IEC TS 62565-1:2023 which is a Technical Specification, defines the system of blank detail specifications for nanomaterials and nano-assemblies as well as final nano-enabled products addressed in the nanomanufacturing value chain.
It defines the concepts of blank detail specification (BDS), detail specification (DS) and key control characteristic (KCC). Furthermore, it provides guidelines how to develop and use product specifications, particularly the IEC 62565 series, in the field of nanotechnology.
This document also provides guidelines regarding the certification and reliability aspects for products specified by a DS and associated KCCs.
NOTE 1 The IEC 62565 series uses an open generic structure that can be flexibly adapted to technical developments. The double indexing of the individual parts allows grouping into technology areas without restriction due to an overly strict hierarchical structure.
NOTE 2 Key elements of the IEC 62565 series are a consensus-based set of key control characteristics (KCCs) with clear definitions and standardized measurement procedures to measure them.

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IEC TS 62607-5-4:2022 specifies the measuring method of the band gap energy of a nanomaterial using electron energy loss data of transmission electron microscope.
The method specified in this document is applicable to semiconducting and insulating nanomaterials to estimate the band gap.
The measurement to get reliable data is performed under the consistent conditions of TEM observation and specimen thickness. The applicable measurement range of band gap energy is more than 2 eV.

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IEC TS 62607-8-1:2020 There are two types of thermally stimulated current (TSC) measurement methods, classified by the origin of the current. One is generated by the detrapping of charges. The other one is generated by depolarization. IEC TS 62607-8-1:2020 focuses on the former method, and specifies the measurement method to be developed for determining defect states of nano-enabled metal-oxide interfacial devices.
IEC TS 62607-8-1:2020 includes:
– outlines of the experimental procedures used to measure TSC,
– methods of interpretation of results and discussion of data analysis, and
– case studies.

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IEC TS 62607-4-2:2016(E), which is a Technical Specification, provides a standardized method for the determination of the density of cathode nanomaterials in powder form used for electrical energy storage devices. This method provides users with a key control characteristic to decide whether or not a cathode nanomaterial is usable, or suitable for their application. This document includes definitions of terminology used in this document, recommendations for sample preparation, outlines of the experimental procedures used to measure cathode nanomaterial properties, methods of interpretation of results and discussion of data analysis, case studies, and references.

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IEC/IEEE 62659:2015(E) provides a framework for introducing nanoelectronics into large scale, high volume production in semiconductor manufacturing facilities through the incorporation of nanomaterials (e.g. carbon nanotubes, graphene, quantum dots, etc.). Since semiconductor manufacturing facilities need to incorporate practices that maintain high yields, there are very strict requirements for how manufacturing is performed. Nanomaterials represent a potential contaminant in semiconductor manufacturing facilities and need to be introduced in a structured and methodical way.

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IEC 62607-3-1:2014 describes the procedures to be followed and precautions to be observed when performing reproducible measurements of the quantum efficiency of luminescent nanomaterials. Luminescent nanomaterials covered by this method include nano-objects such as quantum dots, nanophosphors, nanoparticles, nanofibers, nanocrystals, nanoplates, and structures containing these materials. The nanomaterials may be dispersed in either a liquid state (e.g., colloidal dispersion of quantum dots) or solid-state (e.g., nanofibers containing luminescent nanoparticles). This standard covers both relative measurements of liquid state luminescent nanomaterials and absolute measurements of both solid and liquid state nanomaterials. Key words: nanotechnology, nano, naloleds

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IEC/PAS 62565-2-1:2011(E) establishes a blank detail specification for the essential electrical properties and certain other common characteristics including dimensional, structural and mechanical properties of single-wall carbon nanotubes. It provides a standardized format for detail specifications characterising essential basic properties of single-wall nanotubes and recommends measurement methods. Single-wall carbon nanotubes with a chemical modification, dispersed into a solvent or grown on a substrate are included. A PAS is a technical specification not fulfilling the requirements for a standard, but made available to the public. Following publication of this PAS, which is a pre-standard publication, the technical committee concerned may transform it into an International Standard.

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