EN 62132-5:2006
(Main)Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method
This measurement procedure describes a measurement method to quantify the RF immunity of integrated circuits (ICs) mounted on a standardized test board or on their final application board (PCB), to electromagnetic conductive disturbances.
Integrierte Schaltungen - Messung der elektromagnetischen Störfestigkeit im Frequenzbereich von 150 kHz bis 1 GHz - Teil 5: Verfahren mit Faradayschem Arbeitskäfig
Circuits intégrés - Mesure de l'immunité électromagnétique, 150 kHz à 1 GHz - Partie 5: Méthode de la cage de Faraday sur banc de travail
Cette procédure de mesure décrit une méthode de mesure pour quantifier l'immunité RF des circuits intégrés (CI) montés sur une carte d'essai normalisée ou dans leur application finale de carte d'essai (PCB), aux perturbations électromagnétiques conductrices.
Integrirana vezja – Meritve elektromagnetne odpornosti od 150 kHz do 1 GHz – 5. del: Metoda s Faradayevo kletko (IEC 62132-5:2005)
General Information
Standards Content (Sample)
SLOVENSKI SIST EN 62132-5:2006
STANDARD
julij 2006
Integrirana vezja – Meritve elektromagnetne odpornosti od 150 kHz do 1 GHz –
5. del: Metoda s Faradayevo kletko (IEC 62132-5:2005)
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz -
Part 5: Workbench Faraday cage method (IEC 62132-5:2005)
ICS 31.200; 33.100.20 Referenčna številka
© Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno
EUROPEAN STANDARD
EN 62132-5
NORME EUROPÉENNE
January 2006
EUROPÄISCHE NORM
ICS 31.200
English version
Integrated circuits –
Measurement of electromagnetic immunity, 150 kHz to 1 GHz
Part 5: Workbench Faraday cage method
(IEC 62132-5:2005)
Circuits intégrés – Integrierte Schaltungen –
Mesure de l'immunité électromagnétique, Messung der elektromagnetischen
150 kHz à 1 GHz Störfestigkeit im Frequenzbereich
Partie 5: Méthode de la cage de Faraday von 150 kHz bis 1 GHz
sur banc de travail Teil 5: Verfahren mit Faradayschem
(CEI 62132-5:2005) Arbeitskäfig
(IEC 62132-5:2005)
This European Standard was approved by CENELEC on 2005-12-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania,
Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden, Switzerland
and United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2006 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 62132-5:2006 E
Foreword
The text of document 47A/721/FDIS, future edition 1 of IEC 62132-5, prepared by SC 47A, Integrated
circuits, of IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was
approved by CENELEC as EN 62132-5 on 2005-12-01.
This standard is to be read in conjunction with EN 62132-1.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2006-09-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2008-12-01
This European Standard makes reference to International Standards. Where the International Standard
referred to has been endorsed as a European Standard or a home-grown European Standard exists, this
European Standard shall be applied instead. Pertinent information can be found on the CENELEC web
site.
__________
Endorsement notice
The text of the International Standard IEC 62132-5:2005 was approved by CENELEC as a European
Standard without any modification.
__________
NORME CEI
INTERNATIONALE
IEC
62132-5
INTERNATIONAL
Première édition
STANDARD
First edition
2005-10
Circuits intégrés –
Mesure de l'immunité électromagnétique,
150 kHz à 1 GHz –
Partie 5:
Méthode de la cage de Faraday
sur banc de travail
Integrated circuits –
Measurement of electromagnetic immunity,
150 kHz to 1 GHz –
Part 5:
Workbench Faraday cage method
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62132-5 IEC:2005 – 3 –
CONTENTS
FOREWORD.7
1 Scope.11
2 Normative references.11
3 Terms and definitions .11
4 General .13
4.1 Applicability .13
4.2 Measurement philosophy .13
4.3 Basic test set-up.15
4.4 Workbench concept.15
5 Test conditions .15
6 Test equipment.17
7 Test set-up .17
7.1 General .17
7.2 Shielding and ambient fields .19
7.3 Workbench set-up .19
7.4 Connections to the test board .19
7.5 Common-mode points.21
7.6 Workbench Faraday cage – Practical implementation.23
7.7 Test board.25
8 Test procedure .25
8.1 General .25
8.2 Requirements for the workbench Faraday cage test .27
9 Test report.27
Annex A (normative) Detailed specification of workbench Faraday cage (WBFC) .29
Annex B (informative) Theory of workbench Faraday cage method .37
Annex C (informative) Common-mode impedances.39
Annex D (informative) RF immunity levels .41
Bibliography .45
62132-5 IEC:2005 – 5 –
Figure 1 – Conducted immunity measurement method − General set-up .15
Figure 2 – Set-up for RF immunity testing using the workbench Faraday cage .19
Figure 3 – Influence of selected number of common-mode points .21
Figure 4 – Position of common-mode points .23
Figure A.1 – Mechanical drawing of workbench Faraday cage.31
Figure A.2 – Mechanical drawing of workbench – Cover .31
Figure A.3 – Low-pass feed-through filter .33
Figure A.4 – Example of a construction of the 150 Ω network .33
Figure A.5 – Example of the measured impedance of the 150 Ω network .33
Figure A.6 – Metallic calibration jig for common mode impedance measurements .35
Figure B.1 – Workbench Faraday cage lumped elements model .37
Table C.1 – Statistical values of radiation resistances measured on long cables .39
Table C.2 – CDN common-mode impedance parameters .39
Table D.1 – Test levels for immunity.41
62132-5 IEC:2005 – 7 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
INTEGRATED CIRCUITS –
MEASUREMENT OF ELECTROMAGNETIC IMMUNITY,
150 kHz TO 1 GHz –
Part 5: Workbench Faraday cage method
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62132-5 has been prepared by subcommittee 47A: Integrated
circuits, of IEC technical committee 47: Semiconductor devices.
The text of this standard is based on the following documents:
FDIS Report on voting
47A/721/FDIS 47A/728/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
62132-5 IEC:2005 – 9 –
This standard is to be read in conjunction with IEC 62132-1 .
IEC 62132 consists of the following parts, under the general title Integrated circuits –
Measurement of electromagnetic immunity, 150 kHz to 1 GHz:
Part 1: General conditions and definitions
Part 2: Measurement of Radiated Immunity – TEM-Cell and Wideband TEM-Cell Method
Part 3: Bulk Current Injection (BCI), 10 kHz to 1GHz
Part 4: Direct RF power injection method
Part 5: Workbench Faraday cage method
The committee has decided that the contents of this publication will remain unchanged until the
maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
___________
To be published.
Under consideration.
In preparation.
To be published.
62132-5 IEC:2005 – 11 –
INTEGRATED CIRCUITS –
MEASUREMENT OF ELECTROMAGNETIC IMMUNITY,
150 kHz TO 1 GHz –
Part 5: Workbench Faraday cage method
1 Scope
This measurement procedure describes a measurement method to quantify the RF immunity of
integrated circuits (ICs) mounted on a standardized test board or on their final application
board (PCB), to electromagnetic conductive disturbances.
2 Normative references
The following referenced documents are indispensable for the application of this document. For
dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments) applies.
IEC 60050(131): International Electrotechnical Vocabulary (IEV) – Chapter 131: Electric and
magnetic circuits
IEC 60050(161): International Electrotechnical Vocabulary (IEV) – Chapter 161: Electro-
magnetic compatibility
IEC 62132-1: Integrated circuits – Measurement of electromagnetic immunity, 150 kHz to
1 GHz – Part 1: General conditions and definitions
IEC 61000-4-6: Electromagnetic compatibility (EMC) – Part 4: Testing and measurement
techniques – Section 6: Immunity to conducted disturbances, induced by radio-frequency fields
3 Terms and definitions
For the purposes of this document, the definitions of IEC 62132-1, IEC 60050(131) and
IEC 60050(161), as well as the following, apply.
3.1
common-mode point
node in a circuit or at a PCB at which a single point is taken as signal terminal, the second
terminal being the signal’s reference (forming a 2-terminal port). As an example of a common-
mode point, the ground reference plane (V -plane) at an edge of a PCB is considered with
ss
respect to an external reference, e.g. the bottom of the workbench Faraday cage.
___________
To be published.
62132-5 IEC:2005 – 13 –
3.2
common-mode port
virtual node of a circuit or at a connector port at which the signal follows the vector sum of all
signals (including ground) at that port in relation to a reference port. As an example, the bottom
of the Workbench Faraday cage is considered an external reference. At a common-mode port
with multiple wires, this node can be established by using a passive summation network.
NOTE For a shielded (multi-wire) cable, the screen of that cable is used as common-mode port terminal. In this
case, the common-mode point is the screen of that cable.
4 General
4.1 Applicability
This standard applies to ICs that can perform "stand-alone" functions when used on a
physically small test board.
The RF immunity of these ICs can be measured under pre-defined conditions. In addition, the
method allows measurements on application boards. This gives the user an indication of the
expected immunity once the IC(s) is implemented.
This method makes it possible to classify ICs for dedicated functions where EMC constraints
are applicable. This might apply to ICs used with cordless telephones, other communication
devices and applications where EMC properties are important to obtain optimal operation e.g.
automotive, process measurement and control equipment and all other products that control
critical functions.
4.2 Measurement philosophy
The workbench method is derived from the IEC 61000-4-6. The method described in that
publication assumes that supply and signal cable(s) are attached to an electrically small test
board, with dimensions ≤ λ/2, i.e. 0,15 m at 1 GHz, see note. These connected cables become
the dominant antennas; the induced RF disturbance is injected to the test board via these
“antennas”.
NOTE The test board and its connected cables thereto should be partly supported by material with low dielectric
constant, as such ε = 1 is assumed, see also 7.7.
r
The connected cables will have functions such as supply, communication and other signal
interfaces and these cables are commonly not geometrically oriented in the same plane as the
other cables.
The antenna (common-mode) impedance per port has been normalised to 150 Ω with
tolerances in the various frequency bands. By injecting either a voltage in series or a current
through these common-mode impedances, the RF immunity test is established.
Direct injection of RF disturbance to the IC package is very small, see also IEC 62132-2 as an
additional measurement method, and often negligible compared to the disturbance injected
through the connected cable(s). Due to the fact that induced currents will flow through the
reference of the test board, indirect coupling between the voltages and currents through the
package are also established.
Because of the concept chosen, the workbench method shows the effect of the test board
layout, the IC supply decoupling, the RF performance of the used discrete components
(capacitors, inductors) as well as the measures taken on the IC (e.g. on-chip decoupling,
filtered inputs and Schmitt-triggers used, etc.). Similar modes of operation (by software or
function) shall be used for the various ICs to be tested to allow comparison. In addition, various
modes of operation with one IC allow comparison i.e. determination of contribution of individual
blocks within the IC.
62132-5 IEC:2005 – 15 –
4.3 Basic test set-up
The RF immunity measurements shall take place above a metallic reference plane, see
Figure 1 for an open set-up (according to IEC 61000-4-6). With common-mode impedances
defined by using the coupling and decoupling networks (CDNs), relations between the applied
disturbance voltage, while testing against RF immunity, and the locally created E/H fields can
be calculated.
4.4 Workbench concept
In principle coupling and decoupling is similar to the method given in IEC 61000-4-6; see
Figure 1. With this workbench method, a small Faraday cage is used. Discrete resistors,
connected to several common-mode points (to the PCB ground) or ports (as referred to the
signals) of the test board are implemented to represent the coupling.
RF power amplifier
RF signal generator
50 Ω
Equipment
termination resistor
under test
(EUT)
Coupling/ Coupling/
Auxillary
decoupling decoupling
equipment
network network
Measuring
Non-metal support
Reference plane
height
IEC 1310/05
RF source (generator and power amp) connected to one of the CDNs in turn. All other coupling and decoupling
networks CDNs need to be terminated with 50 Ω.
Figure 1 – Conducted immunity measurement method − General set-up
The decoupling of supply and/or other I/O lines takes place via inductances built on ferrite
cores representing impedances >> 150 Ω at the frequencies of interest and feed-through filters
installed on the wall of the cage. The workbench basic set-up is shown in Subclause 7.3.
5 Test conditions
The test conditions shall be as described in IEC 62132-1.
The workbench method can be used for either absolute or comparative testing of ICs, either on
the predefined, standardised test board, or for the measurement of definitive application
boards.
When measurements are carried out using a test board other than defined in IEC 62132-1, that
test board shall be described such that repetition of the measurement remains possible. When
necessary, a copy of the layout and circuit diagram shall be added to the test report.
62132-5 IEC:2005 – 17 –
6 Test equipment
The test equipment shall meet the requirements as described in IEC 62132-1.
For the purpose of the RF immunity test, the open-circuit test generator voltage is defined.
Adding series resistance (100 Ω with the coupling network) does not affect this open-circuit
test generator voltage. As such no compensation shall be applied during the immunity test.
The test generator used shall meet t
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