EN 61967-6:2002/A1:2008
(Amendment)Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
Integrierte Schaltungen - Messung von elektromagnetischen Aussendungen im Frequenzbereich von 150 kHz bis 1 GHz - Teil 6: Messung der leitungsgeführten Aussendungen - Magnetsondenverfahren
Circuits intégrés - Mesure des émissions électromagnétiques, 150 kHz à 1 GHz - Partie 6: Mesure des émissions conduites - Méthode de la sonde magnétique
Integrirana vezja - Meritve elektromagnetnega sevanja od 150 kHz do 1 GHz - 6. del: Meritve prevajanega sevanja - Metoda z magnetno sondo (IEC 61967-6:2002/A1:2008)
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Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN 61967-6:2005/A1:2008
01-julij-2008
Integrirana vezja - Meritve elektromagnetnega sevanja od 150 kHz do 1 GHz - 6.
del: Meritve prevajanega sevanja - Metoda z magnetno sondo (IEC 61967-
6:2002/A1:2008)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part
6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-
6:2002/A1:2008)
Integrierte Schaltungen - Messung von elektromagnetischen Aussendungen im
Frequenzbereich von 150 kHz bis 1 GHz - Teil 6: Messung der leitungsgeführten
Aussendungen - Magnetsondenverfahren (IEC 61967-6:2002/A1:2008)
Circuits intégrés - Mesure des émissions électromagnétiques, 150 kHz à 1 GHz - Partie
6: Mesure des émissions conduites - Méthode de la sonde magnétique (CEI 61967-
6:2002/A1:2008)
Ta slovenski standard je istoveten z: EN 61967-6:2002/A1:2008
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
SIST EN 61967-6:2005/A1:2008 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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EUROPEAN STANDARD
EN 61967-6/A1
NORME EUROPÉENNE
May 2008
EUROPÄISCHE NORM
ICS 31.200
English version
Integrated circuits -
Measurement of electromagnetic emissions, 150 kHz to 1 GHz -
Part 6: Measurement of conducted emissions -
Magnetic probe method
(IEC 61967-6:2002/A1:2008)
Circuits intégrés - Integrierte Schaltungen -
Mesure des émissions électromagnétiques, Messung von elektromagnetischen
150 kHz à 1 GHz - Aussendungen im Frequenzbereich
Partie 6: Mesure des émissions conduites - von 150 kHz bis 1 GHz -
Méthode de la sonde magnétique Teil 6: Messung der leitungsgeführten
(CEI 61967-6:2002/A1:2008) Aussendungen -
Magnetsondenverfahren
(IEC 61967-6:2002/A1:2008)
This amendment A1 modifies the European Standard EN 61967-6:2002; it was approved by CENELEC on
2008-04-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which
stipulate the conditions for giving this amendment the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This amendment exists in three official versions (English, French, German). A version in any other language
made by translation under the responsibility of a CENELEC member into its own language and notified to the
Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2008 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61967-6:2002/A1:2008 E
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EN 61967-6:2002/A1:2008 - 2 -
Foreword
The text of document 47A/781/FDIS, future amendment 1 to IEC 61967-6:2002, prepared by SC 47A,
Integrated circuits, of IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel
vote and was approved by CENELEC as amendment A1 to EN 61967-6:2002 on 2008-04-01.
The following dates were fixed:
– latest date by which the amendment has to be
implemented at national level by publication of
an identical national standard or by endorsement (dop) 2009-01-01
– latest date by which the national standards conflicting
with the amendment have to be withdrawn (dow) 2011-04-01
__________
Endorsement notice
The text of amendment 1:2008 to the International Standard IEC 61967-6:2002 was approved by
CENELEC as an amendment to the European Standard without any modification.
__________
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IEC 61967-6
Edition 1.0 2008-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 1
AMENDEMENT 1
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to
1 GHz –
Part 6: Measurement of conducted emissions – Magnetic probe method
Circuits intégrés – Mesure des émissions électromagnétiques, 150 kHz à 1 GHz –
Partie 6: Mesure des émissions conduites – Méthode de la sonde magnétique
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
R
CODE PRIX
ICS 31.200 ISBN 2-8318-9641-X
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