ASTM F773M-96
(Practice)Practice for Measuring Dose Rate Response of Linear Integrated Circuits
Practice for Measuring Dose Rate Response of Linear Integrated Circuits
SCOPE
1.1 This practice covers the measurement of the response of linear integrated circuits, under given operating conditions, to pulsed ionizing radiation. The response may be either transient or more lasting, such as latchup. The radiation source is either a flash X-ray machine (FXR) or an electron linear accelerator (LINAC).
1.2 The precision of the measurement depends on the homogeneity of the radiation field and on the precision of the radiation dosimetry and the recording instrumentation.
1.3 The test may be considered to be destructive either for further tests or for other purposes if the total radiation dose exceeds some predetermined level or if the part should latch up. Because this level depends both on the kind of integrated circuit and on the application, a specific value must be agreed upon by the parties to the test. (See 6.10)
1.4 Setup, calibration, and test circuit evaluation procedures are included in this practice.
1.5 Procedures for lot qualifications and sampling are not included in this practice.
1.6 Because response varies with different device types, the dose rate range for any specific test is not given in this practice but must be agreed upon by the parties to the test.
1.7 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
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Designation: F 773M – 96
METRIC
Standard Practice for
Measuring Dose Rate Response of Linear Integrated
1
Circuits [Metric]
This standard is issued under the fixed designation F 773M; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
1. Scope F 526 Test Method for Measuring Dose for Use in Linear
3
Accelerator Pulsed Radiation Effects Tests
1.1 This practice covers the measurement of the response of
linear integrated circuits, under given operating conditions, to
3. Terminology
pulsed ionizing radiation. The response may be either transient
3.1 Definitions:
or more lasting, such as latchup. The radiation source is either
3.1.1 dose rate—energy absorbed per unit time and per unit
a flash X-ray machine (FXR) or an electron linear accelerator
mass by a given material from the radiation to which it is
(LINAC).
exposed.
1.2 The precision of the measurement depends on the
3.1.2 dose rate response—the change that occurs in an
homogeneity of the radiation field and on the precision of the
observed characteristic of an operating linear integrated circuit
radiation dosimetry and the recording instrumentation.
induced by a radiation pulse of a given dose rate.
1.3 The test may be considered to be destructive either for
further tests or for other purposes if the total radiation dose
4. Summary of Practice
exceeds some predetermined level or if the part should latch
4.1 The test device and suitable dosimeters are irradiated by
up. Because this level depends both on the kind of integrated
a pulse from either an FXR or a LINAC while the test device
circuit and on the application, a specific value must be agreed
is operating under agreed-upon conditions. The responses of
upon by the parties to the test. (See 6.10.)
the test device and of the dosimeters are recorded.
1.4 Setup, calibration, and test circuit evaluation procedures
4.2 The response of the test device to dose rate is recorded
are included in this practice.
over a specified dose rate range.
1.5 Procedures for lot qualification and sampling are not
4.3 A number of factors are not defined in this practice, and
included in this practice.
must be agreed upon beforehand by the parties to the test.
1.6 Because response varies with different device types, the
4.3.1 Total dose limit (see 1.3),
dose rate range for any specific test is not given in this practice
4.3.2 Electrical parameters of the test device whose re-
but must be agreed upon by the parties to the test.
sponses are to be measured (see 10.10),
1.7 This standard does not purport to address all of the
4.3.3 Temperature at which the test is to be performed (see
safety concerns, if any, associated with its use. It is the
6.7),
responsibility of the user of this standard to establish appro-
4.3.4 Details of the test circuit, including output loading,
priate safety and health practices and determine the applica-
power supply levels, and other operating conditions (see 7.4
bility of regulatory limitations prior to use.
and 10.3),
4.3.5 Choice of radiation pulse source (see 6.9 and 7.9),
2. Referenced Documents
4.3.6 Pulse width (see 6.9 and 7.9.2),
2.1 ASTM Standards:
4.3.7 Sampling (see 8.1),
E 668 Practice for Application of Thermoluminescence-
4.3.8 Need for total dose measurement (see 6.10, 7.8, and
Dosimetry (TLD) Systems for Determining Absorbed Dose
2 10.1.1),
in Radiation-Hardness Testing of Electronic Devices
4.3.9 An irradiation plan which includes the dose rate range
and the minimum number of dose rate values to be used in that
range (see 10.6 and 10.9), and
1
This practice is under the jurisdiction of ASTM Committee F-1 on Electronics
4.3.10 Appropriate functional test (see 10.4 and 10.8).
and is the direct responsibility of Subcommittee F01.11 on Quality and Hardness
Assurance.
Current edition approved June 10, 1996. Published August 1996. Originally
published as F 773 – 82. Last previous edition F 773 – 92.
2 3
Annual Book of ASTM Standards, Vol 12.02. Annual Book of ASTM Standards, Vol 10.04.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
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NOTICE: This standard has either been superceded and replaced by a new version or discontinued.
Contact ASTM International (www.astm.org) for the latest information.
F 773M – 96
5. Significance and Use irradiating only the minimum area necessary to ensure irradia-
tion of the test device. Reasonable estimates of the expected
5.1 There are many kinds of linear integrated circuits. Any
magnitude of current resulting from secondary-em
...
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