IEC 60539-1:2022 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties.
It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.
This edition includes the following significant technical changes with respect to the previous edition:
Restructured completely to comply to ISO/IEC directives; categorization and reorganization of test methods into these categories; Annex X added for comparison to the previous edition; Some wordings, figures and references have been revised.

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IEC 60539-1:2022 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This edition includes the following significant technical changes with respect to the previous edition:
Restructured completely to comply to ISO/IEC directives; categorization and reorganization of test methods into these categories;
Annex X added for comparison to the previous edition;
Some wordings, figures and references have been revised.

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IEC 60539-1:2022 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties.
It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.
This edition includes the following significant technical changes with respect to the previous edition:  
Restructured completely to comply to ISO/IEC directives; categorization and reorganization of test methods into these categories;
Annex X added for comparison to the previous edition;
Some wordings, figures and references have been revised.

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This part of IEC 60738 describes terms and methods of test for positive step-function temperature coefficient thermistors, insulated and non-insulated types typically made from ferro-electric semi-conductor materials.
It establishes standard terms, inspection procedures and methods of test for use in detail specifications for Qualification Approval and for Quality Assessment Systems for electronic components.

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This part of IEC 60738 describes terms and methods of test for positive step-function temperature coefficient thermistors, insulated and non-insulated types typically made from ferro-electric semi-conductor materials. It establishes standard terms, inspection procedures and methods of test for use in detail specifications for Qualification Approval and for Quality Assessment Systems for electronic components.

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IEC 60738-1:2022 describes terms and methods of test for positive step-function temperature coefficient thermistors, insulated and non-insulated types, typically made from ferro-electric semi-conductor materials.
It establishes standard terms, inspection procedures and methods of test for use in detail specifications for qualification approval and for quality assessment systems for electronic components.
This edition includes the following significant technical changes with respect to the previous edition:
a) Restructured completely to comply with ISO/IEC Directives; categorization and reorganization of test methods into these categories;
b) Some wordings, figures and references have been revised.

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IEC 60539-2:2019 is available as IEC 60539-2:2019 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 60539-2:2019 is applicable to surface mount directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. These thermistors have metallized connecting pads or soldering strips and are intended to be mounted directly on to substrates for hybrid circuits or on to printed boards. This edition includes the following significant technical changes with respect to the previous edition: a) revision for the structure in accordance with ISO/IEC Directives, Part 2:2016 (seventh edition) to the extent practicable, and for harmonizing with IEC 60539-1:2016; b) the upper category temperatures of 175 °C, 200 °C, 250 °C, 315 °C, 400 °C in Table 1 have been added; c) the dimensions of 0402M in Annex A have been added.

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EN-IEC 60539-2 is applicable to surface mount directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. These thermistors have metallized connecting pads or soldering strips and are intended to be mounted directly on to substrates for hybrid circuits or on to printed boards.

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IEC 60539-2:2019 is available as IEC 60539-2:2019 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 60539-2:2019 is applicable to surface mount directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. These thermistors have metallized connecting pads or soldering strips and are intended to be mounted directly on to substrates for hybrid circuits or on to printed boards.
This edition includes the following significant technical changes with respect to the previous edition:
a) revision for the structure in accordance with ISO/IEC Directives, Part 2:2016 (seventh edition) to the extent practicable, and for harmonizing with IEC 60539-1:2016;
b) the upper category temperatures of 175 °C, 200 °C, 250 °C, 315 °C, 400 °C in Table 1 have been added;
c) the dimensions of 0402M in Annex A have been added.

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IEC 60539-1:2016 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. IEC 60539 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This third edition cancels and replaces the second edition published in 2008. This edition constitutes a technical revision. Tables, figures and references have been revised.

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This part of IEC 60539 is applicable to directly heated negative temperature coefficient
thermistors, typically made from transition metal oxide materials with semiconducting
properties.
It establishes standard terms, inspection procedures and methods of test for use in sectional
and detail specifications of electronic components for quality assessment or any other
purpose.

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IEC 60539-1:2016 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. IEC 60539 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This third edition cancels and replaces the second edition published in 2008. This edition constitutes a technical revision. Tables, figures and references have been revised.
The contents of the corrigendum of September 2017 have been included in this copy.

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is a supplementary document to the generic specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements shall not be considered as being in accordance with IEC specifications nor shall they so be described. In the preparation of detail specifications the content of IEC 60738-1:2006,1.4 shall be taken into account. This edition contains changes with respect to the referenced subclauses of the revised Generic Specification IEC 60738-1.

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is a supplementary document to the generic specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements shall not be considered as being in accordance with IEC specifications nor shall they so be described. In the preparation of detail specifications the content of IEC 60738-1:2006, 1.4 shall be taken into account. This edition contains changes with respect to the referenced subclauses of the revised generic specification IEC 60738-1.

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Is a supplementary document to the generic specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements shall not be considered as being in accordance with IEC specifications nor shall they so be described. In the preparation of detail specifications the content of IEC 60738-1:2006,1.4 shall be taken into account. This edition contains changes with respect to the referenced subclauses of the revised Generic Specification IEC 60738-1.

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Is a supplementary document to the generic specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements shall not be considered as being in accordance with IEC specifications nor shall they so be described. In the preparation of detail specifications the content of IEC 60738-1:2006, 1.4 shall be taken into account. This edition contains changes with respect to the referenced subclauses of the revised Generic Specification IEC 60738-1.

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IEC 60539-2:2003 is applicable to surface mount directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. These thermistors have metallized connecting pads or soldering strips and are intended to be mounted directly on to substrates for hybrid circuits or on to printed boards.

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IEC 60738-1:2006+A1:2009 Prescribes terms and methods of test for positive step-function temperature coefficient thermistors, insulated and non-insulated types typically made from ferro-electric semi-conductor materials. It establishes standard terms, inspection procedures and methods of test for use in detail specifications for Qualification Approval and for Quality Assessment Systems for electronic components.
This consolidated version consists of the third edition (2006) and its amendment 1 (2009). Therefore, no need to order amendments in addition to this publication.

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    114 pages
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IEC 60738-1:2006 describes terms and methods of test for positive step-function temperature coefficient thermistors, insulated and non-insulated types typically made from ferro-electric semi-conductor materials. It establishes standard terms, inspection procedures and methods of test for use in detail specifications for Qualification Approval and for Quality Assessment Systems for electronic components. This third edition cancels and replaces the second edition published in 1998 and constitutes a minor revision. The changes with respect to the previous edition refer to the tables, figures and references.

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    114 pages
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IEC 60738-1:2006 describes terms and methods of test for positive step-function temperature coefficient thermistors, insulated and non-insulated types typically made from ferro-electric semi-conductor materials. It establishes standard terms, inspection procedures and methods of test for use in detail specifications for Qualification Approval and for Quality Assessment Systems for electronic components. This third edition cancels and replaces the second edition published in 1998 and constitutes a minor revision. The changes with respect to the previous edition refer to the tables, figures and references.

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Specifies the performance requirements together with the test methods and conditions required to show compliance of tubular fluorescent and other gas-discharge lamps with integrated means for controlling starting and stable operation (self-ballasted lamps), intended for domestic and similar general lighting purposes.

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This blank detail specification is a supplementary  document to the generic specification and contains  requirements for style and layout and minimum  content of detail specifications.

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This blank detail specification is a supplementary  document to the generic specification and contains  requirements for style and layout and minimum  content of detail specifications.

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This blank detail specification is a supplementary  document to the generic specification and contains  requirements for style and layout and minimum  content of detail specifications.

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This blank detail specification is a supplementary  document to the generic specification and contains  requirements for style and layout and minimum  content of detail specifications.

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IEC 60738-1-2:2008 is a supplementary document to the generic specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements shall not be considered as being in accordance with IEC specifications nor shall they so be described. In the preparation of detail specifications the content of IEC 60738-1:2006,1.4 shall be taken into account. This edition contains changes with respect to the referenced subclauses of the revised Generic Specification IEC 60738-1.
This publication is to be read in conjunction with IEC 60738-1:2009.

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IEC 60738-1-3:2008 is a supplementary document to the generic specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements shall not be considered as being in accordance with IEC specifications nor shall they so be described. In the preparation of detail specifications the content of IEC 60738-1:2006,1.4 shall be taken into account. This edition contains changes with respect to the referenced subclauses of the revised Generic Specification IEC 60738-1.
This publication is to be read in conjunction with IEC 60738-1:2009.

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IEC 60539-1:2008 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.

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IEC 60738-1-1:2008 is a supplementary document to the generic specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements shall not be considered as being in accordance with IEC specifications nor shall they so be described. This edition contains changes with respect to the referenced subclauses of the revised generic specification IEC 60738-1.
This publication is to be read in conjunction with IEC 60738-1:2009.

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    14 pages
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    28 pages
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IEC 60738-1-4:2008 is a supplementary document to the generic specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements shall not be considered as being in accordance with IEC specifications nor shall they so be described. In the preparation of detail specifications the content of IEC 60738-1:2006,1.4 shall be taken into account. This edition contains changes with respect to the referenced subclauses of the revised Generic Specification IEC 60738-1.
This publication is to be read in conjunction with IEC 60738-1:2009.

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This part of IEC 60738 describes terms and methods of test for positive step-function temperature coefficient thermistors, insulated and non-insulated types, typically made from ferro-electric semi-conductor materials. It establishes standard terms, inspection procedures and methods of test for use indetail specifictaions for Qualification Approval and for Quality Assessment Systems for electronic components.

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Prescribes terms and methods of test for polymeric positive temperature coefficient thermistors, insulated and non-insulated types, typically intended for use in current limiting and overcurrent protection applications. It establishes standard terms, inspection procedures and methods of test for use in detail specifications for Qualification Approval and for Quality Assessment Systems for electronic components.

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Is a supplementary document to the generic specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements shall not be considered as being in accordance with IEC specifications nor shall they so be described.

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Prescribes terms and methods of test for polymeric positive temperature coefficient thermistors, insulated and non-insulated types, typically intended for use in current limiting and overcurrent protection applications. It establishes standard terms, inspection procedures and methods of test for use in detail specifications for Qualification Approval and for Quality Assessment Systems for electronic components.

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Is a supplementary document to the generic specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements shall not be considered as being in accordance with IEC specifications nor shall they so be described.

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IEC 62319-1:2005(E) prescribes terms and methods of test for polymeric positive temperature coefficient thermistors, insulated and non-insulated types, typically intended for use in current limiting and overcurrent protection applications. It establishes standard terms, inspection procedures and methods of test for use in detail specifications for Qualification Approval and for Quality Assessment Systems for electronic components. The contents of the corrigendum of March 2009 have been included in this copy.

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IEC 62319-1-1:2005 is a supplementary document to the generic specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements shall not be considered as being in accordance with IEC specifications nor shall they so be described.

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Supersedes CECC 43 002 Issue 1:1983 * CECC WG 4B work handled by SR 40

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This blank detail specification is one of a series for directly heated negative temperature coefficient thermistors, all relating to the generic specification CECC 43 000.

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Supersedes CECC 43 004 Issue 1:1983 * CECC WG 4B work handled by SR 40

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Supersedes CECC 43 003 Issue 1:1983 * CECC WG 4B work handled by SR 40

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Applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties.

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Supplementary document to the generic specification, contains requirements for style and layout and minimum content of detail specifications.

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