IEC 60747-14-1:2010
(Main)Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors
Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors
IEC 60747-14-1:2009 describes general items concerning the specifications for sensors, which are the basis for specifications given in other parts of this series for various types of sensors. Sensors described in this standard are basically made of semiconductor materials, however, the statements made in this standard are also applicable to sensors using materials other than semiconductor, for example dielectric and ferroelectric materials. The major changes with regard to the previous edition are as follows: a) Title change from "Semiconductor sensors - General and classification" to "Semiconductor sensors - Generic specification for sensors"; b) Clause 3 has been divided into three Clauses 3, 4 and 5; c) Added new terms from IEC 60747-14-5; d) Added a new Clause relating to Quality assessment procedures; e) Added a Bibliography; f) Added a new Annex for the sampling procedure.
Dispositifs à semiconducteurs - Partie 14-1: Capteurs à semiconducteurs - Spécification générique pour les capteurs
La CEI 60747-14-1:2009 décrit des points généraux concernant les spécifications pour capteurs, qui sont le fondement des spécifications données dans d'autres parties de cette série pour divers types de capteurs. Les capteurs décrits dans cette norme sont essentiellement constitués de matériaux semi-conducteurs; cependant, les indications figurant dans la présente norme sont également applicables aux capteurs utilisant des matériaux autres que semiconducteurs, comme par exemple, des matériaux diélectriques et ferroélectriques. Les modifications principales par rapport à l'édition précédente sont les suivantes: a) Modification du titre, antérieurement "Capteurs à semiconducteurs - Généralités et classification" remplacé par "Capteurs à semiconducteurs - Spécification générique pour les capteurs"; b) L'Article 3 a été divisé en trois Articles 3, 4 et 5; c) Ajouts de nouveaux termes de la CEI 60747-14-5; d) Ajout d'un nouvel Article relatif aux Procédures d'assurance de la qualité; e) Ajout d'une Bibliographie; f) Ajout d'une Annexe relative à la procédure d'échantillonnage.
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IEC 60747-14-1 ®
Edition 2.0 2010-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices –
Part 14-1: Semiconductor sensors – Generic specification for sensors
Dispositifs à semiconducteurs –
Partie 14-1: Capteurs à semiconducteurs – Spécification générique pour les
capteurs
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IEC 60747-14-1 ®
Edition 2.0 2010-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices –
Part 14-1: Semiconductor sensors – Generic specification for sensors
Dispositifs à semiconducteurs –
Partie 14-1: Capteurs à semiconducteurs – Spécification générique pour les
capteurs
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
S
CODE PRIX
ICS 31.080.01 ISBN 978-2-88910-276-1
– 2 – 60747-14-1 © IEC:2010
CONTENTS
FOREWORD.3
1 Scope.5
2 Normative references .5
3 Terminology, units, letter symbols, terms and definitions .6
3.1 Terminology, units and letter symbols.6
3.2 Terms and definitions .8
4 Standard environmental conditions.12
5 Marking .12
6 Quality assessment procedures.12
6.1 General .12
6.2 Eligibility .12
6.3 Qualification approval procedure .13
7 Test and measurement procedures.18
7.1 Standard conditions and general precautions .18
7.2 Physical examination.18
7.3 Climatic and mechanical tests .19
7.4 Alternative test methods .19
Annex A (normative) Sampling procedures .20
Bibliography.21
Figure 1 – Output-measurand relationship of a linear-output sensor with an offset.9
Figure 2 – Hysteresis and repeatability. .11
Table 1 – Measurands .6
60747-14-1 © IEC:2010 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
Part 14-1: Semiconductor sensors –
Generic specification for sensors
FOREWORD
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
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patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60747-14-1 has been prepared by subcommittee 47E: Discrete
semiconductor devices, of IEC technical committee 47: Semiconductor devices.
This second edition cancels and replaces the first edition, published in 2000, and constitutes
a technical revision.
The major changes with regard to the previous edition are as follows:
a) Title change from "Semiconductor sensors - General and classification" to "Semiconductor
sensors - Generic specification for sensors";
b) Clause 3 has been divided into three Clauses 3, 4 and 5;
c) Added new terms from IEC 60747-14-5;
d) Added a new Clause relating to Quality assessment procedures;
e) Added a Bibliography;
f) Added a new Annex for the sampling procedure.
– 4 – 60747-14-1 © IEC:2010
The text of this standard is based on the following documents:
FDIS Report on voting
47E/387/FDIS 47E/391/RVD
Full information on the voting for the approval on this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The list of all parts of the IEC 60747 series, under the general title Semiconductor devices –
Discrete devices, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
60747-14-1 © IEC:2010 – 5 –
SEMICONDUCTOR DEVICES –
Part 14-1: Semiconductor sensors –
Generic specification for sensors
1 Scope
This part of IEC 60147-14 describes general items concerning the specifications for sensors,
which are the basis for specifications given in other parts of this series for various types of
sensors. Sensors described in this standard are basically made of semiconductor materials,
however, the statements made in this standard are also applicable to sensors using materials
other than semiconductor, for example dielectric and ferroelectric materials.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60027 (all parts), Letter symbols to be used in electrical technology
IEC 60068-2 (all parts), Environmental testing – Part 2: Tests
IEC 60410, Sampling plans and procedures for inspection by attributes
IEC 60617-DB, Graphical symbols for diagrams
IEC 60747-1:2006, Semiconductor devices – Part 1: General
IEC 60749 (all parts), Semiconductor device – Test method of mechanical and environment test
IEC 62047-1, Semiconductor devices – Micro-electromechanical devices – Part 1: Terms and
definitions
ISO 1000, SI units and recommendations for the use of their multiples and of certain other
units
ISO 2859-1, Sampling procedure
...
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