IEC 62525:2007

Standard Test Interface Language (STIL) for Digital Test Vector Data

Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.

General Information

• Status: Published
• Publication Date: 06-Nov-2007
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 19.080 - Electrical and electronic testing
• ICS: 25.040.01 - Industrial automation systems in general
• Technical Committee: TC 91 - Electronics assembly technology
• Drafting Committee: WG 15 - TC 91/WG 15
• Current Stage: PPUB - Publication issued
• Start Date: 15-Nov-2007
• Completion Date: 07-Nov-2007

Standards Content (Sample)

IEC 62525
Edition 1.0 2007-11
™
IEEE 1450
INTERNATIONAL
STANDARD
Standard Test Interface Language (STIL) for Digital Test Vector Data



IEC 62525:2007(E) IEEE Std. 1450-1999

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IEC 62525
Edition 1.0 2007-11
™
IEEE 1450
INTERNATIONAL
STANDARD


Standard Test Interface Language (STIL) for Digital Test Vector Data


INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
XG
ICS 25.040;19.080 ISBN 2-8318-9337-2

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– 2 – IEC 62525:2007(E)
IEEE 1450-1999(E)
CONTENTS
FOREWORD .6
IEEE Introduction .9
1. Overview.10
1.1 Scope.12
1.2 Purpose.13
2. References.13
3. Definitions, acronyms, and abbreviations.13
3.1 Definitions.13
3.2 Acronyms and abbreviations.16
4. Structure of this standard . 16
5. STIL orientation and capabilities tutorial (informative).17
5.1 Hello Tester.17
5.2 Basic LS245.
...