SIST EN 61000-4-5:2007

Electromagnetic compatibility (EMC) -- Part 4-5: Testing and measurement techniques - Surge immunity test

This part of IEC 61000 relates to the immunity requirements, test methods, and range of recommended test levels for equipment to unidirectional surges caused by overvoltages from switching and lightning transients. Several test levels are defined which relate to different environment and installation conditions. These requirements are developed for and are applicable to electrical and electronic equipment. The object of this standard is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to surges. The test method documented in this part of IEC 61000 describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon. This standard defines: - a range of test levels; - test equipment; - test setups; - test procedures. The task of the described laboratory test is to find the reaction of the EUT under specified operational conditions, to surge voltages caused by switching and lightning effects at certain threat levels. It is not intended to test the capability of the EUT's insulation to withstand high-voltage stress. Direct injections of lightning currents, i.e, direct lightning strikes, are not considered in this standard.

Elektromagnetische Verträglichkeit (EMV) -- Teil 4-5: Prüf- und Messverfahren - Prüfung der Störfestigkeit gegen Stoßspannungen

Compatiblité électromagnétique (CEM) -- Partie 4-5: Techniques d'essai et de mesure - Essai d'immunité aux ondes de choc

Se rapporte aux exigences d'immunité pour les matériels, aux méthodes d'essai et à la gamme des niveaux d'essai recommandés, vis-à-vis des ondes de choc unidirectionnelles provoquées par des surtensions dues aux transitoires de foudre et de man uvres. Elle définit plusieurs niveaux d'essai se rapportant à différentes conditions d'environnement et d'installation. Ces exigences sont développées pour les matériels électrique et électronique et leur sont applicables. Cette norme a pour objet d'établir une référence commune dans le but d'évaluer l'immunité des matériels électriques et électroniques, quand ils sont soumis à des ondes de choc. La méthode d'essai documentée dans cette partie de la CEI 61000 décrit une méthode logique en vue d'évaluer l'immunité d'un équipement ou d'un système vis-à-vis d'un phénomène donné. Cette norme définit: - une gamme de niveaux d'essai; - le matériel d'essai; - les montages d'essai; - les procédures d'essai. L'essai de laboratoire décrit ici a pour but de déterminer la réaction de l'EST, dans des conditions opérationnelles spécifiées, aux surtensions d'origine atmosphérique ou dues à des man uvres, pour certains niveaux de menace. Il n'est pas destiné à évaluer la capacité de l'isolation à supporter des tensions élevées. Les injections directes de courants de foudre, par exemple les coups de foudre directs, ne sont pas prises en compte par cette norme. Cette norme a le statut de publication fondamentale en CEM en accord avec le Guide 107 de la CEI.

Elektromagnetna združljivost (EMC) - 4-5. del: Preskusne in merilne tehnike - Preskus odpornosti proti napetostnemu udaru (IEC 61000-4-5:2005)

General Information

• Status: Withdrawn
• Publication Date: 17-Jul-2007
• Withdrawal Date: 18-May-2017
• ICS: 33.100.20 - Immunity
• Technical Committee: EMC - Electromagnetic compatibility
• Current Stage: 9900 - Withdrawal (Adopted Project)
• Start Date: 18-May-2017
• Due Date: 10-Jun-2017
• Completion Date: 19-May-2017
• Directive: 89/336/EEC - Electromagnetic compatibility (EMC)
• Ref Project: EN 61000-4-5:2006 - Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test

Relations

• Replaced By: SIST EN 61000-4-5:2014 - Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test
• Effective Date: 28-Jan-2023
• Replaces: SIST EN 61000-4-5:1997 - Electromagnetic compatibility (EMC) -- Part 4-5: Testing and measurement techniques - Surge immunity test
• Effective Date: 01-Mar-2007
• Replaces: SIST EN 61000-4-5:1997/A1:2002 - Electromagnetic compatibility (EMC) -- Part 4-5: Testing and measurement techniques - Surge immunity test
• Effective Date: 01-Mar-2007
• Replaces: SIST EN 61000-4-5:1997/A1:2002 - Electromagnetic compatibility (EMC) -- Part 4-5: Testing and measurement techniques - Surge immunity test
• Effective Date: 29-Jan-2023
• Replaces: SIST EN 61000-4-5:1997 - Electromagnetic compatibility (EMC) -- Part 4-5: Testing and measurement techniques - Surge immunity test
• Effective Date: 29-Jan-2023
• Replaced By: SIST EN 61000-4-5:2014 - Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test
• Effective Date: 01-Nov-2014
• Replaces: SIST EN 61000-4-5:1997/A1:2002 - Electromagnetic compatibility (EMC) -- Part 4-5: Testing and measurement techniques - Surge immunity test
• Effective Date: 07-Jun-2022
• Replaces: SIST EN 61000-4-5:1997 - Electromagnetic compatibility (EMC) -- Part 4-5: Testing and measurement techniques - Surge immunity test
• Effective Date: 07-Jun-2022

Standards Content (Sample)

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3UHVNXVRGSRUQRVWLSURWLQDSHWRVWQHPXXGDUX,(&
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---------------------- Page: 1 ----------------------

EUROPEAN STANDARD
EN 61000-4-5

NORME EUROPÉENNE
November 2006
EUROPÄISCHE NORM

ICS 33.100.20 Supersedes EN 61000-4-5:1995 + A1:2001


English version


Electromagnetic compatibility (EMC)
Part 4-5: Testing and measurement techniques -
Surge immunity test
(IEC 61000-4-5:2005)


Compatiblité électromagnétique (CEM)  Elektromagnetische Verträglichkeit
Partie 4-5: Techniques d'essai (EMV)
et de mesure - Teil 4-5: Prüf- und Messverfahren -
Essai d'immunité aux ondes de choc Prüfung der Störfestigkeit gegen
(CEI 61000-4-5:2005) Stoßspannungen
(IEC 61000-4-5:2005)




This European Standard was approved by CENELEC on 2006-10-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, the Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels


© 2006 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61000-4-5:2006 E

---------------------- Page: 2 ----------------------

EN 61000-4-5:2006 - 2 -
Foreword
The text of document 77B/467/FDIS, future edition 2 of IEC 61000-4-5, prepared by SC 77B, High
frequency phenomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the IEC-CENELEC
parallel vote and was approved by CENELEC as EN 61000-4-5 on 2006-10-01.
This European Standard supersedes EN 61000-4-5:1995 + A1:2001.
Particularly the clauses dedicated to coupling/decoupling networks and to test setups are more detailed.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2007-07-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2009-10-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61000-4-5:2005 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 60664 NOTE  Harmonized as EN 60664 (series) (not modified).
IEC 61643 NOTE  Harmonized as EN 61643 (series) (not modified).
__________

---------------------- Page: 3 ----------------------

- 3 - EN 61000-4-5:2006
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.

Publication Year Title EN/HD Year

1)
IEC 60050-161 - International Electrotechnical Vocabulary - -
(IEV)
Chapter 161: Electromagnetic compatibility


1) 2)
IEC 60060-1 - High-voltage test techniques HD 588.1 S1 1991
Part 1: General definitions and test
requirements


1)
IEC 60469-1 - Pulse techniques and apparatus - -
Part 1: Pulse terms and definitions




1)
Undated reference.
2)
Valid edition at date of issue.

---------------------- Page: 4 ----------------------

INTERNATIONAL IEC


STANDARD 61000-4-5





Second edition
2005-11


BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –
Part 4-5:
Testing and measurement techniques –
Surge immunity test

 IEC 2005 Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical,
including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: [phone] Telefax: [phone] E-mail: [e-mail] Web: www.iec.ch
PRICE CODE
X
Commission Electrotechnique Internationale
International Electrotechnical Commission
МеждународнаяЭлектротехническаяКомиссия
For price, see current catalogue

---------------------- Page: 5 ----------------------

61000-4-5  IEC:2005 – 3 –
CONTENTS
FOREWORD.7
INTRODUCTION.11

1 Scope and object.13
2 Normative references .13
3 Terms and definitions .15
4 General .21
4.1 Power system switching transients .21
4.2 Lightning transients .21
4.3 Simulation of the transients .21
5 Test levels.23
6 Test instrumentation.23
6.1 1,2/50 µs combination wave generator .23
6.2 10/700 µs combination wave generator .31
6.3 Coupling/decoupling networks .37
7 Test setup .63
7.1 Test equipment .63
7.2 Test setup for tests applied to EUT power ports .63
7.3 Test setup for tests applied to unshielded unsymmetrical interconnection
lines .63
7.4 Test setup for tests applied to unshielded symmetrical interconnections
communication lines.65
7.5 Test setup for tests applied to high speed communications lines .65
7.6 Test setup for tests applied to shielded lines .65
7.7 Test setup to apply potential differences .71
7.8 EUT mode of operation .71
8 Test procedure .73
8.1 Laboratory reference conditions .73
8.2 Application of the surge in the laboratory.73
9 Evaluation of test results .75
10 Test report.77

Annex A (informative) Selection of generators and test levels .79
Annex B (informative) Explanatory notes .83
Annex C (informative) Considerations for achieving immunity for equipment
connected to low voltage power systems .91

Bibliography.95

Figure 1 – Simplified circuit diagram of the combination wave generator (1,2/50 µs –
8/20 µs) .25
Figure 2 – Waveform of open-circuit voltage (1,2/50 µs) at the output of the generator
with no CDN connected (waveform definition according to IEC 60060-1).29

---------------------- Page: 6 ----------------------

61000-4-5  IEC:2005 – 5 –
Figure 3 – Waveform of short-circuit current (8/20 µs) at the output of the generator
with no CDN connected (waveform definition according to IEC 60060-1).29
Figure 4 – Simplified circuit diagram of the combination wave generator (10/700 µs –
5/320 µs) according to ITU K series standards.31
Figure 5 – Waveform of open-circuit voltage (10/700 µs) (waveform definition
according to IEC 60060-1) .33
Figure 6 – Waveform of the 5/320 µs short-circuit current waveform (definition
according to IEC 60060-1) .35
Figure 7 – Example of test setup for capacitive coupling on a.c./d.c. lines; line-to-line
coupling (according to 7.2).37
Figure 8 – Example of test setup for capacitive coupling on a.c./d.c. lines; line-to-
ground coupling (according to 7.2).39
Figure 9 – Example of test setup for capacitive coupling on a.c. lines (3 phases); line
L3 to line L1 coupling (according to 7.2) .41
Figure 10 – Example of test setup for capacitive coupling on a.c. lines (3 phases); line
L3 to ground coupling (according to 7.2) .43
Figure 11 – Example of test set up for unshielded unsymmetrical interconnection lines;
line-to-line and line-to-ground coupling (according to 7.3), coupling via capacitors .45
Figure 12 – Example of test setup for unshielded unsymmetrical interconnection lines;
line-to-line and line-to-ground coupling (according to 7.3), coupling via arrestors.47
Figure 13 – Example of test setup for unshielded unsymmetrical interconnection lines;
line-to-line and line-to-ground coupling (according to 7.3), coupling via a clamping
circuit.49
Figure 14 – Example of test setup for unshielded symmetrical interconnection lines
(communication lines); lines-to-ground coupling (according to 7.4), coupling via
arrestors .51
Figure 15 – Example of a coupling/decoupling network for symmetrical high speed
communication lines using the 1,2/50 µs surge .53
Figure 16 – Example of test setup for tests applied to shielded lines (according to 7.6)
and to apply potential differences (according to 7.7) .67
Figure 17 – Example of test setup for tests applied to shielded lines grounded only at
one end (according to 7.6) and to apply potential differences (according to 7.7) .69
Figure 18 – Coupling method and test setup for tests applied to shielded lines and to
apply potential differences, especially in configurations with multiple shielded cable
wiring.71

Table 1 – Test levels.23
Table 2 – Definitions of the waveform parameters 1,2/50 µs – 8/20 µs.27
Table 3 – Relationship between peak open-circuit voltage and peak short-circuit
current .27
Table 4 – Definitions of the waveform parameters 10/700 µs – 5/320 µs .35
Table 5 – Relationship between peak open-circuit voltage and peak short-circuit current.35
Table 6 – Voltage waveform specification at the EUT port of the coupling/decoupling
network.57
Table 7 – Current waveform specification at the EUT port of the coupling/decoupling
network.57
Table A.1 – Selection of the test levels (depending on the installation conditions) .81

---------------------- Page: 7 ----------------------

61000-4-5  IEC:2005 – 7 –
COMMISSION ÉLECTROTECHNIQUE INTERNATIONALE
____________

ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-5 : Testing and measurement techniques –
Surge immunity test


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61000-4-5 has been prepared by subcommittee 77B: High
frequency phenomena, of IEC technical Committee 77: Electromagnetic compatibility.
It forms Part 4-5 of IEC 61000. It has the status of a basic EMC publication in accordance
with IEC Guide 107, Electromagnetic compatibility – Guide to the drafting of electromagnetic
compatibility publications.
This second edition cancels and replaces the first edition published in 1995 and its
amendment 1 (2000), and constitutes a technical revision. Particularly, the clauses dedicated
to coupling/decoupling networks and to test setups are more detailed.

---------------------- Page: 8 ----------------------

61000-4-5  IEC:2005 – 9 –
The text of this standard is based on the following documents:
FDIS Report on voting
77B/467/FDIS 77B/486/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.

---------------------- Page: 9 ----------------------

61000-4-5  IEC:2005 – 11 –
INTRODUCTION
IEC 61000 is published in separate parts according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as international standards
or as technical specifications or technical reports, some of which have already been published
as sections. Others will be published with the part number followed by a dash and a second
number identifying the subdivision (example: 61000-6-1).
This part is an International Standard which gives immunity requirements and test procedures
related to surge voltages and surge currents.

---------------------- Page: 10 ----------------------

61000-4-5  IEC:2005 – 13 –
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-5 : Testing and measurement techniques –
Surge immunity test



1 Scope and object
This part of IEC 61000 relates to the immunity requirements, test methods, and range of
recommended test levels for equipment to unidirectional surges caused by overvoltages from
switching and lightning transients. Several test levels are defined which relate to different
environment and installation conditions. These requirements are developed for and are
applicable to electrical and electronic equipment.
The object of this standard is to establish a common reference for evaluating the immunity of
electrical and electronic equipment when subjected to surges. The test method documented in
this part of IEC 61000 describes a consistent method to assess the immunity of an equipment
or system against a defined phenomenon.
NOTE As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC.
As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity
test standard should be applied or not, and if applied, they are responsible for determining the appropriate test
levels and performance criteria. TC 77 and its sub-committees are prepared to co-operate with product committees
in the evaluation of the value of particular immunity tests for their products.
This standard defines:
– a range of test levels;
– test equipment;
– test setups;
– test procedures.
The task of the described laboratory test is to find the reaction of the EUT under specified
operational conditions, to surge voltages caused by switching and lightning effects at certain
threat levels.
It is not intended to test the capability of the EUT's insulation to withstand high-voltage stress.
Direct injections of lightning currents, i.e, direct lightning strikes, are not considered in this
standard.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60050(161), International Electrotechnical Vocabulary (IEV) – Chapter 161: Electro-
magnetic compatibility

---------------------- Page: 11 ----------------------

61000-4-5  IEC:2005 – 15 –
IEC 60060-1, High-voltage test techniques – Part 1: General definitions and test requirements
IEC 60469-1, Pulse techniques and apparatus – Part 1: Pulse terms and definitions
3 Terms and definitions
For the purposes of this document, the terms and definitions in IEC 60050(161) and the
following apply.
3.1
avalanche device
diode, gas tube arrestor, or other component that is designed to break down and conduct at a
specified voltage
3.2
calibration
set of operations which establishes, by reference to standards, the relationship which exists,
under specified conditions, between an indication and a result of a measurement
[IEV 311-01-09]
NOTE 1 This term is based on the "uncertainty" approach.
NOTE 2 The relationship between the indications and the results of measurement can be expressed, in principle,
by a calibration diagram.
3.3
clamping device
diode, varistor or other component that is designed to prevent an applied voltage from
exceeding a specified value
3.4
combination wave generator
generator with 1,2/50 µs or 10/700 µs open-circuit voltage waveform and respectively 8/20 µs
or 5/320 µs short-circuit current waveform
3.5
coupling network
electrical circuit for the purpose of transferring energy from one circuit to another
3.6
decoupling network
electrical circuit for the purpose of preventing surges applied to the EUT from affecting other
devices, equipment or systems which are not under test
3.7
duration
absolute value of the interval during which a specified waveform or feature exists or continues
[IEC 60469-1]

---------------------- Page: 12 ----------------------

61000-4-5  IEC:2005 – 17 –
3.8
effective output impedance (of a surge generator)
ratio of the peak open-circuit voltage to the peak short-circuit current
3.9
electrical installation
assembly of associated electrical equipment having co-ordinated characteristics to fulfil
purposes
[IEV 826-10-01]
3.10
EUT
equipment under test
3.11
front time
surge voltage
the front time T of a surge voltage is a virtual parameter defined as 1,67 times the interval T
1
between the instants when the impulse is 30 % and 90 % of the peak value (see Figures 2
and 5)
surge current
the front time T of a surge current is a virtual parameter defined as 1,25 times the interval T
1
between the instants when the impulse is 10 % and 90 % of the peak value (see Figures 3
and 6)
[IEC 60060-1, 24.3 modified]
3.12
ground (reference)
part of the Earth considered as conductive, the electrical potential of which is conventionally
taken as zero, being outside the zone of influence of any earthing (grounding) arrangement
[IEV 195-01-01]
3.13
high-speed communication lines
input/output lines which operate at transmission frequencies above 100 kHz
3.14
immunity
ability of a device, equipment or system to perform without degradation in the presence of an
electromagnetic disturbance
[IEV 161-01 -20]
3.15
interconnection lines
I/O lines (input/output lines) and communication lines
3.16
primary protection
means by which the majority of stressful energy is prevented from propagating beyond a
designated interface

---------------------- Page: 13 ----------------------

61000-4-5  IEC:2005 – 19 –
3.17
rise time
interval of time between the instants at which the instantaneous value of a pulse first reaches
the specified lower and upper limits.
[IEV 161-02-05]
NOTE Unless otherwise specified, the lower and upper values are fixed at 10 % and 90 % of the pulse magnitude.
3.18
secondary protection
means by which the let-through energy from primary protection is suppressed. It may be a
special device or an inherent characteristic of the EUT
3.19
surge
transient wave of electrical current, voltage, or power propagating along a line or a circuit and
characterized by a rapid increase followed by a slower decrease
[IEV 161-08-11 modified]
3.20
symmetrical lines
pair of symmetrically driven conductors with a conversion loss from differential to common
mode of greater than 20 dB
3.21
system
set of interdependent elements constituted to achieve a given objective by performing a
specified function
[IEV 351-11-01 modified]
NOTE The system is considered to be separated from the environment and other external systems by an
imaginary surface which cuts the links between them and the considered system. Through these links, the system
is affected by the environment, is acted upon by the external systems, or acts itself on the environment or the
external systems.
3.22
time to half-value
T
2
interval of time between the instant of virtual origin O and the instant when the voltage or
1
current has decreased to half the peak value
[IEC 60060-1, 18.1.6 modified]
NOTE The time to half-value T of a surge is a virtual parameter.
2
3.23
transient
pertaining to or designating a phenomenon or a quantity which varies between two
consecutive steady states during a time interval short compared to the time scale of interest
[IEV 161-02-01]
3.24
verification
set of operations which is used to check the test equipment system (e.g. the test generator
and the interconnecting cables) to demonstrate that the test system is functioning within the
specifications given in Clause 6

---------------------- Page: 14 ----------------------

61000-4-5  IEC:2005 – 21 –
NOTE 1 The methods used for verification may be different from those used for calibration.
NOTE 2 The procedure of 6.1.2 and 6.2.2 is meant to ensure the correct operation of the test generator, and
other items making up the test setup so that the intended waveform is delivered to the EUT.
NOTE 3 For the purposes of this basic EMC standard this definition is different of the definition given in IEV 311-
01-13.
3.25
virtual Origin
O
1
for the surge voltage waveform, it is the instant at which a straight line drawn through the
30 % and 90 % amplitude values crosses the time axis. For the surge current w
...