SIST EN 61193-2:2008

Quality assessment systems -- Part 2: Selection and use of sampling plans for inspection of electronic components and packages

This part of IEC 61193 applies to the inspection of electronic components, packages, and also modules (referred to as "products" in this standard) for use in electronic and electric equipment. It specifies sampling plans for inspection by attributes on the assumption that the acceptance number is zero (Ac = 0), including criteria for sample selection and procedures. The zero acceptance number sampling plans provided by this standard apply to the inspection of products, that are manufactured under suitable process control with the target of a "zerodefect" quality level before sampling inspection. In addition, this standard provides a method for the calculation of the expected value of the statistical verified quality limit (SVQL) at a confidence level of 60 %. Amongst other things, this method can be used to verify the effectiveness of the supplier's process control.

Qualitätsbewertungssysteme -- Teil 2: Auswahl und Anwendung von Stichprobenanweisungen für die Prüfung elektrischer Bauelemente und Gehäuse

Système d'assurance de la qualité -- Partie 2: Choix et utilisation des plans d'échantillonnages pour le contrôle des composants électroniques et des boîtiers

Sistemi ocenjevanja kakovosti - 2. del: Izbira in uporaba planov vzorčenja za pregledovanje elektronskih komponent in embalaže (IEC 61193-2:2007)

General Information

• Status: Published
• Publication Date: 11-May-2008
• ICS: 03.120.99 - Other standards related to quality
• ICS: 31.190 - Electronic component assemblies
• Technical Committee: ITIV - Electronics assembly technology and Environmental standardization
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 03-Dec-2007
• Due Date: 07-Feb-2008
• Completion Date: 12-May-2008
• Ref Project: EN 61193-2:2007 - Quality assessment systems - Part 2: Selection and use of sampling plans for inspection of electronic components and packages

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 61193-2:2008
01-junij-2008
6LVWHPLRFHQMHYDQMDNDNRYRVWLGHO,]ELUDLQXSRUDEDSODQRYY]RUþHQMD]D
SUHJOHGRYDQMHHOHNWURQVNLKNRPSRQHQWLQHPEDODåH,(&
Quality assessment systems -- Part 2: Selection and use of sampling plans for inspection
of electronic components and packages
Qualitätsbewertungssysteme -- Teil 2: Auswahl und Anwendung von
Stichprobenanweisungen für die Prüfung elektrischer Bauelemente und Gehäuse
Système d'assurance de la qualité -- Partie 2: Choix et utilisation des plans
d'échantillonnages pour le contrôle des composants électroniques et des boîtiers
Ta slovenski standard je istoveten z: EN 61193-2:2007
ICS:
03.120.99 Drugi standardi v zvezi s Other standards related to
kakovostjo quality
31.190 Sestavljeni elektronski Electronic component
elementi assemblies
SIST EN 61193-2:2008 en,de
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 61193-2:2008

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SIST EN 61193-2:2008


EUROPEAN STANDARD
EN 61193-2

NORME EUROPÉENNE
November 2007
EUROPÄISCHE NORM

ICS 31.190


English version


Quality assessment systems -
Part 2: Selection and use of sampling plans for inspection
of electronic components and packages
(IEC 61193-2:2007)


Système d'assurance de la qualité -  Qualitätsbewertungssysteme -
Partie 2: Choix et utilisation des plans Teil 2: Auswahl und Anwendung von
d'échantillonnages pour le contrôle
Stichprobenanweisungen für die Prüfung
des composants électroniques elektrischer Bauelemente und Gehäuse
et des boîtiers (IEC 61193-2:2007)
(CEI 61193-2:2007)




This European Standard was approved by CENELEC on 2007-11-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels


© 2007 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61193-2:2007 E

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SIST EN 61193-2:2008
EN 61193-2:2007 - 2 -
Foreword
The text of document 91/690/FDIS, future edition 1 of IEC 61193-2, prepared by IEC TC 91, Electronics
assembly technology, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC
as EN 61193-2 on 2007-11-01
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2008-08-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2010-11-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61193-2:2007 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following note has to be added for the standard indicated:
IEC 62421 NOTE Harmonized as EN 62421:2007 (not modified).
__________

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SIST EN 61193-2:2008
- 3 - EN 61193-2:2007
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.

Publication Year Title EN/HD Year

1) 2)
IEC 60194 - Printed board design, manufacture and EN 60194 2006
assembly - Terms and definitions


ISO 2859-1 1999 Sampling procedures for inspection by - -
attributes -
Part 1: Sampling schemes indexed by
acceptance quality limit (AQL) for lot-by-lot
inspection


ISO 3534-2 2006 Statistics - Vocabulary and symbols - - -
Part 2: Applied statistics



1)
Undated reference.
2)
Valid edition at date of issue.

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SIST EN 61193-2:2008

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SIST EN 61193-2:2008
IEC 61193-2
Edition 1.0 2007-08
INTERNATIONAL
STANDARD

Quality assessment systems –
Part 2: Selection and use of sampling plans for inspection of electronic
components and packages

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
R
ICS 31.190 ISBN 2-8318-9297-X

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SIST EN 61193-2:2008
– 2 – 61193-2 © IEC:2007(E)
CONTENTS
FOREWORD.3
INTRODUCTION.5

1 Scope.6
2 Normative references .6
3 Terms and definitions .6
4 Sampling system .7
4.1 Formation and identification of lots .7
4.2 Drawing of samples .7
4.2.1 Selection of sample items.7
4.2.2 Process of sampling .7
4.3 Sampling plans.7
4.3.1 Inspection level .7
4.3.2 Sampling plan for normal inspection .8
4.3.3 Acceptance number.8
4.3.4 Tightened or reduced inspection.8
5 Acceptance and rejection .9
5.1 Acceptability criteria .9
5.2 Disposition of rejected lots .9
6 Statistical verified quality limit (SVQL) .9
6.1 General .9
6.2 Calculation of the SVQL .10

Annex A (informative) Estimation of the statistical verified quality limit (SVQL) in
-6
nonconforming items per million (×10 ) at a confidence limit 60 %.11
Annex B (informative) Relationship between this standard and ISO 2859-1.15
Annex C (informative) Example of application of this standard (lot-by-lot inspection of
assessment level EZ in IEC/TC 40).17

Bibliography.18

Table 1 – Sample size .8
Table 2 – Sample size code letters .9
Table 3 – Coefficients for confidence level 60 % (see also A.5) .10
-6
Table A.1 – Statistical verified quality limits in nonconforming items per million (×10 ) .12
Table A.2 – np with confidence limit of 60 % for accumulated number of non-
conforming items and coefficient C .14
L
Table B.1 – Sampling plans corresponding to Table 2-A of ISO 2859-1.15
Table B.2 – Tabulated values for operating characteristic curves (p: per cent
nonconforming).16
Table C.1 – Lot-by-lot inspection of assessment level EZ – IEC/TC 40 .17

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SIST EN 61193-2:2008
61193-2 © IEC:2007(E) – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

QUALITY ASSESSMENT SYSTEMS –

Part 2: Selection and use of sampling plans
for inspection of electronic components and packages


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61193-2 has been prepared by IEC technical committee 91:
Electronics assembly technology.
The text of this standard is based on the following documents:
FDIS Report on voting
91/690/FDIS 91/723/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

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SIST EN 61193-2:2008
– 4 – 61193-2 © IEC:2007(E)
A list of all the parts in the IEC 61193 series, under the general title Quality assessment
systems, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.

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SIST EN 61193-2:2008
61193-2 © IEC:2007(E) – 5 –
INTRODUCTION
To obtain a high quality level of products, process controls like 100 % testing of significant
characteristics and statistical methods are needed to stabilize, monitor, and improve
processes.
Sampling inspection is one of the methods to verify
• whether the process control is effective, and
• the quality level of a supplier’s product by a customer or third party.
Today the quality level of products for use in electric and electronic equipment is expected to
be equal or close to zero defects. But, the assessment of a quality level close to zero defects
by sampling only would lead to an unreasonable increase of cost for inspection. A
combination of process control and zero acceptance number sampling plans is indispensable.
This standard provides a sampling system and plans for the inspection of electronic
components, packages and modules, manufactured under suitable process control, which
prevents the outflow of nonconforming products.
NOTE The sampling system provided by this standard is extracted from ISO 2859-1, and is intended to be used
for the inspection of final products, either by the manufacturer, a customer, or a third party.

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SIST EN 61193-2:2008
– 6 – 61193-2 © IEC:2007(E)
QUALITY ASSESSMENT SYSTEMS –

Part 2: Selection and use of sampling plans
for inspection of electronic components and packages



1 Scope
This part of IEC 61193 applies to the inspection of electronic components, packages, and also
modules (referred to as “products” in this standard) for use in electronic and electric
equipment. It specifies sampling plans for inspection by attributes on the assumption that the
acceptance number is zero (Ac = 0), including criteria for sample selection and procedures.
The zero acceptance number sampling plans provided by this standard apply to the inspection
of products, that are manufactured under suitable process control with the target of a “zero-
defect” quality level before sampling inspection.
In addition, this standard provides a method for the calculation of the expected value of the
statistical verified quality limit (SVQL) at a confidence level of 60 %. Amongst other things,
this method can be used to verify the effectiveness of the supplier’s process control.
NOTE In this standard the term “module” is used for products which are modules according to the definition in
IEC 60194.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60194: Printed board design, manufacture and assembly – Terms and definitions
ISO 2859-1:1999, Sampling procedures for inspection by attributes – Part 1: Sampling
schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection
ISO 3534-2:2006, Statistics – Vocabulary and symbols – Part 2: Applied statistics
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60194, ISO 2859-1
and ISO 3534-2, as well as the following, apply.
3.1
electronic component
individual component which includes electronic, optoelectronic and/or micro-electro-
mechanical systems (MEMS) element
3.2
electronic package
individual electronic element or elements in a container which protects the contents to assure
the reliability and provides terminals to interconnect the container to an outer circuit

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SIST EN 61193-2:2008
61193-2 © IEC:2007(E) – 7 –
3.3
electronic module
functional block which contains individual electronic elements and /or electronic packages, to
be used in a next level assembly
3.4
inspection level
IL
level to define sample size for lot size
NOTE Sample size of lots depends on the severity of inspection level.
3.5
nonconforming item
item with one or more nonconformities
NOTE A nonconforming item is a product which cannot satisfy the requirement (visual examination or electrical
performance, etc.) in the lot-by-lot inspection or periodic test, etc.
3.6
structurally similar products
products manufactured by the same manufacturer with the same materials, manufacturing
processes and methods
NOTE Products are structurally similar, even when there are differences e.g. in case size and rated values.
Results from designated tests conducted on items of one lot of these products can be accumulated with results of
other lots in the same group of structural similarity.
4 Sampling system
The procedure and sampling plans described in this clause are based on an acceptance
number zero (Ac = 0).
4.1 Formation and identification of lots
The products shall be assembled into identifiable lots or sub-lots. Each lot shall, as far as
practicable, consist of items of a single type, grade, class, size and composition,
manufactured under uniform conditions at essentially the same time.
4.2 Drawing of samples
4.2.1 Selection of sample items
The items selected for the sample shall be drawn from the lot by simple random sampling
(see 3.1.3.4 in ISO 3534-2). However, when the lot consists of sub-lots or strata, identified by
some rational criterion, stratified sampling shall be used in such a way that the size
...