prEN IEC 61987-41:2024
(Main)IEC 61987, part 41: Generic structures of list of properties (LOP) of process analyzer technology (PAT) measuring devices for electronic data exchange
IEC 61987, part 41: Generic structures of list of properties (LOP) of process analyzer technology (PAT) measuring devices for electronic data exchange
IEC 61987 – Teil 41: Allgemeine Strukturen der Eigenschaftsliste (LOP) von Prozessanalysatoren Technologie (PAT) Messgeräten für den elektronischen Datenaustausch
IEC 61987, partie 41: Structures génériques de la liste des propriétés (LOP) des appareils de mesure de la technologie des analyseurs de processus (PAT, Process Analyzer Technology) pour l'échange électronique de données
IEC 61987, 41 del: Generične strukture seznama lastnosti (LOP) merilnih naprav tehnologije procesnega analizatorja (PAT) za elektronsko izmenjavo podatkov
General Information
Standards Content (Sample)
SLOVENSKI STANDARD
oSIST prEN IEC 61987-41:2024
01-april-2024
IEC 61987, 41 del: Generične strukture seznama lastnosti (LOP) merilnih naprav
tehnologije procesnega analizatorja (PAT) za elektronsko izmenjavo podatkov
IEC 61987, part 41: Generic structures of list of properties (LOP) of process analyzer
technology (PAT) measuring devices for electronic data exchange
IEC 61987, partie 41: Structures génériques de la liste des propriétés (LOP) des
appareils de mesure de la technologie des analyseurs de processus (PAT, Process
Analyzer Technology) pour l'échange électronique de données
Ta slovenski standard je istoveten z: prEN IEC 61987-41:2024
ICS:
25.040.40 Merjenje in krmiljenje Industrial process
industrijskih postopkov measurement and control
35.240.50 Uporabniške rešitve IT v IT applications in industry
industriji
oSIST prEN IEC 61987-41:2024 en,fr,de
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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oSIST prEN IEC 61987-41:2024
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oSIST prEN IEC 61987-41:2024
65E/1067/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 61987-41 ED1
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2024-02-23 2024-05-17
SUPERSEDES DOCUMENTS:
65E/945/CD, 65E/1060/CC
IEC SC 65E : DEVICES AND INTEGRATION IN ENTERPRISE SYSTEMS
SECRETARIAT: SECRETARY:
United States of America Mr Donald (Bob) Lattimer
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:
Other TC/SCs are requested to indicate their interest, if
any, in this CDV to the secretary.
FUNCTIONS CONCERNED:
EMC ENVIRONMENT QUALITY ASSURANCE SAFETY
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft
for Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
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This document is still under study and subject to change. It should not be used for reference purposes.
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Recipients of this document are invited to submit, with their comments, notification of any relevant “In Some
Countries” clauses to be included should this proposal proceed. Recipients are reminded that the CDV stage is
the final stage for submitting ISC clauses. (SEE AC/22/2007 OR NEW GUIDANCE DOC).
TITLE:
IEC 61987, Part 41: Generic structures of List of Properties (LOP) of Process Analyzer
Technology (PAT) measuring devices for electronic data exchange
PROPOSED STABILITY DATE: 2027
NOTE FROM TC/SC OFFICERS:
Copyright © 2024 International Electrotechnical Commission, IEC. All rights reserved. It is permitted to download this
elec tronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
permission in writing from IEC.
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oSIST prEN IEC 61987-41:2024
IEC 61987-41 CDV© IEC 2023 – 1 –
1 CONTENTS
2
3 FOREWORD . 3
4 INTRODUCTION . 5
5 1 Scope . 7
6 2 Normative references . 7
7 3 Terms and definitions . 7
8 3.1 Dynamic property . 8
9 3.2 List of Properties for Dynamic Data (LOPD) . 8
10 4 General . 8
11 4.1 Characterization scheme. 8
12 4.2 OLOP, DLOP and LOPD . 8
13 4.3 Cardinality and polymorphism . 9
14 5 Operating List of Properties (OLOP) .
...
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