EN 60749-29:2003
(Main)Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing No Trouble Found and Electrical Overstress failures due to latch-up.
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 29: Latch-up-Prüfung
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 29: Essai de verrouillage
Couvre l'essai I et les essais de verrouillage de surtension des circuits intégrés. L'objet de cet essai est d'établir une méthode pour déterminer les caractéristiques de verrouillage des circuits intégrés et définir les critères de défaillance de verrouillage. Les caractéristiques de verrouillage sont utilisées dans la détermination de la fiabilité de produit et la minimisation des défaillances en rapport avec "l'absence d'observation de problèmes" et la "contrainte électrique excessive" du fait du verrouillage.
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2003)
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SLOVENSKI SIST EN 60749-29:2004
STANDARD
julij 2004
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up
test (IEC 60749-29:2003)
ICS 31.080.01 Referenčna številka
SIST EN 60749-29:2004(en)
© Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno
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EUROPEAN STANDARD EN 60749-29
NORME EUROPÉENNE
EUROPÄISCHE NORM December 2003
ICS 31.080
English version
Semiconductor devices –
Mechanical and climatic test methods
Part 29: Latch-up test
(IEC 60749-29:2003)
Dispositifs à semiconducteurs – Halbleiterbauelemente –
Méthodes d'essais mécaniques Mechanische und klimatische
et climatiques Prüfverfahren
Partie 29: Essai de verrouillage Teil 29: Latch-up-Prüfung
(CEI 60749-29:2003) (IEC 60749-29:2003)
This European Standard was approved by CENELEC on 2003-12-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Lithuania, Luxembourg, Malta,
Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2003 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60749-29:2003 E
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EN 60749-29:2003 - 2 -
Foreword
The text of document 47/1713/FDIS, future edition 1 of IEC 60749-29, prepared by IEC TC 47,
Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by
CENELEC as EN 60749-29 on 2003-12-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2004-03-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2006-12-01
__________
Endorsement notice
The text of the International Standard IEC 60749-29:2003 was approved by CENELEC as a European
Standard without any modification.
__________
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NORME CEI
INTERNATIONALE IEC
60749-29
INTERNATIONAL
Première édition
STANDARD
First edition
2003-11
Dispositifs à semiconducteurs –
Méthodes d'essais mécaniques et climatiques –
Partie 29:
Essai de verrouillage
Semiconductor devices –
Mechanical and climatic test methods –
Part 29:
Latch-up test
© IEC 2003 Droits de reproduction réservés ⎯ Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in any
utilisée sous quelque forme que ce soit et par aucun procédé, form or by any means, electronic or mechanical, including
électronique ou mécanique, y compris la photocopie et les photocopying and microfilm, without permission in writing from
microfilms, sans l'accord écrit de l'éditeur. the publisher.
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Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch Web: www.iec.ch
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60749-29 © IEC:2003 – 3 –
CONTENTS
FOREWORD . 5
1 Scope . 9
2 Definitions . 9
3 Apparatus and material.
...
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