ISO/IEC 10373-6:2011/FDAmd 6

Identification cards - Test methods - Part 6: Proximity cards - Amendment 6: Alternating between PICC and PCD functionalities, and PICC supporting both types

Cartes d'identification — Méthodes d'essai — Partie 6: Cartes de proximité — Amendement 6: Alternance entre fonctionnalités PICC et PCD, et PICC supportant les deux types

General Information

• Status: Withdrawn
• ICS: 35.240.15 - Identification cards. Chip cards. Biometrics
• Technical Committee: ISO/IEC JTC 1/SC 17 - Cards and security devices for personal identification
• Drafting Committee: ISO/IEC JTC 1/SC 17/WG 8 - Integrated circuit cards without contacts
• Current Stage: 5098 - Project deleted
• Start Date: 10-Mar-2014
• Completion Date: 30-Oct-2025

Relations

• Replaced By: ISO/IEC 10373-6:2016 - Identification cards - Test methods - Part 6: Proximity cards
• Effective Date: 21-Nov-2015
• Amends: ISO/IEC 10373-6:2011 - Identification cards - Test methods - Part 6: Proximity cards
• Effective Date: 07-Aug-2021

Standards Content (Sample)

FINAL
ISO/IEC
AMENDMENT
DRAFT
10373-6:2011
FDAM 6
ISO/IEC JTC 1/SC 17
Identification cards — Test methods —
Secretariat: BSI
Voting begins on:
Part 6:
2013-11-08
Proximity cards
Voting terminates on:
2014-01-08
AMENDMENT 6: Alternating between
PICC and PCD functionalities, and PICC
supporting both types
Cartes d’identification — Méthodes d’essai —
Partie 6: Cartes de proximité
AMENDEMENT 6: Alternance entre fonctionnalités PICC et PCD, et
PICC supportant les deux types
RECIPIENTS OF THIS DRAFT ARE INVITED TO
SUBMIT, WITH THEIR COMMENTS, NOTIFICATION
OF ANY RELEVANT PATENT RIGHTS OF WHICH
THEY ARE AWARE AND TO PROVIDE SUPPOR TING
DOCUMENTATION.
IN ADDITION TO THEIR EVALUATION AS
Reference number
BEING ACCEPTABLE FOR INDUSTRIAL, TECHNO-
ISO/IEC 10373-6:2011/FDAM 6:2013(E)
LOGICAL, COMMERCIAL AND USER PURPOSES,
DRAFT INTERNATIONAL STANDARDS MAY ON
OCCASION HAVE TO BE CONSIDERED IN THE
LIGHT OF THEIR POTENTIAL TO BECOME STAN-
DARDS TO WHICH REFERENCE MAY BE MADE IN
©
NATIONAL REGULATIONS. ISO/IEC 2013

ISO/IEC 10373-6:2011/FDAM 6:2013(E)

© ISO/IEC 2013
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form
or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior
written permission. Permission can be requested from either ISO at the address below or ISO’s member body in the country of
the requester.
ISO copyright office
Case postale 56 • CH-1211 Geneva 20
Tel. + 41 22 749 01 11
Fax + 41 22 749 09 47
E-mail [e-mail]
Web www.iso.org
Published in Switzerland
ii © ISO/IEC 2013 – All rights reserved

ISO/IEC 10373-6:2011/FDAM 6:2013(E)

Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are
members of ISO or IEC participate in the development of International Standards through technical
committees established by the respective organization to deal with particular fields of technical
activity. ISO and IEC technical committees collaborate in fields of mutual interest. Other international
organizations, governmental and non-governmental, in liaison with ISO and IEC, also take part in the
work. In the field of information technology, ISO and IEC have established a joint technical committee,
ISO/IEC JTC 1.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of the joint technical committee is to prepare International Standards. Draft International
Standards adopted by the joint technical committee are circulated to national bodies for voting.
Publication as an International Standard requires approval by at least 75 % of the national bodies
casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights.
Amendment 6 to ISO/IEC 10373-6:2011 was prepared by Joint Technical Committee ISO/IEC JTC 1,
Information technology, Subcommittee SC 17, Cards and personal identification.
© ISO/IEC 2013 – All rights reserved iii

ISO/IEC 10373-6:2011/FDAM 6:2013(E)
Identification cards — Test methods —
Part 6:
Proximity cards
AMENDMENT 6: Alternating between PICC and PCD
functionalities, and PICC supporting both types
Page 1, Clause 1
Replace first sentence of last paragraph with:
This part of ISO/IEC 10373 defines test methods which are specific to proximity cards and objects,
proximity coupling devices and proximity extended devices, defined in ISO/IEC 14443-1:2008,
ISO/IEC 14443-2:2010, ISO/IEC 14443-3:2011 and ISO/IEC 14443-4:2008.
Page 14, Clause 6
Add new subclause 6.3 at the end of Clause 6:
6.3 PXD tests
PCD and PICC tests shall be applied as follows:
— when the PXD is in PCD Mode, tests defined in 6.1 shall be applied;
— when the PXD is in PICC Mode, tests defined in 6.2 shall be applied.
NOTE In automatic mode alternation the PXD may be forced into the required mode.
Page 22, Clause 7
Add new subclause 7.3 at the end of Clause 7:
7.3 PXD tests
PCD and PICC tests shall be applied as follows:
— when the PXD is in PCD Mode, tests defined in 7.1 shall be applied;
— when the PXD is in PICC Mode, tests defined in 7.2 shall be applied.
NOTE In automatic mode alternation the PXD may be forced into the required mode.
Page 22, Clause 8
Add new subclause 8.3 at the end of Clause 8:
8.3 PXD tests
8.3.1 PCD and PICC Modes
PCD and PICC tests shall be applied as follows:
— when the PXD is in PCD Mode, tests defined in 8.1 shall be applied;
© ISO/IEC 2013 – All rights reserved 1

ISO/IEC 10373-6:2011/FDAM 6:2013(E)

— when the PXD is in PICC Mode, tests defined in 8.2 shall be applied.
NOTE In automatic mode alternation the PXD may be forced into the required mode.
8.3.2 Automatic mode alternation
The tests defined in this subclause apply only to PXD supporting automatic mode alternation.
One cycle is defined as the duration between two consecutive beginnings of PCD Mode (RF field on).
8.3.2.1 PCD Mode and PICC Mode alternation cycle
8.3.2.1.1 Purpose
This test checks that:
— each cycle does not last longer than t ,
cyc
— in each cycle, the PICC Mode lasts longer than PCD Mode,
— the PICC Mode duration varies randomly and differs by at least t .
diff
8.3.2.1.2 Test conditions
The PXD should not be in close proximity to another PXD, PCD or PICC.
8.3.2.1.3 Test procedure
The RF field of the PXD shall be monitored and evaluated for at least 10 consecutive cycles.
a) Ensure that the PXD is in automatic Mode alternation.
b) Measure all RF field on and RF field off durations.
8.3.2.1.4 Test Report
The test result is PASS if all the following conditions are met:
— no cycle lasts more than t ,
cyc
— for each t the PICC Mode duration (RF field off) is longer than the PCD Mode duration (RF field on),
cyc
— the PICC Mode durations vary,
— the minimum and maximum PICC Mode durations differ by at least t ,
diff
otherwise the test result is FAIL.
NOTE 1 The appreciation of the randomness of the PICC Mode duration may be done with common
statistical methods.
NOTE 2 Due to statistical reasons the test result may be FAIL and the test may be repeated.
8.3.2.2 PCD Mode
8.3.2.2.1 Polling
2 © ISO/IEC 2013 – All rights reserved

ISO/IEC 10373-6:2011/FDAM 6:2013(E)

8.3.2.2.1.1 Purpose
This test checks that the PXD in automatic mode alternation polls for Type A and Type B PICCs as defined
in ISO/IEC 14443-3:2011, 5.1 in each cycle of PCD
...