prEN IEC 61987-41:2024
(Main)IEC 61987, part 41: Generic structures of list of properties (LOP) of process analyzer technology (PAT) measuring devices for electronic data exchange
IEC 61987, part 41: Generic structures of list of properties (LOP) of process analyzer technology (PAT) measuring devices for electronic data exchange
IEC 61987 – Teil 41: Allgemeine Strukturen der Eigenschaftsliste (LOP) von Prozessanalysatoren Technologie (PAT) Messgeräten für den elektronischen Datenaustausch
IEC 61987, partie 41: Structures génériques de la liste des propriétés (LOP) des appareils de mesure de la technologie des analyseurs de processus (PAT, Process Analyzer Technology) pour l'échange électronique de données
IEC 61987, 41 del: Generične strukture seznama lastnosti (LOP) merilnih naprav tehnologije procesnega analizatorja (PAT) za elektronsko izmenjavo podatkov
General Information
Standards Content (Sample)
SLOVENSKI STANDARD
01-april-2024
IEC 61987, 41 del: Generične strukture seznama lastnosti (LOP) merilnih naprav
tehnologije procesnega analizatorja (PAT) za elektronsko izmenjavo podatkov
IEC 61987, part 41: Generic structures of list of properties (LOP) of process analyzer
technology (PAT) measuring devices for electronic data exchange
IEC 61987, partie 41: Structures génériques de la liste des propriétés (LOP) des
appareils de mesure de la technologie des analyseurs de processus (PAT, Process
Analyzer Technology) pour l'échange électronique de données
Ta slovenski standard je istoveten z: prEN IEC 61987-41:2024
ICS:
25.040.40 Merjenje in krmiljenje Industrial process
industrijskih postopkov measurement and control
35.240.50 Uporabniške rešitve IT v IT applications in industry
industriji
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
65E/1067/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 61987-41 ED1
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2024-02-23 2024-05-17
SUPERSEDES DOCUMENTS:
65E/945/CD, 65E/1060/CC
IEC SC 65E : DEVICES AND INTEGRATION IN ENTERPRISE SYSTEMS
SECRETARIAT: SECRETARY:
United States of America Mr Donald (Bob) Lattimer
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:
Other TC/SCs are requested to indicate their interest, if
any, in this CDV to the secretary.
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TITLE:
IEC 61987, Part 41: Generic structures of List of Properties (LOP) of Process Analyzer
Technology (PAT) measuring devices for electronic data exchange
PROPOSED STABILITY DATE: 2027
NOTE FROM TC/SC OFFICERS:
elec tronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
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IEC 61987-41 CDV© IEC 2023 – 1 –
1 CONTENTS
3 FOREWORD . 3
4 INTRODUCTION . 5
5 1 Scope . 7
6 2 Normative references . 7
7 3 Terms and definitions . 7
8 3.1 Dynamic property . 8
9 3.2 List of Properties for Dynamic Data (LOPD) . 8
10 4 General . 8
11 4.1 Characterization scheme. 8
12 4.2 OLOP, DLOP and LOPD . 8
13 4.3 Cardinality and polymorphism . 9
14 5 Operating List of Properties (OLOP) . 10
15 5.1 Generic block structure . 10
16 5.2 Project data . 10
17 Composition of sample material/component . 10
18 5.3 Material data . Error! Bookmark not defined.
19 5.4 Sampling. Error! Bookmark not defined.
20 5.5 Limiting conditions . Error! Bookmark not defined.
21 5.6 Supply . Error! Bookmark not defined.
22 Electrical supply . Error! Bookmark not defined.
23 Auxiliary media . Error! Bookmark not defined.
24 5.7 Return point . Error! Bookmark not defined.
25 6 Device List of Properties (DLOP) . 12
26 6.1 Basic structure . 12
27 General . 12
28 Generic block structure . 12
29 Relationship to IEC 61987-1 . 14
30 7 LOPD with dynamic properties for condition monitoring . 14
31 7.1 General . 14
32 7.2 Measurement variables . 15
33 7.3 Setpoint variables . Error! Bookmark not defined.
34 7.4 General device variables/status . 15
35 7.5 Specific device variables/status/condition monitoring . 15
36 7.6 General device parameters . 15
37 7.7 General functions . 15
38 8 Additional aspects . 15
39 Annex A (informative) Device Type Dictionary – Classification of process analysers . 16
40 Bibliography . 20
42 Figure 1 – Characterization of process analysers . 8
43 Figure 2 – Assignment of OLOP and DLOPs for process analysers . 9
45 Table 1 – Generic block structure of an OLOP for process analyser . 10
46 Table 2 – Generic block structure of a DLOP . 13
– 2 – IEC 61987-41 CDV © IEC 2023
47 Table 3 – Generic block structure of a LOPD . 15
48 Table A.1 – Classification scheme for process analysers . 16
IEC 61987-41 CDV© IEC 2023 – 3 –
50 INTERNATIONAL ELECTROTECHNICAL COMMISSION
51 ____________
53 INDUSTRIAL-PROCESS MEASUREMENT AND CONTROL – DATA
54 STRUCTURES AND ELEMENTS IN PROCESS EQUIPMENT CATALOGUES –
56 Part 41: Lists of Properties (LOPs) of process analysers for electronic
57 data exchange – Generic structures
59 FOREWORD
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92 International Standard IEC XXXXX has been prepared by subcommittee XX: TITLE, of IEC
93 technical committee XX:XXX.
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98 a technical revision.
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100 edition:
101 a) .;
102 The text of this International Standard is based on the following documents:
– 4 – IEC 61987-41 CDV © IEC 2023
FDIS Report on voting
XX/XX/FDIS XX/XX/RVD
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118 AT THE PUBLICATION STAGE.
IEC 61987-41 CDV© IEC 2023 – 5 –
120 INTRODUCTION
121 The exchange of product data between companies, business systems, engineering tools, data
122 systems within companies and, in the future, control systems (electrical, measuring and control
123 technology) can run smoothly only when both the information to be exchanged and the use of
124 this information has been clearly defined.
125 Prior to this standard, requirements on process control devices and systems were specified by
126 customers in various ways when suppl
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