Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates

SIGNIFICANCE AND USE
Permittivity and dissipation factor are fundamental design parameters for design of microwave circuitry. Permittivity plays a principal role in determining the wavelength and the impedance of transmission lines. Dissipation factor (along with copper losses) influence attenuation and power losses.
This test method is suitable for polymeric materials having permittivity in the order of two to eleven. Such materials are popular in applications of stripline and microstrip configurations used in the 1 to 18 GHz range.
This test method is suitable for design, development, acceptance specifications, and manufacturing quality control.
Note 2—See Appendix X1 for additional information regarding significance of this test method and the application of the results.
SCOPE
1.1 This test method permits the rapid measurement of apparent relative permittivity and loss tangent (dissipation factor) of metal-clad polymer-based circuit substrates in the X-band (8 to 12.4 GHz).  
1.2 This test method is suitable for testing PTFE (polytetrafluorethylene) impregnated glass cloth or random-oriented fiber mats, glass fiber-reinforced polystyrene, polyphenyleneoxide, irradiated polyethylene, and similar materials having a nominal specimen thickness of 1/16 in. (1.6 mm). The materials listed in the preceding sentence have been used in commercial applications at nominal frequency of 9.6 GHz.
Note 1—See Appendix X1 for additional information about range of permittivity, thickness other than 1.6 mm, and tests at frequencies other than 9.6 GHz.  
1.3 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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Historical
Publication Date
31-Dec-2009
Current Stage
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ASTM D3380-10 - Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates
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NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation: D3380 − 10
StandardTest Method for
Relative Permittivity (Dielectric Constant) and Dissipation
1
Factor of Polymer-Based Microwave Circuit Substrates
This standard is issued under the fixed designation D3380; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope* D2520Test Methods for Complex Permittivity (Dielectric
Constant) of Solid Electrical Insulating Materials at Mi-
1.1 This test method permits the rapid measurement of
crowave Frequencies and Temperatures to 1650°C
apparent relative permittivity and loss tangent (dissipation
D6054Practice for Conditioning Electrical Insulating Mate-
factor) of metal-clad polymer-based circuit substrates in the
3
rials for Testing (Withdrawn 2012)
X-band (8 to 12.4 GHz).
4
2.2 IPC Standards:
1.2 This test method is suitable for testing PTFE (polytet-
IPC-TM-650Test Methods Manual Method 2.5.5.5.
rafluorethylene) impregnated glass cloth or random-oriented
IPC-MF-4562Metal Foil for Printed Wiring Applications.
fiber mats, glass fiber-reinforced polystyrene,
5
2.3 IEEE Standards:
polyphenyleneoxide, irradiated polyethylene, and similar ma-
Standard No. 488.1Standard Digital Interface for Program-
1
terials having a nominal specimen thickness of ⁄16 in. (1.6
mable Instrumentation.
mm). The materials listed in the preceding sentence have been
Standard No. 488.2Standards, Codes, Formats, Protocols
used in commercial applications at nominal frequency of 9.6
and Common Commands for use with ANSI and IEEE
GHz.
Standard488.1.
NOTE 1—See Appendix X1 for additional information about range of
3. Terminology
permittivity, thickness other than 1.6 mm, and tests at frequencies other
than 9.6 GHz.
3.1 Definitions—SeeTerminology D1711 for the definitions
1.3 The values stated in inch-pound units are to be regarded
of terms used in this test method. See also Test Methods
as standard. The values given in parentheses are mathematical
D2520, D150, and IPC TM-650 for additional information
conversions to SI units that are provided for information only
regarding the terminology.
and are not considered standard.
3.2 Definitions of Terms Specific to This Standard:
1.4 This standard does not purport to address all of the
3.2.1 D—a symbol used in this test method for the dissipa-
safety concerns, if any, associated with its use. It is the
tion factor.
responsibility of the user of this standard to establish appro-
3.2.2 ∆L—a correction factor associated with length which
priate safety and health practices and determine the applica-
correctsforthefringingcapacitanceattheendsoftheresonator
bility of regulatory limitations prior to use.
element.
3.2.3 κ'—symbol used in this test method to denote relative
2. Referenced Documents
permittivity.
2
2.1 ASTM Standards:
3.2.3.1 Discussion—The preferred symbol for permittivity
D150Test Methods forAC Loss Characteristics and Permit-
is Greek kappa prime but some persons use other symbols to
tivity (Dielectric Constant) of Solid Electrical Insulation
denote this property such as DK, SIC,or ε' .
R
D1711Terminology Relating to Electrical Insulation
3.2.4 microstrip line—a microwave transmission line em-
ploying a flat strip conductor bonded to one surface of a
dielectric board or sheet, the other surface of which is clad
1
This test method is under the jurisdiction of ASTM Committee D09 on
with,orbondedto,acontinuousconductivefoilorplatewhich
Electrical and Electronic Insulating Materials and is the direct responsibility of
is substantially wider than the strip.
Subcommittee D09.12 on Electrical Tests.
Current edition approved Jan. 1, 2010. Published February 2010. Originally
approved in 1975. Last previous edition approved in 2003 as D3380–90(2003).
3
DOI: 10.1520/D3380-10. The last approved version of this historical standard is referenced on
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or www.astm.org.
4
contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM AvailablefromIPC,3000LakesideDrive,Suite309S,Bannockburn,IL60015.
5
Standards volume information, refer to the standard’s Document Summary page on Available from Institute of Electrical and Electronics Engineers, Inc. (IEEE),
the ASTM website. 445 Hoes Ln., P.O. Box 1331, Piscataway, NJ 08854-1331, http://www.ieee.org.
*A Summary of Changes section appears at the end of this standard
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1

---------------------- Page: 1 ----------------------
D3380 − 10
3.2.4.1 Discussion—Microstrip provides easier accessibility
thanstriplinefora
...

This document is not anASTM standard and is intended only to provide the user of anASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
An American National Standard
Designation:D3380–90(Reapproved 2003) Designation: D3380 – 10
Standard Test Method for
Relative Permittivity (Dielectric Constant) and Dissipation
1
Factor of Polymer-Based Microwave Circuit Substrates
This standard is issued under the fixed designation D3380; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope*
1.1 This test method permits the rapid measurement of apparent relative permittivity and loss tangent (dissipation factor) of
metal-clad polymer-based circuit substrates in the X-band (8 to 12.4 GHz).
1.2 ThistestmethodissuitablefortestingPTFE(polytetrafluorethylene)impregnatedglassclothorrandom-orientedfibermats,
glass fiber-reinforced polystyrene, polyphenyleneoxide, irradiated polyethylene, and similar materials having a nominal specimen
1
thicknessof ⁄16in.(1.6mm).Thematerialsareapplicabletoservicelistedintheprecedingsentencehavebeenusedincommercial
applications at nominal frequency of 9.6 GHz.
NOTE 1—SeeAppendix X1 for additional information about range of permittivity, thickness other than 1.6 mm, and tests at frequencies other than 9.6
GHz.
1.3The values stated in inch-pound units are to be regarded as the standard.
1.3 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical
conversions to SI units that are provided for information only and are not considered standard.
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory
limitations prior to use.
2. Referenced Documents
2
2.1 ASTM Standards:
D150 Test Methods for AC Loss Characteristics and Permittivity (Dielectric Constant) of Solid Electrical Insulation
D618Practice for Conditioning Plastics for Testing
D1711 Terminology Relating to Electrical Insulation
D2520 Test Methods for Complex Permittivity (Dielectric Constant) of Solid Electrical Insulating Materials at Microwave
Frequencies and Temperatures to 1650C C
D6054 Practice for Conditioning Electrical Insulating Materials for Testing
3
2.2 IPC Standards:
IPC-TM-650 Test Methods Manual Method 2.5.5.5.
IPC-CF-150E CopperIPC-MF-4562 Metal Foil for Printed Wiring Applications.
4
2.3 IEEE Standards:
Standard No. 488.1 Standard Digital Interface for Programmable Instrumentation.
Standard No. 488.2 Standards, Codes, Formats, Protocols and Common Commands for use with ANSI and IEEE Stan-
dard488.1.
3. Terminology
3.1 Definitions—See Terminology D1711 for the definitions of terms used in this test method. See also Test Methods D2520,
1
This test method is under the jurisdiction of ASTM Committee D09 on Electrical and Electronic Insulating Materials and is the direct responsibility of Subcommittee
D09.12 on Electrical Tests.
´1
Current edition approved March 10, 2003. Published May 2003. Originally approved in 1975. Last previous edition approved in 1995 as D3380–90 (1995) . DOI:
10.1520/D3380-90R03.
Current edition approved Jan. 1, 2010. Published February 2010. Originally approved in 1975. Last previous edition approved in 2003 as D3380–90(2003). DOI:
10.1520/D3380-10.
2
ForreferencedASTMstandards,visittheASTMwebsite,www.astm.org,orcontactASTMCustomerServiceatservice@astm.org.ForAnnualBookofASTMStandards
volume information, refer to the standard’s Document Summary page on the ASTM website.
3
Available from IPC, 2215 Sanders Rd., Northbrook, IL 60062.
3
Available from IPC, 3000 Lakeside Drive, Suite 309S, Bannockburn, IL 60015.
4
Available from Institute of Electrical and Electronics Engineers, Inc. (IEEE), 445 Hoes Ln., P.O. Box 1331, Piscataway, NJ 08854-1331, http://www.ieee.org.
*A Summary of Changes section appears at the end of this standard.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
1

---------------------- Page: 1 ----------------------
D3380 – 10
D150, and IPC TM-650 for additional information regarding the terminology.
3.2 Definitions of Terms Specific to This Standard:
3.2.1 D—a symbol used in this test method for the dissipation factor.
3.2.2 DL—a correction factor associated with length which corrects for the fringing capacitance at the
...

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