SIST EN 61000-4-6:2014
(Main)Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Conducted disturbances, induced by radio-frequency fields immunity test
Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Conducted disturbances, induced by radio-frequency fields immunity test
EN-IEC 61000-4-6 relates to the conducted immunity requirements of electrical and electronic equipment to electromagnetic disturbances coming from intended radio-frequency (RF) transmitters in the frequency range 150 kHz up to 80 MHz. Equipment not having at least one conducting wire and/or cable (such as mains supply, signal line or earth connection) which can couple the equipment to the disturbing RF fields is excluded from the scope of this publication. The object of this standard is to establish a common reference for evaluating the functional immunity of electrical and electronic equipment when subjected to conducted disturbances induced by RF fields. The test method documented in this part of IEC 61000 describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon.
Elektromagnetische Verträglichkeit (EMV) - Teil 4-6: Prüf- und Messverfahren - Störfestigkeit gegen leitungsgeführte Störgrößen, induziert durch hochfrequente Felder
Compatibilité électromagnétique (CEM) - Partie 4-6: Techniques d'essai et de mesure - Essai d'immunité aux perturbations conduites, induites par les champs radioélectriques
La CEI 61000-4-6:2013 se rapporte aux exigences relatives à l'immunité en conduction des matériels électriques et électroniques aux perturbations électromagnétiques provoquées par des émetteurs destinés à des radiofréquences (RF), dans la gamme de fréquences de 150 kHz à 80 MHz. Les matériels n'ayant pas au moins un câble conducteur (par exemple, cordons d'alimentation, lignes de transmission de signaux ou connexions de mise à la terre) capable de coupler les matériels aux champs RF perturbateurs ne sont pas concernés par la présente norme. Cette norme a pour objet d'établir une référence commune dans le but d'évaluer l'immunité fonctionnelle des matériels électriques et électroniques, quand ils sont soumis aux perturbations conduites induites par les champs radiofréquence. La méthode d'essai documentée dans cette norme décrit une méthode cohérente ayant pour but d'évaluer l'immunité d'un matériel ou d'un système vis-à-vis d'un phénomène défini. Cette quatrième édition annule et remplace la troisième édition publiée en 2008 et constitue une révision technique. Elle inclut les modifications techniques majeures suivantes par rapport à l'édition précédente: - utilisation des RCD; - étalonnage des pinces; - réorganisation de l'Article 7 sur les montages d'essai et les méthodes d'injection; - l'Annexe A qui est dédiée maintenant aux pinces EM et de découplage; - l'Annexe G qui traite maintenant l'incertitude de mesure relative au niveau de tension d'essai; - et les annexes informatives H, I et J qui sont nouvelles.
Elektromagnetna združljivost (EMC) - 4-6. del: Preskusne in merilne tehnike - Odpornost proti motnjam po vodnikih, ki jih inducirajo radiofrekvenčna polja (IEC 61000-4-6:2013)
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN 61000-4-6:2014
01-april-2014
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SIST EN 61000-4-6:2009
(OHNWURPDJQHWQD]GUXåOMLYRVW (0& GHO 3UHVNXVQHLQPHULOQHWHKQLNH
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Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques -
Conducted disturbances, induced by radio-frequency fields immunity test
Compatibilité électromagnétique (CEM) - Partie 4-6: Techniques d'essai et de mesure -
Essai d'immunité aux perturbations conduites, induites par les champs radioélectriques
Ta slovenski standard je istoveten z: EN 61000-4-6:2014
ICS:
33.100.20 Imunost Immunity
SIST EN 61000-4-6:2014 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST EN 61000-4-6:2014
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SIST EN 61000-4-6:2014
EUROPEAN STANDARD
EN 61000-4-6
NORME EUROPÉENNE
February 2014
EUROPÄISCHE NORM
ICS 33.100.20 Supersedes EN 61000-4-6:2009
English version
Electromagnetic compatibility (EMC) -
Part 4-6: Testing and measurement techniques -
Immunity to conducted disturbances, induced by radio-frequency fields
(IEC 61000-4-6:2013)
Compatibilité électromagnétique (CEM) - Elektromagnetische Verträglichkeit (EMV)
Partie 4-6: Techniques d'essai et de - Teil 4-6: Prüf- und Messverfahren -
mesure - Immunité aux perturbations Störfestigkeit gegen leitungsgeführte
conduites, induites par les champs Störgrößen, induziert durch hochfrequente
radioélectriques Felder
(CEI 61000-4-6:2013) (IEC 61000-4-6:2013)
This European Standard was approved by CENELEC on 2013-11-27. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the CEN-CENELEC Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the CEN-CENELEC Management Centre has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany,
Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland,
Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B - 1000 Brussels
© 2014 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61000-4-6:2014 E
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SIST EN 61000-4-6:2014
EN 61000-4-6:2014 - 2 -
Foreword
The text of document 77B/691/FDIS, future edition 4 of IEC 61000-4-6, prepared by SC 77B “High
frequency phenomena” of IEC/TC 77 "Electromagnetic compatibility" was submitted to the IEC-CENELEC
parallel vote and approved by CENELEC as EN 61000-4-6:2014.
The following dates are fixed:
• latest date by which the document has (dop) 2014-08-27
to be implemented at national level by
publication of an identical national
standard or by endorsement
(dow) 2016-11-27
• latest date by which the national
standards conflicting with the
document have to be withdrawn
This document supersedes EN 61000-4-6:2009.
EN 61000-4-6:2014 includes the following significant technical changes with respect to EN 61000-4-
6:2009:
a) use of the CDNs;
b) calibration of the clamps;
c) reorganization of Clause 7 on test setup and injection methods;
d) Annex A which is now dedicated to EM and decoupling clamps;
e) Annex G which now addresses the measurement uncertainty of the voltage test level;
f) informative Annexes H, I and J which are new.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent
rights.
Endorsement notice
The text of the International Standard IEC 61000-4-6:2013 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 61000-4-3 NOTE Harmonised as EN 61000-4-3.
CISPR 16-1-2 NOTE Harmonised as EN 55016-1-2.
CISPR 16-1-4 NOTE Harmonised as EN 55016-1-4.
CISPR 20 NOTE Harmonised as EN 55020.
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SIST EN 61000-4-6:2014
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Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
NOTE When an international publication has been modified by common modifications, indicated by
(mod), the relevant EN/HD applies.
Publication Year Title EN/HD Year
IEC 60050 (Series) - International Electrotechnical Vocabulary - -
(IEV)
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SIST EN 61000-4-6:2014
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SIST EN 61000-4-6:2014
IEC 61000-4-6
®
Edition 4.0 2013-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-6: Testing and measurement techniques – Immunity to conducted
disturbances, induced by radio-frequency fields
Compatibilité électromagnétique (CEM) –
Partie 4-6: Techniques d'essai et de mesure – Immunité aux perturbations
conduites, induites par les champs radioélectriques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX XC
ICS 33.100.20 ISBN 978-2-8322-1176-2
Warning! Make sure that you obtained this publication from an authorized distributor.
Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
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SIST EN 61000-4-6:2014
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CONTENTS
FOREWORD . 5
INTRODUCTION . 7
1 Scope . 8
2 Normative references . 8
3 Terms and definitions . 8
4 General . 10
5 Test levels . 12
6 Test equipment and level adjustment procedures . 13
6.1 Test generator . 13
6.2 Coupling and decoupling devices . 15
6.2.1 General . 15
6.2.2 Coupling/decoupling networks (CDNs) . 18
6.2.3 Clamp injection devices . 20
6.2.4 Direct injection devices . 22
6.2.5 Decoupling networks . 22
6.3 Verification of the common mode impedance at the EUT port of coupling
and decoupling devices . 23
6.3.1 General . 23
6.3.2 Insertion loss of the 150 Ω to 50 Ω adapters . 23
6.4 Setting of the test generator . 25
6.4.1 General . 25
6.4.2 Setting of the output level at the EUT port of the coupling
device . 26
7 Test setup and injection methods . 28
7.1 Test setup . 28
7.2 EUT comprising a single unit . 28
7.3 EUT comprising several units . 29
7.4 Rules for selecting injection methods and test points . 30
7.4.1 General . 30
7.4.2 Injection method . 30
7.4.3 Ports to be tested . 31
7.5 CDN injection application . 32
7.6 Clamp injection application when the common mode impedance
requirements can be met. 33
7.7 Clamp injection application when the common mode impedance
requirements cannot be met . 35
7.8 Direct injection application . 35
8 Test procedure . 36
9 Evaluation of the test results . 37
10 Test report . 37
Annex A (normative) EM and decoupling clamps . 39
Annex B (informative) Selection criteria for the frequency range of application . 49
Annex C (informative) Guide for selecting test levels . 51
Annex D (informative) Information on coupling and decoupling networks . 52
Annex E (informative) Information for the test generator specification . 57
Annex F (informative) Test setup for large EUTs . 58
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61000-4-6 © IEC:2013 – 3 –
Annex G (informative) Measurement uncertainty of the voltage test level . 61
Annex H (informative) Measurement of AE impedance . 72
Annex I (informative) Port to port injection . 76
Annex J (informative) Amplifier compression and non-linearity . 78
Bibliography . 83
Figure 1 – Immunity test to RF conducted disturbances . 12
Figure 2 – Open circuit waveforms at the EUT port of a coupling device for test level 1 . 13
Figure 3 – Test generator setup . 15
Figure 4 – Principle of coupling and decoupling . 18
Figure 5 – Principle of coupling and decoupling according to the clamp injection
method . 20
Figure 6 – Example of circuit for level setting setup in a 150 Ω test jig . 21
Figure 7 – Example circuit for evaluating the performance of the current clamp . 22
Figure 8 – Details of setups and components to verify the essential characteristics of
coupling and decoupling devices and the 150 Ω to 50 Ω adapters . 25
Figure 9 – Setup for level setting . 27
Figure 10 – Example of test setup with a single unit EUT (top view) . 29
Figure 11 – Example of a test setup with a multi-unit EUT (top view) . 30
Figure 12 – Rules for selecting the injection method . 31
Figure 13 – Immunity test to 2-port EUT (when only one CDN can be used) . 33
Figure 14 – General principle of a test setup using clamp injection devices . 34
Figure 15 – Example of the test unit locations on the ground plane when using
injection clamps (top view) . 35
Figure A.1 – Example: Construction details of the EM clamp . 40
Figure A.2 – Example: Concept of the EM clamp . 41
Figure A.3 – Dimension of a reference plane . 42
Figure A.4 – Test jig . 42
Figure A.5 – Test jig with inserted clamp . 42
Figure A.6 – Impedance / decoupling factor measurement setup . 43
Figure A.7 – Typical examples for clamp impedance, 3 typical clamps . 44
Figure A.8 – Typical examples for decoupling factors, 3 typical clamps . 45
Figure A.9 – Normalization setup for coupling factor measurement . 45
Figure A.10 – S coupling factor measurement setup . 46
21
Figure A.11 – Typical examples for coupling factor, 3 typical clamps . 46
Figure A.12 – Decoupling clamp characterization measurement setup . 47
Figure A.13 – Typical examples for the decoupling clamp impedance . 47
Figure A.14 – Typical examples for decoupling factors . 48
Figure B.1 – Start frequency as function of cable length and equipment size . 50
Figure D.1 – Example of a simplified diagram for the circuit of CDN-S1 used with
screened cables (see 6.2.2.5) . 53
Figure D.2 – Example of simplified diagram for the circuit of CDN-M1/-M2/-M3 used
with unscreened supply (mains) lines (see 6.2.2.2) . 53
Figure D.3 – Example of a simplified diagram for the circuit of CDN-AF2 used with
unscreened unbalanced lines (see 6.2.2.4) . 54
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Figure D.4 – Example of a simplified diagram for the circuit of a CDN-T2, used with an
unscreened balanced pair (see 6.2.2.3) . 54
Figure D.5 – Example of a simplified diagram of the circuit of a CDN-T4 used with
unscreened balanced pairs (see 6.2.2.3) . 55
Figure D.6 – Example of a simplified diagram of the circuit of a CDN AF8 used with
unscreened unbalanced lines (see 6.2.2.4) . 55
Figure D.7 – Example of a simplified diagram of the circuit of a CDN-T8 used with
unscreened balanced pairs (see 6.2.2.3) . 56
Figure F.1 – Example of large EUT test setup with elevated horizontal reference
ground plane . 59
Figure F.2 – Example of large EUT test setup with vertical reference ground plane . 60
Figure G.1 – Example of influences upon voltage test level using CDN . 62
Figure G.2 – Example of influences upon voltage test level using EM clamp . 62
Figure G.3 – Example of influences upon voltage test level using current clamp . 63
Figure G.4 – Example of influences upon voltage test level using direct injection . 63
Figure G.5 – Circuit for level setting setup . 64
Figure H.1 – Impedance measurement using a voltmeter . 73
Figure H.2 – Impedance measurement using a current probe . 74
Figure I.1 – Example of setup, port-port injection . 77
Figure J.1 – Amplifier linearity measurement setup . 80
Figure J.2 – Linearity characteristic . 81
Figure J.3 – Measurement setup for modulation depth . 81
Figure J.4 – Spectrum of AM modulated signal . 82
Table 1 – Test levels . 13
Table 2 – Characteristics of the test generator . 14
Table 3 – Main parameter of the combination of the coupling and decoupling device . 15
Table 4 – Usage of CDNs . 18
Table B.1 – Main parameter of the combination of the coupling and decoupling device
when the frequency range of test is extended above 80 MHz . 49
Table E.1 – Required power amplifier output power to obtain a test level of 10 V . 57
Table G.1 – CDN level setting process . 65
Table G.2 – CDN test process . 65
Table G.3 – EM clamp level setting process . 67
Table G.4 – EM clamp test process . 67
Table G.5 – Current clamp level setting process . 68
Table G.6 – Current clamp test process . 69
Table G.7 – Direct injection level setting process . 70
Table G.8 – Direct injection test process . 70
Table H.1 – Impedance requirements for the AE . 72
Table H.2 – Derived voltage division ratios for AE impedance measurements . 73
Table H.3 – Derived voltage ratios for AE impedance measurements . 74
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SIST EN 61000-4-6:2014
61000-4-6 © IEC:2013 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-6: Testing and measurement techniques –
Immunity to conducted disturbances,
induced by radio-frequency fields
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
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with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
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between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
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6) All users should ensure that they have the latest edition of this publication.
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other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61000-4-6 has been prepared by subcommittee 77B: High
frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility.
It forms Part 4-6 of IEC 61000. It has the status of a basic EMC publication in accordance
with IEC Guide 107.
This fourth edition cancels and replaces the third edition published in 2008 and constitutes a
technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) use of the CDNs;
b) calibration of the clamps;
c) reorganization of Clause 7 on test setup and injection methods;
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SIST EN 61000-4-6:2014
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d) Annex A which is now dedicated to EM and decoupling clamps;
e) Annex G which now addresses the measurement uncertainty of the voltage test level;
f) informative Annexes H, I and J which are new.
The text of this standard is based on the following documents:
FDIS Report on voting
77B/691/FDIS 77B/704/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 61000 series, published under the general title Electromagnetic
compatibility (EMC), can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
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SIST EN 61000-4-6:2014
61000-4-6 © IEC:2013 – 7 –
INTRODUCTION
IEC 61000 is published in separate parts according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as international standards
or as technical specifications or technical reports, some of which have already been published
as sections. Others will be published with the part number followed by a dash and a second
number identifying the subdivision (example: IEC 61000-6-1).
This part is an international standard which gives immunity requirements and test procedures
related to conducted disturbances induced by radio-frequency fields.
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ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-6: Testing and measurement techniques –
Immunity to conducted disturbances,
induced by radio-frequency fields
1 Scope
This part of IEC 61000 relates to the conducted immunity requirements of electrical and
electronic equipment to electromagnetic disturbances coming from intended radio-frequency
(RF) transmitters in the frequency range 150 kHz up to 80 MHz. Equipment not having at least
one conducting wire and/or cable (such as mains supply, signal line or earth connection)
which can couple the equipment to the disturbing RF fields is excluded from the scope of this
publication.
NOTE 1 Test methods are defined in this part of IEC 61000 to assess the effect that conducted disturbing signals,
induced by electromagnetic rad
...
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