SIST-TP CLC/R217-001:2004
(Main)Basic information on submicron CMOS technology assessment flow
Basic information on submicron CMOS technology assessment flow
D116/196: TC 217 disbanded * D122/065: Withdrawn
Osnovne informacije o poteku ocenjevanja podmikromilimetrske (submikronske) tehnologije CMOS
General Information
Standards Content (Sample)
SLOVENSKI SIST-TP CLC/R217-001:2004
STANDARD
september 2004
Osnovne informacije o poteku ocenjevanja podmikromilimetrske
(submikronske) tehnologije CMOS
Basic information on submicron CMOS technology assessment flow
ICS 31.200 Referenčna
...
This May Also Interest You
- Corrigendum5 pagesEnglish languagesale 10% offe-Library read for×1 day
IEC 61967-8:2023 is available as IEC 61967-8:2023 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 61967-8:2023 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. This edition includes the following significant technical changes with respect to the previous edition:
a) frequency range of 150 kHz to 3 GHz was deleted from the scope;
b) extension of upper usable frequency to 6 GHz or higher as long as the defined requirements are fulfilled.
- Standard20 pagesEnglish languagesale 10% offe-Library read for×1 day
- Draft17 pagesEnglish languagesale 10% offe-Library read for×1 day
- 20-Oct-2022
- 17-Aug-2023
- 31.200
- 2014/30/EU
- I11
This part of IEC 60747 specifies the terminology, essential ratings and characteristics, and measuring methods of microwave integrated circuit limiters.
- Standard39 pagesEnglish languagesale 10% offe-Library read for×1 day
This part of IEC 60747 specifies the terminology, essential ratings and characteristics, and measuring methods of microwave integrated circuit attenuators.
- Standard44 pagesEnglish languagesale 10% offe-Library read for×1 day
This document specifies test and measurement methods for EMC evaluation of Peripheral Sensor Interface 5 (PSI5) transceiver integrated circuits (ICs) under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for PSI5 satellite ICs (e.g. sensors) and ICs with embedded PSI5 transceivers (e.g. PSI5 Electronic control unit IC). The document covers
- the emission of RF disturbances,
- the immunity against RF disturbances,
- the immunity against impulses and
- the immunity against electrostatic discharges (ESD).
- Standard52 pagesEnglish languagesale 10% offe-Library read for×1 day
- Draft42 pagesEnglish languagesale 10% offe-Library read for×1 day
This part of IEC 62228 specifies test and measurement methods for the EMC evaluation of CXPI transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. This specification is applicable for standard CXPI transceiver ICs and ICs with embedded CXPI transceiver and covers
- the emission of RF disturbances,
- the immunity against RF disturbances,
- the immunity against impulses and
- the immunity against electrostatic discharges (ESD).
- Standard52 pagesEnglish languagesale 10% offe-Library read for×1 day
This part of IEC 62228 specifies test and measurement methods for EMC evaluation of Ethernet
transceiver ICs under network condition. It defines test configurations, test conditions, test
signals, failure criteria, test procedures, test setups and test boards. It is applicable for
transceiver of the Ethernet systems
• 100BASE-T1 according to ISO/IEC/IEEE 8802-3/AMD1;
• 100BASE-TX according to ISO/IEC/IEEE 8802-3;
• 1000BASE-T1 according to ISO/IEC/IEEE 8802-3/AMD4
and covers
• the emission of RF disturbances;
• the immunity against RF disturbances;
• the immunity against impulses;
• the immunity against electrostatic discharges (ESD).
- Standard112 pagesEnglish languagesale 10% offe-Library read for×1 day
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission
(EME) of integrated circuits by direct radio frequency (RF) current measurement with a
1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These
methods ensure a high degree of reproducibility and correlation of EME measurement results.
- Standard46 pagesEnglish languagesale 10% offe-Library read for×1 day
The objective of this part of IEC 62433 is to describe the extraction flow for deriving an
immunity macro-model of an Integrated Circuit (IC) against conducted Electrostatic Discharge
(ESD) according to IEC 61000-4-2 and Electrical Fast Transients (EFT) according to
IEC 61000-4-4.
The model addresses physical damages due to overvoltage, thermal damage and other failure
modes. Functional failures can also be addressed.
This model allows the immunity simulation of the IC in an application. This model is commonly
called "Integrated Circuit Immunity Model Conducted Pulse Immunity", ICIM-CPI.
The described approach is suitable for modelling analogue, digital and mixed-signal ICs.
Several terminals of an IC can be part of a single model (e.g. input, output and supply pins).
The implementation of the model is capable of representing the non-linear behaviour of
overvoltage protection circuits.
The model can be implemented for the use in different software tools for circuit simulation in
time-domain. The described modelling approach allows simulating device failure due to ESD
or EFT at component and system level considering all components necessary for the immunity
simulation of an IC, such as a PCB or external protection elements.
This document demonstrates, in detail, the construction of models in a defined XML-based
format which is suitable for the exchange of models without any deeper knowledge of the
semiconductor circuit. However, the model functionality can be implemented in different
formats including, but not limited to, tables, SPICE[1] 1 netlists, hardware description
languages such as VHDL-AMS [2] and Verilog-AMS [3].
This document provides:
• the description of ICIM-CPI macro-model elements representing electrical, thermal or
logical behaviour of the IC.
• a universal data exchange format based on XML.
- Standard58 pagesEnglish languagesale 10% offe-Library read for×1 day
The contents of the corrigendum of September 2020 have been included in this copy.
- Amendment9 pagesEnglish languagesale 10% offe-Library read for×1 day
Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.