SIST EN 62884-2:2018

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method (IEC 62884-2:2017)

This part of IEC 62884 specifies the methods for the measurement and evaluation of the
phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including
dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator
(FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that
allows the accurate measurement of RMS jitter.
In the measurement method, phase noise measurement equipment or a phase noise
measurement system is used.
NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.

Messverfahren für piezoelektrische, dielektrische und elektrostatische Oszillatoren – Teil 2: Messverfahren für Phasenjitter

Techniques de mesure des oscillateurs piézoélectriques, diélectriques et électrostatiques - Partie 2 : méthode de mesure des gigues de phase

L'IEC 62884-2:2017 spécifie les méthodes de mesure et d'évaluation du mesurage de la gigue de phase des oscillateurs piézoélectriques, diélectriques et électrostatiques, y compris les oscillateurs à résonateur diélectrique (DRO - dielectric resonator oscillators) et les oscillateurs utilisant un résonateur à ondes acoustiques de volume à couches fines (FBAR - film bulk acoustic resonator) (appelés ici « oscillateur ») et donne des recommandations relatives à la gigue de phase permettant de mesurer avec exactitude la gigue efficace.
Dans la méthode de mesure, un matériel ou système de mesure du bruit de phase est utilisé.
NOTE Les oscillateurs à résonateur diélectrique (DRO - dielectric resonator oscillator) et les oscillateurs utilisant un FBAR sont à l'étude.

Merilne tehnike za piezoelektrične, dielektrične in elektrostatične oscilatorje - 2. del: Metoda za merjenje faznega trepetanja (IEC 62884-2:2017)

Ta del standarda IEC 62884 določa metode za merjenje in ocenjevanje faznega trepetanja piezoelektričnih, dielektričnih in elektrostatičnih oscilatorjev, vključno z oscilatorji z dielektričnimi resonatorji (DRO) in oscilatorji, ki uporabljajo tankoslojni akustični resonator (FBAR) (v nadaljevanju »oscilator«), ter določa smernice za fazno trepetanje, ki omogočajo natančno merjenje trepetanja RMS.
Pri merilni metodi se uporablja oprema za merjenje faznega šuma ali sistem za merjenje faznega šuma.
OPOMBA: Obravnavani so oscilatorji z dielektričnim resonatorjem (DRO) in oscilatorji, ki uporabljajo resonator FBAR.

General Information

• Status: Published
• Publication Date: 11-Dec-2017
• ICS: 31.140 - Piezoelectric devices
• Technical Committee: I11 - Imaginarni 11
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 06-Dec-2017
• Due Date: 10-Feb-2018
• Completion Date: 12-Dec-2017
• Ref Project: EN 62884-2:2017 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 62884-2:2018
01-februar-2018
0HULOQHWHKQLNH]DSLH]RHOHNWULþQHGLHOHNWULþQHLQHOHNWURVWDWLþQHRVFLODWRUMH
GHO0HWRGD]DPHUMHQMHID]QHJDWUHSHWDQMD,(&
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2:
Phase jitter measurement method (IEC 62884-2:2017)
Ta slovenski standard je istoveten z: EN 62884-2:2017
ICS:
31.140 3LH]RHOHNWULþQHQDSUDYH Piezoelectric devices
SIST EN 62884-2:2018 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 62884-2:2018

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SIST EN 62884-2:2018


EUROPEAN STANDARD EN 62884-2

NORME EUROPÉENNE

EUROPÄISCHE NORM
December 2017
ICS 31.140

English Version
Measurement techniques of piezoelectric, dielectric and
electrostatic oscillators - Part 2: Phase jitter measurement
method
(IEC 62884-2:2017)
Techniques de mesure des oscillateurs piézoélectriques, Messverfahren für piezoelektrische, dielektrische und
diélectriques et électrostatiques - Partie 2 : méthode de elektrostatische Oszillatoren - Teil 2: Messverfahren für
mesure des gigues de phase Phasenjitter
(IEC 62884-2:2017) (IEC 62884-2:2017)
This European Standard was approved by CENELEC on 2017-10-04. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.



European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
 Ref. No. EN 62884-2:2017 E

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SIST EN 62884-2:2018
EN 62884-2:2017 (E)


European foreword
The text of document 49/1212/CDV, future edition 1 of IEC 62884-2:2017, prepared by IEC/TC 49
"Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control,
selection and detection" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN 62884-2:2017.

The following dates are fixed:

• latest date by which this document has (dop) 2018-07-04
to be implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2020-10-04
standards conflicting with this
document have to be withdrawn

Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

Endorsement notice
The text of the International Standard IEC 62884-2:2017 was approved by CENELEC as a European
Standard without any modification.
2

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SIST EN 62884-2:2018
EN 62884-2:2017 (E)

Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content

constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant

EN/HD applies.

NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60027 series Letter symbols to be used in electrical EN 60027 series
technology
IEC 60050-561 -  International electrotechnical vocabulary - - -
Part 561: Piezoelectric, dielectric and
electrostatic devices and associated
materials for frequency control, selection
and detection
IEC 60469 -  Transitions, pulses and related waveforms EN 60469 -
- Terms, definitions and algorithms
IEC 60617 -  Standard data element types with - -
associated classification scheme for
electric components -- Part 4: IEC
reference collection fo standard data
element types and component classes
IEC 60679-1 2017 Piezoelectric, dielectric and electrostatic EN 60679-1 2017
oscillators of assessed quality - Part 1 :
Generic specification
IEC 62884-1 2017 Measurement techniques of piezoelectric, EN 62884-1 2017
dielectric and electrostatic oscillators - Part
1: Basic methods for the measurement
ISO 80000-1 -  Quantities and units -- Part 1: General EN ISO 80000-1 -


3

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SIST EN 62884-2:2018




IEC 62884-2

®


Edition 1.0 2017-08




INTERNATIONAL



STANDARD








colour

inside










Measurement techniques of piezoelectric, dielectric and electrostatic

oscillators –

Part 2: Phase jitter measurement method


























INTERNATIONAL

ELECTROTECHNICAL


COMMISSION





ICS 31.140 ISBN 978-2-8322-4762-4



  Warning! Make sure that you obtained this publication from an authorized distributor.


® Registered trademark of the International Electrotechnical Commission

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SIST EN 62884-2:2018
– 2 – IEC 62884-2:2017 © IEC 2017
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
4 Test and measurement procedures . 8
4.1 General . 8
4.2 Test methods of phase jitter . 8
4.2.1 General . 8
4.2.2 Measurement in the time domain . 8
4.2.3 Measurement in the data domain . 9
4.2.4 Measurement in the frequency domain . 9
4.3 Input and output impedances of the measurement system . 13
4.4 Measurement equipment . 13
4.4.1 General . 13
4.4.2 Jitter floor . 13
4.4.3 Output wave form . 13
4.4.4 Output voltage . 14
4.5 Test fixture. 14
4.6 Cable, tools and instruments, and so on . 14
5 Measurement and the measurement environment . 14
5.1 Set-up before taking measurements . 14
5.2 Points to be considered and noted at the time of measurement . 14
5.3 Treatment after the measurement . 14
6 Measurement . 15
6.1 Reference temperature . 15
6.2 Measurement of temperature characteristics . 15
6.3 Measurement under vibration . 15
6.4 Measurement at the time of impact . 15
6.5 Measurement in accelerated ageing . 15
7 Other points to be noted . 15
8 Miscellaneous . 15
Annex A (normative)  Calculation method for the amount of phase jitter . 16
A.1 General . 16
A.2 Explanation . 16
A.3 Relations between phase noise and phase jitter . 16
A.4 Commentary on theoretical positioning of phase jitter . 18
A.5 Description . 18
A.5.1 General . 18
A.5.2 RMS jitter . 19
A.5.3 Peak-to-peak jitter . 19
A.5.4 Random jitter . 20
A.5.5 Deterministic jitter . 20
A.5.6 Period (periodic) jitter . 20
A.5.7 Data-dependent jitter . 20
A.5.8 Total jitter . 21

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IEC 62884-2:2017 © IEC 2017 – 3 –
A.6 Points to be considered for measurement . 21
A.6.1 Measurement equipment . 21
A.6.2 Factors of measurement errors . 22
Bibliography . 24

Figure 1 – Phase jitter measurement with sampling oscilloscope . 9
Figure 2 – Block diagram of a jitter and wander analyser according to ITU-T O.172 . 11
Figure 3 – Equivalent block diagram . 13
Figure A.1 – Concept diagram of SSB phase noise . 18
Figure A.2 – Voltage versus time . 19
Figure A.3 – Explanatory diagram of the amount of jitter applied to RMS jitter . 21
Figure A.4 – Explanatory diagrams of random jitter, deterministic jitter, and total jitter . 22

Table 1 – Fourier frequency range for phase noise test . 10
Table 2 – Standard bit rates for various applications . 12

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SIST EN 62884-2:2018
– 4 – IEC 62884-2:2017 © IEC 2017
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

MEASUREMENT TECHNIQUES OF PIEZOELECTRIC,
DIELECTRIC AND ELECTROSTATIC OSCILLATORS –

Part 2: Phase jitter measurement method

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62884-2 has been prepared by IEC technical committee 49:
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency
control, selection and detection.
The text of this International Standard is based on the following documents:
CDV Report on voting
49/1212/CDV 49/1243/RVC

Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.

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SIST EN 62884-2:2018
IEC 62884-2:2017 © IEC 2017 – 5 –
A list of all parts in the IEC 62884 series, published under the general title Measurement
techniques of piezoelectric, dielectric and electrostatic oscillators, can be found on the IEC
website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.

IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.

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SIST EN 62884-2:2018
– 6 – IEC 62884-2:2017 © IEC 2017
INTRODUCTION
A crystal oscillator as a highly efficient and highly precise source of a frequency oscillation is
widely used for fields such as the electronic equipment, communication equipment,
measurement equipment and a clock. Also recently, digitalization of these equipments is
advancing rapidly. In this situation, the frequency of crystal oscillator requires high precision
and high stability and reduction of noise with oscillating phenomenon. A phase jitter is one of
the noise characteristic in oscillation characteristic and precise measurement which is needed
when shipping a component to a customer.
For advance application in electronic information and communication technology,
(e.g. advanced satellite communications, control circuits for electric vehicle (EV)), necessity
arises for the measurement method for common guidelines of phase jitter. In these days,
measurement method of phase jitter also becomes more important from the electromagnetic
influence (EMI) point of view.
This document has been restructured from IEC 60679-1:2007 (third edition) and
IEC 60679-6:2011 (first edition). The test methods for oscillators have been separated from
IEC 60679-6:2011 into IEC 62884 (all parts). This document covers the phase jitter
measurement.

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SIST EN 62884-2:2018
IEC 62884-2:2017 © IEC 2017 – 7 –
MEASUREMENT TECHNIQUES OF PIEZOELECTRIC,
DIELECTRIC AND ELECTROSTATIC OSCILLATORS –

Part 2: Phase jitter measurement method



1 Scope
This part of IEC 62884 specifies the methods for the measurement and evaluation of the
phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including
dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator
(FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that
allows the accurate measurement of RMS jitter.
In the measurement method, phase noise measurement equipment or a phase noise
measurement system is used.
NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
IEC 60027 (all parts), Letter symbols to be used in electrical technology
IEC 60050-561, International Electrotechnical Vocabulary – Part 561: Piezoelectric, dielectric
and electrostatic devices and associated materials for frequency control, selection and
detection
IEC 60679-1:2017, Piezoelectric, dielectric and electrostatic oscillators of assessed quality –
Part 1: Generic specification
IEC 60469, Transitions, pulses and related waveforms – Terms, definitions and algorithms
IEC 60617, Graphical symbols for diagrams (available at http://std.iec.ch/iec60617)
IEC 62884-1:2017, Measurement techniques of piezoelectric, dielectric and electrostatic
oscillators – Part 1: Basic methods for the measurement
ISO 80000-1, Quantities and units – Part 1: General
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60027 (all parts),
IEC 60050-561, IEC 60469, IEC 60617, IEC 60679-1 and ISO 80000-1 apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/

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SIST EN 62884-2:2018
– 8 – IEC 62884-2:2017 © IEC 2017
• ISO Online browsing platform: available at http://www.iso.org/obp
4 Test and measurement procedures
4.1 General
The test and measurement procedures are given in Clause 4 of IEC 62884-1:2017 and shall
be applied as indicated in 4.2 to Clause 8.
4.2 Test methods of phase jitter
4.2.1 General
As the measurement method, the phase noise measurement equipment (system) or the
specially designed phase jitter measurement equipment shall be used.
Three basic methods are described:
a) measurement in the time domain by use of a digital real-time or sampling oscilloscope;
b) measurement in the data domain (BER test set);
c) measurement in the frequency domain using
1) a phase noise test set, or
2) a jitter and wander test set.
Method c) 1) using a phase noise test set is the recommended measurement method because
it allows sufficient accuracy for arbitrary oscillator output frequencies.
– In the measurement of phase jitter and wander of oscillator circuits, attention should be
paid to relative measurement reproducibility.
– A user and a manufacturer should deepen understanding through discussion about
relative measurement reproducibility.
– Measurement equipment (including software program) should be made clear between a
manufacturer and a user through a contract.
– When phase jitter and wander is calculated from phase noise, the range of frequency
deviation should be made clear between a user and a manufacturer through a contract.
4.2.2 Measurement in the time domain
Digital real-time or sampling oscilloscopes with wide bandwidth, fast sampling rates, and large
data memories are commercially available (see Figure 1), in some cases with special jitter
evaluation software.

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SIST EN 62884-2:2018
IEC 62884-2:2017 © IEC 2017 – 9 –

Sampling
Delay line

scope
スコープ

Trigger
Input


Power
Oscillator

splitter


IEC
Figure 1 – Phase jitter measurement with sampling oscilloscope
The time variation of the edges of the clock signal relative to the trigger edge is displayed and
stored over a large number (typically thousands) of cycles. Instrument software allows the
determination of the peak-to-peak jitter value and a statistical evaluation of its distribution.
The sampling oscilloscope method does not allow an accurate evaluation of the spectral
content of the jitter. Also, jitter larger than one unit interval (UI) cannot be distinguished.
The measured jitter value is worse than the jitter of the device under test due to the internal
jitter of the instrument’s clock.
2 2
J = (J ) − (J )
DUT meas int
where
J is the measured jitter;
DUT
J is the jitter of the device under test;
meas
J is the internal jitter of the instrument’s clock.
int
High stability/low noise Oscillator exhibits a significantly lower jitter than the instrument’s
clock jitter and trigger stability. Therefore, this technology is currently not suitable for accurate
jitter measurement of such Oscillator.
4.2.3 Measurement in the data domain
Bit-error rate (BER) test sets are used for measuring bit-error rate to characterise the overall
system performance of a communication subsystem. It is difficult to deduct the contribution of
the Oscillator jitter to the system BER. This method also does not yield quantitative jitter
performance values for the Oscillator.
4.2.4 Measurement in the frequency domain
4.2.4.1 Methods of phase noise test set
Phase jitter can be tested in the frequency domain using the well-established phase noise test
method with a phase locked loop as described in 4.5.25 of IEC 62884-1:2017.
The range of detuned frequency shall be determined by contracts between customers and
suppliers after discussion between them. The formula for calculating the RMS jitter from a
phase noise is based on the calculation method for the amount of phase jitter shown in
Annex A.

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SIST EN 62884-2:2018
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For given SDH/SONET applications, the Fourier frequency range (f . f ) may be
min max
selected as described in 3.2.53 of IEC 60679-1:2017. If not specified in the relevant data
sheet, the recommended Fourier frequency range is as given by f to f in Table 1.
3 4
Table 1 – Fourier frequency range for phase noise test
Oscillator output frequency f = f f = f
f
0 min 4 max
3
1 MHz to < 10 MHz 10 Hz 10 kHz 100 kHz
10 MHz to < 50 MHz 20 Hz 20 kHz 500 kHz
50 MHz to < 200 MHz 100 Hz 50 kHz 1,5 MHz
200 MHz to < 1 000 MHz 1,0 kHz 200 kHz 5,0 MHz
1 000 MHz to < 5 000 MHz 5,0 kHz 500 kHz 15 MHz
≥ 5 000 MHz 20 kHz 2 MHz 80 MHz

From Table 1, it can be seen that the most stringent requirement applies over the range f to
3
f .
4
Jitter performance over a frequency-band other than f to f may also be defined.
3 4
To compute the phase jitter, the phase noise data L(f) have to be integrated in the considered
frequency ranges and evaluated as follows.
Compute the spectral density of phase fluctuations S (f) from the single-sideband phase noise
φ
plot 10 log L (f):
10
S( f)= 2L( f)
φ

Integrate S (f) over the specified Fourier frequency range f to f to get the mean squared
φ min max
phase jitter in that bandwidth:
f
max
2
( ) ( )
∆ϕ f = S f df
ϕ
∫
f
min
The mean square phase jitter can be approximated by stepwise integration over the specified
Fourier frequency range f to f segmented by n, for example:
min max
2
∆φ( f) ≈ S( f)∆f
∑ φ i i
where
Δf = f – f (i = 1.n - 1)
i i+1 i
with
f = f and f = f
1 min n max

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SIST EN 62884-2:2018
IEC 62884-2:2017 © IEC 2017 – 11 –
The square root Δφ(f) of the integral is the effective or RMS phase jitter in radians. It can be
converted into degrees, fractions of unit interval (UI), or time (in seconds) by multiplication
with the following factor k:
Degree Unit interval Time
UI s
°
k = 1/(2πf )
360/2π 1/(2π)
c

For random jitter, the peak-to-peak value is assumed to be 7 times the value computed above
(see 3.2.53 of IEC 60679-1:2017).
Accuracy:
A 1 dB error of the phase noise data 10 log L(f) over the full Fourier frequency range causes
10
a jitter inaccuracy of approximately 10 %.
4.2.4.2 Methods of communication analyser
Commercially available communication analyser may be used to measure jitter and wander of
clock sources with the method described in ITU-T Recommendation O.172 (see Figure 2). The
working principle is similar to the phase noise measurement technique using the quadrature
method. Softwares supplied with the test sets deliver directly all characteristic values for jitter
and wander in numeric and graphical presentation.
Jitter free
Clock with Demodulator
reference clock
output
jitter and generation
wander

ψ U ~ Δψ
Digital signal
UI
Pattern
pp
Ext.
HP
LP
U
(with jitter UI
Clock
Jitter RMS
and wander) Int. Weighting
Phase detector
filters Result
Peak-peak
evaluation
RMS
and
display
External clock

 TIE

PLL
PLL LP
(wander
10 Hz
measurement)
MTIE
Internal ref
...