Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST

The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 24: Beschleunigte Verfahren für Feuchtebeständigkeit - Hochbeschleunigte Wirkung (HAST) ohne elektrische Beanspruchung

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 24: Résistance à l'humidité accélérée - HAST sans polarisation

The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance, unbiased HAST (IEC 60749-24:2004)

General Information

Status
Published
Publication Date
15-Apr-2004
Withdrawal Date
31-Mar-2007
Drafting Committee
IEC/TC 47 - IEC_TC_47
Parallel Committee
IEC/TC 47 - IEC_TC_47
Current Stage
6060 - Document made available - Publishing
Start Date
16-Apr-2004
Completion Date
16-Apr-2004

Relations

Effective Date
23-Jul-2024

Overview

EN 60749-24:2004 is a European standard published by the CLC that specifies mechanical and climatic test methods for semiconductor devices, focusing on accelerated moisture resistance through the Unbiased Highly Accelerated Stress Test (HAST). This test is used to evaluate the reliability of non-hermetically sealed solid-state devices under humid conditions. By simulating elevated temperature and humidity in non-condensing environments, the standard accelerates moisture ingress into semiconductor packages, mimicking long-term environmental exposure in a compressed timeframe.

The standard aligns with the International Electrotechnical Commission (IEC) standard IEC 60749-24:2004 and has been harmonized across European nations to ensure consistent application of moisture resistance testing for semiconductor devices.

Key Topics

  • Accelerated Moisture Resistance
    The standard outlines procedures to rapidly assess the capability of semiconductor devices’ external protective materials to resist moisture penetration.

  • Unbiased Highly Accelerated Stress Test (HAST)
    HAST is performed without applying electrical bias to the devices, focusing solely on the mechanical and climatic interaction effects of temperature and humidity.

    • Non-condensing temperature and humidity conditions are applied.
    • Moisture ingress driven through protective materials and interfaces is accelerated.
  • Reliability Assessment
    This standard supports the evaluation of non-hermetic solid-state devices’ durability when exposed to high humidity environments typical of operational conditions in real-world applications.

  • Test Environment Parameters
    The climate and mechanical test environment is strictly controlled to replicate accelerated aging, providing quicker and more reliable predictions of product lifespan.

  • Harmonized Reference
    The document references complementary standards such as EN 60749-33 (unbiased autoclave moisture resistance) and EN 60749-5 (steady-state temperature humidity bias life test) to provide a comprehensive testing framework.

Applications

EN 60749-24:2004 is essential for manufacturers, quality assurance teams, and reliability engineers working with semiconductor devices to:

  • Validate Moisture Resistance of Semiconductor Packages
    Ensure non-hermetic packages meet required moisture ingress protection before market release.

  • Accelerate Product Development Cycles
    Quickly assess potential failure mechanisms related to moisture exposure in early design stages, reducing time-to-market.

  • Support Quality Control and Reliability Testing
    Routinely verify batch consistency and long-term reliability of semiconductor devices operating in humid industrial, automotive, consumer electronics, and telecommunications environments.

  • Guide Material and Process Improvement
    Identify weaknesses in protective coatings and molding compounds, leading to optimized materials and enhanced package integrity.

  • Compliance with International Requirements
    Demonstrate product compliance for global markets by adhering to widely recognized European and IEC standards.

Related Standards

  • EN 60749-33:2004 – Semiconductor devices - Mechanical and climatic test methods - Accelerated moisture resistance - Unbiased autoclave: Complements HAST by providing test procedures involving autoclave conditions for moisture resistance assessment.

  • EN 60749-5:2003 – Semiconductor devices - Mechanical and climatic test methods - Steady-state temperature humidity bias life test: Used alongside unbiased tests to evaluate device reliability under combined electrical stress and environmental factors.

  • IEC 60749 Series – Governing test methods for mechanical and climatic reliability testing of semiconductor devices, providing a comprehensive framework for moisture, temperature, and mechanical stress evaluations.


Keywords: EN 60749-24, unbiased HAST, accelerated moisture resistance, semiconductor device testing, humidity stress test, semiconductor reliability, mechanical and climatic test methods, non-hermetic package testing, CLC standards, IEC 60749-24 compliance, moisture ingress acceleration, high humidity environment testing.

Frequently Asked Questions

EN 60749-24:2004 is a standard published by CLC. Its full title is "Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST". This standard covers: The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

EN 60749-24:2004 is classified under the following ICS (International Classification for Standards) categories: 31.080 - Semiconductor devices. The ICS classification helps identify the subject area and facilitates finding related standards.

EN 60749-24:2004 has the following relationships with other standards: It is inter standard links to EN IEC 60749-24:2026. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.

You can purchase EN 60749-24:2004 directly from iTeh Standards. The document is available in PDF format and is delivered instantly after payment. Add the standard to your cart and complete the secure checkout process. iTeh Standards is an authorized distributor of CLC standards.

Standards Content (Sample)


SLOVENSKI SIST EN 60749-24:2004

STANDARD
julij 2004
Semiconductor devices - Mechanical and climatic test methods - Part 24:
Accelerated moisture resistance, unbiased HAST (IEC 60749-24:2004)
ICS 31.080.01 Referenčna številka
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

EUROPEAN STANDARD EN 60749-24
NORME EUROPÉENNE
EUROPÄISCHE NORM April 2004
ICS 31.080
English version
Semiconductor devices –
Mechanical and climatic test methods
Part 24: Accelerated moisture resistance –
Unbiased HAST
(IEC 60749-24:2004)
Dispositifs à semiconducteurs –  Halbleiterbauelemente –
Méthodes d'essais mécaniques Mechanische und klimatische
et climatiques Prüfverfahren
Partie 24: Résistance à l'humidité Teil 24: Beschleunigte Verfahren für
accélérée – Feuchtebeständigkeit -
HAST sans polarisation Hochbeschleunigte Wirkung (HAST)
(CEI 60749-24:2004) ohne elektrische Beanspruchung
(IEC 60749-24:2004)
This European Standard was approved by CENELEC on 2004-04-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden,
Switzerland and United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels

© 2004 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 60749-24:2004 E
Foreword
The text of document 47/1736/FDIS, future edition 1 of IEC 60749-24, prepared by IEC TC 47,
Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by
CENELEC as EN 60749-24 on 2004-04-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2005-01-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2007-04-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60749-24:2004 was approved by CENELEC as a European
Standard without any modification.
__________
- 3 - EN 60749-24:2004
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE Where an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
1) 2)
IEC 60749-33 - Semiconductor devices - Mechanical and EN 60749-33 2004
climatic test methods
Part 33: Accelerated moisture resistance -
Unbiased autoclave
1) 2)
IEC 60749-5 - Part 5: Steady-state temperature humidity EN 60749-5 2003
bias life test
1)
Undated reference.
2)
Valid edition at date of issue.



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