IEC PAS 62187:2000

Variable frequency vibration test method

The variable frequency vibration test is performed to determine the effect of vibration, within the specified frequency range, on the internal structural elements. Normally applicable to cavity-type packages.

General Information

• Status: Replaced
• Publication Date: 23-Aug-2000
• ICS: 31.080.01 - Semiconductor devices in general
• Technical Committee: TC 47 - Semiconductor devices
• Drafting Committee: WG 2 - TC 47/WG 2
• Current Stage: WPUB - Publication withdrawn
• Start Date: 30-Jun-2002
• Completion Date: 01-Jul-2002

Relations

• Replaced By: IEC 60749-12:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
• Effective Date: 05-Sep-2023

Standards Content (Sample)

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Edition 1.0
2000-08
Variable frequency
vibration test method
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IN TER N A TION AL Reference number
E L E C T R OT E CHNI CA L
IEC/PAS 62187
C O MMI S S I O N
Copyright © 1989, JEDEC; 2000, IEC

INTERNATIONAL ELECTROTECHNICAL COMMISSION

____________
VARIABLE FREQUENCY
VIBRATION TEST METHOD
FOREWORD
A PAS is a technical specification not fulfilling the requirements for a standard, but made available to the
public and established in an organization operating under given procedures.
IEC-PAS 62187 was submitted by JEDEC and has been processed by IEC technical committee 47: Semiconductor
devices.
The text of this PAS is based on the This PAS was approved for
following document: publication by the P-members of the
committee concerned as indicated in
the following document:
Draft PAS Report on voting
47/1460/PAS 47/1493/RVD
Following publication of this PAS, the technical committee or subcommittee concerned will investigate the
possibility of transforming the PAS into an International Standard.
An IEC-PAS licence of copyright and assignment of copyright has been signed by the IEC and JEDEC and is
recorded at the Central Office.
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising all
national electrotechnical committees (IEC National Committees). The object of the IEC is to promote international co-
operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition
to other activities, the IEC publishes International Standards. Their preparation is entrusted to technical committees;
any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International,
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determined by agreement between the two organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all interested

National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form of
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transparently to the maximum extent possible in their national and regional standards. Any divergence between the
IEC Standard and the corresponding national or regional standard shall be clearly indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is draw
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