IEC 60825-1:2014
(Main)Safety of laser products - Part 1: Equipment classification and requirements
Safety of laser products - Part 1: Equipment classification and requirements
IEC 60825-1:2014 is applicable to safety of laser products emitting laser radiation in the wavelength range 180 nm to 1 mm. A laser product may consist of a single laser with or without a separate power supply or may incorporate one or more lasers in a complex optical, electrical, or mechanical system. Typically, laser products are used for demonstration of physical and optical phenomena, materials processing, data reading and storage, transmission and display of information, etc. Such systems have found use in industry, business, entertainment, research, education, medicine and consumer products. Laser products that are sold to other manufacturers for use as components of any system for subsequent sale are not subject to IEC 60825-1, since the final product will itself be subject to this standard. Laser products that are sold by or for manufacturers of end products for use as repair parts for the end products are also not subject to IEC 60825-1. However, if the laser system within the laser product is operable when removed from the end product, the requirements of this Part 1 apply to the removable laser system. The objectives of this part of IEC 60825 are:
- to introduce a system of classification of lasers and laser products emitting radiation in the wavelength range 180 nm to 1 mm according to their degree of optical radiation hazard in order to aid hazard evaluation and to aid the determination of user control measures;
- to establish requirements for the manufacturer to supply information so that proper precautions can be adopted;
- to ensure, through labels and instructions, adequate warning to individuals of hazards associated with accessible radiation from laser products; and
- to reduce the possibility of injury by minimizing unnecessary accessible radiation and to give improved control of the laser radiation hazards through protective features. This edition includes the following significant technical changes with respect to the previous edition:
- a new class, Class 1C, was introduced;
- the measurement condition 2 ("eye loupe" condition) was removed;
- a classification of the emission of laser products below a certain radiance level that are intended to be used as replacement for conventional light sources can, as an option, be based on the IEC 62471 series;
- and the accessible emission limits (AELs) for Class 1, 1M, 2, 2M and 3R of pulsed sources, particularly of pulsed extended sources, were updated to reflect the latest revision of the ICNIRP guidelines on exposure limits (accepted for publication in Health Physics Journal 2013, see also www.icnirp.org).
The contents of the Interpretation sheet 1 and 2 of December 2017 have been included in this copy.
Sécurité des appareils à laser - Partie 1: Classification des matériels et exigences
L'IEC 60825-1:2014 s'applique à la sécurité des appareils à laser émettant un rayonnement laser dans la gamme des longueurs d'ondes de 180 nm à 1 mm. Un appareil à laser peut se composer d'un seul laser avec ou sans dispositif d'alimentation séparé, ou bien il peut comporter un ou plusieurs lasers dans un système complexe optique, électrique ou mécanique. Les appareils à laser sont généralement utilisés pour la démonstration des phénomènes physiques et optiques, le travail des matériaux, la lecture et le stockage des données, la transmission et la visualisation de l'information, etc. De tels systèmes sont utilisés dans l'industrie, le commerce, le spectacle, la recherche, l'enseignement, la médecine et les produits de consommation. Les appareils à laser qui sont vendus à d'autres fabricants pour être utilisés en tant que composants d'un matériel quelconque destiné à une vente ultérieure ne sont pas soumis à l'IEC 60825-1, étant donné que l'appareil final est lui-même soumis à la présente norme. Les appareils à laser qui sont vendus par des fabricants ou à d'autres fabricants de produits finis, pour être utilisés en tant que pièces de rechange pour les produits finis ne sont pas couverts par l'IEC 60825-1. Cependant, si le système à laser dans l'appareil à laser est utilisable lorsqu'il est ôté de cet appareil, les exigences de la présente Partie 1 s'appliquent à ce système à laser amovible. La présente partie de l'IEC 60825 répond aux objectifs suivants:
- introduire un système de classification des lasers et des appareils à laser émettant un rayonnement dans la gamme des longueurs d'ondes de 180 nm à 1 mm, selon leur degré de danger de rayonnement optique, afin de faciliter l'évaluation des dangers et la détermination des mesures de contrôle des utilisateurs;
- établir des exigences pour que le fabricant fournisse des informations, de telle sorte que des précautions adéquates puissent être adoptées;
- assurer aux personnes, par des étiquetages et des instructions, une mise en garde appropriée contre les dangers associés au rayonnement accessible des appareils à laser;
- et diminuer la possibilité d'accident en réduisant au minimum le rayonnement accessible non utile, et procurer un meilleur contrôle des dangers liés au rayonnement laser par des procédures de protection. Cette troisième édition de l'IEC 60825-1 annule et remplace la deuxième édition publiée en 2007. Elle constitue une révision technique. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente:
- une nouvelle classe, Classe 1C, a été introduite;
- la condition de mesure 2 (condition "loupe") a été supprimée;
- la classification de l'émission des appareils à laser en deçà d'un certain niveau de radiance qui sont prévus pour être utilisés en remplacement des sources de lumière conventionnelles peut éventuellement se faire sur la base de la série IEC 62471;
- et les limites d'émission accessible (LEA) des classes 1, 1M, 2, 2M et 3R concernant les lasers à impulsions, essentiellement les sources étendues, ont été actualisées pour prendre en compte la dernière révision des recommandations de l'ICNIRP (document accepté pour publication dans le journal Health Physics en 2013, voir également www.icnirp.org).
Le contenu des feuilles d'interprétation 1 et 2 de décembre 2017 a été pris en considération dans cet exemplaire.
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IEC 60825-1 ®
Edition 3.0 2014-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
GROUP SAFETY PUBLICATION
PUBLICATION GROUPÉE DE SÉCURITÉ
Safety of laser products –
Part 1: Equipment classification and requirements
Sécurité des appareils à laser –
Partie 1: Classification des matériels et exigences
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IEC 60825-1 ®
Edition 3.0 2014-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
GROUP SAFETY PUBLICATION
PUBLICATION GROUPÉE DE SÉCURITÉ
Safety of laser products –
Part 1: Equipment classification and requirements
Sécurité des appareils à laser –
Partie 1: Classification des matériels et exigences
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX XE
ICS 13.110; 31.260 ISBN 978-2-8322-1499-2
IEC 2017
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
IEC 60825-1
Edition 3.0 2014-05
SAFETY OF LASER PRODUCTS –
Part 1: Equipment classification and requirements
INTERPRETATION SHEET 1
This interpretation sheet has been prepared by IEC technical committee 76: Optical radiation
safety and laser equipment.
The text of this interpretation sheet is based on the following documents:
FDIS Report on voting
76/587/FDIS 76/593/RVD
Full information on the voting for the approval of this interpretation sheet can be found in the
report on voting indicated in the above table.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
___________
Subclause 4.3 Classification rules
This subclause is clarified by the following:
Introduction
For some complex extended sources or irregular temporal emissions, the application of the
rules of subclause 4.3 may require clarification because of changes from IEC 60825-1:2007.
NOTE 1 For the purpose of this interpretation sheet, the abbreviation “AE” is used for “accessible emission”.
NOTE 2 The clarifications also apply in an equivalent way to MPE analysis, i.e. for Annex A.
ICS 13.110; 31.260
– 2 – IEC 60825-1:2014/ISH1:2017
IEC 2017
1 Subclause 4.3 b) Radiation of multiple wavelengths
See IEC 60825-1:2014/ISH2.
2 Subclause 4.3 c) Radiation from extended sources
When using the default (simplified) evaluation method (subclause 5.4.2) for wavelengths
≥ 400 nm and < 1 400 nm, the angle of acceptance may be limited to 100 mrad for
determining the accessible emission to be compared against the accessible emission limit,
except in the wavelength range 400 nm to 600 nm for durations longer than 100 s where the
circular-cone angle of acceptance is not limited. When evaluating the emissions for
comparison to the Class 3B AELs, the angle of acceptance is not limited.
3 Subclause 4.3 d) Non-uniform, non-circular or multiple apparent sources
In subclause 4.3 d), for comparison with the thermal retinal limits, the requirement to vary the
angle of acceptance in each dimension might appear to contradict the labelling in Figure 1
and Figure 2 of subclause 5.4.3 where the field stop is labelled as circular.
Interpretation
A circular field stop is applicable for circularly symmetric images of the apparent source and
for this case is consistent with the procedure given in subclause 4.3 d). For images of the
apparent source that are not circularly symmetric, the simple example below clarifies the
application of subclause 4.3 d).
A circular field stop with an angular subtense equal to α is, however, applicable for non-
max
circularly symmetric profiles if the analysis performed according to subclause 4.3 d), following
variation of the angle of acceptance in each dimension, results in a solution which is equal to
α in both dimensions.
max
As a general principle, for whatever emission duration t the AEL is determined (such as the
pulse duration, the pulse group duration or the time base for averaging of the power), the
same emission duration t is also used to calculate α (t).
max
The following example demonstrates the method described in subclause 4.3 d) to analyse
irregular or complex images of a source. It is noted that the example is equivalent to the
second part of the example (“Additional Remarks”; 6 mrad spacing instead of 3 mrad) B.9.1 of
IEC TR 60825-14:2004 (however, for 6 mrad element spacing, the result in terms of which
grouping is critical was not correct). The source is a diode array (Figure 1). The task is to
determine the applicable AEL that limits the AE for Class 2. Each diode contributes a partial
accessible emission AE of 1 mW that passes through a 7 mm aperture stop at the distance
where the analysis is performed (i.e. a total power of 20 mW passes through the aperture
stop), and the emission is continuous wave. The analysis requires determination of the most
restrictive (maximum) ratio of AE over AEL by variation of the angle of acceptance in position
and size to achieve different fields of view.
IEC 2017
α = γ
x1 x1
6 mrad
α = γ
x2 x2
2,8 mrad
α = γ
α = γ
y2 y2
y1 y1
2,2 mrad
IEC
Figure 1 – Image of a source pattern for the example of 20 emitters. Two possible
groupings are defined by the respective angle of acceptance γ and γ
x y
The analysis of a sub-group of sources is associated with a certain value of α for that group,
and a certain accessible emission associated with that sub-group. For instance α of a single
element equals (1,5 mrad + 2,2 mrad)/2 = 1,85 mrad so that the AEL = 1,23 mW. The
applicable AE = 1 mW and AE/AEL = 1 mW/1,23 mW = 0,8. For a vertical two-element group,
as shown in the figure with γ and γ , α = (2,8 + 2,2)/2 = 2,5 mrad so that AEL = 1,66 mW;
x1 y1
AE = 2 × 1 mW = 2 mW and AE/AEL = 1,2, which is more restrictive than AE/AEL for only one
element. For one row of 10 diodes α = (1,5 + 56,2)/2 = 28,9 mrad, AEL = 19,2 mW, the AE =
10 × 1 mW = 10 mW and AE/AEL = 0,5. Analysis of all possible groupings shows that the
vertical two-element group has the maximum AE/AEL and therefore is the solution of the
analysis. This means that the AEL of Class 2 is exceeded by a factor 1,2. Note that only a
portion of the power of 20 mW that passes through the 7 mm aperture stop is considered as
the AE (2 mW; as partial power within the angle of acceptance that is associated to the part of
the image with the maximum ratio of AE/AEL) that is compared against the AEL. The entire
array represents the highest ratio of AE/AEL in cases where the element spacing is
sufficiently close, e.g. when the contributions of extra elements to the AE are not dominated
by the increased AEL due to the larger subtended angle.
For pulsed emission, for the determination of α according to the above method (4.3 d)) where
the ratio of AE to AEL is maximized, requirement 3) of 4.3 f) is not applied, i.e. the AEL is
single
not reduced by C . Due to the dependence of α on emission duration t, the analysis of the
5 max
image of the apparent source may result in different values of α and of the partial accessible
emission, depending which emission duration is analysed for the requirements of 4.3 f). For
example, for emission durations shorter than 625 µs (α = 5 mrad), the maximum partial
max
array to consider in the image analysis is a vertical two element group.
Ref.: Classification of extended source products according to IEC 60825-1, K. Schulmeister,
ILSC 2015 Proceedings Paper, p 271 – 280; Download:
https://www.filesanywhere.com/fs/v.aspx?v=8b70698a595e75bcaa69
4 Subclause 4.3 f) 3) determination of α
For an analysis of pulsed emission, α , which is a function of time α (t), limits both the
max max
value of α for the determination of C (α) as well as the angle of acceptance γ for the
determination of the accessible emission (see 4.3 c) and d)) and Clause 3 of this
interpretation sheet; in this process, α (t) is determined for the same emission duration t
max
that is used to determine AEL(t) (i.e. the pulse duration or the pulse group duration for
α is
4.3 f) 3) and the averaging duration for 4.3 f) 2), respectively). However, the parameter
also used in subclause 4.3 f) 3) in the criteria which C is applied. For these criteria, the
parameter α is not limited in the same way as for the determination of C according to 4.3 d).
For the criterion “Unless α > 100 mrad”, the angular subtense of the apparent source α is not
restricted by α . For non-uniform (oblong, rectangular, or linear) sources, the inequality
max
needs to be satisfied by both angular d
...
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