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ASTM F677-13

(Test Method)

Standard Test Method for Fluid and Grease Resistance of Thermoset Encapsulating Compounds Used in Electronic and Microelectronic Applications (Withdrawn 2013)

Standard Test Method for Fluid and Grease Resistance of Thermoset Encapsulating Compounds Used in Electronic and Microelectronic Applications (Withdrawn 2013)

SIGNIFICANCE AND USE
5.1 Fluids and greases in contact with encapsulating compounds have the potential to adversely modify the encapsulant properties with resulting damage or loss of protection to components in electronic applications.  
5.2 This test method provides a means for measuring the effect of fluids and greases on various encapsulants.  
5.3 This test method is intended for use in research and evaluation.
SCOPE
1.1 This test method determines the resistance of encapsulating compounds to fluids or greases by measuring changes in weight (Note 1) and volume under defined conditions of time and temperature. Note 1—To provide consistency with the usage in other ASTM test methods concerned with determining the properties of plastic materials, the terms “weight” and “weigh” are used in this test method although the units of measurement are those of mass.  
1.2 The values stated in SI units are standard. The values in parentheses are for information only.Note 2—There is no similar or equivalent IEC standard.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.  See 9.1.
WITHDRAWN RATIONALE
This test method determines the resistance of encapsulating compounds to fluids or greases by measuring changes in weight and volume under defined conditions of time and temperature.
Formerly under the jurisdiction of Committee D09 on Electrical and Electronic Insulating Materials, this test method was withdrawn in November 2013. This standard is being withdrawn without replacement due to its limited use by industry.

General Information

Status
Withdrawn
Publication Date
31-Mar-2013
Withdrawal Date
05-Dec-2013
ICS
31.020 - Electronic components in general
Technical Committee
D09 - Electrical and Electronic Insulating Materials
Drafting Committee
D09.01 - Electrical Insulating Products
Current Stage
Ref Project

Relations

Replaces
ASTM F677-04(2009) - Standard Test Method for Fluid and Grease Resistance of Thermoset Encapsulating Compounds Used in Electronic and Microelectronic Applications
Effective Date
01-Apr-2013

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ASTM F677-13 - Standard Test Method for Fluid and Grease Resistance of Thermoset Encapsulating Compounds Used in Electronic and Microelectronic Applications (Withdrawn 2013)ASTM F677-13 - Standard Test Method for Fluid and Grease Resistance of Thermoset Encapsulating Compounds Used in Electronic and Microelectronic Applications (Withdrawn 2013)
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ASTM F677-13 - Standard Test Method for Fluid and Grease Resistance of Thermoset Encapsulating Compounds Used in Electronic and Microelectronic Applications (Withdrawn 2013)
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Standards Content (Sample)

NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation: F677 − 13 AnAmerican National Standard
Standard Test Method for
Fluid and Grease Resistance of Thermoset Encapsulating
Compounds Used in Electronic and Microelectronic
1
Applications
ThisstandardisissuedunderthefixeddesignationF677;thenumberimmediatelyfollowingthedesignationindicatestheyearoforiginal
adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.Asuperscript
epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope* 3.1.1 For the definitions of terms used in this standard, refer
to Terminology D1711.
1.1 This test method determines the resistance of encapsu-
lating compounds to fluids or greases by measuring changes in
4. Summary of Test Method
weight (Note 1) and volume under defined conditions of time
4.1 Specimens of encapsulating compound are immersed in
and temperature.
fluids or greases for specified conditions of temperature and
NOTE 1—To provide consistency with the usage in other ASTM test
time. The weight and volume of each specimen is measured
methods concerned with determining the properties of plastic materials,
before and after immersion and percent change is reported.
the terms “weight” and “weigh” are used in this test method although the
4.2 The fluids and greases to be used as test media (8.3) are
units of measurement are those of mass.
not specified by the test method and shall be agreed to by the
1.2 The values stated in SI units are standard. The values in
parties to the test.
parentheses are for information only.
5. Significance and Use
NOTE 2—There is no similar or equivalent IEC standard.
1.3 This standard does not purport to address all of the 5.1 Fluids and greases in contact with encapsulating com-
safety concerns, if any, associated with its use. It is the pounds have the potential to adversely modify the encapsulant
responsibility of the user of this standard to establish appro- properties with resulting damage or loss of protection to
priate safety and health practices and determine the applica- components in electronic applications.
bility of regulatory limitations prior to use. See 9.1.
5.2 This test method provides a means for measuring the
effect of fluids and greases on various encapsulants.
2. Referenced Documents
2
5.3 This test method is intended for use in research and
2.1 ASTM Standards:
evaluation.
D1193 Specification for Reagent Water
D1711 Terminology Relating to Electrical Insulation
6. Interferences
D5423 Specification for Forced-Convection Laboratory Ov-
6.1 Test results obtained with molded or cast specimens of
ens for Evaluation of Electrical Insulation
filled encapsulating compounds will differ from those obtained
D6054 Practice for Conditioning Electrical Insulating Mate-
3 with cut or machined specimens (because of exposed fillers in
rials for Testing (Withdrawn 2012)
the latter).
3. Terminology
6.2 Lack of complete contact between the test medium and
3.1 Definitions: thesurfacesofthespecimenhasthepotentialtoseriouslyaffect
the results of the test.
1
This test method is under the jurisdiction of ASTM Committee D09 on
6.3 Some encapsulants have the potential to be affected by
Electrical and Electronic Insulating Materials and is the direct responsibility of
the reagents specified for use in removing the test media from
Subcommittee D09.01 on Electrical Insulating Varnishes, Powders and Encapsulat-
the specimens. If the encapsulants are affected, alternative
ing Compounds.
Current edition approved April 1, 2013. Published April 2013. Originally
reagents are required, as agreed upon by the parties to the test.
approved in 1980. Last previous edition approved in 2009 as F677 – 04 (2009).
DOI: 10.1520/F0677-13. 7. Apparatus
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
7.1 Analytical Balance, capable of determining weight to
contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
Standards volume information, refer to the standard’s Document Summary page on the nearest 0.001 g.
the ASTM website.
3 7.2 Oven, forced-convection type meeting the requirements
The last approved version of this historical standard is referenced on
www.astm.org. of Specification D5423, Type I.
*A Summary of Changes section appears at the end of this standard
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1

---------------------- Page: 1 ----------------------
F677 − 13
7.3 Glass Dishes, of sufficient diameter for specimens to be 13.2.2 For grease test media, omit the filter paper if the
exposed horizontally, and of sufficient height for specimens to viscosity of the grease at the exposure temperature is sufficient
becompletelycoveredbythetestmedium.Aloose-fittingglass to prevent specimens from touching. Ap
...

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Standard Test Method for Fluid and Grease Resistance of Thermoset Encapsulating Compounds Used in Electronic and Microelectronic Applications

SIGNIFICANCE AND USE
Fluids and greases in contact with encapsulating compounds may adversely modify the encapsulant properties with resulting damage or loss of protection to components in electronic applications.
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This test method is intended for use in research and evaluation.
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4.1 Although Co-60 nuclei only emit monoenergetic gamma rays at 1.17 and 1.33 MeV, the finite thickness of sources, and encapsulation materials and other surrounding structures that are inevitably present in irradiators can contribute a substantial amount of low-energy gamma radiation, principally by Compton scattering (1, 2).3 In radiation-hardness testing of electronic devices this low-energy photon component of the gamma spectrum can introduce significant dosimetry errors for a device under test since the equilibrium absorbed dose as measured by a dosimeter can be quite different from the absorbed dose deposited in the device under test because of absorbed dose enhancement effects (3, 4). Absorbed dose enhancement effects refer to the deviations from equilibrium absorbed dose caused by non-equilibrium electron transport near boundaries between dissimilar materials.  
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4.1 Absorbed dose in a material is an important parameter that can be correlated with radiation effects produced in electronic components and devices that are exposed to ionizing radiation. Reasonable estimates of this parameter can be calculated if knowledge of the source radiation field (that is, energy spectrum and particle fluence) is available. Sufficiently detailed information about the radiation field is generally not available. However, measurements of absorbed dose with passive dosimeters in a radiation test facility can provide information from which the absorbed dose in a material of interest can be inferred. Under certain prescribed conditions, TLDs are quite suitable for performing such measurements.
Note 2: For comprehensive discussions of various dosimetry methods applicable to the radiation types and energy and absorbed dose-rate range discussed in this practice, see ICRU Reports 14, 17, 21, and 34.
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5.1 Overtesting should be done when (a) testing by variables is impractical because of time and cost considerations or because the probability distribution of stress to failure cannot be estimated with sufficient accuracy, and (b) an unrealistically large number of parts would have to be tested at the specification stress for the necessary confidence and survival probability.
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4.1 This practice was written primarily to guide test participants in establishing, identifying, maintaining, and using suitable environments for conducting high quality neutron tests. Its development was motivated, in large measure, because inadequate controls in the neutron-effects-test process have, in some past instances, resulted in exposures that have differed by factors of three or more from irradiation specifications. A radiation test environment generally differs from the environment in which the electronics must operate (the operational environment); therefore, a high quality test requires not only the use of a suitable radiation environment, but also control and compensation for contributions to damage that differ from those in the operational environment. In general, the responsibility for identifying suitable test environments to accomplish test objectives lies with the sponsor/user/tester and test specialist part of the team, with the assistance of an independent validator, if available. The responsibility for the establishment and maintenance of suitable environments lies with the facility operator/dosimetrist and test specialist, again with the possible assistance of an independent validator. Additional guidance on the selection of an irradiation facility is provided in Practice F1190.  
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4.1 Electronic circuits used in many space, military and nuclear power systems may be exposed to various levels of ionizing radiation dose. It is essential for the design and fabrication of such circuits that test methods be available that can determine the vulnerability or hardness (measure of nonvulnerability) of components to be used in such systems.  
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4.5 Bend testing may be destructive, therefore any samples tested should be considered unfit for future use.
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4.3 The principal determinants of a properly conducted test are: (1) the radiation test environment shall be well characterized, controlled, and correlated with the specified irradiation levels; (2) damage produced in the electronic materials and devices is caused by the desired, specified component of the environment a...
SCOPE
1.1 This practice sets forth requirements to ensure consistency in neutron-induced displacement damage testing of silicon and gallium arsenide electronic piece parts. This requires controls on facility, dosimetry, tester, and communications processes that affect the accuracy and reproducibility of these tests. It provides background information on the technical basis for the requirements and additional recommendations on neutron testing.  
1.2 Methods are presented for ensuring and validating consistency in neutron displacement damage testing of electronic parts such as integrated circuits, transistors, and diodes. The issues identified and the controls set forth in this practice address the characterization and suitability of the radiation environments. They generally apply to reactor sources, accelerator-based neutron sources, such as 14-MeV DT sources, and  252Cf sources. Facility and environment characteristics that introduce complications or problems are identified, and recommendations are offered to recognize, minimize or eliminate these problems. This practice may be used by facility users, test personnel, facility operators, and independent process validators to determine the suitability of a specific environment within a facility and of the testing process as a whole. Electrical measurements are addressed in other standards, such as Guide F980. Additional information on conducting irradiations can be found in Practices E798 and F1190. This practice also may be of use to test sponsors (organizations that establish test specifications or otherwise have a vested interest in the performance of electronics in neutron environments).  
1.3 Methods for the evaluation and control of undesired contributions to damage are discussed in this practice. References to relevant ASTM standards and technical reports are provided. Processes and methods used to arrive at the appropriate test environments and specification levels f...

  • Standard
    13 pages
    English language
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  • Standard
    13 pages
    English language
    sale 15% off