CISPR 16:1977
(Main)CISPR specification for radio interference measuring apparatus and measurement methods
CISPR specification for radio interference measuring apparatus and measurement methods
Spécification du CISPR pour les appareils et les méthodes de mesure des perturbations radioélectriques
General Information
Relations
This May Also Interest You
CISPR 17:2011 specifies methods to measure the radio interference suppression characteristics of passive EMC filtering devices used in power and signal lines, and in other circuits. The defined methods may also be applied to combinations of over-voltage protection devices and EMC filtering devices. The measurement method covers the frequency range from 9 kHz to several GHz depending on the device and test circuit. The standard describes procedures for laboratory tests (type tests) as well as factory tests. The suppression characteristics of EMC filters and components used for the suppression of EM disturbances, are a function of numerous variables such as impedance of the circuits to which they connect, operating voltage and current, and ambient temperature. This standard specifies uniform test methods that will enable comparison of filtering and suppression characteristics determined by test laboratories or specified by manufacturers. Measurement procedures are provided for unbiased and bias conditions. Measurements under bias conditions are performed to determine potential non-linear behaviour of the EMC filtering devices such as saturation effects in inductors with magnetic cores. This testing serves to show the usability in a specific application (such as frequency converters that produce high amplitudes of common mode pulse current and thus may drive inductors into saturation). Measurement under bias conditions may be omitted if the non-linear behaviour can be determined by other methods (e.g. separate saturation measurement of the inductors used). The first edition of CISPR 17 (1981) prescribed the measurement methods of insertion loss mainly for power-line filters. Today, however, many types of sophisticated EMC filters and suppression components can be found in various electronic devices. Those filters need to be characterized using standardized measurement methods. New methods for measurement of impedance and S-parameters for such EMI devices are included in this second edition.
- Standard132 pagesEnglish and French languagesale 15% off
The second part of CISPR 16 specifies the methods of measurement of EMC phenomena in the frequency range 9kHz to 18 GHz. It deals with disturbance measurements and immunity measurements.
- Standard151 pagesEnglish and French languagesale 15% off
- Standard169 pagesEnglish and French languagesale 15% off
- Standard213 pagesEnglish and French languagesale 15% off
Defines a new subclause on field-strength measurements in the frequency range 1 GHz to 18 GHz.
- Standard19 pagesEnglish and French languagesale 15% off
Specifies the characteristics and performance of equipment for the measurement of radio disturbance voltages, currents and fields in the frequency range 9 Hz to 18 GHz. In addition, requirements are specified for specialized equipment for discontinuous disturbance measurements. The requirements include the measurement of broadband and narrowband types of radio disturbance. Replaces the second edition of CISPR 16 published in 1987.
- Standard220 pagesEnglish and French languagesale 15% off
- Standard275 pagesEnglish and French languagesale 15% off
- Standard75 pagesEnglish and French languagesale 15% off
- Standard4 pagesEnglish and French languagesale 15% off
Prescribes methods of measurement of insertion loss of passive radio frequency suppression filters, which may consist of single elements, such as capacitors, inductors or resistors, or combinations of inductors, capacitors and resistors of either the lumped or distributed types. The methods include those for use in a laboratory or on a production line, utilizing fixed impedance terminations or "worst case" terminations, those to be used in situ or in model installations, and provides for voltage and current loading.
- Standard52 pagesEnglish and French languagesale 15% off
- Standard10 pagesEnglish and French languagesale 15% off
IEC 61000-5-6:2024 covers guidelines for the mitigation of external electromagnetic influences impinging upon a facility or installation, aimed at ensuring electromagnetic compatibility (EMC) among electrical and electronic apparatus or systems. These influences include lightning, RF transmitters, power-line and telecom transients, high-altitude electromagnetic pulse (HEMP) and other high-power electromagnetic transients such as those from intentional electromagnetic interference (IEMI). This document is intended for use by installers, manufacturers and users of sensitive electrical or electronic installations or systems. It applies primarily to new installations but, where economically feasible, it can be applied to extensions or modifications to existing facilities. While the technical principles are applicable to individual equipment or apparatus, such application is not included in the scope of this document.
This first edition cancels and replaces the first edition of IEC TR 61000-5-6 published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) updating the whole document to include other HPEM environments including IEMI;
b) adding a new Annex A which provides details on the concept of EM resilience and includes information on HPEM detectors, recovery and restoration.
- Standard74 pagesEnglish languagesale 15% off
IEC TR 61000-1-9:2024 which is a Technical Report, provides examples for the evaluation of measurement uncertainty of harmonic emission tests performed using IEC 61000-3-2 and IEC 61000-3-12, and their application to the relevant conformity decisions. It also contains practical formulae to enable calculations in accordance with ISO/IEC Guide 98-3 (GUM).
- Technical report23 pagesEnglish languagesale 15% off
Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.