IEC 60747-14-12:2026
(Main)Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors
- Abstract
IEC 60747-14-12:2026 specifies the performance test methods for CMOS imager-based gas sensors. It includes the terms and definitions, the test environmental conditions, the test system, the test methods, and the test report. This document is applicable to the performance test of both CMOS gas sensors based on lens-free imaging and CMOS gas sensors based on lens imaging.
- Status
- Published
- Publication Date
- 03-Nov-2026
- Technical Committee
- SC 47E - Discrete semiconductor devices
- Drafting Committee
- WG 1 - TC 47/SC 47E/WG 1
- Current Stage
- PPUB - Publication issued
- Start Date
- 04-Nov-2026
- Completion Date
- 27-Nov-2026
Frequently Asked Questions
IEC 60747-14-12:2026 is a standard published by the International Electrotechnical Commission (IEC). Its full title is "Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors". This standard covers: IEC 60747-14-12:2026 specifies the performance test methods for CMOS imager-based gas sensors. It includes the terms and definitions, the test environmental conditions, the test system, the test methods, and the test report. This document is applicable to the performance test of both CMOS gas sensors based on lens-free imaging and CMOS gas sensors based on lens imaging.
IEC 60747-14-12:2026 specifies the performance test methods for CMOS imager-based gas sensors. It includes the terms and definitions, the test environmental conditions, the test system, the test methods, and the test report. This document is applicable to the performance test of both CMOS gas sensors based on lens-free imaging and CMOS gas sensors based on lens imaging.
IEC 60747-14-12:2026 is classified under the following ICS (International Classification for Standards) categories: 31.080.01 - Semiconductor devices in general. The ICS classification helps identify the subject area and facilitates finding related standards.
IEC 60747-14-12:2026 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
IEC 60747-14-12 ®
Edition 1.0 2026-11
INTERNATIONAL
STANDARD
Semiconductor devices -
Part 14-12: Semiconductor sensors - Performance test methods for CMOS
imager-based gas sensors
ICS 31.080.01 ISBN 978-2-8327-1587-1
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CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
3.1 General terms . 6
3.2 Performance parameters . 7
4 Test environmental conditions . 7
5 Test system . 8
5.1 General . 8
5.2 Gas flowmeter . 8
5.3 Gas chamber . 9
5.4 Image storage device . 9
5.5 Image analysis system. 9
6 Test methods . 9
6.1 Preparation before test . 9
6.2 Sensitivity test . 9
6.2.1 General . 9
6.2.2 Test procedure . 9
6.2.3 Data analysis . 10
6.3 Limit of detection test . 10
6.3.1 General . 10
6.3.2 Test procedure . 10
6.3.3 Data analysis . 11
6.4 Selectivity test . 11
6.4.1 General . 11
6.4.2 Test procedure . 11
6.4.3 Data analysis . 11
6.5 Response time test . 12
6.5.1 General . 12
6.5.2 Test procedure . 12
6.5.3 Data analysis . 12
6.6 Repeatability test . 13
6.6.1 General . 13
6.6.2 Test procedure . 13
6.6.3 Data analysis . 14
6.7 Stability test . 14
6.7.1 General . 14
6.7.2 Test procedure . 14
6.7.3 Data analysis . 15
7 Test report . 15
Annex A (informative) Principle and type of CMOS imager-based gas sensor . 16
A.1 Principle . 16
A.2 Type . 16
Annex B (informative) Test report template . 18
Bibliography . 19
Figure 1 – Schematic diagram of the performance test system for CMOS imager-based gas sensors . 8
Figure 2 – Schematic diagram of the 𝐼𝐼P−𝑐𝑐 curve . 10
Figure 3 – Schematic diagram of the curve of response time . 13
Figure A.1 – Structure schematic diagram of CMOS imager-based gas sensor using lensless imaging . 16
Figure A.2 – Structure schematic diagram of CMOS imager-based gas sensor using lens imaging . 17
Table B.1 – Test report . 18
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
Semiconductor devices -
Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-
based gas sensors
FOREWORD
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IEC 60747-14-12 has been prepared by subcommittee 47E: Discrete semiconductor devices, of IEC
technical committee 47: Semiconductor devices. It is an International Standard.
The text of this International Standard is based on the following documents:
Draft Report on voting
47E/906/FDIS 47E/910/RVD
Full information on the voting for its approval can be found in the report on voting indicated in the above
table.
The language used for the development of this International Standard is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in accordance
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A list of all parts in the IEC 60747 series, published under the general title Semiconductor devices, can be
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INTRODUCTION
Gas sensors play a crucial role in various areas, including environmental monitoring, healthcare monitoring,
leakage and exposure detection, and so on. In the era of intelligence, gas sensors are evolving towards
miniaturization, low power consumption, multiplexing, and smart features. CMOS imager-based gas
sensors are at the forefront of this trend, enabling high-density integration and parallel reading of sensing
units. This makes them easily integratable and suitable for intelligent applications, aligning with the future
development direction. These sensors can be applied to environmental monitoring, breath analysis, food
detection, and other fields.
The key parameters of a gas sensor can reflect its performance, such as sensitivity, limit of detection, and
so on. Standards are crucial to specify the test methods of sensor performance and regulate the procedure
and data analysis during the development, productions and delivery acceptance.
IEC 60747-14-12 specifies the performance test methods of CMOS imager-based gas sensors, which
includes the test methods of sensitivity, limit of detection, selectivity, response time, repeatability, and
stability.
1 Scope
This part of IEC 60747 specifies the performance test methods for CMOS imager-based gas sensors. It
includes the terms and definitions, the test environmental conditions, the test system, the test methods,
and the test report. This document is applicable to the performance test of both CMOS gas sensors based
on lens-free imaging and CMOS gas sensors based on lens imaging.
2 Normative references
There are no normative references in this document.
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminology databases for use in standardization at the following addresses:
– IEC Electropedia: available at https://www.electropedia.org/
– ISO Online browsing platform: available at https://www.iso.org/obp
3.1 General terms
3.1.1
zero gas
gas or gas mixture with sufficiently low content of the component(s) of interest, used to produce the zero
response of a gas sensor for a given range of content
[SOURCE: ISO 7504:2015 [1], 5.6, modified – The terms "a given instrument" were changed to "gas
sensor".]
3.1.2
target gas
test object of the gas sensor, which is a type of gas or gas mixture with a certain concentration of a kind of
component of interest, used to test the performance of the gas sensor
Note 1 to entry: Gas concentration is expressed as a volume fraction.
3.1.3
sensing unit
sensing area formed by a material that reacts when in contact with a specific gas
3.1.4
pixel value
value of R channel, or G channel, or B channel, or gray value of a pixel
3.1.5
sensing unit value
average of the pixel value covered by a sensing unit in an image
3.1.6
average sensing unit value
average sensing unit value of specified frames of images
3.1.7
stable state
state in which the fluctuation value of the sensing unit value is less than 3 % within 1 minute, with at least
10 images captured
Note 1 to entry: Fluctuation value is the standard deviation of the sensing unit value divided by the average sensing unit value.
3.2 Performance parameters
3.2.1
sensitivity
S
ratio of the change of sensing unit value to the concentration of the target gas
3.2.2
limit of detection
LOD
smallest reliable measurable concentration of the target gas (3.1.2) that the gas sensor is a
...



