Amendment 1 - Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers

Integrierte Schaltungen - Bewertung der elektromagnetischen Verträglichkeit von Sende-Empfangsgeräten - Teil 5: Ethernet-Sende-Empfangsgerät

Amendement 1 - Circuits intégrés - Evaluation de la CEM des émetteurs-récepteurs - Partie 5: Emetteurs-récepteurs Ethernet

Integrirana vezja - Vrednotenje elektromagnetne združljivosti (EMC) oddajnikov-sprejemnikov - 5. del: Ethernet oddajniki-sprejemniki - Dopolnilo A1

General Information

Status
Not Published
Public Enquiry End Date
28-Feb-2023
Technical Committee
Current Stage
4020 - Public enquire (PE) (Adopted Project)
Start Date
27-Dec-2022
Due Date
16-May-2023
Completion Date
11-May-2023

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SLOVENSKI STANDARD
SIST EN IEC 62228-5:2021/oprA1:2023
01-februar-2023
Integrirana vezja - Vrednotenje elektromagnetne združljivosti (EMC) oddajnikov-
sprejemnikov - 5. del: Ethernet oddajniki-sprejemniki - Dopolnilo A1
Amendment 1 - Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet
transceivers
Integrierte Schaltungen - Bewertung der elektromagnetischen Verträglichkeit von Sende-
Empfangsgeräten - Teil 5: Ethernet-Sende-Empfangsgerät
Amendement 1 - Circuits intégrés - Evaluation de la CEM des émetteurs-récepteurs -
Partie 5: Emetteurs-récepteurs Ethernet
Ta slovenski standard je istoveten z: EN IEC 62228-5:2021/prA1:2022
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
33.100.01 Elektromagnetna združljivost Electromagnetic compatibility
na splošno in general
SIST EN IEC 62228-5:2021/oprA1:2023 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN IEC 62228-5:2021/oprA1:2023

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SIST EN IEC 62228-5:2021/oprA1:2023
47A/1148/CDV

COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 62228-5/AMD1 ED1
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2022-12-16 2023-03-10
SUPERSEDES DOCUMENTS:
47A/1137/CD, 47A/1140A/CC

IEC SC 47A : INTEGRATED CIRCUITS
SECRETARIAT: SECRETARY:
Japan Mr Yoshinori FUKUBA
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:


Other TC/SCs are requested to indicate their interest, if
any, in this CDV to the secretary.
FUNCTIONS CONCERNED:
EMC ENVIRONMENT QUALITY ASSURANCE SAFETY
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft
for Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.

This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of
which they are aware and to provide supporting documentation.

TITLE:
Amendment 1 - Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet
transceivers

PROPOSED STABILITY DATE: 2026

NOTE FROM TC/SC OFFICERS:
IEC SC 47A WG 9 reviewed the comments on 47A/1140A/CC of 47A/1137/CD and decided to distribute
CDV.

Copyright © 2022 International Electrotechnical Commission, IEC. All rights sreserved. It is permitted to
download this electronic file, to make a copy and to print out the content for the sole purpose of preparing National
Committee positions. You may not copy or "mirror" the file or printed version of the document, or any part of it, for
any other purpose without permission in writing from IEC.

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1 INTERNATIONAL ELECTROTECHNICAL COMMISSION
2 ____________
3
4 INTEGRATED CIRCUITS –
5 EMC EVALUATION OF TRANSCEIVERS –
6
7 Part 5: Ethernet transceivers
8
9 Amendment 1
10
11
12 FOREWORD
13 The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all
14 national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
15 co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
16 in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
17 Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
18 preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
19 may participate in this preparatory work. International, governmental and non-governmental organizations liaising
20 with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
21 Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
22 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
23 consensus of opinion on the relevant subjects since each technical committee has representation from all
24 interested IEC National Committees.
25 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
26 Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
27 Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
28 misinterpretation by any end user.
29 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
30 transparently to the maximum extent possible in their national and regional publications. Any divergence between
31 any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
32 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
33 assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
34 services carried out by independent certification bodies.
35 6) All users should ensure that they have the latest edition of this publication.
36 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
37 members of its technical committees and IEC National Committees for any personal injury, property damage or
38 other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
39 expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
40 Publications.
41 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
42 indispensable for the correct application of this publication.
43 9) Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
44 rights. IEC shall not be held responsible for identifying any or all such patent rights.
45 Amendment 1 to IEC 62228-5:2021 has been prepared by subcommittee 47A: Integrated
46 circuits, of IEC technical committee 47: Semiconductor devices.
47 The text of this standard is based on the following documents:

- -
48 ss
49 Full information on the voting for its approval can be found in the report 49 on voting indicated in

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50 the above table.
51 The language used for the development of this Amendment is English.
52 This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
53 accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
54 at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
55 described in greater detail at www.iec.ch/standardsdev/publications/.
56 The committee has decided that the contents of this document will remain unchanged until the
57 stability date indicated on the IEC website under webstore.iec.ch in the data related to the
58 specific document. At this date, the document will be
59 • reconfirmed,
60 • withdrawn,
61 • replaced by a revised edition, or
62 • amended.
63
64                           -----------------------------
65 Page 4
66 CONTENTS
67 Add the following new annex title:
68 Annex G (normative) EMC evaluation of optical Ethernet transceivers
69
70 Page 9
71 Add the following new figure titles and table titles:
72 Figure G.1 - Fiber optical MDI interface test network with FOT (Optical-BIN)
73 Figure G.2 - 1000 BASE-RHx transceiver network
74 Figure G.3 - General test configuration for tests in fiber optical transceiver network
75 Figure G.4 - Transceiver network tests - coupling ports and networks
76 Figure G.5 - Test setup for measurement of conduced RF disturbances
77 Figure G.6 - General drawing of the circuit diagram of test network for 1000BASE-RH Ethernet
78 transceivers for functional test
79 Table G.1 - Overview of measurements and tests
80 Table G.2 - Definition for transceiver configuration for normal operation mode
81 Table G.3 - Selection recommendation of GMII interfaces for transceiver network configuration
82 Table G.4 - Transceiver network tests – component value definitions of coupling ports and networks
83 Table G.5 - Conducted emission measurements
84

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85 Page 12
86 2 Normative references
87 Add the following new references:
88 ISO/IEC/IEEE 8802-3:2021, Telecommunications and exchange between information
89 technology systems — Requirements for local and metropolitan area networks — Part 3:
90 Standard for Ethernet
91
92 3 Terms, definitions and abbreviations
93 Add the following new terms and definitions:
94 3.1.8
95 1000BASE-RH transceiver
96 transceiver 1000 Mbit/s via FOT (fiber optic transceiver) and multi-mode plastic optical fiber,
97 with a functionality according to ISO/IEC/IEEE 8802-3 (1000BASE-RH)
98
99 Add the following new abbreviated terms:
100
FOT
Fiber optic transceiver
OFE Optical front end
POF Plastic optical fiber
SFP Small form-factor pluggable
101
102 Page 107
103 Add, after Annex F, the following new Annex G :
104
105

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106
107 (normative)
108
109 EMC evaluation of optical Ethernet transceivers
110 G.1 General
111 This annex specifies the application of measurement methods of EMC evaluation of optical
112 Ethernet transceiver ICs under network condition. It defines test configurations, test conditions,
113 test signals, test procedures and test setups. It is applicable for an Ethernet transceiver IC and
114 a fiber optic transceiver (FOT) of the Ethernet systems using duplex plastic optical fibers specified
115 in
116 • 1000BASE-RH according to ISO/IEC/IEEE 8802.3.
117 For optical Ethernet transceiver ICs which do not implement global pins, evaluation covers
118 • the conducted emission of RF disturbances;
119 • the radiated emission of RF disturbances (optional);
120 • the radiated immunity against RF disturbances (optional).
121 For optical Ethernet transceiver ICs which have global pins, conducted RF immunity tests,
122 impulse immunity tests and ESD test shall be additionally performed as described in 5 and 6 of
123 IEC 62228-5 for Ethernet transceivers.
124 G.2 General requirements for EMC evaluation of optical Ethernet
125 A PHY of an optical Ethernet consists of PCS, PMA, and PMD as described in ISO/IEC/IEEE
126 8802-3. The PMD is a fiber optic transceiver (FOT) which can be integrated in a transceiver IC
127 or can be an external component connected with a transceiver IC via optical front end (OFE)
128 interface. For an optical Ethernet transceiver IC which does not implement global pins, only RF
129 emission through local DC supply connections of the transceiver IC shall be measured. In
130 addition, since FOT is also an active component with power supply, RF emission through DC
131 supply pins of the FOT shall be measured as a part of DUT. The Ethernet transceiver shall be
132 tested in functional operation modes according to Table G.1.
133 NOTE  No test in low power mode is required for RF emission measurement.
134 Table G.1 –Overview of measurements and tests
Configuration Test Test method Evaluation Functional operation
mode


RF conducted emission
150 Ω direct coupling
Transceiver network
(EMI) Spectrum Normal
(IEC 61967-4)




135 G.3 Test and operating conditions
Transceiver network
136 G.3.1 Supply and ambient conditions
137 For all tests and measurements under operating conditions, the same settings for electrical
138 Ethernet transceiv
...

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