IEC 60115-8:2023 is applicable to fixed surface mount resistors for use in electronic equipment. These resistors are typically described according to types (different geometric shapes) and styles (different dimensions) and product technology. These resistors have metallized terminations and are primarily intended to be mounted directly onto a circuit board.
The object of this document is to specify preferred ratings and characteristics and to select from IEC 60115-1, the appropriate quality assessment procedures, tests and measuring methods and to give general performance requirements for this type of resistor.
This edition includes the following significant technical changes with respect to the previous edition:
a) definitions of product technologies and product classification levels of the generic specification, IEC 60115-1:2020, have been adopted;
b) new style of transverse (RT) resistors has been added in 3.1.5 and 4.2.2 to cover resistors with wide terminals, which have become common in market;
c) recommended test boards in 5.2.2 have been revised to fit the demands from the market for higher rated dissipation in resistors;
d) test boards have been revised so that they can be set vertically instead of horizontally during specified tests to optimize the temperature rise stability, area and spacing inside the test chamber;
e) 'Periodic-pulse high-voltage overload test' of IEC 60115‑1:2020, 8.3 has been added to the default test method in 5.3.8, however, the legacy test 'periodic-pulse overload test' of IEC 60115‑1:2020, 8.4 is still maintained for historical products;
and more. Please see the foreword for the list of changes.

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IEC 60393-3:2023 applies to rotary precision potentiometers for use in electronic equipment. The object of this document is to prescribe preferred ratings and characteristics and to select from IEC 60393-1, the appropriate quality assessment procedures, tests and measuring methods and to give general performance requirements for this type of potentiometer. This document gives the minimum performance requirements and test severities.
This edition includes the following significant technical changes with respect to the previous edition:
a) revised all parts of the document based on the ISO/IEC Directives, Part 2:2018 (eighth edition) and harmonized with other similar kinds of documents;
b) the document structure has been organized to follow new sectional specification structure decided in TC 40;
c) revision of the information on the assessment level EZ (zero nonconforming).

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This part of EN 60115 is a generic specification and is applicable to fixed resistors for use in electronic equipment.
It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.

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This part of EN 60115 is a generic specification and is applicable to fixed resistors for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.

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IEC 60539-1:2022 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties.
It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.
This edition includes the following significant technical changes with respect to the previous edition:
Restructured completely to comply to ISO/IEC directives; categorization and reorganization of test methods into these categories; Annex X added for comparison to the previous edition; Some wordings, figures and references have been revised.

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IEC 60115-2-10:2023(E) is a detail specification which specifies the characteristics and ratings of low-power film resistors with leads for use in electronic equipment, which are typically assembled in through-hole technology (THT) on circuit boards. This detail specification establishes test schedules and performance requirements permitting the quality assessment of the resistors covered herein according to the quality assessment procedures specified by IEC 60115-1:2020, Annex Q.
This first edition cancels and replaces IEC 60115-2-1:1982. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
it employs the product classification based on application requirements as defined in the generic specification IEC 60115‑1:2020;
it permits the specification of additional dimensional requirements concerning the eccentricity of termination wires and the coating extending onto wires;
it provides for a tabulated presentation of resistance ranges in relationship to the temperature coefficient and the tolerance;
it supports solderability testing for both traditional lead-bearing soldering and up-to-date lead-free soldering, as required;
it introduces a test for the specimens’ robustness to electrostatic discharge;
it introduces a test for the specimens’ resistance to solvents;
it introduces a test for the flammability of the specimens;
it employs consistent stability requirements grouped in stability classes;
it supports the provision of detailed visual acceptance criteria;
it includes the requirement for a visual examination of the primary and proximity packaging;
it provides the correlated test schedules for a qualification approval and for subsequent quality conformance inspections side by side;
it employs quality assessment procedures which meet the requirements of a zero-defect approach, which evades the use of historic AQL levels and the permission of non-conforming specimens in test groups;
it provides for the inclusion of specific visual acceptance criteria, to be applied in addition to those given in Annex B of the sectional specification IEC 60115-2:2023;
it provides for the optional coverage of 0 Ω resistors (jumpers) within the scope of the drafted detail specification;
furthermore, it employs a new document structure, for which a transition guidance is provided in Annex X.

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IEC 60115-2:2023(E) is applicable to fixed low-power film resistors with termination leads for use in electronic equipment, which are typically assembled in through-hole technology (THT) on circuit boards.
These resistors are typically described according to types (different geometric shapes) and styles (different dimensions) and product technology. The resistive element of these resistors is typically protected by a conformal lacquer coating. These resistors have wire terminations and are primarily intended to be mounted on a circuit board in through-hole technique.
The object of this document is to state preferred ratings and characteristics and to select from IEC 60115-1 the appropriate quality assessment procedures, tests and measuring methods and to give general performance requirements for this type of resistor.
This edition includes the following significant technical changes with respect to the previous edition:  
the definitions of product technologies and product classification levels of the generic specification, IEC 60115‑1:2020, have been adopted;
the preferred dimensions given in Table 1 have been reviewed, and the legacy style RA_0922 has been removed;
a basis for the optional specification of the lead eccentricity of axial leaded resistors has been amended in 4.2;
the 'period-pulse high-voltage overload test' of IEC 60115‑1:2020, 8.3 has been adopted as default test method in 5.3.8, thereby replacing the legacy test 'periodic-pulse overload test' of IEC 60115‑1:2020, 8.4;
the revised solderability test of IEC 60115‑1:2020, 11.1 has been adopted in 5.3.19 and 5.3.20;
the combined solvent resistance test of IEC 60115‑1:2020, 11.3 has been adopted in 5.3.22;
the 'endurance at room temperature test' of IEC 60115‑1:2020, 7.2 (prior IEC 60115 2:2014, Annex C) has been adopted as an optional test in 5.4.1;
the 'single-pulse high-voltage overload test' of IEC 60115 1:2020, 8.2, applied with the pulse shape 10/700 in 5.3.7, is complemented with the optional alternative provided by the pulse shape 1,2/50 in 5.4.2;
climatic tests for 'operation at low temperature' of IEC 60115‑1:2020, 10.2, and for 'damp heat, steady state, accelerated' of IEC 60115‑1:2020, 10.5, have been adopted as optional tests in 5.4.4 and 5.4.5, respectively;
new guidance is provided in 6.2 on the presentation of stability requirements with their permissible absolute and relative deviations;
acceptance criteria for the visual examination have been added in 6.5 and in Annex B;
visual examination for the primary and proximity packaging has been added in 6.5.2 and in 7.2;
the periodical evaluation of termination platings has been added as a new topic of quality assessment in 9.8;
the revised test clause numbering of IEC 60115‑1:2020 has been applied;
a new Annex C has been added to summarize workmanship requirements for the assembly of leaded film resistors, e.g. as given in the prior IEC 61192 series of standards;
the informative Annex F (prior Annex B) on radial formed styles has been amended with details on a formed Z-bend style for surface-mount assembly.

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IEC 60539-1:2022 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This edition includes the following significant technical changes with respect to the previous edition:  Restructured completely to comply to ISO/IEC directives; categorization and reorganization of test methods into these categories; Annex X added for comparison to the previous edition; Some wordings, figures and references have been revised.

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IEC 60539-1:2022 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties.
It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.
This edition includes the following significant technical changes with respect to the previous edition:  
Restructured completely to comply to ISO/IEC directives; categorization and reorganization of test methods into these categories;
Annex X added for comparison to the previous edition;
Some wordings, figures and references have been revised.

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This part of IEC 60738 describes terms and methods of test for positive step-function temperature coefficient thermistors, insulated and non-insulated types typically made from ferro-electric semi-conductor materials.
It establishes standard terms, inspection procedures and methods of test for use in detail specifications for Qualification Approval and for Quality Assessment Systems for electronic components.

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IEC 60115-4:2022(E) relates to resistors having a rated dissipation typically greater than 1 W up to and including 1 000 W for use in electronic equipment. This document is applicable to fixed power resistors with a maximum surface temperature (MET) higher than the preferred upper category temperature (UCT) of 200 °C.
NOTE Heat sink resistors, i.e. resistors which in their operation depend on being mounted on a dedicated heat sink, owing to their special temperature conditions, are covered by a special sectional specification (under consideration at the time of publication).
These resistors are typically described according to types (different geometric shapes) and styles (different dimensions), and product technology.
The object of this document is to define preferred ratings and characteristics and to select from IEC 60115-1 the appropriate quality assessment procedures, tests and measuring methods and to give general performance requirements for this type of resistor.
NOTE SMD resistors are covered by IEC 60115-8, regardless of their dissipation.
This edition includes the following significant technical changes with respect to the previous edition:  
the definitions of product technologies and product classification levels of the generic specification, IEC 60115-1:2020, have been adopted;
a basis for the optional specification of the lead eccentricity of axial leaded resistors has been amended in 4.2;
the 'period-pulse high-voltage overload test' of IEC 60115-1:2020, 8.3 has been adopted as default test method in 5.3.9, thereby replacing the legacy test 'periodic-pulse overload test of IEC 60115-1:2020, 8.4;
the revised solderability test of IEC 60115-1:2020, 11.1 has been adopted in 5.3.22 and 5.3.23;
the combined solvent resistance test of IEC 60115-1:2020, 11.3 has been adopted in 5.3.25;
the 'endurance at room temperature test' of IEC 60115-1:2020, 7.2 has been reworked and adopted in 5.3.5;
the 'single-pulse high-voltage overload test' of IEC 60115-1:2020, 8.2, applied with the pulse shape 10/700 in 5.3.8, is complemented with the optional alternative provided by the pulse shape 1,2/50 in 5.4.1.
climatic tests for 'operation at low temperature' of IEC 60115 1:2020, 10.2, and for 'damp heat, steady state, accelerated' of IEC 60115‑1:2020, 10.5, have been adopted as optional tests in 5.4.5. and 5.4.6, respectively;
inclusion of an optional flammability test as 5.4.8;
new guidance is provided in 6.2 on the presentation of stability requirements with their permissible absolute and relative deviations;
acceptance criteria for the visual inspection have been added in 6.5 and in Annex B;
visual inspection for the primary and proximity packaging has been added in 6.5.3 and in 7.2;
the periodical evaluation of termination platings has been added as a new topic of quality assessment in 9.8;
the revised test clause numbering of IEC 60115-1:2020 has been applied;
a new Annex C has been added to summarize workmanship requirements for the assembly of leaded power resistors, e.g. as given in the prior IEC 61192 series of standards;
the informative Annex F on radial formed styles has been amended with details on a formed Z-bend style for surface-mount assembly;
furthermore, the informative Annex X has been ad

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This part of IEC 60738 describes terms and methods of test for positive step-function temperature coefficient thermistors, insulated and non-insulated types typically made from ferro-electric semi-conductor materials. It establishes standard terms, inspection procedures and methods of test for use in detail specifications for Qualification Approval and for Quality Assessment Systems for electronic components.

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IEC 60738-1:2022 describes terms and methods of test for positive step-function temperature coefficient thermistors, insulated and non-insulated types, typically made from ferro-electric semi-conductor materials.
It establishes standard terms, inspection procedures and methods of test for use in detail specifications for qualification approval and for quality assessment systems for electronic components.
This edition includes the following significant technical changes with respect to the previous edition:
a) Restructured completely to comply with ISO/IEC Directives; categorization and reorganization of test methods into these categories;
b) Some wordings, figures and references have been revised.

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IEC 60539-2:2019 is available as IEC 60539-2:2019 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 60539-2:2019 is applicable to surface mount directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. These thermistors have metallized connecting pads or soldering strips and are intended to be mounted directly on to substrates for hybrid circuits or on to printed boards. This edition includes the following significant technical changes with respect to the previous edition: a) revision for the structure in accordance with ISO/IEC Directives, Part 2:2016 (seventh edition) to the extent practicable, and for harmonizing with IEC 60539-1:2016; b) the upper category temperatures of 175 °C, 200 °C, 250 °C, 315 °C, 400 °C in Table 1 have been added; c) the dimensions of 0402M in Annex A have been added.

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IEC 62812:2019 specifies methods of measurement and associated test conditions that eliminate or reduce the influence of adverse phenomena in order to improve the attainable accuracy of low-resistance measurements. The methods described in this document are applicable for the individual measurements of the resistance of individual resistors, and also for resistance measurements as part of a test sequence. They are applied if prescribed by a relevant component specification, or if agreed between a customer and a manufacturer.

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IEC 60477-1:2022 applies to resistors intended for use as laboratory DC resistors (hereinafter referred to as "resistors") comprising standard resistors, single or multiple resistors of accuracy Classes 0,000 05 to 10 and single or multi-dial resistors of accuracy Classes 0,000 5 to 10. This document does not apply to: 1) resistors which are intended for use solely as permanently mounted circuit components, 2) resistors used on alternating current or on pulsed current, 3) active resistors, 4) series resistors and shunts which are considered as accessories of electrical measuring instruments in the relevant IEC document (examples of these are as follows). IEC 60477-1:2022 cancels and replaces the first edition of IEC 60477 published in 1974, and its Amendment 1:1997. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) extended the resistor accuracy classes; b) deleted the resistor accuracy class expression in parts per million (ppm); c) excluded the active resistor from the scope of this document; d) updated the terms and definitions according to new IEC 60050 series; e) changed the term "resistance decade" to "resistance dial" to cover the multi-dial resistors with other resistance step values; f) updated the intrinsic error to intrinsic uncertainty according to IEC 60359; g) added the limits of relative stability for resistors of classes 0,000 05 to 0,01; h) added the requirements of high voltage resistors; i) updated the safety symbols and requirements according to the new IEC 61010 series; j) updated the insulation resistance requirements of resistors; k) added the requirements of temperature coefficient; l) updated the temperature requirements for transport and storage of resistors.

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This part of IEC 60477 applies to resistors intended as laboratory AC resistors for use over a range of frequencies from DC up to a stated frequency which is not in excess of 1 MHz. Such resistors are hereinafter referred to as "AC resistors". In addition to satisfying the requirements of IEC 60477, resistors satisfying the requirements of this standard are designed to have a small variation of resistance and a small phase displacement over the stated frequency range. Because of the uncertainties in AC properties which can result from stray inductances, stray capacitances, eddy currents, dielectric absorption effects and skin effect, the AC resistors to which this standard applies are classified according to their construction (see Annex D), as follows: a) Two-terminal resistor which each of one terminal both for current and potential; b) Three-terminal resistor which has one more shield terminal (also could be called as guard terminal) connected to the electric screen than the two-terminal resistor to reduce the stray capacitances effect; c) Four-terminal resistor which has independent current terminals and potential terminals to reduce the stray inductances and contact resistances; d) Five-terminal resistor which has one more shield terminal than the four-terminal resistor; e) Four-terminal coaxial resistor which has two terminal-pairs with the outer shield conductors working as the low terminal of current or potential; f) Two-terminal-pair resistor which has two terminal-pairs with the outer shield conductors working as the return path for the signal current (not grounded); g) Four-terminal-pair resistor which has four terminal-pairs with the outer shield conductors working as the return path for the signal current (not grounded) to eliminate the effect of mutual coupling between the current and potential leads.

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IEC 60477-2:2022 applies to resistors intended as laboratory AC resistors for use over a range of frequencies from DC up to a stated frequency which is not in excess of 1 MHz. Such resistors are hereinafter referred to as "AC resistors".
In addition to satisfying the requirements of IEC 60477-1, resistors satisfying the requirements of this document are designed to have a small variation of resistance and a small phase displacement over the stated frequency range.
IEC 60477-2:2022 cancels and replaces the first edition published in 1979, and Amendment 1:1997. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a) extended the AC resistor frequency range to 1 MHz;
b) updated the terms and definitions according to IEC 60050 series;
c) added the definition of AC/DC difference of an AC resistor;
d) added the resistor classification according to the AC resistance or AC/DC difference index;
e) updated the classification according to the AC resistor construction;
f) updated the safety symbols and requirements according to IEC 60477-1;
g) added the three-element equivalent circuits of an AC resistor in Annex C;
h) added the annex on constructions of AC resistors.

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IEC 60477-1:2022 applies to resistors intended for use as laboratory DC resistors (hereinafter referred to as "resistors") comprising standard resistors, single or multiple resistors of accuracy Classes 0,000 05 to 10 and single or multi-dial resistors of accuracy Classes 0,000 5 to 10.
This document does not apply to:
1) resistors which are intended for use solely as permanently mounted circuit components,
2) resistors used on alternating current or on pulsed current,
3) active resistors,
4) series resistors and shunts which are considered as accessories of electrical measuring instruments in the relevant IEC document (examples of these are as follows).
IEC 60477-1:2022 cancels and replaces the first edition of IEC 60477 published in 1974, and its Amendment 1:1997. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a) extended the resistor accuracy classes;
b) deleted the resistor accuracy class expression in parts per million (ppm);
c) excluded the active resistor from the scope of this document;
d) updated the terms and definitions according to new IEC 60050 series;
e) changed the term "resistance decade" to "resistance dial" to cover the multi-dial resistors with other resistance step values;
f) updated the intrinsic error to intrinsic uncertainty according to IEC 60359;
g) added the limits of relative stability for resistors of classes 0,000 05 to 0,01;
h) added the requirements of high voltage resistors;
i) updated the safety symbols and requirements according to the new IEC 61010 series;
j) updated the insulation resistance requirements of resistors;
k) added the requirements of temperature coefficient;
l) updated the temperature requirements for transport and storage of resistors.

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This part of IEC 61051 is a sectional specification and is applicable to metal oxide varistors with symmetrical voltage-current characteristics for use in electronic equipment connected to any AC or DC supply system.
These varistors are designed to protect electronic and other sensitive equipment from high transient surges. Varistors under the scope of this sectional specification are not intended to give primary protection against lightning surges.
These varistors have metallic connections and are intended to be mounted as through hole component or directly on to printed boards.
The object of this document is to prescribe preferred ratings and characteristics and to select from IEC 61051-1 the appropriate quality assessment procedures, tests and measuring methods, and to give general performance requirements for this type of varistors. Test severities and requirements prescribed in detail specifications referring to this sectional specification should be of equal or higher performance level, because lower performance levels are not permitted.

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This part of IEC 61051 is a sectional specification and is applicable to metal oxide varistors with symmetrical voltage-current characteristics for use in electronic equipment connected to any AC or DC supply system. These varistors are designed to protect electronic and other sensitive equipment from high transient surges. Varistors under the scope of this sectional specification are not intended to give primary protection against lightning surges. These varistors have metallic connections and are intended to be mounted as through hole component or directly on to printed boards. The object of this document is to prescribe preferred ratings and characteristics and to select from IEC 61051-1 the appropriate quality assessment procedures, tests and measuring methods, and to give general performance requirements for this type of varistors. Test severities and requirements prescribed in detail specifications referring to this sectional specification should be of equal or higher performance level, because lower performance levels are not permitted.

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This part of IEC 61051 is a generic specification and is applicable to varistors with symmetrical voltage-current characteristics for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications for quality assessment or any other purpose. NOTE Detail specifications can be specifications within the IEC system, another specification system linked to IEC, or specified by the manufacturer or user. The drafting of a complete detail specification by IEC technical committee 40, if required, follows the rules described in Annex A.

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IEC 61051-2:2021 is a sectional specification and is applicable to metal oxide varistors with symmetrical voltage-current characteristics for use in electronic equipment connected to any AC or DC supply system.
These varistors are designed to protect electronic and other sensitive equipment from high transient surges. Varistors under the scope of this sectional specification are not intended to give primary protection against lightning surges.
These varistors have metallic connections and are intended to be mounted as through hole component or directly on to printed boards.
The object of this document is to prescribe preferred ratings and characteristics and to select from IEC 61051-1 the appropriate quality assessment procedures, tests and measuring methods, and to give general performance requirements for this type of varistors.
This edition includes the following significant technical changes with respect to the previous edition:  
revision for the structure in accordance with ISO/IEC Directives, Part 2) to the extent practicable, and for harmonizing with IEC 61051-1:2018;
Annex X has been added for comparison with the previous edition;
two lists of preferred voltage ratings for disk type and SMD type varistors have been added;
permissible numbers of non-conforming items have been set to zero (zero fault) in the test schedule in 8.4.3.

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EN-IEC 61643-331 is a test specification for metal oxide varistors (MOV), which are usedfor applications up to 1 000 V AC or 1 500 V DC in power lines, or telecommunication, orsignalling circuits. They are designed to protect apparatus or personnel, or both, from hightransient voltages.This document applies to MOVs having two electrodes and hybrid surge protectioncomponents. This document also does not apply to mountings and their effect on the MOV’scharacteristics. Characteristics given apply solely to the MOV mounted only in the waysdescribed for the tests.

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IEC 61643-331:2020 is available as IEC 61643-331:2020 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 61643-331:2020 is a test specification for metal oxide varistors (MOV), which are used for applications up to 1 000 V AC or 1 500 V DC in power lines, or telecommunication, or signalling circuits. They are designed to protect apparatus or personnel, or both, from high transient voltages. This document applies to MOVs having two electrodes and hybrid surge protection components. This document also does not apply to mountings and their effect on the MOV’s characteristics. Characteristics given apply solely to the MOV mounted only in the ways described for the tests. This third edition cancels and replaces the second edition published in 2017. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: - a Varistor MCOV rating assurance test; - an energy rating test (2ms); - revised Dielectric strength and insulation resistance tests.

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TAN - // IEC Corrigendum

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TAN - // IEC Corrigendum

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IEC 61643-331:2020 is available as IEC 61643-331:2020 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 61643-331:2020 is a test specification for metal oxide varistors (MOV), which are used for applications up to 1 000 V AC or 1 500 V DC in power lines, or telecommunication, or signalling circuits. They are designed to protect apparatus or personnel, or both, from high transient voltages. This document applies to MOVs having two electrodes and hybrid surge protection components. This document also does not apply to mountings and their effect on the MOV’s characteristics. Characteristics given apply solely to the MOV mounted only in the ways described for the tests. This third edition cancels and replaces the second edition published in 2017. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
- a Varistor MCOV rating assurance test;
- an energy rating test (2ms);
- revised Dielectric strength and insulation resistance tests.

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IEC 60115-1:2020 is a generic specification and is applicable to fixed resistors for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.
This edition contains the following significant technical changes with respect to the previous edition:
this 5th edition employs a new document structure, where the tests of prior Clause 4 are given in Clauses 6 to 12 now, with an informative Annex X providing cross-references for references to the prior revision of this standard;
the terms and definitions have been revised and amended, supplemented by a new section on resistor technologies and a new section on product classification levels;
a new Subclause 4.7 on recommendations for permissible substitutions has been added;
the provisions for packaging, storage and transportation in Subclauses 4.8, 4.9 and 4.10 have been completely revised;
a new Subclause 5.3 on default tolerances for the most common test parameters has been added;
the generic method of measuring resistance, now Sublause 5.6, has been separated from the test for compliance with a prescribed resistance value in 6.1, as a revision of the prior 4.5;
the test for the temperature coefficient of resistance of Subclause 6.2 is a revision of the prior test 4.8, variation of resistance with temperature, where the special concessions for resistors below 10 Ω have been waived;
the test methods for endurance testing of Subclauses 7.1 to 7.3 (prior 4.25.1 to 4.25.3) have been completely revised;
the single‑pulse high‑voltage overload test of Subclause 8.2 (prior 4.27) has been completely revised, and now offers adjustable severities for the 1,2/50 and for the 10/700 pulse shape for the benefit of detail specifications with improved significance;
the periodic-pulse high-voltage overload test of Subclause 8.3 (prior 4.28) has been revised and a corrected table of severities provided;
the period-pulse overload test of Subclause 8.4 (prior 4.39) has been deprecated and streamlined to only offer the severity historically applied in subordinate specifications;
the Subclauses 9.1 on visual inspection, 9.2 on the gauging of dimensions, and 9.3 on the assessment of detail dimensions (all parts of prior 4.4) have been completely revised;
the tests for robustness of terminations (prior 4.16) have been revised and separated into tests for the robustness of solderable terminations, Subclause 9.5, and tests for the robustness of threaded stud or screw terminations, Subclause 9.6;
the bump test of Subclause 9.9 (prior 4.20) and the shock test of Subclause 9.10 (prior 4.21) have been revised to reflect the merged relevant test standard IEC 60068-2-29;
the dry heat and cold test of the climatic sequence of Subclause 10.3 (prior 4.23) have been revised to reflect the changes of the relevant test standards IEC 60068‑2‑2 and IEC 60068‑2‑1;
the accelerated damp heat, steady state test of Subclause 10.5 (prior 4.37) has been amended with an option for a reduced number of bias voltages;
the corrosion test of Subclause 10.6 has been completely revised in order to employ the better suitable test method of IEC 60068-2-52 instead of the prior used IEC 60068-2-11;
the whisker growth test of Subclause 10.7 has been revised to reflect the changes of the new revision of the test methods of IEC 60068-2-82;
the test methods for solderability of Subclause 11.1 (prior 4.17) and for resistance to soldering heat of Subclause 11.2 (prior 4.18) have been completely revised to incorporate the necessary option for the variety of lead-bearing and lead-free solder alloys and respective process conditions;
the solvent resistance test of Subclause 11.3 combines the prior tests 4.29, component solvent resistance, and 4.30, solvent resistance of marking, in one test;
the accidental overload test of Subclause 12.3 (prior 4.26) has been completely r

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Amendment of the detail specification, aiming to amend the ordering information for a proper discrimination between two different permissible product variants.

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Amendment of the detail specification, aiming to amend the ordering information for a proper discrimination between two different permissible product variants.

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Specifies marking codes for resistors and capacitors and indexes for the dielectric material and the electrodes of plastic film and paper capacitors

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EN-IEC 60539-2 is applicable to surface mount directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. These thermistors have metallized connecting pads or soldering strips and are intended to be mounted directly on to substrates for hybrid circuits or on to printed boards.

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Specific Amendment to the EN 140402 to add an Annex D which, owing to the nature of a Blank Detail Specification, consists of the blank template for the Annex with respective editorial comments.

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Resistance measurements are typically compromised by a variety of phenomena, for example
serial resistance in the measurement path, self-heating or non-ohmic properties. Whether the
effect of such phenomena on a resistance measurement is acceptable or not depends on the
magnitude of each effect in comparison to the resistance and to the required accuracy. Hence,
the risk of erroneous resistance measurements increases with decreasing resistance and with
a tightening of the permissible tolerance.
This document specifies methods of measurement and associated test conditions that
eliminate or reduce the influence of adverse phenomena in order to improve the attainable
accuracy of low-resistance measurements.
The methods described in this document are applicable for the individual measurements of
the resistance of individual resistors, and also for resistance measurements as part of a test
sequence. They are applied if prescribed by a relevant component specification, or if agreed
between a customer and a manufacturer.

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IEC 60539-2:2019 is available as IEC 60539-2:2019 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 60539-2:2019 is applicable to surface mount directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. These thermistors have metallized connecting pads or soldering strips and are intended to be mounted directly on to substrates for hybrid circuits or on to printed boards.
This edition includes the following significant technical changes with respect to the previous edition:
a) revision for the structure in accordance with ISO/IEC Directives, Part 2:2016 (seventh edition) to the extent practicable, and for harmonizing with IEC 60539-1:2016;
b) the upper category temperatures of 175 °C, 200 °C, 250 °C, 315 °C, 400 °C in Table 1 have been added;
c) the dimensions of 0402M in Annex A have been added.

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IEC 60539-1:2016 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. IEC 60539 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This third edition cancels and replaces the second edition published in 2008. This edition constitutes a technical revision. Tables, figures and references have been revised.

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IEC 62812:2019 specifies methods of measurement and associated test conditions that eliminate or reduce the influence of adverse phenomena in order to improve the attainable accuracy of low-resistance measurements. The methods described in this document are applicable for the individual measurements of the resistance of individual resistors, and also for resistance measurements as part of a test sequence. They are applied if prescribed by a relevant component specification, or if agreed between a customer and a manufacturer.
The contents of the corrigendum of March 2020 have been included in this copy.

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IEC 60393-2:2015 applies to lead-screw actuated and rotary preset potentiometers, wirewound and non-wirewound for use in electronic equipment. These potentiometers are primarily intended for use in circuits for trimming purposes which require infrequent adjustments. This part of IEC 60393 prescribes preferred ratings and characteristics and selects from IEC 60393-1 the appropriate quality assessment procedures, tests and measuring methods. It provides general performance requirements for this type of potentiometer. This standard gives the minimum performance requirements and test severities. This edition includes the following significant technical changes with respect to the previous edition: a) revision of the information on the assessment level EZ and FZ (zero nonconforming); b) complete editorial revision.

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IEC 60393-5:2015 applies to single-turn rotary low-power wirewound and non-wirewound potentiometers, with a rated dissipation less than to 10 W. These potentiometers are primarily intended for use in electronic equipment. This part of IEC 60393 prescribes preferred ratings and characteristics and selects from IEC 60393-1, appropriate quality assessment procedures, tests and measuring methods. It provides general performance requirements for this type of potentiometer. This standard gives the minimum performance requirements and test severities. This edition includes the following significant technical changes with respect to the previous edition: a) revision of the information on the assessment level EZ and FZ (zero nonconforming); b) complete editorial revision.

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IEC 60393-6:2015 applies to surface mount preset potentiometers for use in electronic equipment. This part of IEC 60393 prescribes preferred ratings and characteristics and selects from IEC 60393-1, the appropriate quality assessment procedures, tests and measuring methods, and it gives general performance requirements for this type of potentiometers. This standard gives the minimum performance requirements and test severities. This edition includes the following significant technical changes with respect to the previous edition: a) revision of the information on the assessment level EZ (zero nonconforming); b) complete editorial revision.

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This part of IEC 61051 is a generic specification and is applicable to varistors with symmetrical
voltage-current characteristics for use in electronic equipment.
It establishes standard terms, inspection procedures and methods of test for use in sectional
and detail specifications for quality assessment or any other purpose.
NOTE Detail specifications can be specifications within the IEC system, another specification system linked to IEC,
or specified by the manufacturer or user. The drafting of a complete detail specification by IEC technical committee 40,
if required, follows the rules described in Annex A.

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IEC 61051-1:2018 is available as IEC 61051-1:2018 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 61051-1:2018 is a generic specification and is applicable to varistors with symmetrical voltage-current characteristics for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications for quality assessment or any other purpose. This edition includes the following significant technical changes with respect to the previous edition:
a) 10 new terms and definitions – leaded varistors, surface mount varistors(SMV), electrostatic discharge (ESD), ESD clamping voltage, equivalent rectangular pulse duration, maximum peak current derating characteristic, rated average dissipation power, rated energy, abnormal overvoltage withstanding duration and temperature derating curve – have been added (see 3.6, 3.7, 3.14, 3.15, 3.19, 3.20, 3.23, 3.24, 3.25 and 3.29);
b) General requirements for electrical tests and 7 new test items – clamping voltage, ESD clamping voltage, maximum peak current, rated average dissipation power, rated energy, electrostatic discharge (ESD), robustness of terminations of surface mount varistors – have been added (see 6.5, 6.11, 6.12, 6.13, 6.14, 6.15, 6.16 and 6.17.8);
c) In 6.6, 6.7, 6.8, 6.9.3, 6.23.2, 6.23.4 and 6.26, following test items have been revised:
- Varistor voltage, leakage current and capacitance: more detailed requirements and information have been added;
- Voltage proof – foil method: the space between the edge of the foil and each termination has been changed from 1 mm ~ 1,5 mm to 3 mm ~ 3.5 mm for testing varistors not having axial terminations and the minimum space between the foil and the termination has been changed from 1 mm to 3 mm for testing varistors having axial terminations;
- Climatic sequence – dry heat: the method has been changed from Ba to Bb;
- Climatic sequence – cold: the method has been changed from Aa to Ab;
- Endurance at upper category temperature: the method of “applying test voltages in cycles of 1,5 h on and 0,5 h off” has been changed to the method of applying test voltages continuously throughout the test lasting for 1 000 h;
d) The test items of pulse current, voltage under pulse condition and bump have been deleted from the section of test and measurement procedures;
e) Annex A and the contents referring to the test fixture specified in Annex A have been deleted;
f) All contents related to silicon carbide varistors have been deleted;
g) A new normative annex entitled “Test pulses used in this specification” (Annex B) has been added;
h) A new informative annex entitled "Recommended measurement/test methods for characteristics and parameters for application reference" (Annex C) has been added, in which guidelines of measuring/testing characteristics and parameters for application reference including voltage vs. current characteristic, maximum peak current derating characteristic, thermal resistance and abnormal overvoltage withstanding duration have been given.

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IEC 60063:2015 provides series of preferred values for the resistance of resistors and for the capacitance of capacitors. The definition of such series with a defined numeric resolution is a basic prerequisite for the marking and coding of capacitors and resistors with their respective capacitance or resistance values as described in IEC 60062. This edition includes the following significant technical changes with respect to the previous edition: - revision of the information on a relationship between an E Series and the tolerance of a resistance or capacitance value of a respective component; - introduction of advice on a possible deduction from the marking of a component to an associated E Series and also to an associated tolerance; - complete editorial revision.

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IEC 60115-1: 2008(E) is a generic specification and is applicable to fixed resistors for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This fourth edition cancels and replaces the third edition issued in 1999 and Amendment 1 (2001). It constitutes a technical revision. It contains the following significant technical changes with respect to the previous edition: a) implementation of Annex Q which replaces Clause 3; b) addition of new tests procedures in 4.34 through 4.38; c) removal of the property 'temperature characteristics' from 4.8; d) introduction of a new system of test severities for the shear test in 4.32; e) introduction of new bias voltages for the damp heat steady-state test in 4.24; f) furthermore, this fourth edition cancels and replaces the third edition published in 1999 and constitutes minor revisions related to tables, figures and references.

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Various parameters of this component are precisely defined in this specification. Unspecified parameters may vary from one component to another.

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Various parameters of this component are precisely defined in this specification. Unspecified parameters may vary from one component to another.

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