ASTM E722-04e2

Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics

SIGNIFICANCE AND USE
This practice is important in characterizing the radiation hardness of electronic devices irradiated by neutrons. This characterization makes it feasible to predict some changes in operational properties of irradiated semiconductor devices or electronic systems. To facilitate uniformity of the interpretation and evaluation of results of irradiations by sources of different energy spectra, it is convenient to reduce the incident neutron fluence from a source to a single parameter—an equivalent monoenergetic neutron fluence—applicable to a particular semiconductor material.
In order to determine an equivalent monoenergetic neutron fluence, it is necessary to evaluate the displacement damage of the particular semiconductor material. Ideally, this quantity is correlated to the degradation of a specific functional performance parameter (such as current gain) of the semiconductor device or system being tested. However, this correlation has not been established unequivocally for all device types and performance parameters since, in many instances, other effects also can be important. Ionization effects produced by the incident neutron fluence or by gamma rays in a mixed neutron fluence, short-term and long-term annealing, and other factors can contribute to observed performance degradation (damage). Thus, caution should be exercised in making a correlation between calculated displacement damage and performance degradation of a given electronic device. The types of devices for which this correlation is applicable, and numerical evaluation of displacement damage are discussed in the annexes.
The concept of 1-MeV equivalent fluence is widely used in the radiation-hardness testing community. It has merits and disadvantages that have been debated widely (9-12). For these reasons, specifics of a standard application of the 1-MeV equivalent fluence are presented in the annexes.
SCOPE
1.1 This practice covers procedures for characterizing a neutron fluence from a source in terms of an equivalent monoenergetic neutron fluence. It is applicable to neutron effects testing, to the development of test specifications, and to the characterization of neutron test environments. The sources may have a broad neutron-energy spectrum, or may be mono-energetic neutron sources with energies up to 20 MeV. This practice is not applicable in cases where the predominant source of displacement damage is from neutrons of energy less than 10 keV. The relevant equivalence is in terms of a specified effect on certain physical properties of materials upon which the source spectrum is incident. In order to achieve this, knowledge of the effects of neutrons as a function of energy on the specific property of the material of interest is required. Sharp variations in the effects with neutron energy may limit the usefulness of this practice in the case of mono-energetic sources.
1.2 This practice is presented in a manner to be of general application to a variety of materials and sources. Correlation between displacements (1-3) caused by different particles (electrons, neutrons, protons, and heavy ions) is beyond the scope of this practice. In radiation-hardness testing of electronic semiconductor devices, specific materials of interest include silicon and gallium arsenide, and the neutron sources generally are test and research reactors and californium-252 irradiators.
1.3 The technique involved relies on the following factors: (1) a detailed determination of the energy spectrum of the neutron source, and (2) a knowledge of the degradation (damage) effects of neutrons as a function of energy on specific material properties.
1.4 The detailed determination of the neutron energy spectrum referred to in 1.3 need not be performed afresh for each test exposure, provided the exposure conditions are repeatable. When the spectrum determination is not repeated, a neutron fluence monitor shall be used for each test exposure.
1.5 This ...

General Information

• Status: Historical
• Publication Date: 14-Feb-2005
• ICS: 31.080.01 - Semiconductor devices in general
• Technical Committee: E10 - Nuclear Technology and Applications
• Drafting Committee: E10.07 - Radiation Dosimetry for Radiation Effects on Materials and Devices

Relations

• Replaces: ASTM E722-04e1 - Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
• Effective Date: 15-Feb-2005
• Replaced By: ASTM E722-09 - Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
• Effective Date: 01-Jun-2009
• Referred By: ASTM E1855-20 - Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
• Effective Date: 15-Feb-2005
• Referred By: ASTM F1190-18 - Standard Guide for Neutron Irradiation of Unbiased Electronic Components
• Effective Date: 15-Feb-2005
• Referred By: ASTM F980-16 - Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
• Effective Date: 15-Feb-2005
• Referred By: ASTM E261-16(2021) - Standard Practice for Determining Neutron Fluence, Fluence Rate, and Spectra by Radioactivation Techniques
• Effective Date: 15-Feb-2005
• Referred By: ASTM E1854-19 - Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
• Effective Date: 15-Feb-2005
• Referred By: ASTM E170-23 - Standard Terminology Relating to Radiation Measurements and Dosimetry
• Effective Date: 15-Feb-2005
• Referred By: ASTM E3084-17(2022)e1 - Standard Practice for Characterizing Particle Irradiations of Materials in Terms of Non-Ionizing Energy Loss (NIEL)
• Effective Date: 15-Feb-2005
• Referred By: ASTM E2450-23 - Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
• Effective Date: 15-Feb-2005
• Referred By: ASTM E721-22 - Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
• Effective Date: 15-Feb-2005

Standards Content (Sample)

NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
´2
Designation:E722–04
Standard Practice for
Characterizing Neutron Energy Fluence Spectra in Terms of
an Equivalent Monoenergetic Neutron Fluence for
1
Radiation-Hardness Testing of Electronics
This standard is issued under the fixed designation E722; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
This standard has been approved for use by agencies of the Department of Defense.
1
´ NOTE—Table A1.1 and A2.1 were corrected editorially in February 2005.
2
´ NOTE—An = sign was added in Eq 1 in April 2007.
1. Scope neutron source, and (2) a knowledge of the degradation
(damage)effectsofneutronsasafunctionofenergyonspecific
1.1 This practice covers procedures for characterizing a
material properties.
neutron fluence from a source in terms of an equivalent
1.4 The detailed determination of the neutron energy spec-
monoenergetic neutron fluence. It is applicable to neutron
trum referred to in 1.3 need not be performed afresh for each
effects testing, to the development of test specifications, and to
testexposure,providedtheexposureconditionsarerepeatable.
the characterization of neutron test environments. The sources
When the spectrum determination is not repeated, a neutron
may have a broad neutron-energy spectrum, or may be mono-
fluence monitor shall be used for each test exposure.
energetic neutron sources with energies up to 20 MeV. This
1.5 This standard does not purport to address all of the
practice is not applicable in cases where the predominant
safety concerns, if any, associated with its use. It is the
sourceofdisplacementdamageisfromneutronsofenergyless
responsibility of the user of this standard to establish appro-
than10keV.Therelevantequivalenceisintermsofaspecified
priate safety and health practices and determine the applica-
effect on certain physical properties of materials upon which
bility of regulatory limitations prior to use.
the source spectrum is incident. In order to achieve this,
knowledgeoftheeffectsofneutronsasafunctionofenergyon
2. Referenced Documents
the specific property of the material of interest is required.
3
2.1 ASTM Standards:
Sharp variations in the effects with neutron energy may limit
E265 Test Method for Measuring Reaction Rates and
the usefulness of this practice in the case of mono-energetic
Fast-Neutron Fluences by Radioactivation of Sulfur-32
sources.
E693 Practice for Characterizing Neutron Exposures in
1.2 This practice is presented in a manner to be of general
Iron and LowAlloy Steels in Terms of Displacements Per
application to a variety of materials and sources. Correlation
2 Atom (DPA), E 706(ID)
between displacements (1-3) caused by different particles
E720 Guide for Selection and Use of Neutron Sensors for
(electrons, neutrons, protons, and heavy ions) is beyond the
Determining Neutron Spectra Employed in Radiation-
scope of this practice. In radiation-hardness testing of elec-
Hardness Testing of Electronics
tronic semiconductor devices, specific materials of interest
E721 Guide for Determining Neutron Energy Spectra from
include silicon and gallium arsenide, and the neutron sources
Neutron Sensors for Radiation-Hardness Testing of Elec-
generally are test and research reactors and californium-252
tronics
irradiators.
E844 Guide for Sensor Set Design and Irradiation for
1.3 The technique involved relies on the following factors:
Reactor Surveillance, E 706(IIC)
(1) a detailed determination of the energy spectrum of the
E944 Guide for Application of Neutron Spectrum Adjust-
ment Methods in Reactor Surveillance, E 706 (IIA)
1
This practice is under the jurisdiction of ASTM Committee E10 on Nuclear
Technology and Applications and is the direct responsibility of Subcommittee
E10.07 on Radiation Dosimetry for Radiation Effects on Materials and Devices.
3
Current edition approved Feb. 15, 2005. Published July 2004. Originally For referenced ASTM standards, visit the ASTM website, www.astm.org, or
approved in 1980. Last previous edition approved in 2002 as E722–94(2002). contact ASTM Customer Service at [e-mail]. For Annual Book of ASTM
2
The boldface numbers in parentheses refer to a list of references at the end of Standards volume information, refer to the standard’s Document Summary page on
this practice. the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
1

---------------------- Page: 1 ----------------------
´2
E722–04
2.2 International Commission on Radiation Units and current gain degradation in silicon) being correlated is de-
Measurements (ICRU) Reports: scribed
...

This document is not anASTM standard and is intended only to provide the user of anASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately,ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
´1 ´1
Designation:E722–04 E722–04 ´2
Standard Practice for
Characterizing Neutron Energy Fluence Spectra in Terms of
an Equivalent Monoenergetic Neutron Fluence for
1
Radiation-Hardness Testing of Electronics
This standard is issued under the fixed designation E722; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
This standard has been approved for use by agencies of the Department of Defense.
1
´ NOTE—Table A1.1 and A2.1 were corrected editorially in February 2005.
—Table A1.1 and A2.1 were corrected editorially in February 2005.
2
´ NOTE—An = sign was added in Eq 1 in April 2007.
1. Scope
1.1 Thispracticecoversproceduresforcharacterizinganeutronfluencefromasourceintermsofanequivalentmonoenergetic
neutron fluence. It is applicable to neutron effects testing, to the development of test specifications, and to the characterization of
neutron test environments. The sources may have a broad neutron-energy spectrum, or may be mono-energetic neutron sources
withenergiesupto20MeV.Thispracticeisnotapplicableincaseswherethepredominantsourceofdisplacementdamageisfrom
neutrons of energy less than 10 keV. The relevant equivalence is in terms of a specified effect on certain physical properties of
materials upon which the source spectrum is incident. In order to achieve this, knowledge of the effects of neutrons as a function
of energy on the specific property of the material of interest is required. Sharp variations in the effects with neutron energy may
limit the usefulness of this practice in the case of mono-energetic sources.
1.2 Thispracticeispresentedinamannertobeofgeneralapplicationtoavarietyofmaterialsandsources.Correlationbetween
2
displacements (1-3) caused by different particles (electrons, neutrons, protons, and heavy ions) is beyond the scope of this
practice.Inradiation-hardnesstestingofelectronicsemiconductordevices,specificmaterialsofinterestincludesiliconandgallium
arsenide, and the neutron sources generally are test and research reactors and californium-252 irradiators.
1.3 The technique involved relies on the following factors: (1) a detailed determination of the energy spectrum of the neutron
source,and(2)aknowledgeofthedegradation(damage)effectsofneutronsasafunctionofenergyonspecificmaterialproperties.
1.4 The detailed determination of the neutron energy spectrum referred to in 1.3 need not be performed afresh for each test
exposure, provided the exposure conditions are repeatable. When the spectrum determination is not repeated, a neutron fluence
monitor shall be used for each test exposure.
1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory
limitations prior to use.
2. Referenced Documents
3
2.1 ASTM Standards:
E265 Test Method for Measuring Reaction Rates forand Fast-Neutron Fluences by Radioactivation of Sulfur-32
E693 Practice for Characterizing Neutron Exposures in Ferritic Steels inTerms of Displacement perAtom (DPA) Practice for
Characterizing Neutron Exposures in Iron and Low Alloy Steels in Terms of Displacements Per Atom (DPA), E 706(ID)
E720 GuideforSelectionandUseofNeutron-ActivationFoilsNeutronSensorsforDeterminingNeutronSpectraEmployedin
Radiation-Hardness Testing of Electronics
E721 Test Method for Determining Neutron Energy Spectra with NeutronActivation Foils for Radiation-Hardness Testing of
Electronics Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of
Electronics
1
This practice is under the jurisdiction of ASTM Committee E10 on Nuclear Technology and Applications and is the direct responsibility of Subcommittee E10.07 on
Radiation Dosimetry for Radiation Effects on Materials and Devices.
Current edition approved June 1, 2004.Feb. 15, 2005. Published July 2004. Originally approved in 1980. Last previous edition approved in 2002 as E722–94(2002).
2
The boldface numbers in parentheses refer to a list of references at the end of this practice.
3
ForreferencedASTMstandards,visittheASTMwebsite,www.astm.org,[e-mail] Annual Book of ASTM Standards
volume information, refer to the standard’s Document Summary page on the AST
...