EN 61000-4-20:2010

Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides

IEC 61000-4-20:2010 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (for example, striplines and electromagnetic pulse simulators) and closed structures (for example, TEM cells). These structures can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe: - TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations; - TEM waveguide validation methods for EMC tests; - the EUT (i.e. EUT cabinet and cabling) definition; - test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and - test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides. IEC 61000-4-20:2010 does not intend to specify the tests to be applied to any particular apparatus or system(s). The main intention of this standard is to provide a general basic reference for all interested product committees of the IEC. For radiated emissions testing, product committees should select emission limits and test methods in consultation with CISPR standards. For radiated immunity testing, product committees remain responsible for the appropriate choice of immunity tests and immunity test limits to be applied to equipment within their scope. This standard describes test methods that are separate from those of IEC 61000-4-3. This second edition cancels and replaces the first edition published in 2003 and its amendment 1 (2006), and constitutes a technical revision. It has the status of a basic EMC publication in accordance with IEC Guide 107. The main changes with respect to the first edition of this standard and its amendment are the following: - consistency of terms (e.g. test, measurement, etc.) has been improved; - clauses covering test considerations, evaluations and the test report have been added; - references to large TEM waveguides have been eliminated; - a new informative annex has been added to deal with calibration of E-field probes.

Elektromagnetische Verträglichkeit (EMV) - Teil 4-20: Prüf- und Messverfahren - Messung der Störaussendung und Prüfung der Störfestigkeit in transversal-elektromagnetischen (TEM-)Wellenleitern

Compatibilité électromagnétique (CEM) - Partie 4-20: Techniques d'essai et de mesure - Essais d'émission et d'immunité dans les guides d'onde TEM

La CEI 61000-4-20:2010 concerne les méthodes d'essai d'émission et d'immunité pour les matériels électriques et électroniques utilisant différents types de guides d'onde transverses électromagnétiques (TEM). Ces types comprennent des structures ouvertes (par exemple, des lignes ouvertes et des simulateurs d'impulsion électromagnétique), et des structures fermées (par exemple des cellules TEM), qui peuvent être elles-mêmes classées en guides d'onde TEM à un accès, à deux accès, ou à accès multiples. La gamme de fréquences dépend des exigences d'essai spécifiques et du type spécifique de guide d'onde TEM. L'objet de cette norme est de décrire: - les caractéristiques des guides d'onde TEM, y compris les gammes de fréquences types et les limites de tailles des matériels en essai (EST); - les méthodes de validation des guides d'onde TEM pour les essais CEM; - la définition de l'EST (c'est-à-dire l'armoire et le câblage de l'EST); - les montages d'essai, les procédures et les exigences pour les essais d'émissions rayonnées dans les guides d'onde TEM, et - les montages d'essai, les procédures et les exigences pour les essais d'immunité rayonnée dans les guides d'onde TEM. La CEI 61000-4-20:2010 ne vise pas à spécifier les essais devant s'appliquer à des appareils ou systèmes particuliers. Le but principal de cette norme est de donner une référence de base d'ordre général à tous les comités de produits CEI concernés. Pour les essais d'émission rayonnée, il convient que les comités de produits sélectionnent des limites d'émission et des méthodes d'essai en consultation avec le CISPR. Pour les essais d'immunité rayonnée, les comités de produits restent responsables du choix approprié des essais d'immunité et des limites à appliquer aux matériels relevant de leur domaine d'application. Cette norme décrit des méthodes d'essai qui sont indépendantes de celles de la CEI 61000-4-3. Cette deuxième édition annule et remplace la première édition parue en 2003 et son amendement 1 (2006) et constitue une révision technique. Elle a le statut de publication fondamentale en CEM conformément au Guide 107 de la CEI. Les principaux changements par rapport à la première édition de la présente norme et à son amendement sont les suivants: - amélioration de la cohérence des termes (par exemple essai, mesure, etc.); - addition d'articles couvrant les considérations d'essai, les évaluations et le rapport d'essai; - suppression des références aux guides d'onde TEM de grande taille: - addition d'une nouvelle annexe informative dédiée à l'étalonnage des sondes de champ électrique.

Elektromagnetna združljivost (EMC) - 4-20. del: Preskusne in merilne tehnike - Preskušanje oddajanja in odpornosti v prečnih elektromagnetnih (TEM) valovodih (IEC 61000-4-20:2010)

Ta del IEC 61000 se nanaša na metode preskušanja oddajanja in odpornosti za električno in elektronsko opremo z uporabo različnih tipov prečnih elektromagnetnih (TEM) valovodov. Ti tipi vključujejo odprte strukture (na primer trakaste valovode in simulatorje elektromagnetnih pulzov) ter zaprte strukture (na primer TEM celice). Te strukture se lahko dalje klasificirajo kot eno-, dvo- ali več-kanalni TEM valovodi. Frekvenčni razpon je odvisen od določenih zahtev za preskušanje in določenega TEM tipa valovoda. Namen tega standarda je opisati:
- značilnosti TEM valovoda, vključno z tipičnimi frekvenčnimi razponi in omejitvami velikosti EUT;
- validacijske metode za preskuse EMC;
- definicija EUT (tj. EUT ohišja in okabljenja);
- preskusne postavitve, postopke in zahteve za preskušanje emisij sevanja v TEM valovodih ter
- preskusne postavitve, postopke in zahteve za preskušanje odpornosti proti sevanju v TEM valovodih. OPOMBA: Preskusne metode temu standardu so opredeljene za merjenja učinkov elektromagnetnega sevanja na opremo in elektromagnetnih emisij iz zadevne opreme. Simulacija in merjenje elektromagnetnega sevanja nista zadosti natančna za kvantitativno določevanje učinkov za vse končne uporabe inštalacij. Opredeljene preskusne metode so strukturirane za primarni cilj ugotavljanja zadostne ponovljivosti rezultatov v različnih preskuševalnih laboratorijih za kvalitativno analizo učinkov. Ta standard ni namenjen za določevanje preskusov, namenjenih za uporabo na kateri koli določeni opremi ali sistemih. Glavni namen tega standarda je zagotoviti splošno in osnovno referenco za vse zainteresirane odbore za izdelke IEC. Za preskušanje emisij sevanja morajo odbori za izdelke izbrati meje emisij in preskusne metode ob upoštevanju napotkov CISPR standardov. Odbori ostajajo odgovorni za primerno izbiro preskusov odpornosti in meja preskusov pri preskušanju odpornosti proti sevanju, namenjeni za opremo znotraj njihovega delovnega področja. Ta standard opisuje preskusne metode, ki so ločene od tistih iz 61000-4-3.1.

General Information

• Status: Published
• Publication Date: 04-Nov-2010
• Withdrawal Date: 30-Sep-2013
• ICS: 33.100.10 - Emission
• ICS: 33.100.20 - Immunity
• Technical Committee: CLC/TC 210 - Electromagnetic Compatibility (EMC)
• Drafting Committee: IEC/SC 77B - IEC_SC_77B
• Parallel Committee: IEC/SC 77B - IEC_SC_77B
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 05-Nov-2010
• Completion Date: 05-Nov-2010
• Directive: 2004/108/EC - Directive 2004/108/EC of the European Parliament and of the Council of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC
• Directive: 2004/108/EU - DIRECTIVE 2004/108/EC OF THE EUROPEAN PARLIAMENT AND OF THE COUNCIL of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC
• Directive: 2014/30/EU - Directive 2014/30/EU of the European Parliament and of the Council of 26 February 2014 on the harmonisation of the laws of the Member States relating to electromagnetic compatibility (recast)
• Mandate: M/490 - Standardisation mandate to the European Standardisation Organisations (ESOs) to support European Smart Grid deployment
• Ref Project: SIST EN 61000-4-20:2011 - Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides (IEC 61000-4-20:2010)

Relations

• Replaces: EN 61000-4-20:2003/A1:2007 - Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• Effective Date: 28-Jan-2023
• Replaces: EN 61000-4-20:2003 - Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• Effective Date: 28-Jan-2023
• Replaced By: EN IEC 61000-4-20:2022 - Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• Effective Date: 25-Oct-2016

Standards Content (Sample)

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01-januar-2011
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Ta slovenski standard je istoveten z: EN 61000-4-20:2010
ICS:
33.100.10 Emisija Emission
33.100.20 Imunost Immunity
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD
EN 61000-4-20
NORME EUROPÉENNE
November 2010
EUROPÄISCHE NORM
ICS 33.100.10; 33.100.20 Supersedes EN 61000-4-20:2003 + A1:2007

English version
Electromagnetic compatibility (EMC) -
Part 4-20: Testing and measurement techniques -
Emission and immunity testing in transverse electromagnetic (TEM)
waveguides
(IEC 61000-4-20:2010)
Compatibilité électromagnétique (CEM) -  Elektromagnetische
Partie 4-20: Techniques d'essai et de Verträglichkeit (EMV) -
mesure - Teil 4-20: Prüf- und Messverfahren -
Essais d'émission et d'immunité dans les Messung der Störaussendung und
guides d'onde TEM Störfestigkeit in transversal-
(CEI 61000-4-20:2010) elektromagnetischen (TEM-)Wellenleitern
(IEC 61000-4-20:2010)
This European Standard was approved by CENELEC on 2010-10-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia,
Spain, Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Management Centre: Avenue Marnix 17, B - 1000 Brussels

© 2010 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61000-4-20:2010 E
Foreword
The text of document 77B/637/FDIS, future edition 2 of IEC 61000-4-20, prepared by SC 77B, High
frequency phenomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the IEC-CENELEC
parallel vote and was approved by CENELEC as EN 61000-4-20 on 2010-10-01.
This European Standard supersedes EN 61000-4-20:2003 + A1:2007.
The main changes with respect to EN 61000-4-20:2003 + A1:2007 are the following:
– consistency of terms (e.g. test, measurement, etc.) has been improved;
– clauses covering test considerations, evaluations and the test report have been added;
– references to large TEM waveguides have been eliminated;
– a new informative annex has been added to deal with calibration of E-field probes.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent
rights.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2011-07-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2013-10-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61000-4-20:2010 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
CISPR 20 NOTE  Harmonized as EN 55020.
CISPR 25 NOTE  Harmonized as EN 55025.
IEC 60068-1 NOTE  Harmonized as EN 60068-1.
IEC 60118-13 NOTE  Harmonized as EN 60118-13.
IEC 61967-2 NOTE  Harmonized as EN 61967-2.
IEC 62132-2 NOTE  Harmonized as EN 62132-2.
[11] CISPR 14 series NOTE  Harmonized in EN 55014 series (not modified).
[23] IEC 61000-2-9 NOTE  Harmonized as EN 61000-2-9.
[42] IEC 61000-4-3 NOTE  Harmonized as EN 61000-4-3.
[44] CISPR 16-4-2 NOTE  Harmonized as EN 55016-4-2.
__________
- 3 - EN 61000-4-20:2010
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year

IEC 60050-161 - International Electrotechnical Vocabulary - -
(IEV) -
Chapter 161: Electromagnetic compatibility

IEC 61000-2-11 1999 Electromagnetic compatibility (EMC) - - -
Part 2-11: Environment - Classification of
HEMP environments
IEC 61000-4-23 - Electromagnetic compatibility (EMC) - EN 61000-4-23 -
Part 4-23: Testing and measurement
techniques - Test methods for protective
devices for HEMP and other radiated
disturbances
IEC/TR 61000-4-32 - Electromagnetic compatibility (EMC) - - -
Part 4-32: Testing and measurement
techniques - High-altitude electromagnetic
pulse (HEMP) simulator compendium

IEC/TR 61000-5-3 - Electromagnetic compatibility (EMC) - - -
Part 5: Installation and mitigation guidelines -
Section 3: HEMP protection concepts

CISPR 16-1-1 - Specification for radio disturbance and EN 55016-1-1 -
immunity measuring apparatus and methods -
Part 1-1: Radio disturbance and immunity
measuring apparatus - Measuring apparatus

CISPR 16-1-4 - Specification for radio disturbance and EN 55016-1-4 -
immunity measuring apparatus and methods -
Part 1-4: Radio disturbance and immunity
measuring apparatus - Antennas and test
sites for radiated disturbance measurements

1)
CISPR 16-2-3 2006 Specification for radio disturbance and EN 55016-2-3 2006
immunity measuring apparatus and methods -
Part 2-3: Methods of measurement of
disturbances and immunity - Radiated
disturbance measurements
CISPR 22 (mod) - Information technology equipment - Radio EN 55022 -
disturbance characteristics - Limits and
methods of measurement
1)
EN 55016-2-3 is superseded by EN 55016-2-3:2010, which is based on CISPR 16-2-3:2010.

IEC 61000-4-20
Edition 2.0 2010-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-20: Testing and measurement techniques – Emission and immunity
testing in transverse electromagnetic (TEM) waveguides

Compatibilité électromagnétique (CEM) –
Partie 4-20: Techniques d’essai et de mesure – Essais d’émission et d’immunité
dans les guides d’onde TEM
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
XC
CODE PRIX
ICS 33.100.10; 33.100.20 ISBN 978-2-88912-149-6
– 2 – 61000-4-20 © IEC:2010
CONTENTS
FOREWORD.4
INTRODUCTION.6
1 Scope and object.7
2 Normative references .7
3 Terms, definitions and abbreviations .8
3.1 Terms and definitions .8
3.2 Abbreviations .11
4 General .11
5 TEM waveguide requirements.12
5.1 General .12
5.2 General requirements for the use of TEM waveguides .12
5.2.1 TEM mode verification .12
5.2.2 Test volume and maximum EUT size .12
5.2.3 Validation of usable test volume .13
5.3 Special requirements and recommendations for certain types of TEM
waveguides .15
5.3.1 Set-up of open TEM waveguides .15
5.3.2 Alternative TEM mode verification for a two-port TEM waveguide .16
6 Overview of EUT types .16
6.1 General .16
6.2 Small EUT .16
6.3 Large EUT.16
7 Laboratory test conditions .17
7.1 General .17
7.2 Climatic conditions .17
7.3 Electromagnetic conditions.17
8 Evaluation and reporting of test results.17
Annex A (normative) Emission testing in TEM waveguides.19
Annex B (normative) Immunity testing in TEM waveguides.40
Annex C (normative) HEMP transient testing in TEM waveguides .46
Annex D (informative) TEM waveguide characterization.53
Annex E (informative) Calibration method for E-field probes in TEM waveguides .61
Bibliography.71

Figure A.1 – Routing the exit cable to the corner at the ortho-angle and the lower edge
of the test volume .30
Figure A.2 – Basic ortho-axis positioner or manipulator .31
Figure A.3 – Three orthogonal axis-rotation positions for emission measurements.32
Figure A.4 – Twelve-face (surface) and axis orientations for a typical EUT .33
Figure A.5 – Open-area test site (OATS) geometry .34
Figure A.6 – Two-port TEM cell (symmetric septum) .35
Figure A.7 – One-port TEM cell (asymmetric septum) .36
Figure A.8 – Stripline (two plates) .38
Figure A.9 – Stripline (four plates, balanced feeding).39

61000-4-20 © IEC:2010 – 3 –
Figure B.1 – Example of test set-up for single-polarization TEM waveguides .44
Figure B.2 – Uniform area calibration points in TEM waveguide .45
Figure C.1 – Frequency domain spectral magnitude between 100 kHz and 300 MHz .52
Figure D.1 – Simple waveguide (no TEM mode).59
Figure D.2 – Example waveguides for TEM-mode propagation.59
Figure D.3 – Polarization vector.
...