IEC TS 62804-2:2022

Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 2: Thin-film

IEC TS 62804-2:2022 defines apparatus and procedures to test and evaluate the durability of photovoltaic (PV) modules to power loss by the effects of high voltage stress in a damp heat environment, referred to as potential-induced degradation (PID). This document defines a test method that compares the coulomb transfer between the active cell circuit and ground through the module packaging under voltage stress during accelerated stress testing with the coulomb transfer during outdoor testing to determine an acceleration factor for the PID.
This document tests for the degradation mechanisms involving mobile ions influencing the electric field over the semiconductor absorber layer or electronically interacting with the films such that module power is affected.

General Information

• Status: Published
• Publication Date: 28-Mar-2022
• ICS: 27.160 - Solar energy engineering
• Technical Committee: TC 82 - Solar photovoltaic energy systems
• Drafting Committee: WG 2 - TC 82/WG 2
• Current Stage: PPUB - Publication issued
• Start Date: 28-Apr-2022
• Completion Date: 29-Mar-2022

Standards Content (Sample)

IEC TS 62804-2
®

Edition 1.0 2022-03
TECHNICAL
SPECIFICATION

colour
inside


Photovoltaic (PV) modules – Test methods for the detection of potential-induced
degradation –
Part 2: Thin-film
IEC TS 62804-2:2022-03(en)

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IEC TS 62804-2

®


Edition 1.0 2022-03




TECHNICAL



SPECIFICATION








colour

inside










Photovoltaic (PV) modules – Test methods for the detection of potential-

induced degradation –

Part 2: Thin-film

























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ICS 27.160 ISBN 978-2-8322-1093-6




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– 2 – IEC TS 62804-2:2022  IEC 2022
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 9
2 Normative references . 9
3 Terms and definitions . 10
4 Samples . 10
5 Tests . 11
5.1 General . 11
5.2 Test procedures – Outdoor measurements . 12
5.2.1 General . 12
5.2.2 Apparatus . 12
5.2.3 Optional monitoring . 15
5.2.4 Test conditions .
...