ASTM D6095-12
(Test Method)Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
SIGNIFICANCE AND USE
4.1 The electrical behavior of semiconducting extruded shielding materials is important for a variety of reasons, such as safety, static charges, and current transmission. This test method is useful in predicting the behavior of such semiconducting compounds. Also see Test Method D4496.
SCOPE
1.1 This test method covers the procedure for determining the volume resistivity, measured longitudinally, of extruded crosslinked and thermoplastic semiconducting, conductor and insulation shields for wire and cable.
1.2 In common practice the conductor shield is often referred to as the strand shield.
1.3 Technically, this test method is the measurement of a resistance between two electrodes on a single surface and modifying that value using dimensions of the specimen geometry to calculate a resistivity. However, the geometry of the specimen is such as to support the assumption of a current path primarily throughout the volume of the material between the electrodes, thus justifying the use of the term “longitudinal volume resistivity.” (See 3.1.2.1)
1.4 Whenever two sets of values are presented, in different units, the values in the first set are the standard, while those in parentheses are for information only.
1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. For a specific hazard statement, see 7.1.
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Designation: D6095 − 12
Standard Test Method for
Longitudinal Measurement of Volume Resistivity for
Extruded Crosslinked and Thermoplastic Semiconducting
1
Conductor and Insulation Shielding Materials
This standard is issued under the fixed designation D6095; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope* D4496 Test Method for D-C Resistance or Conductance of
Moderately Conductive Materials
1.1 This test method covers the procedure for determining
the volume resistivity, measured longitudinally, of extruded
3. Terminology
crosslinked and thermoplastic semiconducting, conductor and
3.1 Definitions of Terms Specific to This Standard:
insulation shields for wire and cable.
3.1.1 semiconducting, adj—moderately conductive, see Ter-
1.2 In common practice the conductor shield is often re-
minology D1711 and Test Method D4496.
ferred to as the strand shield.
3.1.2 longitudinal volume resistivity, n—an electrical resis-
1.3 Technically, this test method is the measurement of a
tance multiplied by a factor calculated from the geometry of a
resistance between two electrodes on a single surface and
specimen volume between electrodes in contact with one, and
modifying that value using dimensions of the specimen geom-
only one, surface of the specimen.
etry to calculate a resistivity. However, the geometry of the
3.1.2.1 Discussion—In normal wire and cable usage, the
specimen is such as to support the assumption of a current path
longitudinalvolumeresistivityissimplyreferredtoas“volume
primarily throughout the volume of the material between the
resistivity.” This usage is at variance with terminology in Test
electrodes, thus justifying the use of the term “longitudinal
Methods D257, Terminology D1711, and Test Method D4496.
volume resistivity.” (See 3.1.2.1)
4. Significance and Use
1.4 Whenever two sets of values are presented, in different
4.1 The electrical behavior of semiconducting extruded
units, the values in the first set are the standard, while those in
shielding materials is important for a variety of reasons, such
parentheses are for information only.
as safety, static charges, and current transmission. This test
1.5 This standard does not purport to address all of the
method is useful in predicting the behavior of such semicon-
safety concerns, if any, associated with its use. It is the
ducting compounds. Also see Test Method D4496.
responsibility of the user of this standard to establish appro-
5. Apparatus
priate safety and health practices and determine the applica-
bility of regulatory limitations prior to use. For a specific
5.1 See Test Method D4496 for a description of the
hazard statement, see 7.1.
apparatus, except the electrode system which is described in
7.2.
2. Referenced Documents
2
6. Sampling and Test Specimens
2.1 ASTM Standards:
D257 Test Methods for DC Resistance or Conductance of 6.1 Take one 2-ft (600-mm) sample from each lot, or from
Insulating Materials
each 25000 ft (7600 m) of completed cable, whichever is less.
D1711 Terminology Relating to Electrical Insulation
6.2 The specimen consists of a 10 in. (250 mm) length of
cable core with all layers external to the semi-conducting
insulation shield removed. Use this specimen to test the
1
This test method is under the jurisdiction of ASTM Committee D09 on
insulation shield. To test the conductor shield, bisect the
Electrical and Electronic Insulating Materials and is the direct responsibility of
Subcommittee D09.07 on Electrical Insulating Materials.
sample longitudinally and remove the conductor. Use only one
Current edition approved Nov. 1, 2012. Published November 2012. Originally
piece of the conductor shield as the test specimen.
approved in 1997. Last previous edition approved in 2006 as D6095 – 06. DOI:
10.1520/D6095-12.
6.3 Condition the specimens in accordance with Test
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
Method D4496.
contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
6.3.1 If the shielding materials are crosslinked, condition
Standards volume information, refer to the standard’s Document Summary page on
the ASTM website. the cable core (jacket removed) overnight at 50°C to eliminate
*A Summary of Changes section appears at the end of this standard
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1
---------------------- Page: 1 ----------------------
D6095 − 12
any acetophenone that is potentially present. Then proceed Insulation Shielding:
with the conditioning in accordance with T
...
Designation: D6095 − 06 D6095 − 12 An American National Standard
Standard Test Method for
Longitudinal Measurement of Volume Resistivity for
Extruded Crosslinked and Thermoplastic Semiconducting
1
Conductor and Insulation Shielding Materials
This standard is issued under the fixed designation D6095; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon («) indicates an editorial change since the last revision or reapproval.
1. Scope*
1.1 This test method covers the procedure for determining the volume resistivity, measured longitudinally, of extruded
crosslinked and thermoplastic semiconducting, conductor and insulation shields for wire and cable.
1.2 In common practice the conductor shield is often referred to as the strand shield.
1.3 Technically, this test method is the measurement of a resistance between two electrodes on a single surface and modifying
that value using dimensions of the specimen geometry to calculate a resistivity. However, the geometry of the specimen is such
as to support the assumption of a current path primarily throughout the volume of the material between the electrodes, thus
justifying the use of the term “longitudinal volume resistivity.” (See 3.1.2.1)
1.4 Whenever two sets of values are presented, in different units, the values in the first set are the standard, while those in
parentheses are for information only.
1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory
limitations prior to use. For a specific hazard statement, see 7.1.
2. Referenced Documents
2
2.1 ASTM Standards:
D257 Test Methods for DC Resistance or Conductance of Insulating Materials
D1711 Terminology Relating to Electrical Insulation
D4496 Test Method for D-C Resistance or Conductance of Moderately Conductive Materials
3. Terminology
3.1 Definitions of Terms Specific to This Standard:
3.1.1 semiconducting, adj—moderately conductive, see Terminology D1711 and Test Method D4496.
3.1.2 longitudinal volume resistivity, n—an electrical resistance multiplied by a factor calculated from the geometry of a
specimen volume between electrodes in contact with one, and only one, surface of the specimen.
3.1.2.1 Discussion—
1
This test method is under the jurisdiction of ASTM CommitteeD09 on
Electrical and Electronic Insulating Materials and is the direct responsibility of
Subcommittee D09.18 on Solid Insulations, Non-Metallic Shieldings and Coverings
2
for Electrical and Telecommunication Wires and Cables. For referenced ASTM standards, visit the ASTM website, www.astm.org, or
Current edition approved April 1, 2006Nov. 1, 2012. Published April 2006No- contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
vember 2012. Originally approved in 1997. Last previous edition approved in Standards volume information, refer to the standard’s Document Summary page on
20052006 as D6095–05.–06. DOI: 10.1520/D6095-06.10.1520/D6095-12. the ASTM website.
In normal wire and cable usage, the longitudinal volume resistivity is simply referred to as “volume resistivity.” This usage is at
variance with terminology in Test Methods D257, Terminology D1711, and Test Method D4496.
*A Summary of Changes section appears at the end of this standard
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1
---------------------- Page: 1 ----------------------
D6095 − 12
4. Significance and Use
4.1 The electrical behavior of semiconducting extruded shielding materials is important for a variety of reasons, such as safety,
static charges, and current transmission. This test method is useful in predicting the behavior of such semiconducting compounds.
Also see Test Method D4496.
5. Apparatus
5.1 See Test Method D4496 for a description of the apparatus, except the electrode system which is described in 7.2.
6. Sampling and Test Specimens
6.1 Take one 2-ft (600-mm) sample from each lot, or from each 25000 ft (7600 m) of completed cable, whichever is less.
6.2 The specimen consists of a 10 in. (250 mm) length of cable core with all layers external to the semi-conducting insulation
shield removed. Use this specimen to test the insulation shield. To test the conductor shield, bisect the sample longitudinally and
remove the conductor. Use only one piece of the conductor shield as the test specimen.
6.3 Condition the specimens in accordance with Test Method D4496.
6.3.1 If the shielding materials are crosslinked, condition the cable core (jacket removed) overnight at 50°C to eliminate any
acetophenone that may beis potentially present. Then proceed with the conditioning in accordance with Test Method D4496
...
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