Videodisks - Methods of measurements for parameters

Collects the different typical parameters for videodisks described in EN 60844, 60845, 60856 and 60857 and proposes a method of measurement for each.

Videoplatten - Meßverfahren der Eigenschaften

Vidéodisques - Méthodes de mesure des paramètres

Rassemble les différents paramètres caractéristiques des vidéodisques décrits dans les EN 60844, 60845, 60856 et 60857 et propose pour chacun une méthode de mesure.

Videodisks - Methods of measurements for parameters (IEC 61106:1993)

General Information

Status
Published
Publication Date
05-Aug-1993
Withdrawal Date
30-Jun-1994
Current Stage
6060 - Document made available - Publishing
Start Date
06-Aug-1993
Completion Date
06-Aug-1993

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SLOVENSKI STANDARD
01-april-1999
Videodisks - Methods of measurements for parameters (IEC 61106:1993)
Videodisks - Methods of measurements for parameters
Videoplatten - Meßverfahren der Eigenschaften
Vidéodisques - Méthodes de mesure des paramètres
Ta slovenski standard je istoveten z: EN 61106:1993
ICS:
33.160.40 Video sistemi Video systems
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

NORME CEI
INTERNATIONALE IEC
INTERNATIONAL
Première édition
STANDARD
First edition
1993-05
Vidéodisques — Méthodes de mesure
des paramètres
Videodisks — Methods of measurement
for parameters
© IEC 1993 Droits de reproduction réservés — Copyright - all rights reserved
Aucune partie de cette publication ne peut étre reproduite ni No part of this publication may be reproduced or utilized in
utilisée sous quelque forme que ce soit et par aucun any form or by any means, electronic or mechanical,
procédé, électronique ou mécanique, y compris la photo- including photocopying and microfilm, without permission in
copie et les microfilms, sans l'accord écrit de l'éditeur writing from the publisher.
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Telefax: X41 22 919 0300 e-mail: inmail@iec.ch IEC web site http: //www.iec.ch
CODE PRIX
Commission Electrotechnique Internationale
PRICE CODE
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Pour prix, voir catalogue en vigueur
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For price, see current catalogue

1106 ©IEC:1993 - 3 -
CONTENTS
Page
FOREWORD 5
INTRODUCTION 7
Clause
1 Scope 9
2 Normative references 9
3 List of parameters and their applications 9
4 Standard atmospheric conditions for testing 15
Table 1 - Measuring items 15
Annexes
A Thickness of protective transparent layer 21
B Rotation speed 23
C Track position and number 25
D Track depth 29
E Vert
ical deviation and acceleration of VHD 33
F Vert
ical deviation and acceleration of LV 39
G Radial deviation and acceleration of VHD 45
H
Radial deviation and acceleration of LV 51
J Tangential deviation of VHD 55
K
Tangential deviation of LV 57
L Birefringence of transparent disk 59
M Audio subcarrier amplitude and EFM amplitude 61
N
Audio subcarrier frequencies, channels 1 and 2 63
P
Maximum video level 67
Q Blanking level frequency 71
R Main carrier deviation 73
S
Pre-emphasis audio 75
T Pre-emphasis video 79
U Operation signals 83
_ 5
1106 ©IEC:1993
INTERNATIONAL ELECTROTECHNICAL COMMISSION
VIDEODISKS - METHODS OF MEASUREMENT FOR PARAMETERS
FOREWORD
1)
The IEC (International Electrotechnical Commission) is a worldwide organization for standardization
comprising all national electrotechnical committees (IEC National Committees). The object of the IEC is to
promote international cooperation on all questions concerning standardization in the electrical and
electronic fields. To this end and in addition to other activities, the IEC publishes International Standards.
Their preparation is entrusted to technical committees; any IEC National Committee interested in
the subject dealt with may participate in this preparatory work. International, governmental and
non-governmental organizations liaising with the IEC also participate in this preparation. The IEC
collaborates closely with the International Organization for Standardization (ISO) in accordance with
conditions determined by agreement between the two organizations.
2)
The formal decisions or agreements of the IEC on technical matters, prepared by technical committees on
which all the National Committees having a special interest therein are represented, express, as nearly as
possible, an international consensus of opinion on the subjects dealt with.
3)
They have the form of recommendations for international use published in the form of standards, technical
reports or guides and they are accepted by the National Committees in that sense.
4)
In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
This International Standard IEC 1106 has been prepared by IEC by sub-committee 60B:
Video recording, of IEC technical committee 60: Recording.
The text of this standard is based on the following documents:
DIS Report on Voting
60B(CO)134
60B(CO)147A
Full information on the voting for the approval of this standard can be found in the report
on voting indicated in the above table.

1106 ©I EC:1993 _ 7 _
INTRODUCTION
Two videodisk systems are covered by the lEC publications quoted in clause 2. In order to
play back these two types of videodisks it is necessary to use an optical pick-up device for
the optical system and a capacitance pick-up device for the capacitance system. These
videodisks are characterized by mechanical, electrical and optical parameters for which
measuring methods are unknown.

1106 ©IEC:1993 - 9 -
VIDEODISKS - METHODS OF MEASUREMENT FOR PARAMETERS
1 Scope
This International Standard collects the different typical parameters for videodisks
described in IEC 844, 845, 856 and 857 and proposes a method of measurement for each.
Some of these parameters can be measured by well known methods existing in every labo-
ratory, whilst other parameters need specific equipment described in the annexes.
2 Normative references
The following standards contain provisions which, through reference in this text, constitute
provisions of this International Standard. At the time of publication, the editions indicated
were valid. All standards are subject to revision, and parties to agreements based on this
International Standard are encouraged to investigate the possibility of applying the most
recent editions of the standards indicated below. Members of IEC and ISO maintain
registers of currently valid International Standards.
IEC 844: 1988, Pre-recorded capacitance grooveless videodisk system. 50 Hz/625 lines -
PAL, on Type VHD
IEC 845: 1988, Pre-recorded capacitance grooveless videodisk system. 60 Hz/525 lines -
NTSC, on Type VHD
Pre-recorded optical reflective videodisk system. «Laser vision» 50 Hz/625
IEC 856: 1986,
lines - PAL
IEC 857: 1986, Pre-recorded optical reflective videodisk system. «Laser vision» 60 Hz/525
lines - M/NTSC
3 List of parameters and their applications
Applies to Classification
(note 2)
3.1 Mechanical parameters
3.1.1 Thickness of protective transparent layer LV, (note 1) (3)
3.1.2 Thickness of disk areas LV, VHD (1)
3.1.3 Outer radius of disk LV, VHD (1)
3.1.4 Diameter of center hole LV, VHD (1)
3.1.5 Concentricity of disk assembled from two
single disks LV (1)
3.1.6 Inside diameter of label LV (1)
3.1.7 Outside diameter of label LV (1)
For the notes, see page 13.
1106@ IEC:1993 – 11 –
Applies to
Classification
(note 2)
3.1.8 Rotation speed
3.1.8.1
Angular velocity of CAV* disk LV, VHD
(3)
3.1.8.2 Linear velocity of CLV** disk LV
(3)
3.1.8.3 Angular acceleration for CLV disk
LV (3)
3.1.9 Mass of the disk LV
(1)
3.1.10 Maximum unbalance force
LV, VHD (1)
3.1.11
Starting radius lead-in tracks LV, VHD (1)
3.1.12 Starting radius programme area
LV, VHD (1)
3.1.13
End radius programme area and starting position LV, VHD (1)
of lead-out tracks
3.1.14
Minimum number of programme tracks LV (1)
3.1.15 Length of lead-out tracks
LV (1)
3.1.16
Inner radius programme end signal area VHD (1)
3.1.17 Track pitch LV, VHD
(3)
3.1.18 Width and depth of information track
VHD (3)
3.1.19 Width and depth of pilot signal track VHD
(3)
3.1.20
Vertical deviation of programme tracks
during playback
3.1.20.1 Maximum distance from reference plane LV, VHD (3)
3.1.20.2 Maximum vertical acceleration LV, VHD
(3)
3.1.20.3
Maximum vertical deviation LV, VHD (3)
3.1.20.4 Maximum velocity LV
(3)
3.1.21
Maximum static deflection of disk LV, VHD (1)
3.1.22 Radial deviation of programme tracks
during playback LV, VHD (1)
3.1.22.1 Maximum deviation during one revolution
LV, VHD (3)
3.1.22.2 Maximum radial deviation LV, VHD
(3)
3.1.22.3
Maximum radial acceleration LV, VHD (3)
3.1.23 Tangential deviation of programme tracks
3.1.23.1 Maximum time base error
LV, VHD (3)
3.1.23.2 Shift between two adjacent tracks LV, VHD
(3)
3.1.24
Disk case VHD (1)

Constant Angular Velocity.
** Constant Linear Velocity.
Note 2, see page 13.
1106 © I EC:1993 - 13 -
Applies to Classification
(note 2)
3.2 Disk material parameters
3.2.1 Refractive index LV (1)
3.2.2 Birefringence of transparent disk LV (3)
(1)
3.2.3 Reflectivity LV
3.2.4 VHD (2)
Surface resistivity
3.3 Recorded parameters
(1)
3.3.1 Audio subcarrier amplitude and EFM (note 3) LV, VHD
amplitude
LV, VHD (1)
3.3.2 Audio subcarrier frequencies, channels 1 and 2
Audio subcarrier frequency maximum deviation LV, VHD (1)
3.3.3
Video signal standards (visual check), color burst,
3.3.4
(1)
VIRS (note 3), ITS (note 3), address signals LV, VHD
LV, VHD (1)
3.3.5 Maximum video level
3.3.6 Blanking level frequency LV, VHD (1)
LV, VHD (1)
3.3.7 Main carrier deviation
VHD (1)
3.3.8 Pilot frequency
Pre-emphasis audio and video
3.3.9
LV, VHD (1)
3.3.9.1 Pre-emphasis audio
(1)
3.3.9.2 Pre-emphasis video LV, VHD
LV, VHD (1)
3.3.10 Digital data encoding format correctness
3.4 Operation signals
3.4.1 Radial signal
LV (3)
3.4.1.1 Radial modulation index
LV (3)
3.4.1.2 Radial reflection index
3.4.1.3 Radial signal to error ratio LV (3)
3.4.2 Push-pull tracking signal
3.4.2.1 Magnitude LV (3)
LV (3)
3.4.2.2 Noise
Tangential signal
3.4.3
LV, VHD (3)
3.4.3.1 Drop outs
LV (3)
3.4.3.2 Signal to noise ratio
LV (3)
3.4.4 High frequency modulation index
NOTES
1 LV Laser vision
2 (1) Parameters which can be measured by conventional techniques.
(2) Parameters for which specific methods exist with an IEC definition.
Parameters of videodisk technology which need specific attention.
(3)
3 EFM Eight to Fourteen Modulation.
VIRS Vertical Interval Reference Signal.
ITS International Test Signal.

1106 ©IEC:1993 - 15 -
Standard atmospheric conditions for testing
Measurements and mechanical checks shall be carried out at any combination of tem-
perature, humidity and air pressure within the following limits unless otherwise specified
for ce rt
ain parameters in IEC 844, 845, 856 and 857:
Ambient temperature:
15 °C to 35 °C;
Relative humidity: 45%to75%;
Air pressure:
86 kPa to 106 kPa.
Samples shall be conditioned in the testing environment for 24 h before testing.
Table 1 - Measuring items
Parameters
LV VHD
3.1 Mechanical parameters
3.1.1 Thickness of protective transparent layer
Annex A —
3.1.2 Thickness of disk areas
A disk may be measured with sufficient accuracy
by means of general measuring instruments such
3.3.1.3 Outer radius of disk
as a dial gauge, thickness gauge, caliper, and
3.1.4 Diameter of centre hole
plug gauge
3.1.5 Concentricity of disk assembled from
two single disks
3.1.6 Inside diameter of label
3.1.7 Outside diameter of label
3.1.8 Rotation speed
Annex B
3.1.8.1 Angular velocity of CAV disk
3.1.8.2 Linear velocity of CLV disk —
Conventional method —
3.1.8.3 Angular acceleration for CLV disk
A disk shall be measured on a dynamic
3.1.9 Mass of the disk
balancing machine with a specified rotation
3.1.10 Maximum unbalance force
speed
Annex C
3.1.11 Starting radius lead-in tracks
3.1.12 Starting radius programme area
3.1.13 End radius programme area and starting
position of lead-out tracks
3.1.14 Minimum number of programme tracks
3.1.15 Length of lead-out tracks
3.1.16 Inner radius programme end signal

Annex C
1106 © IEC:1993
- 17 -
Table 1
(continued)
Parameters
LV VH D
Optical microscope (measure mean track pitch)
3.1.17 Track pitch
3.1.18 Width and depth of information track
3.1.19 Annex D
Width and depth of pilot signal track
3.1.20
Vertical deviation of programme tracks
during playback
3.1.20.1 Maximum distance from reference plane
Annex F Annex E
3.1.20.2 Maximum vertical acceleration
3.1.20.3 Maximum ve rt
ical deviation
3.1.20.4 Maximum velocity
3.1.21
Maximum static deflection of disk
Mechanical method
3.1.22
Radial deviation of programme tracks
during playback
3.1.22.1 Maximum deviation during one revolution
3.1.22.2 Maximum radial deviation Annex H Annex G
3.1.22.3 Maximum radial acceleration
3.1.23 Tangential deviation of programme tracks Annex K
Annex J
Special test disk will be required for this
3.1.23.1
Maximum time base error
measurement.
3.1.23.2 Shift between two adjacent tracks
Conventional disk under consideration.
3.1.24 Disk case
Conventional method
3.2
Disk material parameters
Conventional method
3.2.1 Refractive index
Annex L
3.2.2 Birefringence of transparent disk
3.2.3 Reflectivity Conventional method
3.2.4 Surface resistivity
IEC 93
1106 © I EC:1993
- 19 -
Table 1 (concluded)
Parameters
LV VI-10
3.3 Recorded parameters
Optical microscope (measure mean track pitch)
3.3.1 Audio subcarrier amplitude and EFM amplitude
Annex M
3.3.2 Audio subcarrier frequencies, channels 1 and 2
Annex N
3.3.3 Audio subcarrier frequency maximum deviation
Special test disk will be required for this
measurement
3.3.4 Video signal standards (visual check), color
Verify the location of
burst, VIRS, ITS, address signals
each test signal by use

of waveform monitor
3.3.5 Maximum video level
Annex P
3.3.6 Blanking level frequency
Annex Q
3.3.7 Main carrier deviation
Annex R
3.3.8 Pilot frequency

Under consideration
3.3.9 Pre-emphasis audio and video
3.3.9.1 Pre-emphasis audio
Annex S
3.3.9.2 Annex T Under consideration
Pre-emphasis video
3.3.10 Digital data encoding format correctness
Digital data can be measured on a waveform
monitor or video monitor at vertical
blanking time interval
3.4 Operation signals
3.4.1 Radial signal
3.4.1.1 Radial modulation index
3.4.1.2 Radial reflection index Annex U
3.4.1.3 Radial signal to error ratio
3.4.2 Push-pull tracking signal
3.4.2.1 Magnitude
Annex U
3.4.2.2 Noise
3.4.3 Tangential signal
Annex U
3.4.3.1 Drop outs
3.4.3.2 Signal to noise ratio
3.4.4 High frequency modulation index

1106 ©I EC:1993 - 21 -
Annex A
(normative)
Thickness of protective transparent layer
A.1 Application
This measuring method shall be applied.
Parameter Applies to
3.1.1 Thickness
...

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