SIST EN IEC 61726:2022
(Main)Cable assemblies, cables, connectors and passive microwave components - Screening attenuation measurement by the reverberation chamber method (IEC 61726:2022)
Cable assemblies, cables, connectors and passive microwave components - Screening attenuation measurement by the reverberation chamber method (IEC 61726:2022)
This standard describes the measurement of screening attenuation by the reverberation chamber measurement method, also called mode stirred chamber method.
This standard is applicable to screening attenuation measurements of cable assemblies, cables, connectors, and passive microwave components, such as waveguides, phase shifters, diplexers/multiplexers, power dividers/combiners and etc.
Modern electronic equipments have shown a demand for methods for testing screening attenuation performance of microwave components over their whole frequency range. Convenient measurement methods have existed for lower frequencies and components of regular shape. These measurement methods are described in IEC 62153 series standards. For much higher frequencies and for components of irregular shape, the reverberation chamber method should be used. Theoretically, the reverberation chamber method has no upper limit of the measurement frequency, but it is limited by the quality and sensitivity of the measurement system, and the lower limit of the measurement frequency is restricted by the size of the reverberation chamber.
Konfektionierte Kabel, Kabel, Steckverbinder und passive Mikrowellenbauteile - Messung der Schirmdämpfung mit dem Strahlungskammerverfahren (IEC 61726:2022)
Câbles, cordons, connecteurs et composants hyperfréquence passifs - Mesure de l'affaiblissement d'écran par la méthode de la chambre réverbérante (IEC 61726:2022)
IEC 61726:2022 décrit le mesurage de l'affaiblissement d'écran par la méthode de mesure de la chambre réverbérante, également appelée "méthode de la chambre à brassage de modes".
Le présent document est applicable aux mesurages de l'affaiblissement d’écran des cordons, des câbles, des connecteurs et des composants hyperfréquence passifs, tels que les guides d'ondes, les déphaseurs, les diplexeurs/multiplexeurs, les répartiteurs/combineurs de puissance, etc.
Cette quatrième édition annule et remplace la troisième édition parue en 2015. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente:
a. reformulation de l’Article 1 "Domaine d’application";
b. remplacement de l’IEC TS 62153-4-1 par l’IEC 62153 (toutes les parties) à l’Article 2;
c. ajout de la définition de l’affaiblissement d’écran en 3.1;
d. ajout de l’Article 4 "Principe de mesure de l’affaiblissement d’écran";
e. ajout des descriptions de certains montages d’essai, comme le synthétiseur de fréquences, l’analyseur de spectre, le moteur pas-à-pas, les dispositifs de liaison et le système d’échantillonnage etc. à l’Article 5;
f. ajout de l'Article 6 "DUT";
g. reformulation de l’Article 7 "Procédure de mesure";
h. ajout de l’Article 8 "Notes d’avertissement";
i. ajout de l’Article 9 "Critère d’acceptation";
j. ajout de l’Article 10 "Informations à fournir dans la spécification appropriée".
Kabelski sestavi, kabli, konektorji in pasivne mikrovalovne komponente - Meritve zaslonskega slabljenja z metodo odmevne komore (IEC 61726:2022)
Ta standard opisuje meritve zaslonskega slabljenja z metodo odmevne komore, imenovano tudi metoda mešane komore.
Ta standard se uporablja za meritve zaslonskega slabljenja kabelskih sklopov, kablov, konektorjev in pasivnih mikrovalovnih komponent, kot so valovodi, preklopniki napetosti, diplekserji/multiplekserji, delilniki/združevalniki virov napajanja itd.
Sodobna elektronska oprema nakazuje potrebe po metodah za preskušanje učinkovitosti zaslonskega slabljenja mikrovalovnih komponent za celotno frekvenčno območje. Obstajajo priročne metode merjenja za nižje frekvence in komponente pravilne oblike. Te metode merjenja so opisane v skupini standardov IEC 62153. Za veliko višje frekvence in za komponente nepravilne oblike je treba uporabiti metodo odmevne komore. Metoda odmevne komore v teoriji nima zgornje meje merilne frekvence, ampak je omejena s kakovostjo in občutljivostjo merilnega sistema, spodnja meja merilne frekvence pa je omejena z velikostjo odmevne komore.
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN IEC 61726:2022
01-november-2022
Nadomešča:
SIST EN 61726:2016
Kabelski sestavi, kabli, konektorji in pasivne mikrovalovne komponente - Meritve
zaslonskega slabljenja z metodo odmevne komore (IEC 61726:2022)
Cable assemblies, cables, connectors and passive microwave components - Screening
attenuation measurement by the reverberation chamber method (IEC 61726:2022)
Konfektionierte Kabel, Kabel, Steckverbinder und passive Mikrowellenbauteile -
Messung der Schirmdämpfung mit dem Strahlungskammerverfahren (IEC 61726:2022)
Câbles, cordons, connecteurs et composants hyperfréquence passifs - Mesure de
l'affaiblissement d'écran par la méthode de la chambre réverbérante (IEC 61726:2022)
Ta slovenski standard je istoveten z: EN IEC 61726:2022
ICS:
33.120.10 Koaksialni kabli. Valovodi Coaxial cables. Waveguides
33.120.30 Radiofrekvenčni konektorji RF connectors
(RF)
SIST EN IEC 61726:2022 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST EN IEC 61726:2022
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SIST EN IEC 61726:2022
EUROPEAN STANDARD EN IEC 61726
NORME EUROPÉENNE
EUROPÄISCHE NORM September 2022
ICS 33.120.01 Supersedes EN 61726:2015
English Version
Cable assemblies, cables, connectors and passive microwave
components - Screening attenuation measurement by the
reverberation chamber method
(IEC 61726:2022)
Cordons, câbles, connecteurs et composants Konfektionierte Kabel, Kabel, Steckverbinder und passive
hyperfréquence passifs - Mesurage de l'affaiblissement Mikrowellenbauteile - Messung der Schirmdämpfung mit
d'écran par la méthode de la chambre réverbérante dem Hallraum-Verfahren
(IEC 61726:2022) (IEC 61726:2022)
This European Standard was approved by CENELEC on 2022-08-22. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Türkiye and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2022 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 61726:2022 E
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SIST EN IEC 61726:2022
EN IEC 61726:2022 (E)
European foreword
The text of document 46/847/CDV, future edition 4 of IEC 61726, prepared by IEC/TC 46 "Cables,
wires, waveguides, RF connectors, RF and microwave passive components and accessories" was
submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN IEC 61726:2022.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2023-05-22
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2025-08-22
document have to be withdrawn
This document supersedes EN 61726:2015 and all of its amendments and corrigenda (if any).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Any feedback and questions on this document should be directed to the users’ national committee. A
complete listing of these bodies can be found on the CENELEC website.
Endorsement notice
The text of the International Standard IEC 61726:2022 was approved by CENELEC as a European
Standard without any modification.
2
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SIST EN IEC 61726:2022
EN IEC 61726:2022 (E)
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod),
the relevant EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available
here: www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 61000-4-21 2011 Electromagnetic compatibility (EMC) - EN 61000-4-21 2011
Part 4-21: Testing and measurement
techniques - Reverberation chamber test
methods
IEC 61196-1 - Coaxial communication cables - Part 1: - -
Generic specification - General, definitions
and requirements
IEC 62153-1 series Metallic communication cables test methods EN 62153-1 series
3
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SIST EN IEC 61726:2022
IEC 61726
®
Edition 4.0 2022-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Cable assemblies, cables, connectors and passive microwave components –
Screening attenuation measurement by the reverberation chamber method
Cordons, câbles, connecteurs et composants hyperfréquence passifs –
Mesurage de l'affaiblissement d’écran par la méthode de la chambre
réverbérante
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.120.01 ISBN 978-2-8322-3966-7
Warning! Make sure that you obtained this publication from an authorized distributor.
Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
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CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Principle of screening attenuation measurement . 7
5 Measurement equipment . 9
5.1 General test instruments . 9
5.1.1 Frequency synthesizer . 9
5.1.2 Spectrum analyser . 9
5.1.3 Reverberation chamber . 9
5.1.4 Mode stirrer . 10
5.1.5 Input antenna . 10
5.1.6 Reference antenna . 10
5.1.7 Stepper motor . 10
5.1.8 Linking devices . 10
5.1.9 Other instruments . 11
5.2 Return loss requirements for linking devices . 11
5.3 Sampling system . 11
5.3.1 General . 11
5.3.2 Normal sampling system . 11
5.3.3 Fast sampling system . 12
6 DUT . 12
6.1 DUT preparation . 12
6.1.1 Cables . 12
6.1.2 Connector . 13
6.1.3 Cable assemblies . 13
6.1.4 Passive microwave components . 13
6.2 Installation of DUT . 13
7 Measurement procedure . 13
8 Caution notes . 14
8.1 Speed of mode stirrer . 14
8.2 Measurement of lossy DUT . 14
8.3 Oscillation and resonance . 14
8.4 Positioning of spectrum analyser . 15
8.5 High power signal test . 15
8.6 High dynamic range test . 15
9 Acceptance criterion . 15
10 Information to be given in the relevant specification . 15
11 Test report . 15
Annex A (informative) Example of a calibrator . 16
A.1 Relationship between transfer impedance and screening attenuation . 16
A.2 Example of a calibrator . 17
Bibliography . 19
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IEC 61726:2022 © IEC 2022 – 3 –
Figure 1 – System configuration example of screening attenuation by reverberation
chamber . 7
Figure 2 – System configuration example of screening attenuation by reverberation
chamber with only one spectrum analyser . 9
Figure A.1 – Basic construction details . 17
Table 1 – Recommended antennas . 10
Table 2 – Number of sampling positions recommended for calibration and test . 12
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INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
CABLE ASSEMBLIES, CABLES, CONNECTORS AND PASSIVE
MICROWAVE COMPONENTS – SCREENING ATTENUATION
MEASUREMENT BY THE REVERBERATION CHAMBER METHOD
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence between
any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
IEC 61726 has been prepared by IEC technical committee 46: Cables, wires, waveguides, RF
connectors, RF and microwave passive components and accessories. It is an International
Standard.
This fourth edition cancels and replaces the third edition published in 2015. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) reworded Clause 1 "Scope";
b) replaced IEC TS 62153-4-1 by IEC 62153 (all parts) in Clause 2;
c) added the definition of screening attenuation in 3.1;
d) added Clause 4 "Principle of screening attenuation measurement";
e) added the descriptions of some test set-ups, such as frequency synthesizer, spectrum
analyser, stepper motor, linking devices and the sampling system, etc. in Clause 5;
f) added Clause 6 "DUT";
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SIST EN IEC 61726:2022
IEC 61726:2022 © IEC 2022 – 5 –
g) reworded Clause 7 "Measurement procedure";
h) added Clause 8 "Caution notes";
i) added Clause 9 "Acceptance criterion";
j) added Clause 10 "Information to be given in the relevant specification".
The text of this International Standard is based on the following documents:
Draft Report on voting
46/847/CDV 46/877/RVC
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The "colour inside" logo on the cover page of this document indicates that it
contains colours which are considered to be useful for the correct understanding of its
contents. Users should therefore print this document using a colour printer.
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CABLE ASSEMBLIES, CABLES, CONNECTORS AND PASSIVE
MICROWAVE COMPONENTS – SCREENING ATTENUATION
MEASUREMENT BY THE REVERBERATION CHAMBER METHOD
1 Scope
This document describes the measurement of screening attenuation by the reverberation
chamber measurement method, also called mode stirred chamber method.
This document is applicable to screening attenuation measurements of cable assemblies,
cables, connectors, and passive microwave components, such as waveguides, phase shifters,
diplexers/multiplexers, power dividers/combiners, etc.
Modern electronic equipment has shown a demand for methods for testing screening
attenuation performance of microwave components over their whole frequency range.
Convenient measurement methods have existed for lower frequencies and components of
regular shape. These measurement methods are described in the IEC 62153 series. For much
higher frequencies and for components of irregular shape, the reverberation chamber method
can be used. Theoretically, the reverberation chamber method has no upper limit of the
measurement frequency, but it is limited by the quality and sensitivity of the measurement
system, and the lower limit of the measurement frequency is restricted by the size of the
reverberation chamber.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 61000-4-21:2011, Electromagnetic compatibility (EMC) – Part 4-21: Testing and
measurement techniques – Reverberation chamber test methods
IEC 61196-1, Coaxial communication cables – Part 1: Generic specification – General,
definitions and requirements
IEC 62153 (all parts), Metallic communication cable test methods
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 61196-1,
IEC 61000-4-21 and the following apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
• IEC Electropedia: available at https://www.electropedia.org/
• ISO Online browsing platform: available at https://www.iso.org/obp
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IEC 61726:2022 © IEC 2022 – 7 –
3.1
screening attenuation
ratio of the electromagnetic field power coupled to the reference antenna to the electromagnetic
field power coupled to the device under test (DUT), expressed by a in Formula (1):
s
P
REF
a = 10 log
(1)
s 10
P
DUT
where
a is the screening attenuation of DUT, in dB;
s
P is the power coupled to the reference antenna, in W;
REF
P is the power coupled to the DUT, in W.
DUT
4 Principle of screening attenuation measurement
The reverberation chamber is an electrically large screening cavity with high quality factor,
which is equipped with mode stirrer(s), input antenna and reference antenna. A system
configuration example of screening attenuation measurement by reverberation chamber method
is shown in Figure 1.
Figure 1 – System configuration example of screening
attenuation by reverberation chamber
The electromagnetic wave power P emitted by the frequency synthesizer is transmitted to the
INJ
reverberation chamber through the input antenna in the cavity. The electromagnetic wave will
excite the multi-mode electromagnetic field in the reverberation chamber. The boundary
conditions of these electromagnetic fields change with the rotation and stirring of the mode
stirrer, and the electromagnetic field distribution in the cavity is nearly uniform, isotropic and
randomly polarized in the sense of statistical average. When the DUT is placed in the
reverberation chamber, the approximately uniformly distributed electromagnetic power P in
REF
the reverberation chamber received by the reference antenna is equivalent to the external input
power of the DUT, and the electromagnetic power P coupled into the DUT can be obtained
DUT
by the spectrum analyser outside the reverberation chamber.
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According to the definition Formula (1), the screening attenuation of DUT can be calculated
from Formula (2):
P
REF
a = 10 log
s 10
P
DUT
P P
INJ REF
10 log ×
10
PP
DUT INJ
(2)
P P
INJ INJ
10 log −10log
10 10
PP
DUT REF
P
INJ
10 log − Δ
10 ins
P
DUT
where
a is the screening attenuation of DUT, in dB;
s
P is the power coupled to the reference antenna, in W;
REF
P is the power coupled to the DUT, in W;
DUT
P is the power injected into the chamber, in W;
INJ
Δ is the insertion loss of the chamber, in decibels (dB).
ins
In Formula (2), the first term represents the total screening attenuation of the system which
can be obtained by measuring the power of DUT connected with a load by spectrum analyser
1. The second term represents the insertion loss of the reverberation chamber which can be
obtained by measuring the power of the reference antenna by spectrum analyser 2.
Measurements of the total screening attenuation and the insertion loss can be carried out
simultaneously.
When only one spectrum analyser is configured, the DUT and reference antenna can be
connected to the spectrum analyser separately by using a switch, and the total screening
attenuation of the system and the insertion loss of the reverberation chamber can be measured
separately (also known as time-division measurement), as shown in Figure 2.
=
=
=
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IEC 61726:2022 © IEC 2022 – 9 –
Figure 2 – System configuration example of screening attenuation
by reverberation chamber with only one spectrum analyser
5 Measurement equipment
5.1 General test instruments
5.1.1 Frequency synthesizer
Frequency synthesizer or other frequency source shall be used, and its output power, frequency
range and transmission bandwidth shall meet the measurement requirements. In order to
ensure the repeatability of measurement, the frequency stability of frequency synthesizer or
−6
other frequency source should be better than 10 .
5.1.2 Spectrum analyser
The frequency range, resolution bandwidth and sensitivity of the spectrum analyser should meet
the measurement requirements. Other equipment that offers the same function, such as EMI
test receiver, can also be used.
5.1.3 Reverberation chamber
The reverberation chamber shall comply with IEC 61000-4-21.
In general, the reverberation chamber is a shielded enclosure having any shape; however, a
perfect cubic shape should be avoided for optimum performance at lower frequencies. It shall
be made of conductive materials (copper, aluminium or steel) and shall not contain lossy
materials.
The upper frequency limit depends on the quality of the shielded enclosure and cables.
Furthermore, the sensitivity of the used measurement instruments also limits the maximum
frequency. There is no upper limit theoretically for the measurement frequency of the
reverberation chamber when its quality is disregarded.
In general, the reverberation chamber is required to work with sufficient modes, and the working
frequency should be greater than the cavity mode frequency as calculated from Formula (3):
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2 22
c
mn p
0
(3)
ff>= ++
mnp
2 l wh
where l, w and h are the length, width and height of reverberation chamber respectively, m, n
and p are integers, and the value range is up to the number of modes of reverberation chamber.
It can be drawn from Formula (3) that the lowest usable frequency (LUF) of the reverberation
chamber is limited by the size of the reverberation chamber. The larger the volume is, the lower
LUF is; and the number of modes of the reverberation chamber is directly proportional to the
measurement frequency and the size of the reverberation chamber. Increasing the size of the
reverberation chamber and raising the test frequency can both expand the number of modes of
the reverberation chamber. Therefore, the size of reverberation chamber should be large
enough to meet the requirements for mode frequency and mode number when measuring at
lower frequencies.
For more detailed requirements and instructions for reverberation chambers, reference to
IEC 61000-4-21.
5.1.4 Mode stirrer
The mode stirrer shall be large with respect to wavelength and be at an angle to the walls of
the chamber. The mode stirrer shall be at least two wavelengths at the lowest measurement
frequency from tip to tip. When needed, more than one mode stirrer can be provided.
5.1.5 Input antenna
The input antenna shall be a broadband antenna capable of covering the operating frequency
range, and its transmitting direction shall be towards the corner of the reverberation chamber
or the mode stirrer to avoid direct exposure to the reference antenna. The antenna should
exhibit limited resonances in the frequency range and not introduce losses.
The recommended antennas for different frequency bands are given in Table 1.
Table 1 – Recommended antennas
Frequency range Antenna type
≤1 GHz Dipole antenna
≥1 GHz Horn antenna
5.1.6 Reference antenna
The reference antenna shall be of the same type as the input antenna, and its polarization
direction shall be orthogonal to that of the input antenna.
5.1.7 Stepper motor
The stepper motor should be driven with enough torque to control the angle and speed.
5.1.8 Linking devices
Low loss semi-rigid coaxial cables with good screening attenuation shall be used as the test
cables to connect the spectrum analyser to the DUT. To avoid resonances, the DUT is inserted
into a test cable loop having a length of more than four wavelengths at minimum frequency.
The cable connecting the spectrum analyser to the reference antenna should be consistent with
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the length and quality of the test cable connecting the spectrum analyser to the DUT. It is
required that the test cables, related connectors, adapters, loads, etc. having a screening
attenuation at least 10 dB better than the D
...
SLOVENSKI STANDARD
oSIST prEN IEC 61726:2022
01-februar-2022
Kabelski sestavi, kabli, konektorji in pasivne mikrovalovne komponente - Meritve
zaslonskega slabljenja z metodo odmevne komore
Cable assemblies, cables, connectors and passive microwave components - Screening
attenuation measurement by the reverberation chamber method
Konfektionierte Kabel, Kabel, Steckverbinder und passive Mikrowellenbauteile -
Messung der Schirmdämpfung mit dem Strahlungskammerverfahren
Câbles, cordons, connecteurs et composants hyperfréquence passifs - Mesure de
l'affaiblissement d'écran par la méthode de la chambre réverbérante
Ta slovenski standard je istoveten z: prEN IEC 61726:2021
ICS:
33.120.10 Koaksialni kabli. Valovodi Coaxial cables. Waveguides
33.120.30 Radiofrekvenčni konektorji RF connectors
(RF)
oSIST prEN IEC 61726:2022 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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oSIST prEN IEC 61726:2022
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oSIST prEN IEC 61726:2022
46/847/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 61726 ED4
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2021-12-10 2022-03-04
SUPERSEDES DOCUMENTS:
46/825/CD, 46/843/CC
IEC TC 46 : CABLES, WIRES, WAVEGUIDES, RF CONNECTORS, RF AND MICROWAVE PASSIVE COMPONENTS AND ACCESSORIES
SECRETARIAT: SECRETARY:
United States of America Mr David Wilson
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:
SC 46A,SC 46C,SC 46F
Other TC/SCs are requested to indicate their interest, if any,
in this CDV to the secretary.
FUNCTIONS CONCERNED:
EMC ENVIRONMENT QUALITY ASSURANCE SAFETY
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft for
Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.
This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of which they
are aware and to provide supporting documentation.
TITLE:
Cable assemblies, cables, connectors and passive microwave components - Screening attenuation
measurement by the reverberation chamber method
PROPOSED STABILITY DATE: 2027
NOTE FROM TC/SC OFFICERS:
Copyright © 2021 International Electrotechnical Commission, IEC. All rights reserved. It is permitted to download this
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
permission in writing from IEC.
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oSIST prEN IEC 61726:2022
IEC CDV 61726 © IEC 2021 - 2 - 46/847/CDV
1 CONTENTS
2
3
4 1 Scope . 3
5 2 Normative references . 3
6 3 Terms and definitions . 3
7 4 Principle of screening attenuation measurement . 3
8 5 Measurement equipment . 5
9 5.1 General test instruments . 5
10 5.1.1 Frequency synthesizer . 5
11 5.1.2 Spectrum analyser . 5
12 5.1.3 Reverberation chamber . 5
13 5.1.4 Mode stirrer . 6
14 5.1.5 Input antenna . 6
15 5.1.6 Reference antenna . 6
16 5.1.7 Stepper motor . 6
17 5.1.8 Linking devices . 6
18 5.1.9 Other instruments . 7
19 5.2 Return loss requirements for linking devices . 7
20 5.3 Sampling system . 7
21 5.3.1 General . 7
22 5.3.2 Normal sampling system . 7
23 5.3.3 Fast sampling system . 8
24 6 DUT . 8
25 6.1 DUT preparation . 8
26 6.1.1 Cables . 8
27 6.1.2 Connector . 8
28 6.1.3 Cable assemblies . 9
29 6.1.4 Passive microwave components . 9
30 6.1.5 Installation of DUT . 9
31 7 Measurement procedure . 9
32 8 Caution notes . 10
33 8.1 Speed of mode stirrer . 10
34 8.2 Measurement of lossy DUT . 10
35 8.3 Oscillation and resonance . 10
36 8.4 Positioning of spectrum analyser . 10
37 8.5 High power signal test . 10
38 8.6 High dynamic range test . 11
39 9 Acceptance criterion . 11
40 10 Information to be given in the relevant specification . 11
41 11 Test report . 11
42 Annex A . 12
43 Bibliography . 15
44
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45 Cable assemblies, cables, connectors and passive
46 microwave components –Screening attenuation
47 measurement by the reverberation chamber method
48 1 Scope
49 This standard describes the measurement of screening attenuation by the reverberation
50 chamber measurement method, also called mode stirred chamber method.
51 This standard is applicable to screening attenuation measurements of cable assemblies,
52 cables, connectors, and passive microwave components, such as waveguides, phase shifters,
53 diplexers/multiplexers, power dividers/combiners and etc.
54 Modern electronic equipments have shown a demand for methods for testing screening
55 attenuation performance of microwave components over their whole frequency range.
56 Convenient measurement methods have existed for lower frequencies and components of
57 regular shape. These measurement methods are described in IEC 62153 series standards.
58 For much higher frequencies and for components of irregular shape, the reverberation
59 chamber method should be used. Theoretically, the reverberation chamber method has no
60 upper limit of the measurement frequency, but it is limited by the quality and sensitivity of the
61 measurement system, and the lower limit of the measurement frequency is restricted by the
62 size of the reverberation chamber.
63 2 Normative references
64 The following documents are referred to in the text in such a way that some or all of their
65 content constitutes requirements of this document. For dated references, only the edition
66 cited applies. For undated references, the latest edition of the referenced document (including
67 any amendments) applies.
68 IEC 61196-1, Coaxial communication cables – Part 1: Generic specification – General,
69 definitions and requirements
70 IEC 62153 series, Metallic communication cable test methods
71 IEC 61000-4-21, Electromagnetic compatibility (EMC) – Part 4-21: Testing and measurement
72 techniques – Reverberation chamber test methods
73 3 Terms and definitions
74 For the purposes of this document, the terms and definitions given in IEC 61196-1 and IEC
75 61000-4-21 as well as the following, apply.
76
77 3.1
78 Screening attenuation
79 The ratio of the electromagnetic field power coupled to the reference antenna to the
80 electromagnetic field power coupled to the device under test (DUT), is expressed by 𝑎𝑎 and
s
81 expressed as formula (1):
𝑃𝑃
REF
82 𝑎𝑎 = 10 log � � (1)
s 10
𝑃𝑃
DUT
83 Where
84 𝑎𝑎 is the screening attenuation of DUT, in dB;
s
85 𝑃𝑃 is the power coupled to the reference antenna, in W;
REF
86 𝑃𝑃 is the power coupled to the DUT, in W
DUT
87 4 Principle of screening attenuation measurement
88 The reverberation chamber is an electrically large screening cavity with high quality factor,
89 which is equipped with mode stirrer(s), input antenna and reference antenna. A system
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90 configuration example of screening attenuation measurement by reverberation chamber
91 method is shown in Figure 1.
Reverberation chamber
P
INJ
Input
antenna
Stepper
Mode
motor
50Ω
stirrer
DUT
DUT
measurement
Spectrum
Refernece
analyser1
antenna
P
DUT
Frequency
synthesizer
Spectrum
analyser2
P
REF
Reference measurement
Motor
Computer
control
92
93 Figure 1. A system configuration example of screening attenuation
94 by reverberation chamber
95 The electromagnetic wave power P emitted by the frequency synthesizer is transmitted to
INJ
96 the reverberation chamber through the input antenna in the cavity. The electromagnetic wave
97 will excite the multi-mode electromagnetic field in the reverberation chamber. The boundary
98 conditions of these electromagnetic fields change with the rotation and stirring of the mode
99 stirrer, and the electromagnetic field distribution in the cavity is nearly uniform, isotropic and
100 randomly polarized in the sense of statistical average. When the DUT is placed in the
101 reverberation chamber, the approximately uniformly distributed electromagnetic power P in
REF
102 the reverberation chamber received by the reference antenna is equivalent to the external
103 input power of the DUT, and the electromagnetic power PDUT coupled into the DUT can be
104 obtained by the spectrum analyser outside the reverberation chamber.
105 According to the definition formula (1), the screening attenuation of DUT can be calculated
106 from formula (2):
𝑃𝑃
REF
107 𝑎𝑎 = 10log � �
s 10
𝑃𝑃
DUT
𝑃𝑃
𝑃𝑃
INJ
REF
108 = 10log �� �∙� ��
10
𝑃𝑃 𝑃𝑃
DUT INJ
𝑃𝑃 𝑃𝑃
INJ INJ
109 = 10log � �− 10log � �
10 10
𝑃𝑃 𝑃𝑃
DUT REF
𝑃𝑃
INJ
110 = 10log � �−∆ (2)
10 ins
P
DUT
111 Where:
112 𝑎𝑎 is the screening attenuation of DUT, in dB;
s
113 𝑃𝑃 is the power coupled to the reference antenna, in W;
REF
114 𝑃𝑃 is the power coupled to the DUT, in W;
DUT
115 𝑃𝑃 is the power injected into the chamber, in W;
INJ
116 𝛥𝛥 is the insertion loss of the chamber, in decibels (dB).
ins
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117 In formula (2), the first term represents the total screening attenuation of the system which
118 can be obtained by measuring the power of DUT connected with a load by spectrum analyser
119 1; the second term represents the insertion loss of the reverberation chamber which can be
120 obtained by measuring the power of the reference antenna by spectrum analyser 2, and
121 measurements of the total screening attenuation and the insertion loss can be carried out
122 simultaneously.
123 When only one spectrum analyser is configured, the DUT and reference antenna can be
124 connected to the spectrum analyser separately by using a switch, and the total screening
125 attenuation of the system and the insertion loss of the reverberation chamber can be
126 measured separately (also known as time-division measurement), as shown in Figure 2.
Reverberation chamber
P
INJ
Input
antenna
Stepper
Mode
motor
50Ω
stirrer
DUT
Refernece
P
antenna
DUT
Frequency Spectrum
synthesizer analyser
Switch
P
REF
Reference measurement
Motor
Computer
control
127
128
129 Figure 2. A system configuration example of screening attenuation
130 by reverberation chamber with only one spectrum analyser
131
132 5 Measurement equipment
133 5.1 General test instruments
134 5.1.1 Frequency synthesizer
135 Frequency synthesizer or other frequency source shall be used, and its output power,
136 frequency range and transmission bandwidth shall meet the measurement requirements. In
137 order to ensure the repeatability of measurement, the frequency stability of frequency
-6
138 synthesizer or other frequency source should be better than 10 .
139 5.1.2 Spectrum analyser
140 The frequency range, resolution bandwidth and sensitivity of the spectrum analyser should
141 meet the measurement requirements. Other equipment that offers the same function, such as
142 EMI test receiver, can also be used.
143 5.1.3 Reverberation chamber
144 The reverberation chamber shall comply with IEC 61000-4-21.
145 In general, the reverberation chamber is a shielded enclosure having any shape; however, a
146 perfect cubic shape should be avoided for optimum performance at lower frequencies. It shall
147 be made of conductive materials (copper, aluminium or steel) and shall not contain lossy
148 materials.
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149 The upper frequency limit depends on the quality of the shielded enclosure and cables.
150 Furthermore, the sensitivity of the used measurement instruments also limits the maximum
151 frequency. There is no upper limit theoretically for the measurement frequency of the
152 reverberation chamber when its quality is disregarded.
153
154 In general, the reverberation chamber is required to work with sufficient modes, and the
155 working frequency should be greater than the cavity mode frequency as calculated from
156 formula (3):
2 2 2
𝑐𝑐 𝑚𝑚 𝑛𝑛 𝑝𝑝
0
�
157 𝑓𝑓 >𝑓𝑓 = � � +� � +�� (3)
mnp
2 𝑙𝑙 𝑤𝑤 ℎ
158
159 Where l, w and h are the length, width and height of reverberation chamber respectively, m, n
160 and p are integers, and the value range is up to the number of modes of reverberation
161 chamber.
162 It can be drawn from equation (3) that the lowest usable frequency (LUF) of the reverberation
163 chamber is limited by the size of the reverberation chamber. The larger the volume is, the
164 lower LUF is; and the number of modes of the reverberation chamber is directly proportional
165 to the measurement frequency and the size of the reverberation chamber. Increasing the size
166 of the reverberation chamber and raising the test frequency can both expand the number of
167 modes of the reverberation chamber. Therefore, the size of reverberation chamber should be
168 large enough to meet the requirements for mode frequency and mode number when
169 measuring at lower frequencies.
170 For more detailed requirements and instructions for reverberation chambers, reference to IEC
171 61000-4-21.
172 5.1.4 Mode stirrer
173 The mode stirrer shall be large with respect to wavelength and be at an angle to the walls of
174 the chamber. The mode stirrer shall be at least two wavelengths at the lowest measurement
175 frequency from tip to tip. When needed, more than one mode stirrer can beprovided.
176 5.1.5 Input antenna
177 The input antenna shall be a broadband antenna capable of covering the operating frequency
178 range, and its transmitting direction shall be towards the corner of the reverberation chamber
179 or the mode stirrer to avoid direct exposure to the reference antenna. The antenna should
180 exhibit limited resonances in the frequency range and not introduce losses.
181 The recommended antennas for different frequency bands are given in Table 1.
182 Table1. Recommended antennas
Frequency range Antenna type
≤1GHz Dipole antenna
≥1GHz Horn antenna
183 5.1.6 Reference antenna
184 The reference antenna shall be of the same type as the input antenna, and its polarization
185 direction shall be orthogonal to that of the input antenna.
186 5.1.7 Stepper motor
187 The stepper motor should be driven with enough torque to control the angle and speed.
188 5.1.8 Linking devices
189 Low loss semi-rigid coaxial cables with good screening attenuation shall be used as the test
190 cables to connect the spectrum analyser to the DUT. To avoid resonances, the DUT is
191 inserted into a test cable loop having a length of more than four wavelengths at minimum
192 frequency. The cable connecting the spectrum analyser to the reference antenna should be
193 consistent with the lengt
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