EN 60749-26:2006

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive.

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 26: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Human Body Model (HBM)

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 26: Essai de sensibilité aux décharges électrostatiques (DES) - Modèle du corps humain (HBM)

Etablit une procédure normalisée pour les essais et la classification des dispositifs à semiconducteurs en fonction de leu sensibilité aux dommagesou de leur dégradation suite à leur exposition à des déchargesélectrostatiques (DES) sur un modèle decorps humain (HBM). Le but de cette norme est de fournir des résultats d essai de DES HBM fiables et reproductibles de manière que des classifications précises puissent être réalisées. Cette méthode d essai est applicable à tous lesdispositifs à semiconducteurs et elle est classée destructive

Polprevodniški elementi - Mehanske in klimatske preskusne metode - 26. del: Preskušanje občutljivosti na elektrostatične izpraznitve (ESD) - Model človeškega telesa (HBM) (IEC 60749-26:2006)

General Information

• Status: Withdrawn
• Publication Date: 24-Aug-2006
• Withdrawal Date: 31-Jul-2009
• ICS: 31.080.01 - Semiconductor devices in general
• Technical Committee: CLC/SR 47 - Semiconductor devices
• Drafting Committee: IEC/TC 47 - IEC_TC_47
• Parallel Committee: IEC/TC 47 - IEC_TC_47
• Current Stage: 9960 - Withdrawal effective - Withdrawal
• Start Date: 14-Apr-2017
• Completion Date: 14-Apr-2017
• Ref Project: SIST EN 60749-26:2007 - Semiconductor devices - Mechanical and climatic test methods -- Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

Relations

• Replaced By: EN 60749-26:2014 - Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
• Effective Date: 29-Jan-2023

Standards Content (Sample)

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EUROPEAN STANDARD
EN 60749-26

NORME EUROPÉENNE
August 2006
EUROPÄISCHE NORM

ICS 31.080.01


English version


Semiconductor devices -
Mechanical and climatic test methods
Part 26: Electrostatic discharge (ESD) sensitivity testing -
Human body model (HBM)
(IEC 60749-26:2006)


Dispositifs à semiconducteurs -  Halbleiterbauelemente -
Méthodes d'essais mécaniques Mechanische und klimatische
et climatiques Prüfverfahren
Partie 26: Essai de sensibilité aux Teil 26: Prüfung der Empfindlichkeit
décharges électrostatiques (DES) - gegen elektrostatische Entladungen
Modèle du corps humain (HBM) (ESD) -
(CEI 60749-26:2006) Human Body Model (HBM)
(IEC 60749-26:2006)




This European Standard was approved by CENELEC on 2006-08-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, the Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels


© 2006 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60749-26:2006 E

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EN 60749-26:2006 - 2 -
Foreword
The text of document 47/1859/FDIS, future edition 2 of IEC 60749-26, prepared by IEC TC 47,
Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by
CENELEC as EN 60749-26 on 2006-08-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2007-05-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2009-08-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60749-26:2006 was approved by CENELEC as a European
Standard without any modification.
__________

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- 3 - EN 60749-26:2006
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.

Publication Year Title EN/HD Year

1) 2)
IEC 60749-27 - Semiconductor devices - Mechanical and EN 60749-27 2006
climatic test methods
Part 27: Electrostatic discharge (ESD)
sensitivity testing - Machine model (MM)


1) 2)
IEC 61340-3-1 - Electrostatics EN 61340-3-1 2002
Part 3-1: Methods for simulation of
electrostatic effects - Human body model
(HBM) - Component testing




1)
Undated reference.
2)
Valid edition at date of issue.

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NORME CEI
INTERNATIONALE
IEC



60749-26
INTERNATIONAL


Deuxième édition
STANDARD

Second edition

2006-07


Dispositifs à semiconducteurs –
Méthodes d'essais mécaniques
et climatiques –
Parti
...