SIST EN IEC 62228-1:2018
(Main)Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions (IEC 62228-1:2018)
Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions (IEC 62228-1:2018)
This part of IEC 62228 provides general information and definitions for electromagnetic
compatibility (EMC) evaluation of integrated circuits (IC) with transceivers for wired network
applications under network condition. It defines general test conditions, general test setups
and test and measurement methods are applied to all parts of IEC 62228.
Integrierte Schaltungen - Bewertung der elektromagnetischen Verträglichkeit von Sende-Empfangsgeräten - Teil 1: Allgemeine Bedingungen und Festlegungen
Circuits intégrés - Évaluation CEM des émetteurs-récepteurs - Partie 1 : Conditions générales et définitions
L'IEC 62228-1:2018 fournit des informations générales et des définitions relatives à l'évaluation de la compatibilité électromagnétique (CEM) des circuits intégrés (CI) avec émetteurs-récepteurs pour les applications de réseaux câblés dans des conditions de réseau. Elle définit les conditions générales d'essais, les montages d'essais généraux et les méthodes d'essais et de mesure qui sont appliqués à toutes les parties de l'IEC 62228.
Integrirana vezja - Vrednotenje elektromagnetne združljivosti (EMC) oddajnikov-sprejemnikov - 1. del: Splošni pogoji in definicije (IEC 62228-1:2018)
Ta del standarda IEC 62228 podaja splošne informacije in definicije za vrednotenje elektromagnetne združljivosti (EMC) integriranih vezij (IC) z oddajniki-sprejemniki v žičnem omrežju pri omrežnih pogojih. Opredeljuje splošne preskusne pogoje, splošne nastavitve preskusa ter preskusne in merilne metode, ki se uporabljajo za vse dele standarda IEC 62228.
General Information
Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN IEC 62228-1:2018
01-september-2018
Integrirana vezja - Vrednotenje elektromagnetne združljivosti (EMC) oddajnikov-
sprejemnikov - 1. del: Splošni pogoji in definicije (IEC 62228-1:2018)
Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and
definitions (IEC 62228-1:2018)
Ta slovenski standard je istoveten z: EN IEC 62228-1:2018
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
33.100.01 Elektromagnetna združljivost Electromagnetic compatibility
na splošno in general
SIST EN IEC 62228-1:2018 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST EN IEC 62228-1:2018
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SIST EN IEC 62228-1:2018
EUROPEAN STANDARD EN IEC 62228-1
NORME EUROPÉENNE
EUROPÄISCHE NORM
June 2018
ICS 31.200
English Version
Integrated circuits - EMC evaluation of transceivers - Part 1:
General conditions and definitions
(IEC 62228-1:2018)
Circuits intégrés - Évaluation CEM des émetteurs- Integrierte Schaltungen - Bewertung der
récepteurs - Partie 1 : Conditions générales et définitions elektromagnetischen Verträglichkeit von Sende-
(IEC 62228-1:2018) Empfangsgeräten - Teil 1: Allgemeine Bedingungen und
Festlegungen
(IEC 62228-1:2018)
This European Standard was approved by CENELEC on 2018-02-13. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2018 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 62228-1:2018 E
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SIST EN IEC 62228-1:2018
EN IEC 62228-1:2018 (E)
European foreword
The text of document 47A/1018/CDV, future edition 1 of IEC 62228-1, prepared by IEC/SC 47A
"Integrated circuits" of IEC/TC 47 "Semiconductor devices" was submitted to the IEC-CENELEC
parallel vote and approved by CENELEC as EN IEC 62228-1:2018.
The following dates are fixed:
• latest date by which the document has to be (dop) 2018-12-01
implemented at national level by
publication of an identical national
standard or by endorsement
(dow) 2021-06-01
• latest date by which the national
standards conflicting with the
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Endorsement notice
The text of the International Standard IEC 62228-1:2018 was approved by CENELEC as a European
Standard without any modification.
2
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SIST EN IEC 62228-1:2018
EN IEC 62228-1:2018 (E)
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 61967-1 - Integrated circuits - Measurement of EN 61967-1 -
electromagnetic emissions, 150 kHz to 1
GHz -- Part 1: General conditions and
definitions
IEC 61967-4 2002 Integrated circuits - Measurement of EN 61967-4 2002
electromagnetic emissions, 150 kHz to 1
GHz -- Part 4: Measurement of conducted
emissions - 1 ohm/150 ohm direct coupling
method
+ A1 2006 + A1 2006
- - + corrigendum Dec. 2006
IEC 62132-1 - Integrated circuits - Measurement of EN 62132-1 -
electromagnetic immunity - Part 1: General
conditions and definitions
IEC 62132-4 - Integrated circuits - Measurement of EN 62132-4 -
electromagnetic immunity, 150 kHz to 1
GHz -- Part 4: Direct RF power injection
method
IEC 62215-3 - Integrated circuits - Measurement of EN 62215-3 -
impulse immunity -- Part 3: Non-
synchronous transient injection method
ISO 10605 - Road vehicles - Test methods for electrical - -
disturbances from electrostatic discharge
3
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SIST EN IEC 62228-1:2018
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SIST EN IEC 62228-1:2018
IEC 62228-1
®
Edition 1.0 2018-01
INTERNATIONAL
STANDARD
Integrated circuits – EMC evaluation of transceivers –
Part 1: General conditions and definitions
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.200 ISBN 978-2-8322-5191-1
Warning! Make sure that you obtained this publication from an authorized distributor.
® Registered trademark of the International Electrotechnical Commission
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SIST EN IEC 62228-1:2018
– 2 – IEC 62228-1:2018 © IEC 2018
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms, definitions and abbreviated terms . 5
3.1 Terms and definitions . 6
3.2 Abbreviated terms . 6
4 Philosophy . 6
5 General test conditions and test board specification . 8
5.1 Test conditions . 8
5.2 Test board specification . 8
6 Test report . 8
Figure 1 – General test configuration for tests in functional operation modes . 7
Figure 2 – General test configuration for unpowered ESD test . 7
Table 1 – Overview of test and measurement methods . 6
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SIST EN IEC 62228-1:2018
IEC 62228-1:2018 © IEC 2018 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
INTEGRATED CIRCUITS –
EMC evaluation of transceivers –
Part 1: General conditions and definitions
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of confo
...
SLOVENSKI STANDARD
oSIST prEN 62228-1:2017
01-september-2017
Integrirana vezja - Vrednotenje elektromagnetne združljivosti (EMC) oddajnikov-
sprejemnikov - 1. del: Splošni pogoji in definicije
Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and
definitions
Ta slovenski standard je istoveten z: prEN 62228-1:2017
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
oSIST prEN 62228-1:2017 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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oSIST prEN 62228-1:2017
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oSIST prEN 62228-1:2017
47A/1018/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 62228-1 ED1
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2017-07-07 2017-09-29
SUPERSEDES DOCUMENTS:
47A/995/CD,47A/1013A/CC
IEC SC 47A : INTEGRATED CIRCUITS
SECRETARIAT: SECRETARY:
Japan Mr Yoshinori FUKUBA
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:
– Other TC/SCs are requested to indicate their interest, if
any, in this CDV to the secretary.
FUNCTIONS CONCERNED:
EMC ENVIRONMENT QUALITY ASSURANCE SAFETY
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
– Attention IEC-CENELEC parallel voting
– The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft for
Vote (CDV) is submitted for parallel voting.
– The CENELEC members are invited to vote through the
CENELEC online voting system.
– This document is still under study and subject to change. It should not be used for reference purposes.
– Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of
which they are aware and to provide supporting documentation.
TITLE:
Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
NOTE FROM TC/SC OFFICERS:
Copyright © 2017 International Electrotechnical Commission, IEC. All rights reserved. It is permitted to download this
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
permission in writing from IEC.
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oSIST prEN 62228-1:2017
62228-1/Ed1/CDV © IEC (E) – 2 – 47A/1018/CDV
1 CONTENTS
2
3 FOREWORD . 3
4 1 Scope . 5
5 2 Normative references . 5
6 3 Terms, definitions and abbreviations . 6
7 3.1.1 Global pin . 6
8 3.1.2 6
9 mandatory components . 6
10 3.2.1 DUT . 6
11 3.2.2 DPI . 6
12 3.2.3 ESD . 6
13 3.2.4 PCB . 6
14 3.2.5 RxD . 6
15 3.2.6 SBC . 6
16 3.2.7 TxD . 6
17 4 Philosophy . 7
18 5 General test conditions and test board specification . 8
19 6 Test report . 9
20
21 Figure 1 – General test configuration for tests in functional operation modes . 8
22 Figure 2 – General test configuration for unpowered ESD test . 8
23
24 Table 1 – Overview of test and measurement methods . 7
25
26
27
28
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oSIST prEN 62228-1:2017
62228-1/Ed1/CDV © IEC (E) – 3 – 47A/1018/CDV
29 INTERNATIONAL ELECTROTECHNICAL COMMISSION
30 ____________
31
32 INTEGRATED CIRCUITS –
33 EMC Evaluation of transceivers –
34
35 Part 1: General conditions and definitions
36
37 FOREWORD
38 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
39 all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
40 international co-operation on all questions concerning standardization in the electrical and electronic fields. To
41 this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
42 Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
43 Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
44 in the subject dealt with may participate in this preparatory work. International, governmental and non-
45 governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
46 with the International Organization for Standardization (ISO) in accordance with conditions determined by
47 agreement between the two organizations.
48 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
49 consensus of opinion on the relevant subjects since each technical committee has representation from all
50 interested IEC National Committees.
51 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
52 Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
53 Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
54 misinterpretation by any end user.
55 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
56 transparently to the maximum extent possible in their national and regional publications. Any divergence
57 between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
58 the latter.
59 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
60 assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
61 services carried out by independent certification bodies.
62 6) All users should ensure that they have the latest edition of this publication.
63 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
64 members of its technical committees and IEC National Committees for any personal injury, property damage or
65 other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
66 expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
67 Publications.
68 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
69 indispensable for the correct application of this publication.
70 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
71 patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
72 International Standard IEC 62228-1 has been prepared by subcommittee 47A: Integrated
73 circuits, of IEC technical committee 47: Semiconductor devices.
74 The text of this standard is based on the following documents:
FDIS Report on voting
47A/XX/FDIS 47A/XX/RVD
75
76 Full information on the voting for the approval of this standard can be found in the report on
77 voting indicated in the above table.
78 This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
79 A list of all parts in the IEC 62228 series, published, in development or planned under the
80 general title Integrated circuits – EMC Evaluation of transceivers, can be found below.
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oSIST prEN 62228-1:2017
62228-1/Ed1/CDV © IEC (E) – 4 – 47A/1018/CDV
81 Part 1: General conditions and definitions
82 Part 2: LIN transceivers
83 Part 3: CAN transceivers
84 Part 4: FlexRay transceivers
85 Part 5: Ethernet transceivers
86 Part 6: PSI5 transceivers
87 Part 7: CXPI transceivers
88
89
90
91 The committee has decided that the contents of this
...
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