Amendment 1 - Shunt capacitors for a.c. power systems having a rated voltage above 1 000 V - Part 2: Endurance testing

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IEC TS 60871-2:2014/AMD1:2022 - Amendment 1 - Shunt capacitors for a.c. power systems having a rated voltage above 1 000 V - Part 2: Endurance testing
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IEC TS 60871-2
Edition 3.0 2022-03
Shunt capacitors for a.c. power systems having a rated voltage above 1 000 V –
Part 2: Endurance testing
IEC TS 60871-2:2014-11/AMD1:2022-03(en)
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IEC TS 60871-2
Edition 3.0 2022-03
Shunt capacitors for a.c. power systems having a rated voltage above 1 000 V –
Part 2: Endurance testing
ICS 29.240.99; 31.060.70 ISBN 978-2-8322-1096-2

Warning! Make sure that you obtained this publication from an authorized distributor.

® Registered trademark of the International Electrotechnical Commission
---------------------- Page: 3 ----------------------
– 2 – IEC TS 60871-2:2014/AMD1:2022
© IEC 2022
Part 2: Endurance testing

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Amendment 1 to IEC TS 60871-2:2014 has been prepared by IEC technical committee 33:

Power capacitors and their applications.
The text of this Amendment is based on the following documents:
Draft Report on voting
33/668/DTS 33/671/RVDTS

Full information on the voting for its approval can be found in the report on voting indicated in

the above table.
The language used for the development of this Amendment is English.
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IEC TS 60871-2:2014/AMD1:2022 – 3 –
© IEC 2022

This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in

accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available

at The main document types developed by IEC are

described in greater detail at

The committee has decided that the contents of this document will remain unchanged until the

stability date indicated on the IEC website under in the data related to the

specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
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– 4 – IEC TS 60871-2:2014/AMD1:2022
© IEC 2022
Add, after Clause 4, the following new text:
5 Element fail safe test for fuseless capacitors
5.1 General

The proof of element fail safe is a design test applicable to fuseless power capacitors, as

defined in IEC 60871-1:2014, Clause E.4.

This proof is obtained by means of two separate tests, the low energy test and the high energy


The low energy test is aimed to demonstrate that a failure of one capacitive element, caused

by a low voltage element failure event at the rated voltage, will result in reliable and secure foil

welding on the failed portion of the element without generation of hot spots and persistent

release of gas.

The high energy test is aimed to demonstrate that a failure of one or more capacitive elements,

caused by the occurrence of an overvoltage on the capacitor bank, will result in reliable and

safe behaviour without container rupture or explosion.

The physical location of the fault on the capacitor element is intended to represent the worst

possible location under the expected low or high energy level tested. A damage to the insulation

of the container is acceptable, provided that it maintains enough insulation in order to remain

in service until replacement.
5.2 Test unit
5.2.1 General

Two set-ups of the test unit are possible, as described in 5.2.2 and 5.2.3; the manufacturer

shall choose the set-up and manufacture the test unit accordingly.
5.2.2 Set-up of the test unit, first method

The test unit shall be a capacitor unit comparable to the units to be manufactured, as described

in Annex A, with the following features:

• The container shall be identical to that used for the units to be manufactured.

• The test unit shall contain a single active element, i.e. electrically connected to the bushings

for power supply; the other elements shall be passive, i.e. not electrically connected neither

to the active element nor to the bushings.
• The unit may be equipped

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