SIST EN 61988-5:2010

Plasma display panels - Part 5: Generic specification (IEC 61988-5:2009)

This generic specification for plasma display panels specifies general procedures for quality assessment to be used in the IECQ-CECC system and establishes general principles for describing and testing of electrical, optical, mechanical and environmental characteristics.

Plasmabildschirme - Teil 5: Fachgrundspezifikation (IEC 61988-5:2009)

Panneaux d'affichage à plasma - Partie 5: Spécifications génériques (IEC 61988-5:2009)

La CEI 61988-5:2009 est une spécification générique, relative aux panneaux d'affichage à plasma, définit les procédures générales pour l'assurance de la qualité à utiliser dans le système IECQ-CECC et établit des principes généraux pour décrire et mesurer les caractéristiques électriques, optiques, mécaniques et de tenue à l'environnement.

Plošče s plazemskimi prikazovalniki - 5. del: Rodovna specifikacija (IEC 61988-5:2009)

Ta rodovna specifikacija za plošče s plazemskimi prikazovalniki podaja splošne postopke za ocenjevanje kakovosti, ki se uporabljajo v IECQ-CECC sistemu (IEC sistem za ugotavljanje kakovosti elektronskih elementov - CENELEC združenje elektronskih komponent), ter vzpostavlja splošna načela za opisovanje in preskušanje električnih, optičnih, mehanskih in okoljskih značilnosti.

General Information

• Status: Published
• Publication Date: 17-Jan-2010
• ICS: 31.260 - Optoelectronics. Laser equipment
• Technical Committee: I11 - Imaginarni 11
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 22-Dec-2009
• Due Date: 26-Feb-2010
• Completion Date: 18-Jan-2010
• Ref Project: EN 61988-5:2009 - Plasma display panels - Part 5: Generic specification

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 61988-5:2010
01-februar-2010
3ORãþHVSOD]HPVNLPLSULND]RYDOQLNLGHO5RGRYQDVSHFLILNDFLMD,(&

Plasma display panels - Part 5: Generic specification (IEC 61988-5:2009)
Plasmabildschirme - Teil 5: Fachgrundspezifikation (IEC 61988-5:2009)
Panneaux d'affichage à plasma - Partie 5: Spécifications génériques (IEC 61988-5:2009)
Ta slovenski standard je istoveten z: EN 61988-5:2009
ICS:
31.260 Optoelektronika, laserska Optoelectronics. Laser
oprema equipment
SIST EN 61988-5:2010 en,fr
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------

SIST EN 61988-5:2010

---------------------- Page: 2 ----------------------

SIST EN 61988-5:2010

EUROPEAN STANDARD
EN 61988-5

NORME EUROPÉENNE
December 2009
EUROPÄISCHE NORM

ICS 31.260


English version


Plasma display panels -
Part 5: Generic specification
(IEC 61988-5:2009)


Panneaux d'affichage à plasma -  Plasmabildschirme -
Partie 5: Spécification générique Teil 5: Fachgrundspezifikation
(CEI 61988-5:2009) (IEC 61988-5:2009)




This European Standard was approved by CENELEC on 2009-12-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: Avenue Marnix 17, B - 1000 Brussels


© 2009 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61988-5:2009 E

---------------------- Page: 3 ----------------------

SIST EN 61988-5:2010
EN 61988-5:2009 - 2 -
Foreword
The text of document 110/182/FDIS, future edition 1 of IEC 61988-5, prepared by IEC TC 110, Flat panel
display devices, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as
EN 61988-5 on 2009-12-01
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2010-09-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2012-12-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61988-5:2009 was approved by CENELEC as a European
Standard without any modification.
__________

---------------------- Page: 4 ----------------------

SIST EN 61988-5:2010
- 3 - EN 61988-5:2009
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.

Publication Year Title EN/HD Year


IEC 60027 Series Letter symbols to be used in electrical EN 60027 Series
technology


IEC 60050 Series International electrotechnical vocabulary - -


IEC 60410 1973 Sampling plans and procedures for inspection - -
by attributes


IEC 60617 Graphical symbols for diagrams - -
Data-
base


1)
IEC 60747-1 - Semiconductor devices - - -
Part 1: General


1) 2)
IEC 61988-1 - Plasma display panels - EN 61988-1 2003
Part 1: Terminology and letter symbols


1) 2)
IEC 61988-2-1 - Plasma display panels - EN 61988-2-1 2002
Part 2-1: Measuring methods - Optical


1) 2)
IEC 61988-2-2 - Plasma display panels - EN 61988-2-2 2003
Part 2-2: Measuring methods - Optoelectrical


1) 2)
IEC 61988-3-1 - Plasma display panels - EN 61988-3-1 2005
Part 3-1: Mechanical interface


1) 2)
IEC 61988-4 - Plasma display Panels - EN 61988-4 2007
Part 4: Climatic and mechanical testing
methods


1)
IECQ 01 - IEC Quality Assessment System for - -
Electronic Components (IECQ) - Basic Rules


IEC QC 001002 Series IEC quality assessment system for electronic - -
components (IECQ) - Rules of procedure


ISO 1000 1992 SI units and recommendations for the use of - -
their multiples and of certain other units


1)
ISO 2859-1 - Sampling procedures for inspection by - -
attributes -
Part 1: Sampling schemes indexed by
acceptance quality limit (AQL) for lot-by-lot
inspection



1)
Undated reference.
2)
Valid edition at date of issue.

---------------------- Page: 5 ----------------------

SIST EN 61988-5:2010
EN 61988-5:2009 - 4 -
Publication Year Title EN/HD Year

1)
ISO 2859-10 - Sampling procedures for inspection by - -
attributes -
Part 10: Introduction to the ISO 2859 series of
standards for sampling for inspection by
attributes


1)
ISO 3534-2 - Statistics - Vocabulary and symbols - - -
Part 2: Applied statistics

---------------------- Page: 6 ----------------------

SIST EN 61988-5:2010
IEC 61988-5
®
Edition 1.0 2009-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE


Plasma display panels –
Part 5: Generic specification

Panneaux d’affichage à plasma –
Partie 5: Spécification générique

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
T
CODE PRIX
ICS 31.260 ISBN 2-8318-1071-1
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

---------------------- Page: 7 ----------------------

SIST EN 61988-5:2010
– 2 – 61988-5 © IEC:2009
CONTENTS
FOREWORD.4
1 Scope.6
2 Normative references .6
3 Order of precedence.7
4 Terminology, units, symbols and abbreviations.7
5 Standard environmental conditions.8
6 Marking .8
6.1 Device identification code.8
6.2 Device traceability code .8
6.3 Packing .8
7 Quality assessment procedures.8
7.1 General .8
7.2 Eligibility for qualification and/or capability approval.8
7.3 Primary stage of manufacture.8
7.4 Commercially confidential information .9
7.5 Formation of inspection lots.9
7.6 Structurally similar devices.9
7.7 Subcontracting .9
7.8 Incorporated components .9
7.9 Validity of release.9
8 Qualification approval procedure .9
8.1 Qualification approval testing .9
8.2 Granting of qualification approval .9
8.3 Quality conformance inspection requirements.9
8.3.1 General .9
8.3.2 Division into groups and subgroups .10
8.3.3 Inspection requirements .12
8.3.4 Supplementary procedure for reduced inspection .12
8.3.5 Sampling requirements for small lots .13
8.3.6 Certified records of released lots (CRRL) .13
8.3.7 Delivery of device subjected to destructive or non-destructive tests.13
8.3.8 Delayed deliveries .13
8.3.9 Supplementary procedure for deliveries.13
8.4 Statistical sampling procedures .13
8.4.1 AQL sampling plans.14
8.4.2 LTPD sampling plans.14
8.5 Endurance tests .14
8.6 Endurance tests where the failure rate is specified.14
8.6.1 General .14
8.6.2 Selection of samples .14
8.6.3 Failure.14
8.6.4 Endurance test time and sample size .14
8.6.5 Procedure to be used when the number of observed failures exceeds
the acceptance number .14
8.7 Accelerated test procedures .15
9 Capability approval procedures .15

---------------------- Page: 8 ----------------------

SIST EN 61988-5:2010
61988-5 © IEC:2009 – 3 –
10 Test and measurement procedures.15
10.1 Standard conditions and general precautions .15
10.1.1 Standard conditions.15
10.1.2 General precautions .15
10.1.3 Precision of measurements .16
10.2 Physical examination.16
10.2.1 Visual examination .16
10.2.2 Dimensions .16
10.3 Electrical and optical measurements .16
10.4 Climatic and mechanical tests .16
10.5 Alternative test methods .16
10.6 Endurance.16
Annex A (normative) Lot tolerance percentage defective (LTPD) sampling plans .17
Annex B (informative) General description of specifications .22

Table A.1 – LTPD sampling plans .19
Table A.2 – Hypergeometric sampling plans for small lot size of 200 or less .20
Table A.3 – AQL and LTPD sampling plans.21

---------------------- Page: 9 ----------------------

SIST EN 61988-5:2010
– 4 – 61988-5 © IEC:2009
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________

PLASMA DISPLAY PANELS –

Part 5: Generic specification


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61988-5 has been prepared by IEC technical committee 110: Flat
panel display devices.
The text of this standard is based on the following documents:
FDIS Report on voting
110/182/FDIS 110/191/RVD

Full information on the voting for the approval on this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all the parts in the IEC 61988 series, under the general title Plasma display panels,
can be found on the IEC website.

---------------------- Page: 10 ----------------------

SIST EN 61988-5:2010
61988-5 © IEC:2009 – 5 –
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.

---------------------- Page: 11 ----------------------

SIST EN 61988-5:2010
– 6 – 61988-5 © IEC:2009
PLASMA DISPLAY PANELS –

Part 5: Generic specification



1 Scope
This generic specification for plasma display panels specifies general procedures for quality
assessment to be used in the IECQ-CECC system and establishes general principles for
describing and testing of electrical, optical, mechanical and environmental characteristics.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60027 (all parts), Letter symbols to be used in electrical technology
IEC 60050 (all parts), International electrotechnical vocabulary
IEC 60410:1973, Sampling plans and procedures for inspection by attributes
IEC 60617, Graphical symbols for diagrams
IEC 60747-1, Semiconductor devices – Part 1: General
IEC 61988-1, Plasma display panels – Part 1: Terminology and letter symbols
IEC 61988-2-1, Plasma display panels – Part 2-1: Measuring methods – Optical
IEC 61988-2-2, Plasma display panels – Part 2-2: Measuring methods – Optoelectrical
IEC 61988-3-1, Plasma display panels – Part 3-1: Mechanical interface
IEC 61988-4, Plasma display panels – Part 4: Climatic and mechanical testing methods
IECQ 01, IEC Quality Assessment System for Electronic components (IECQ) – Basic Rules
QC 001002 (all parts), IEC Quality Assessment System for Electronic components (IECQ) –
Rules of Procedure
ISO 1000:1992, SI units and recommendations for the use of their multiples and of certain
other units
ISO 2859-1, Sampling procedures for inspection by attributes – Part 1: Sampling schemes
indexed by acceptance quality limit (AQL) for lot-by-lot inspection
ISO 2859-10, Sampling procedures for inspection by attributes – Part 10: Introduction to the
ISO 2859 series of standards for sampling for inspection by attributes
ISO 3534-2, Statistics – Vocabulary and symbols – Part 2: Applied statistics

---------------------- Page: 12 ----------------------

SIST EN 61988-5:2010
61988-5 © IEC:2009 – 7 –
3 Terms, definitions, units, symbols and abbreviations
3.1 Terms and definitions
For the purpose of this document, the following terms and definitions given in IEC 61988-1,
IEC 60050 series, IECQ 01, and ISO 3534-2 apply.
NOTE Special terms for statistical quality control are given in IECQ 01 and ISO 3534-2.
3.2 Units, symbols and abbreviations
Units, graphical and letter symbols shall, wherever possible, be taken from IEC 60027,
IEC 60617 and ISO 1000:1992.
Any other units, symbols or terminology peculiar to one of the devices covered by this generic
specification shall be taken from the relevant IEC or ISO standards (see Clause 2) or derived
in accordance with the principles of the standards listed above.
In this document following abbreviations are used:
AQL: Acceptance quality level (see 8.4.1)
LTPD: Lot tolerance percentage defectives (see 8.4.2)
SI: Supervising Inspectorate
DMR: Designated Management Representative
4 Order of precedence
The documents are ranked in the following order of authority:
a) Detail specifications
b) Blank detail specifications
c) Sectional specifications
d) Generic specifications
e) Basic specifications
f) IECQ rules of procedure
g) Any other international (e.g. IEC) documents to which reference is made
h) National documents.
The same order of precedence shall apply to equivalent national documents.
Detail specifications are prepared by the National Standards Organization (NSO), an
approved manufacturer, industrial task groups or users as described in IEC QC 001002-
2:1998, 1.4.
Blank detail specifications, sectional specifications and generic specification (this standard)
are to be prepared by technical committee of IEC.
Basic specifications are IEC or ISO documents related to all electrical components.
IECQ rules of procedure are specified in IEC QC 001002.
In Annex B, the general description of specifications is shown extracted from IEC Guide 102,
2.3.

---------------------- Page: 13 ----------------------

SIST EN 61988-5:2010
– 8 – 61988-5 © IEC:2009
5 Standard environmental conditions
Standard environmental conditions for the measurement of characteristics, for tests and
operating conditions are at temperature of 25 °C ± 3 °C, a relative humidity of 25 % to 85 %,
and pressure of 86 kPa to 106 kPa.
6 Marking
6.1 Device identification code
Each device shall have a marking that will enable clear identification of the device type, for
example the model number.
6.2 Device traceability code
The device shall be provided with a traceability code which enables back-tracing of the device
to a certain production or inspection lot, for example the serial number.
6.3 Packing
Marking on the packing shall state
a) the device identification code(s) of the enclosed device(s);
b) the device traceability code(s);
c) the number of enclosed devices;
d) the required precautions, if any.
This marking shall be in accordance with import/export customs regulations. Additional
requirements can be specified in the relevant detail specification.
7 Quality assessment procedures
7.1 General
Quality assessment is carried out in the following order:
a) approval of the manufacturer;
b) qualification approval;
c) quality conformance inspection;
d) certification of conformity.
The quality conformance inspection are subdivided into group A, B and C tests; these are
performed lot by lot or periodically, as defined in 8.3.2. In some cases, group D tests may
also be specified, for example, for qualification approval.
7.2 Eligibility for qualification and/or capability approval
A type of device becomes eligible for qualification and/or capability approval when the rules of
the following procedures are satisfied: IEC QC 001002-3:2005, Clause 3, Qualification
Approval of electronic components, describing the procedure for qualification approval (QA),
the release for delivery and validity of release.
7.3 Primary stage of manufacture
The primary stage of manufacture is defined in the sectional specification.

---------------------- Page: 14 ----------------------

SIST EN 61988-5:2010
61988-5 © IEC:2009 – 9 –
7.4 Commercially confidential information
If any part of the manufacturing process is commercially confidential, this shall be suitably
identified, and DMR shall demonstrate to the SI that the requirements of the rules of
procedure given in IEC QC 001002-3:2005, 2.3.3.1, have been complied with.
7.5 Formation of inspection lots
See the rules of procedure given in IEC QC 001002-3:2005, 3.3.1.
7.6 Structurally similar devices
See the rules of procedure given in IEC QC 001002-3:2005, 3.3.2.
7.7 Subcontracting
The use of subcontracting is permitted, unreservedly.
See the rules of procedure given in IEC QC001002-3:2005, from 3.1.2.3 to 3.1.2.7.
7.8 Incorporated components
See the rules of procedure given in IEC QC 001002-3:2005, 5.2.3.
7.9 Validity of release
See the rules of procedure given in IEC QC 001002-3:2005, 3.2.2.
8 Qualification approval procedure
8.1 Qualification approval testing
Method a), b) or c) of IEC QC001002-3:2005, 3.1.4 of the rules of procedure may be used at
the manufacturer's discretion in accordance with the inspection requirements given in the
sectional or blank detail specifications.
Samples may be composed of appropriate structurally similar devices.
All measurements called for in the detail specification shall be recorded.
The qualification report shall include a summary of all the test results for each group and
subgroup, including number of devices tested and number of devices failed. This summary
shall be derived from the recorded data. The manufacturer shall retain all data for submission
to the SI on demand.
8.2 Granting of qualification approval
See the rules of procedure given in IEC QC 001002-3:2005, 3.1.5.
8.3 Quality conformance inspection requirements
8.3.1 General
Quality conformance inspection shall consist of the examinations and tests of groups A, B, C
and D, as specified. For group B and C inspection, samples may be composed of structurally
similar devices. Sample for periodic test shall be drawn from one or more lots which have
passed groups A and B inspection. Individual devices shall have passed the group A
measurements called for in the detail specification.

---------------------- Page: 15 ----------------------

SIST EN 61988-5:2010
– 10 – 61988-5 © IEC:2009
8.3.2 Division into groups and subgroups
The following groups and subgroups shall be used in the preparation of detail specifications.
8.3.2.1 Group A inspection (lot-by-lot)
This group prescribes the visual inspection, the electrical and the optical measurements to be
made on a lot-by-lot basis to assess the principal characteristics of a device. Unless
otherwise specified, samples shall not be composed of structurally similar devices. Group A
inspection is divided into appropriate subgroups as follows:
a) Subgroup A1
This subgroup comprises a visual examination as specified in 10.2.1.
b) Subgroup A2
This subgroup comprises measurements of primary electrical characteristics of the device.
c) Subgroup A3
This subgroup comprises measurements of primary optical characteristics of the device.
d) Subgroup A4 and A5
These subgroups may not be required. They comprise measurements of secondary
characteristics of the device. The choice between subgroups A4 or A5 for given
measurements is essentially governed by the desirability of performing them at a given quality
level.
8.3.2.2 Group B inspection (lot-by-lot)
This group prescribes the procedures to be used to assess additional properties of the device,
and includes electrical and optical measurements, mechanical, climatic and endurance tests
that can normally be performed in one week or as specified in the relevant sectional or blank
detail specification.
8.3.2.3 Group C inspection (periodic)
This group prescribes the procedures to be used on a periodic basis to assess additional
properties of the devices, and includes electrical and optical measurements, mechanical,
climatic and endurance tests appropriate for checking at intervals of either three months or
twelve months, or as specified in the relevant sectional or blank detail specification.
8.3.2.4 Division of group B and group C into subgroups
To enable comparison and to facilitate change from group B to group C and vice versa when
necessary (see 8.3.4), tests in these groups are divided among subgroups bearing the same
number for corresponding tests.
a) Subgroup B1/C1
Comprise measurements that control dimensional interchange-ability of the devices.
b) Subgroup B2/C2
Comprise measurements that assess the electrical properties of the device design.

---------------------- Page: 16 ----------------------

SIST EN 61988-5:2010
61988-5 © IEC:2009 – 11 –
c) Subgroup B3/C3
Comprise measurements that assess the optical properties of the device design.
d) Subgroup B4/C4
Comp
...