IEC TS 62804-2:2022

Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 2: Thin-film

IEC TS 62804-2:2022 defines apparatus and procedures to test and evaluate the durability of photovoltaic (PV) modules to power loss by the effects of high voltage stress in a damp heat environment, referred to as potential-induced degradation (PID). This document defines a test method that compares the coulomb transfer between the active cell circuit and ground through the module packaging under voltage stress during accelerated stress testing with the coulomb transfer during outdoor testing to determine an acceleration factor for the PID.
This document tests for the degradation mechanisms involving mobile ions influencing the electric field over the semiconductor absorber layer or electronically interacting with the films such that module power is affected.

General Information

• Status: Published
• Publication Date: 28-Mar-2022
• ICS: 27.160 - Solar energy engineering
• Technical Committee: TC 82 - Solar photovoltaic energy systems
• Drafting Committee: WG 2 - TC 82/WG 2
• Current Stage: PPUB - Publication issued
• Start Date: 28-Apr-2022
• Completion Date: 29-Mar-2022

Standards Content (Sample)

IEC TS 62804-2 ®
Edition 1.0 2022-03
TECHNICAL
SPECIFICATION
colour
inside
Photovoltaic (PV) modules – Test methods for the detection of potential-induced
degradation –
Part 2: Thin-film
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IEC TS 62804-2 ®
Edition 1.0 2022-03
TECHNICAL
SPECIFICATION
colour
inside
Photovoltaic (PV) modules – Test methods for the detection of potential-

induced degradation –
Part 2: Thin-film
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 27.160 ISBN 978-2-8322-1093-6

– 2 – IEC TS 62804-2:2022  IEC 2022
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 9
2 Normative references . 9
3 Terms and definitions . 10
4 Samples . 10
5 Tests . 11
5.1 General . 11
5.2 Test procedures – Outdoor measurements . 12
5.2.1 General . 12
5.2.2 Apparatus . 12
5.2.3 Optional monitoring . 15
5.2.4 Test conditions . 16
5.2.5 Procedure . 16
5.2.6 Acceleration by elevated system voltage testing outdoors . 19
5.3 Test procedures – Accelerated testing in environmental chamber . 21
5.3.1 General . 21
5.3.2 Test of modules in the dark and unpowered state . 22
5.3.3 Testing in chamber with light bias or current . 29
5.3.4 Acceleration factor determination—coulomb basis . 36
6 Test report . 37
Annex A (normative) Evaluation for moisture ingress sensitivity . 40
A.1 General . 40
A.2 Procedure . 40
A.3 Evaluation . 41
Annex B (informative) Dew point and required chamber relative humidity (RH)
setpoints depending on temperature difference between module and the chamber air . 43
Bibliography . 44

Figure 1 – Circuit suitable for electrical loading, application of system voltage bias and
evaluation of leakage current from the module on the ground return-side . 14
Figure 2 – Module mounting configuration for isolation and measurement of current
transfer to ground . 15
Figure 3 – Circuit suitable for electrical loading, application of system voltage bias and
evaluation of leakage current from the module . 15
Figure 4 – Test flow for performing PID tests in the field associated with procedures
described in 5.2.2 to 5.2.5 for evaluation of coulombic transfer from the cell circuit of
the module to earth . 17
Figure 5 – PID test flow for performing voltage stress test with module dark and
unpowered . 23
Figure 6 – Apparatus for applying system voltage bias (Vsys) to a PV module in an
environmental chamber . 25
Figure 7 – Example test time-temperature-humidity-voltage profile for application of
stress in an environmental chamber . 27
Figure 8 – Schematic for isolated power supply for application of forward bias voltage
(V ) . 30
fwd
Figure 9 – Schematic for application of system voltage (Vsys) bias on test module on
normally grounded parts . 31
Figure 10 – Apparatus for applying system voltage bias (Vsys) to a PV module in an
environmental chamber under light bias . 32
Figure 11 – PID test flow for modules placed under voltage stress and with light bias
or dark forward bias voltage . 33
Figure A.1 – Test flow for modules to detect and evaluate moisture ingress on PID
rate . 41

Table 1 – General schema of test procedures . 12
Table 2 – PID chamber test report table (example) (Variables are given in 5.3.2.3.3.7
and 5.3.4.1) . 38
Table 3 – PID chamber recovery test report table (example) (Variables are given in
5.3.3.4) . 38
Table B.1 – Dew point and required chamber relative humidity (RH) setpoints
depending on temperature difference between module and the chamber air . 43

– 4 – IEC TS 62804-2:2022  IEC 2022
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
PHOTOVOLTAIC (PV) MODULES – TEST METHODS FOR
THE DETECTION OF POTENTIAL-INDUCED DEGRADATION –

Part 2: Thin-film
FOREWORD
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IEC TS 62804-2 has been prepared by IEC technical committee 82: Solar photovoltaic energy
systems. It is a Technical Specification.
The text of this Technical Specification is based on the following documents:
Draft Report on voting
82/1958/DTS 82/2001A/RVDTS
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this Technical Specification is English.
A list of all parts in the IEC 62804 series, published under the general title Photovoltaic (PV)
modules – Test methods for the detection of potential-induced degradation, can be found on
the IEC website.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
The committee has decided that the contents of this document will rem
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