This European Standard defines a method for the determination of the trace element concentrations of Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide.
Dependent on element, wavelength, plasma conditions and weight, this test method is applicable for mass contents of the above trace contaminations from about 0,1 mg/kg to about 1 000 mg/kg, after evaluation also from 0,001 mg/kg to about 5 000 mg/kg.
NOTE 1 Generally for optical emission spectrometry using inductively coupled plasma (ICP OES) and electrothermal vaporisation (ETV) there is a linear working range of up to four orders of magnitude. This range can be expanded for the respective elements by variation of the weight or by choosing lines with different sensitivity.
After adequate verification, the standard is also applicable to further metallic elements (excepting Rb and Cs) and some non-metallic contaminations (like P and S) and other allied non-metallic powdered or granular materials like carbides, nitrides, graphite, soot, coke, coal, and some other oxidic materials (see [1], [4], [5], [6], [7], [8], [9] and [10]).
NOTE 2 There is positive experience with materials like for example graphite, B4C, Si3N4, BN and several metal oxides as well as with the determination of P and S in some of these materials.

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This European Standard defines a method for the determination of the trace element concentrations of Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide.
Dependent on element, wavelength, plasma conditions and weight, this test method is applicable for mass contents of the above trace contaminations from about 0,1 mg/kg to about 1 000 mg/kg, after evaluation also from 0,001 mg/kg to about 5 000 mg/kg.
NOTE 1   Generally for optical emission spectrometry using inductively coupled plasma (ICP OES) and electrothermal vaporization (ETV) there is a linear working range of up to four orders of magnitude. This range can be expanded for the respective elements by variation of the weight or by choosing lines with different sensitivity.
After adequate verification, the standard is also applicable to further metallic elements (excepting Rb and Cs) and some non-metallic contaminations (like P and S) and other allied non-metallic powdered or granular materials like carbides, nitrides, graphite, soot, coke, coal, and some other oxidic materials (see [1], [4], [5], [6], [7], [8], [9] and [10]).
NOTE 2   There is positive experience with materials like, for example, graphite, B4C, Si3N4, BN and several metal oxides as well as with the determination of P and S in some of these materials.

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This part of ISO 14720 defines a method for the determination of sulfur in powdered and granular non-oxidic ceramic raw materials and materials, which are completely oxidized at a higher temperature in an oxygen atmosphere, e.g. carbon and graphite materials.
For materials which are not completely oxidizable under these conditions, it is possible to determine sulfur that can be released under these conditions, e.g. the adherent sulfur.
This part of ISO 14720 is applicable for materials with mass fractions of sulfur ≤ 10 % and mass fractions of ash  < 20 %, The defined method is limited for materials with mass fractions of barium < 10 mg/kg, because the sulfur bonded in barium sulfate is not detectable with this method.
For the lower detection limit of this method, a mass fraction of sulfur of 0,5 mg/kg in the case of inductively coupled plasma optical emission spectrometry (ICP/OES) and 5 mg/kg in the case of ion chromatography (IC) has to be considered as a recommended value.

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ISO 14720-1:2013 defines a method for the determination of sulfur in powdered and granular non-oxidic ceramic raw materials and materials, such as silicon carbides, silicon nitrides, graphites, carbon blacks, cokes, carbon powders. If proved by the recovery rate, this method can also be applied for other non-metallic powdered and granular materials, e.g. silicon dioxide.
ISO 14720-1:2013 is applicable for materials with mass fractions of sulfur from 0,005 % to 2 %.
ISO 14720-1:2013 can also be applied for materials with higher mass fractions of sulfur after verification of the particular case.

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This part of ISO 14720 defines a method for the determination of sulfur in powdered and granular nonoxidic ceramic raw materials and materials, such as silicon carbides, silicon nitrides, graphites, carbon blacks, cokes, carbon powders. If proved by the recovery rate, this method can also be applied for other non-metallic powdered and granular materials, e.g. silicon dioxide. This part of ISO 14720 is applicable for materials with mass fractions of sulfur from 0,005 % to 2 %. This part of ISO 14720 can also be applied for materials with higher mass fractions of sulfur after verification of the particular case.

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This part of ISO 14720 defines a method for the determination of sulfur in powdered and granular nonoxidic ceramic raw materials and materials, which are completely oxidized at a higher temperature in an oxygen atmosphere, e.g. carbon and graphite materials. For materials which are not completely oxidizable under these conditions, it is possible to determine sulfur that can be released under these conditions, e.g. the adherent sulfur. This part of ISO 14720 is applicable for materials with mass fractions of sulfur ≤ 10 % and mass fractions of ash < 20 %, The defined method is limited for materials with mass fractions of barium < 10 mg/kg, because the sulfur bonded in barium sulfate is not detectable with this method. For the lower detection limit of this method, a mass fraction of sulfur of 0,5 mg/kg in the case of inductively coupled plasma optical emission spectrometry (ICP/OES) and 5 mg/kg in the case of ion chromatography (IC) has to be considered as a recommended value.

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This part of ISO 14720 defines a method for the determination of sulfur in powdered and granular non-oxidic ceramic raw materials and materials, which are completely oxidized at a higher temperature in an oxygen atmosphere, e.g. carbon and graphite materials. For materials which are not completely oxidizable under these conditions, it is possible to determine sulfur that can be released under these conditions, e.g. the adherent sulfur. This part of ISO 14720 is applicable for materials with mass fractions of sulfur ≤ 10 % and mass fractions of ash For the lower detection limit of this method, a mass fraction of sulfur of 0,5 mg/kg in the case of inductively coupled plasma optical emission spectrometry (ICP/OES) and 5 mg/kg in the case of ion chromatography (IC) has to be considered as a recommended value.

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ISO 14720-1:2013 defines a method for the determination of sulfur in powdered and granular non-oxidic ceramic raw materials and materials, such as silicon carbides, silicon nitrides, graphites, carbon blacks, cokes, carbon powders. If proved by the recovery rate, this method can also be applied for other non-metallic powdered and granular materials, e.g. silicon dioxide. ISO 14720-1:2013 is applicable for materials with mass fractions of sulfur from 0,005 % to 2 %. ISO 14720-1:2013 can also be applied for materials with higher mass fractions of sulfur after verification of the particular case.

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ISO 14719:2011 specifies a spectral photometric method with 1,10-phenanthroline for the quantitative determination of Fe2+ and Fe3+ in oxidic raw and basic materials for ceramics, glass and glazes, e.g. feldspar, kaolinites, clay, limestone, quartz refractory materials. ISO 14719:2011 could be extended to other aluminosilicate materials, providing that uncertainty data is produced to support it. However, there might be problems in the decomposition of high-purity alumina and chrome ore samples.
The method is not suitable for reduced materials, such as silicon carbide, graphite-magnesia, etc.

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This standard defines a method for the determination of the trace element concentrations of Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular siliconcarbide.

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This European Standard describes the method for the analysis of mass fractions of the impurities Al, B, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powder  and grain-shaped silicon carbide of ceramic raw and basic materials. This application can also be extended to other metallic elements and other similar non-metallic powder  and grain-shaped materials such as carbides, nitrides, graphite, carbon blacks, cokes, carbon, as well as a number of further oxidic raw and basic materials after appropriate testing.
NOTE   There are positive interferences for materials such as e.g. graphite, B4C, BN, WC and several refractory metal oxides.
This testing procedure is applicable to mass fractions of the impurities mentioned above from approximately
1 mg/kg up to approximately 3 000 mg/kg, after verification. In some cases it may be possible to extend the range up to 5 000 mg/kg depending on element, wavelength, arc parameter, and sample weight.

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This part of EN 12698 describes the methods for the analysis of all refractory products containing nitride bonded silicon carbide, irrespective of the Silicon carbide level.  It includes details of sample preparation, general principles of chemical analysis and detailed methods for the determination of carbon, silicon carbide, free aluminium, free silicon, total nitrogen and oxygen.  
Silicon nitride, silicon oxynitride, silicon, free silica and silicon aluminium oxynitride (sialon) can be determined by XRD.

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This standard defines a method for the determination of the trace element concentrations of Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide.
Dependent on element, wavelength, plasma conditions and weight, this test method is applicable for mass contents of the above trace contaminations from about  0,1 mg/kg to about 1 000 mg/kg, after evaluation also from 0,001 mg/kg to about 5 000 mg/kg.
NOTE 1   Generally for optical emission spectroscopy using inductively coupled plasma (ICP OES) and electrothermal vaporisation (ETV) there is a linear working range of up to four orders of magnitude. This range can be expanded for the respective elements by variation of the weight or by choosing lines with different sensitivity.
After adequate verification, the standard is also applicable to further metallic elements (excepting Rb and Cs) and some non-metallic contaminations (like P and S) and other allied non-metallic powdered or granular materials like carbides, nitrides, graphite, soot, coke, coal, and some other oxidic materials (see [1], [4], [5], [6], [7], [8], [9] and [10]).
NOTE 2   There is positive experience with materials like for example graphite, B4C, Si3N4, BN and several metal oxides as well as with the determination of P and S in some of these materials.

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This European Standard defines a method for the determination of the trace element concentrations of Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide.
Dependent on element, wavelength, plasma conditions and weight, this test method is applicable for mass contents of the above trace contaminations from about 0,1 mg/kg to about 1 000 mg/kg, after evaluation also from 0,001 mg/kg to about 5 000 mg/kg.
NOTE 1   Generally for optical emission spectrometry using inductively coupled plasma (ICP OES) and electrothermal vaporisation (ETV) there is a linear working range of up to four orders of magnitude. This range can be expanded for the respective elements by variation of the weight or by choosing lines with different sensitivity.
After adequate verification, the standard is also applicable to further metallic elements (excepting Rb and Cs) and some non-metallic contaminations (like P and S) and other allied non-metallic powdered or granular materials like carbides, nitrides, graphite, soot, coke, coal, and some other oxidic materials (see [1], [4], [5], [6], [7], [8], [9] and [10]).
NOTE 2   There is positive experience with materials like for example graphite, B4C, Si3N4, BN and several metal oxides as well as with the determination of P and S in some of these materials.

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