2007 (not modified).
__________
- 3 - EN 61193-2:2007
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year
1) 2)
IEC 60194 - Printed board design, manufacture and EN 60194 2006
assembly - Terms and definitions
ISO 2859-1 1999 Sampling procedures for inspection by - -
attributes -
Part 1: Sampling schemes indexed by
acceptance quality limit (AQL) for lot-by-lot
inspection
ISO 3534-2 2006 Statistics - Vocabulary and symbols - - -
Part 2: Applied statistics
1)
Undated reference.
2)
Valid edition at date of issue.
IEC 61193-2
Edition 1.0 2007-08
INTERNATIONAL
STANDARD
Quality assessment systems –
Part 2: Selection and use of sampling plans for inspection of electronic
components and packages
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
R
ICS 31.190 ISBN 2-8318-9297-X
– 2 – 61193-2 © IEC:2007(E)
CONTENTS
FOREWORD.3
INTRODUCTION.5
1 Scope.6
2 Normative references .6
3 Terms and definitions .6
4 Sampling system .7
4.1 Formation and identification of lots .7
4.2 Drawing of samples .7
4.2.1 Selection of sample items.7
4.2.2 Process of sampling .7
4.3 Sampling plans.7
4.3.1 Inspection level .7
4.3.2 Sampling plan for normal inspection .8
4.3.3 Acceptance number.8
4.3.4 Tightened or reduced inspection.8
5 Acceptance and rejection .9
5.1 Acceptability criteria .9
5.2 Disposition of rejected lots .9
6 Statistical verified quality limit (SVQL) .9
6.1 General .9
6.2 Calculation of the SVQL .10
Annex A (informative) Estimation of the statistical verified quality limit (SVQL) in
-6
nonconforming items per million (×10 ) at a confidence limit 60 %.11
Annex B (informative) Relationship between this standard and ISO 2859-1.15
Annex C (informative) Example of application of this standard (lot-by-lot inspection of
assessment level EZ in IEC/TC 40).17
Bibliography.18
Table 1 – Sample size .8
Table 2 – Sample size code letters .9
Table 3 – Coefficients for confidence level 60 % (see also A.5) .10
-6
Table A.1 – Statistical verified quality limits in nonconforming items per million (×10 ) .12
Table A.2 – np with confidence limit of 60 % for accumulated number of non-
conforming items and coefficient C .14
L
Table B.1 – Sampling plans corresponding to Table 2-A of ISO 2859-1.15
Table B.2 – Tabulated values for operating characteristic curves (p: per cent
nonconforming).16
Table C.1 – Lot-by-lot inspection of assessment level EZ – IEC/TC 40 .17
61193-2 © IEC:2007(E) – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
QUALITY ASSESSMENT SYSTEMS –
Part 2: Selection and use of sampling plans
for inspection of electronic components and packages
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61193-2 has been prepared by IEC technical committee 91:
Electronics assembly technology.
The text of this standard is based on the following documents:
FDIS Report on voting
91/690/FDIS 91/723/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
– 4 – 61193-2 © IEC:2007(E)
A list of all the parts in the IEC 61193 series, under the general title Quality assessment
systems, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.
61193-2 © IEC:2007(E) – 5 –
INTRODUCTION
To obta
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