IEC 61051-2:2021 is a sectional specification and is applicable to metal oxide varistors with symmetrical voltage-current characteristics for use in electronic equipment connected to any AC or DC supply system.
These varistors are designed to protect electronic and other sensitive equipment from high transient surges. Varistors under the scope of this sectional specification are not intended to give primary protection against lightning surges.
These varistors have metallic connections and are intended to be mounted as through hole component or directly on to printed boards.
The object of this document is to prescribe preferred ratings and characteristics and to select from IEC 61051-1 the appropriate quality assessment procedures, tests and measuring methods, and to give general performance requirements for this type of varistors.
This edition includes the following significant technical changes with respect to the previous edition:  
revision for the structure in accordance with ISO/IEC Directives, Part 2) to the extent practicable, and for harmonizing with IEC 61051-1:2018;
Annex X has been added for comparison with the previous edition;
two lists of preferred voltage ratings for disk type and SMD type varistors have been added;
permissible numbers of non-conforming items have been set to zero (zero fault) in the test schedule in 8.4.3.

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A Blank Detail Specification is a supplementary document to the Sectional Specification and contains requirements for style, layout and minimum content of Detail Specifications

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EN-IEC 61643-331 is a test specification for metal oxide varistors (MOV), which are usedfor applications up to 1 000 V AC or 1 500 V DC in power lines, or telecommunication, orsignalling circuits. They are designed to protect apparatus or personnel, or both, from hightransient voltages.This document applies to MOVs having two electrodes and hybrid surge protectioncomponents. This document also does not apply to mountings and their effect on the MOV’scharacteristics. Characteristics given apply solely to the MOV mounted only in the waysdescribed for the tests.

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TAN - // IEC Corrigendum

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TAN - // IEC Corrigendum

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IEC 61643-331:2020 is available as IEC 61643-331:2020 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 61643-331:2020 is a test specification for metal oxide varistors (MOV), which are used for applications up to 1 000 V AC or 1 500 V DC in power lines, or telecommunication, or signalling circuits. They are designed to protect apparatus or personnel, or both, from high transient voltages. This document applies to MOVs having two electrodes and hybrid surge protection components. This document also does not apply to mountings and their effect on the MOV’s characteristics. Characteristics given apply solely to the MOV mounted only in the ways described for the tests. This third edition cancels and replaces the second edition published in 2017. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
- a Varistor MCOV rating assurance test;
- an energy rating test (2ms);
- revised Dielectric strength and insulation resistance tests.

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IEC 60115-1:2020 is a generic specification and is applicable to fixed resistors for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.
This edition contains the following significant technical changes with respect to the previous edition:  
this 5th edition employs a new document structure, where the tests of prior Clause 4 are given in Clauses 6 to 12 now, with an informative Annex X providing cross-references for references to the prior revision of this standard;
the terms and definitions have been revised and amended, supplemented by a new section on resistor technologies and a new section on product classification levels;
a new Subclause 4.7 on recommendations for permissible substitutions has been added;
the provisions for packaging, storage and transportation in Subclauses 4.8, 4.9 and 4.10 have been completely revised;
a new Subclause 5.3 on default tolerances for the most common test parameters has been added;
the generic method of measuring resistance, now Sublause 5.6, has been separated from the test for compliance with a prescribed resistance value in 6.1, as a revision of the prior 4.5;
the test for the temperature coefficient of resistance of Subclause 6.2 is a revision of the prior test 4.8, variation of resistance with temperature, where the special concessions for resistors below 10 Ω have been waived;
the test methods for endurance testing of Subclauses 7.1 to 7.3 (prior 4.25.1 to 4.25.3) have been completely revised;
the single‑pulse high‑voltage overload test of Subclause 8.2 (prior 4.27) has been completely revised, and now offers adjustable severities for the 1,2/50 and for the 10/700 pulse shape for the benefit of detail specifications with improved significance;
the periodic-pulse high-voltage overload test of Subclause 8.3 (prior 4.28) has been revised and a corrected table of severities provided;
the period-pulse overload test of Subclause 8.4 (prior 4.39) has been deprecated and streamlined to only offer the severity historically applied in subordinate specifications;
the Subclauses 9.1 on visual inspection, 9.2 on the gauging of dimensions, and 9.3 on the assessment of detail dimensions (all parts of prior 4.4) have been completely revised;
the tests for robustness of terminations (prior 4.16) have been revised and separated into tests for the robustness of solderable terminations, Subclause 9.5, and tests for the robustness of threaded stud or screw terminations, Subclause 9.6;
the bump test of Subclause 9.9 (prior 4.20) and the shock test of Subclause 9.10 (prior 4.21) have been revised to reflect the merged relevant test standard IEC 60068-2-29;
the dry heat and cold test of the climatic sequence of Subclause 10.3 (prior 4.23) have been revised to reflect the changes of the relevant test standards IEC 60068‑2‑2 and IEC 60068‑2‑1;
the accelerated damp heat, steady state test of Subclause 10.5 (prior 4.37) has been amended with an option for a reduced number of bias voltages;
the corrosion test of Subclause 10.6 has been completely revised in order to employ the better suitable test method of IEC 60068-2-52 instead of the prior used IEC 60068-2-11;
the whisker growth test of Subclause 10.7 has been revised to reflect the changes of the new revision of the test methods of IEC 60068-2-82;
the test methods for solderability of Subclause 11.1 (prior 4.17) and for resistance to soldering heat of Subclause 11.2 (prior 4.18) have been completely revised to incorporate the necessary option for the variety of lead-bearing and lead-free solder alloys and respective process conditions;
the solvent resistance test of Subclause 11.3 combines the prior tests 4.29, component solvent resistance, and 4.30, solvent resistance of marking, in one test;
the accidental overload test of Subclause 12.3 (prior 4.26) has been completely

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Specifies marking codes for resistors and capacitors and indexes for the dielectric material and the electrodes of plastic film and paper capacitors

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EN-IEC 60539-2 is applicable to surface mount directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. These thermistors have metallized connecting pads or soldering strips and are intended to be mounted directly on to substrates for hybrid circuits or on to printed boards.

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IEC 60539-2:2019 is available as IEC 60539-2:2019 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 60539-2:2019 is applicable to surface mount directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. These thermistors have metallized connecting pads or soldering strips and are intended to be mounted directly on to substrates for hybrid circuits or on to printed boards. This edition includes the following significant technical changes with respect to the previous edition: a) revision for the structure in accordance with ISO/IEC Directives, Part 2:2016 (seventh edition) to the extent practicable, and for harmonizing with IEC 60539-1:2016; b) the upper category temperatures of 175 °C, 200 °C, 250 °C, 315 °C, 400 °C in Table 1 have been added; c) the dimensions of 0402M in Annex A have been added.

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Resistance measurements are typically compromised by a variety of phenomena, for example
serial resistance in the measurement path, self-heating or non-ohmic properties. Whether the
effect of such phenomena on a resistance measurement is acceptable or not depends on the
magnitude of each effect in comparison to the resistance and to the required accuracy. Hence,
the risk of erroneous resistance measurements increases with decreasing resistance and with
a tightening of the permissible tolerance.
This document specifies methods of measurement and associated test conditions that
eliminate or reduce the influence of adverse phenomena in order to improve the attainable
accuracy of low-resistance measurements.
The methods described in this document are applicable for the individual measurements of
the resistance of individual resistors, and also for resistance measurements as part of a test
sequence. They are applied if prescribed by a relevant component specification, or if agreed
between a customer and a manufacturer.

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IEC 60539-2:2019 is available as IEC 60539-2:2019 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 60539-2:2019 is applicable to surface mount directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. These thermistors have metallized connecting pads or soldering strips and are intended to be mounted directly on to substrates for hybrid circuits or on to printed boards.
This edition includes the following significant technical changes with respect to the previous edition:
a) revision for the structure in accordance with ISO/IEC Directives, Part 2:2016 (seventh edition) to the extent practicable, and for harmonizing with IEC 60539-1:2016;
b) the upper category temperatures of 175 °C, 200 °C, 250 °C, 315 °C, 400 °C in Table 1 have been added;
c) the dimensions of 0402M in Annex A have been added.

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IEC 62812:2019 specifies methods of measurement and associated test conditions that eliminate or reduce the influence of adverse phenomena in order to improve the attainable accuracy of low-resistance measurements. The methods described in this document are applicable for the individual measurements of the resistance of individual resistors, and also for resistance measurements as part of a test sequence. They are applied if prescribed by a relevant component specification, or if agreed between a customer and a manufacturer.

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IEC 62812:2019 specifies methods of measurement and associated test conditions that eliminate or reduce the influence of adverse phenomena in order to improve the attainable accuracy of low-resistance measurements. The methods described in this document are applicable for the individual measurements of the resistance of individual resistors, and also for resistance measurements as part of a test sequence. They are applied if prescribed by a relevant component specification, or if agreed between a customer and a manufacturer.
The contents of the corrigendum of March 2020 have been included in this copy.

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This part of IEC 61051 is a generic specification and is applicable to varistors with symmetrical
voltage-current characteristics for use in electronic equipment.
It establishes standard terms, inspection procedures and methods of test for use in sectional
and detail specifications for quality assessment or any other purpose.
NOTE Detail specifications can be specifications within the IEC system, another specification system linked to IEC,
or specified by the manufacturer or user. The drafting of a complete detail specification by IEC technical committee 40,
if required, follows the rules described in Annex A.

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This part of IEC 61051 is a generic specification and is applicable to varistors with symmetrical voltage-current characteristics for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications for quality assessment or any other purpose. NOTE Detail specifications can be specifications within the IEC system, another specification system linked to IEC, or specified by the manufacturer or user. The drafting of a complete detail specification by IEC technical committee 40, if required, follows the rules described in Annex A.

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IEC 61051-1:2018 is available as IEC 61051-1:2018 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 61051-1:2018 is a generic specification and is applicable to varistors with symmetrical voltage-current characteristics for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications for quality assessment or any other purpose. This edition includes the following significant technical changes with respect to the previous edition:
a) 10 new terms and definitions – leaded varistors, surface mount varistors(SMV), electrostatic discharge (ESD), ESD clamping voltage, equivalent rectangular pulse duration, maximum peak current derating characteristic, rated average dissipation power, rated energy, abnormal overvoltage withstanding duration and temperature derating curve – have been added (see 3.6, 3.7, 3.14, 3.15, 3.19, 3.20, 3.23, 3.24, 3.25 and 3.29);
b) General requirements for electrical tests and 7 new test items – clamping voltage, ESD clamping voltage, maximum peak current, rated average dissipation power, rated energy, electrostatic discharge (ESD), robustness of terminations of surface mount varistors – have been added (see 6.5, 6.11, 6.12, 6.13, 6.14, 6.15, 6.16 and 6.17.8);
c) In 6.6, 6.7, 6.8, 6.9.3, 6.23.2, 6.23.4 and 6.26, following test items have been revised:
- Varistor voltage, leakage current and capacitance: more detailed requirements and information have been added;
- Voltage proof – foil method: the space between the edge of the foil and each termination has been changed from 1 mm ~ 1,5 mm to 3 mm ~ 3.5 mm for testing varistors not having axial terminations and the minimum space between the foil and the termination has been changed from 1 mm to 3 mm for testing varistors having axial terminations;
- Climatic sequence – dry heat: the method has been changed from Ba to Bb;
- Climatic sequence – cold: the method has been changed from Aa to Ab;
- Endurance at upper category temperature: the method of “applying test voltages in cycles of 1,5 h on and 0,5 h off” has been changed to the method of applying test voltages continuously throughout the test lasting for 1 000 h;
d) The test items of pulse current, voltage under pulse condition and bump have been deleted from the section of test and measurement procedures;
e) Annex A and the contents referring to the test fixture specified in Annex A have been deleted;
f) All contents related to silicon carbide varistors have been deleted;
g) A new normative annex entitled “Test pulses used in this specification” (Annex B) has been added;
h) A new informative annex entitled "Recommended measurement/test methods for characteristics and parameters for application reference" (Annex C) has been added, in which guidelines of measuring/testing characteristics and parameters for application reference including voltage vs. current characteristic, maximum peak current derating characteristic, thermal resistance and abnormal overvoltage withstanding duration have been given.

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IEC 61643-331:2017E) is a test specification for metal oxide varistors (MOV), which are used for applications up to 1 000 V AC or 1 500 V DC in power line, or telecommunication, or signalling circuits. They are designed to protect apparatus or personnel, or both, from high transient voltages. This specification applies to MOVs having two electrodes and hybrid overvoltage protection components. This specification also does not apply to mountings and their effect on the MOV’s characteristics. Characteristics given apply solely to the MOV mounted only in the ways described for the tests. This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) Update of the nominal varistor voltage test method; b) Addition of thermally protected varistors – component symbol and test methods; c) Addition of nominal discharge current – test methods; d) Addition of voltage ratings for disc types (Table 1); e) Addition of test currents for clamping voltage of disc types (Table 2); f) Addition of typical voltage ratings of SMD types (Table 3); and g) Addition of Limited current and temporary overvoltage tests for thermally protected varistors. Keywords: metal oxide varistors (MOV), high transient voltages.

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IEC 61643-331:2017E) is a test specification for metal oxide varistors (MOV), which are used for applications up to 1 000 V AC or 1 500 V DC in power line, or telecommunication, or signalling circuits. They are designed to protect apparatus or personnel, or both, from high transient voltages. This specification applies to MOVs having two electrodes and hybrid overvoltage protection components. This specification also does not apply to mountings and their effect on the MOV’s characteristics. Characteristics given apply solely to the MOV mounted only in the ways described for the tests. This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) Update of the nominal varistor voltage test method; b) Addition of thermally protected varistors – component symbol and test methods; c) Addition of nominal discharge current – test methods; d) Addition of voltage ratings for disc types (Table 1); e) Addition of test currents for clamping voltage of disc types (Table 2); f) Addition of typical voltage ratings of SMD types (Table 3); and g) Addition of Limited current and temporary overvoltage tests for thermally protected varistors. Keywords: metal oxide varistors (MOV), high transient voltages.

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Specific Amendment to the EN 140402 to add an Annex D which, owing to the nature of a Blank Detail Specification, consists of the blank template for the Annex with respective editorial comments.

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IEC TR 63091:2017(E) is a technical report and is applicable to SMB resistors with sizes equal or smaller than the RR6332M, including the typical rectangular and cylindrical SMD resistors mentioned in IEC 60115-8.

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Amendment of the detail specification, aiming to amend the ordering information for a proper discrimination between two different permissible product variants.

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Amendment of the detail specification, aiming to amend the ordering information for a proper discrimination between two different permissible product variants.

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Amendment of the detail specification, aiming to amend the ordering information for a proper discrimination between two different permissible product variants.

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Amendment of the detail specification, aiming to amend the ordering information for a proper discrimination between two different permissible product variants.

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IEC corrigendum

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Specific Amendment to the EN 140402 to add an Annex D which, owing to the nature of a Blank Detail Specification, consists of the blank template for the Annex with respective editorial comments.

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Specifies marking codes for resistors and capacitors and indexes for the dielectric material and the electrodes of plastic film and paper capacitors

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IEC 62153-4-16:2016(E) describes a method to extrapolate the test results of transfer impedance to higher frequencies and the test results of screening attenuation to lower frequencies when measured with the triaxial set-up according to IEC 62153-4-3 (method B) respectively IEC 62153-4-4. A similar approach to extrapolate the test results of transfer impedance to higher frequencies was already described in IEC 61196-1:1995 Subclause 12.2. This method is applicable for homogenous screens, i.e. screens having a transfer impedance directly proportional to length. The transfer impedance may have any frequency behaviour, i.e. it could have a behaviour where it does not increase with 20 dB per decade as observed for screens made of a foil and a braid.

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This part of IEC 60539 is applicable to directly heated negative temperature coefficient
thermistors, typically made from transition metal oxide materials with semiconducting
properties.
It establishes standard terms, inspection procedures and methods of test for use in sectional
and detail specifications of electronic components for quality assessment or any other
purpose.

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This International Standard specifies a method of measurement and associated test
conditions to assess the "noisiness", or magnitude of current noise, generated in fixed
resistors of any given type. The method applies to all classes of fixed resistors. The aim is to
provide comparable results for the determination of the suitability of resistors for use in
electronic circuits having critical noise requirements.
The current noise in resistive materials reflects the granular structure of the resistive material.
For some resistor technologies utilizing homogenous layers it is regarded as providing an
indication of defects, which are considered as a root cause for abnormal ageing of the
component under the influence of temperature and time.
The method described in this International Standard is not a general specification requirement
and therefore is applied if prescribed by a relevant component specification, or, if agreed
between a customer and a manufacturer.

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IEC 60539-1:2016 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. IEC 60539 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This third edition cancels and replaces the second edition published in 2008. This edition constitutes a technical revision. Tables, figures and references have been revised.

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IEC 60195:2016 specifies a method of measurement and associated test conditions to assess the "noisiness", or magnitude of current noise, generated in fixed resistors of any given type. The method applies to all classes of fixed resistors. The aim is to provide comparable results for the determination of the suitability of resistors for use in electronic circuits having critical noise requirements. This edition includes the following significant technical changes with respect to the previous edition: - harmonization of the allocation of isolation resistors RM in the recommended operating conditions given in Table 2; - correction of erroneous numeric values of the contribution of system noise, f(T - S) in Table 3; - addition of advice on the prescription of requirements in a relevant component specification; - addition of a set of recommended measuring conditions for specimens with a rated dissipation of less than 100 mW; - complete editorial revision.

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This part of IEC 60393 applies to single-turn rotary low-power wirewound and non-wirewound
potentiometers, with a rated dissipation less than to 10 W. These potentiometers are primarily
intended for use in electronic equipment.
This part of IEC 60393 prescribes preferred ratings and characteristics and selects from
IEC 60393-1, appropriate quality assessment procedures, tests and measuring methods. It
provides general performance requirements for this type of potentiometer.
This standard gives the minimum performance requirements and test severities.

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This part of IEC 60393 applies to lead-screw actuated and rotary preset potentiometers,
wirewound and non-wirewound for use in electronic equipment. These potentiometers are
primarily intended for use in circuits for trimming purposes which require infrequent
adjustments.
This part of IEC 60393 prescribes preferred ratings and characteristics and selects from
IEC 60393-1 the appropriate quality assessment procedures, tests and measuring methods. It
provides general performance requirements for this type of potentiometer.
This standard gives the minimum performance requirements and test severities.

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This part of IEC 60393 applies to surface mount preset potentiometers for use in electronic
equipment.
This part of IEC 60393 prescribes preferred ratings and characteristics and selects from
IEC 60393-1, the appropriate quality assessment procedures, tests and measuring methods,
and it gives general performance requirements for this type of potentiometers.
This standard gives the minimum performance requirements and test severities.

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IEC 60539-1:2016 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. IEC 60539 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This third edition cancels and replaces the second edition published in 2008. This edition constitutes a technical revision. Tables, figures and references have been revised.
The contents of the corrigendum of September 2017 have been included in this copy.

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IEC 60393-2:2015 applies to lead-screw actuated and rotary preset potentiometers, wirewound and non-wirewound for use in electronic equipment. These potentiometers are primarily intended for use in circuits for trimming purposes which require infrequent adjustments. This part of IEC 60393 prescribes preferred ratings and characteristics and selects from IEC 60393-1 the appropriate quality assessment procedures, tests and measuring methods. It provides general performance requirements for this type of potentiometer. This standard gives the minimum performance requirements and test severities. This edition includes the following significant technical changes with respect to the previous edition: a) revision of the information on the assessment level EZ and FZ (zero nonconforming); b) complete editorial revision.

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IEC 60393-6:2015 applies to surface mount preset potentiometers for use in electronic equipment. This part of IEC 60393 prescribes preferred ratings and characteristics and selects from IEC 60393-1, the appropriate quality assessment procedures, tests and measuring methods, and it gives general performance requirements for this type of potentiometers. This standard gives the minimum performance requirements and test severities. This edition includes the following significant technical changes with respect to the previous edition: a) revision of the information on the assessment level EZ (zero nonconforming); b) complete editorial revision.

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IEC 60393-5:2015 applies to single-turn rotary low-power wirewound and non-wirewound potentiometers, with a rated dissipation less than to 10 W. These potentiometers are primarily intended for use in electronic equipment. This part of IEC 60393 prescribes preferred ratings and characteristics and selects from IEC 60393-1, appropriate quality assessment procedures, tests and measuring methods. It provides general performance requirements for this type of potentiometer. This standard gives the minimum performance requirements and test severities. This edition includes the following significant technical changes with respect to the previous edition: a) revision of the information on the assessment level EZ and FZ (zero nonconforming); b) complete editorial revision.

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IEC 60195:2016 specifies a method of measurement and associated test conditions to assess the "noisiness", or magnitude of current noise, generated in fixed resistors of any given type. The method applies to all classes of fixed resistors. The aim is to provide comparable results for the determination of the suitability of resistors for use in electronic circuits having critical noise requirements. This edition includes the following significant technical changes with respect to the previous edition:
- harmonization of the allocation of isolation resistors RM in the recommended operating conditions given in Table 2;
- correction of erroneous numeric values of the contribution of system noise, f(T - S) in Table 3;
- addition of advice on the prescription of requirements in a relevant component specification;
- addition of a set of recommended measuring conditions for specimens with a rated dissipation of less than 100 mW;
- complete editorial revision.

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IEC 60393-2:2015 applies to lead-screw actuated and rotary preset potentiometers, wirewound and non-wirewound for use in electronic equipment. These potentiometers are primarily intended for use in circuits for trimming purposes which require infrequent adjustments. This part of IEC 60393 prescribes preferred ratings and characteristics and selects from IEC 60393-1 the appropriate quality assessment procedures, tests and measuring methods. It provides general performance requirements for this type of potentiometer. This standard gives the minimum performance requirements and test severities. This edition includes the following significant technical changes with respect to the previous edition:
a) revision of the information on the assessment level EZ and FZ (zero nonconforming);
b) complete editorial revision.
This publication is to be read in conjunction with IEC 60393-1:2008.

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IEC 60393-6:2015 applies to surface mount preset potentiometers for use in electronic equipment. This part of IEC 60393 prescribes preferred ratings and characteristics and selects from IEC 60393-1, the appropriate quality assessment procedures, tests and measuring methods, and it gives general performance requirements for this type of potentiometers. This standard gives the minimum performance requirements and test severities. This edition includes the following significant technical changes with respect to the previous edition:
a) revision of the information on the assessment level EZ (zero nonconforming);
b) complete editorial revision.
This publication is to be read in conjunction with IEC 60393-1:2008.

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IEC 60393-5:2015 applies to single-turn rotary low-power wirewound and non-wirewound potentiometers, with a rated dissipation less than to 10 W. These potentiometers are primarily intended for use in electronic equipment. This part of IEC 60393 prescribes preferred ratings and characteristics and selects from IEC 60393-1, appropriate quality assessment procedures, tests and measuring methods. It provides general performance requirements for this type of potentiometer. This standard gives the minimum performance requirements and test severities. This edition includes the following significant technical changes with respect to the previous edition:
a) revision of the information on the assessment level EZ and FZ (zero nonconforming);
b) complete editorial revision.
This publication is to be read in conjunction with IEC 60393-1:2008.

  • Standard
    65 pages
    English and French language
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IEC 60115-1: 2008(E) is a generic specification and is applicable to fixed resistors for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This fourth edition cancels and replaces the third edition issued in 1999 and Amendment 1 (2001). It constitutes a technical revision. It contains the following significant technical changes with respect to the previous edition:  a) implementation of Annex Q which replaces Clause 3;  b) addition of new tests procedures in 4.34 through 4.38;  c) removal of the property 'temperature characteristics' from 4.8;  d) introduction of a new system of test severities for the shear test in  4.32;  e) introduction of new bias voltages for the damp heat steady-state test in 4.24;  f) furthermore, this fourth edition cancels and replaces the third edition published in 1999 and constitutes minor revisions related to tables, figures and references.

  • Amendment
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    English language
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This part of IEC 60115 is applicable to leaded fixed low-power film resistors for use in
electronic equipment.
These resistors are typically described according to types (different geometric shapes) and
styles (different dimensions) and product technology. The resistive element of these resistors
is typically protected by a conformal lacquer coating. These resistors have wire terminations
and are primarily intended to be mounted on a circuit board in through-hole technique.
The object of this standard is to prescribe preferred ratings and characteristics and to select
from IEC 60115-1, the appropriate quality assessment procedures, tests and measuring
methods and to give general performance requirements for this type of resistor.

  • Standard
    82 pages
    English language
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