ASTM F773M-10

Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric]

SIGNIFICANCE AND USE
There are many kinds of linear integrated circuits. Any given linear integrated circuit may be used in a variety of ways and under various operating conditions within the limits of performance specified by the manufacturer. The procedures of this practice provide a standardized way to measure the dose-rate response of a linear integrated circuit, under operating conditions similar to those of the intended application, when the circuit is exposed to pulsed ionizing radiation.
Knowledge of the responses of linear integrated circuits to radiation pulses is essential for the design, production, and maintenance of electronic systems that are required to operate in the presence of pulsed radiation environments.
SCOPE
1.1 This practice covers the measurement of the response of linear integrated circuits, under given operating conditions, to pulsed ionizing radiation. The response may be either transient or more lasting, such as latchup. The radiation source is either a flash X-ray machine (FXR) or an electron linear accelerator (LINAC).  
1.2 The precision of the measurement depends on the homogeneity of the radiation field and on the precision of the radiation dosimetry and the recording instrumentation.
1.3 The test may be considered to be destructive either for further tests or for other purposes if the total radiation ionizing dose exceeds some predetermined level or if the part should latch up. Because this level depends both on the kind of integrated circuit and on the application, a specific value must be agreed upon by the parties to the test. (See 6.10.)
1.4 Setup, calibration, and test circuit evaluation procedures are included in this practice.
1.5 Procedures for lot qualification and sampling are not included in this practice.
1.6 Because response varies with different device types, the dose rate range for any specific test is not given in this practice but must be agreed upon by the parties to the test.
1.7 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

General Information

• Status: Historical
• Publication Date: 30-Apr-2010
• ICS: 17.220.20 - Measurement of electrical and magnetic quantities
• ICS: 31.200 - Integrated circuits. Microelectronics
• Technical Committee: F01 - Electronics
• Drafting Committee: F01.11 - Nuclear and Space Radiation Effects

Relations

• Replaces: ASTM F773M-96(2003) - Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric]
• Effective Date: 01-May-2010
• Replaced By: ASTM F773M-16 - Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric) (Withdrawn 2023)
• Effective Date: 01-May-2016

Standards Content (Sample)

NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation: F773M − 10
StandardPractice for
Measuring Dose Rate Response of Linear Integrated
1
Circuits (Metric)
This standard is issued under the fixed designation F773M; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope 2. Referenced Documents
2
2.1 ASTM Standards:
1.1 Thispracticecoversthemeasurementoftheresponseof
E666Practice for CalculatingAbsorbed Dose From Gamma
linear integrated circuits, under given operating conditions, to
or X Radiation
pulsed ionizing radiation.The response may be either transient
E668 Practice for Application of Thermoluminescence-
or more lasting, such as latchup. The radiation source is either
Dosimetry (TLD) Systems for Determining Absorbed
a flash X-ray machine (FXR) or an electron linear accelerator
DoseinRadiation-HardnessTestingofElectronicDevices
(LINAC).
E1894Guide for Selecting Dosimetry Systems for Applica-
1.2 The precision of the measurement depends on the
tion in Pulsed X-Ray Sources
homogeneity of the radiation field and on the precision of the
F526Test Method for Using Calorimeters for Total Dose
radiation dosimetry and the recording instrumentation.
Measurements in Pulsed Linear Accelerator or Flash
X-ray Machines
1.3 The test may be considered to be destructive either for
further tests or for other purposes if the total radiation ionizing
3. Terminology
dose exceeds some predetermined level or if the part should
3.1 Definitions:
latch up. Because this level depends both on the kind of
3.1.1 dose rate—energy absorbed per unit time and per unit
integrated circuit and on the application, a specific value must
mass by a given material from the radiation to which it is
be agreed upon by the parties to the test. (See 6.10.)
exposed.
1.4 Setup,calibration,andtestcircuitevaluationprocedures
3.1.2 dose rate induced latchup—Regenerative device ac-
are included in this practice.
tioninwhichaparasiticregion(e.g.,afour(4)layerp-n-p-nor
n-p-n-p path) is turned on by a photocurrent generated by a
1.5 Procedures for lot qualification and sampling are not
pulse of ionizing radiation and remains on for an indefinite
included in this practice.
period of time after the photocurrent subsides. The device will
1.6 Because response varies with different device types, the
remain latched as long as the power supply delivers voltage
doseraterangeforanyspecifictestisnotgiveninthispractice
greater than the holding voltage and current greater than the
but must be agreed upon by the parties to the test.
holding current. Latchup may disrupt normal circuit operation
insomeportionofthecircuits,andmayalsocausecatastrophic
1.7 The values stated in SI units are to be regarded as
failure due to local heating of semiconductor regions, metalli-
standard. No other units of measurement are included in this
zations or bond wires.
standard.
3.1.2.1 Discussion—Latchup is very sensitive at higher
1.8 This standard does not purport to address all of the
voltagesandmaximumvoltage.Theobservanceoflatchupwill
safety concerns, if any, associated with its use. It is the
be seen readily if these operation conditions are achieved.
responsibility of the user of this standard to establish appro-
3.1.3 dose rate response—the change that occurs in an
priate safety and health practices and determine the applica-
observed characteristic of an operating linear integrated circuit
bility of regulatory limitations prior to use.
induced by a radiation pulse of a given dose rate.
3.1.4 latchup window—A latchup window is the phenom-
enon in which a device exhibits latchup in a specific range of
1
This practice is under the jurisdiction ofASTM Committee F01 on Electronics
and is the direct responsibility of Subcommittee F01.11 on Nuclear and Space
2
Radiation Effects. For referenced ASTM standards, visit the ASTM website, www.astm.org, or
Current edition approved May 1, 2010. Published June 2010. Originally contact ASTM Customer Service at [e-mail]. For Annual Book of ASTM
approved in 1982. Last previous edition approved in 2003 as F773M–96 (2003). Standards volume information, refer to the standard’s Document Summary page on
DOI: 10.1520/F0773M-10. the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1

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F773M − 10
dose rates. Above and below this range, the device does not ionizedbytheradiationpulse.Suchspuriouscontributionscan
latchup.Adevice may exhibit more than one latchup window. be checked by measuring the signal while irradiating the test
This phenomenon has been obser
...

This document is not anASTM standard and is intended only to provide the user of anASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
Designation:F773M–96 (Reapproved 2003) Designation: F773M – 10
Standard Practice for
Measuring Dose Rate Response of Linear Integrated
1
Circuits (Metric)
This standard is issued under the fixed designation F773M; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope
1.1 This practice covers the measurement of the response of linear integrated circuits, under given operating conditions, to
pulsed ionizing radiation. The response may be either transient or more lasting, such as latchup. The radiation source is either a
flash X-ray machine (FXR) or an electron linear accelerator (LINAC).
1.2 The precision of the measurement depends on the homogeneity of the radiation field and on the precision of the radiation
dosimetry and the recording instrumentation.
1.3 The test may be considered to be destructive either for further tests or for other purposes if the total radiation ionizing dose
exceeds some predetermined level or if the part should latch up. Because this level depends both on the kind of integrated circuit
and on the application, a specific value must be agreed upon by the parties to the test. (See 6.10.)
1.4 Setup, calibration, and test circuit evaluation procedures are included in this practice.
1.5 Procedures for lot qualification and sampling are not included in this practice.
1.6 Because response varies with different device types, the dose rate range for any specific test is not given in this practice but
must be agreed upon by the parties to the test.
1.7
1.7 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory
limitations prior to use.
2. Referenced Documents
2
2.1 ASTM Standards:
E666 Practice for Calculating Absorbed Dose From Gamma or X Radiation
E668 Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in
Radiation-Hardness Testing of Electronic Devices
E1894 Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
F526 Test Method for Measuring Dose for Use in Linear Accelerator Pulsed Radiation Effects Tests
3. Terminology
3.1 Definitions:
3.1.1 dose rate—energy absorbed per unit time and per unit mass by a given material from the radiation to which it is exposed.
3.1.2 dose rate induced latchup—Regenerativedeviceactioninwhichaparasiticregion(e.g.,afour(4)layerp-n-p-norn-p-n-p
path)isturnedonbyaphotocurrentgeneratedbyapulseofionizingradiationandremainsonforanindefiniteperiodoftimeafter
the photocurrent subsides. The device will remain latched as long as the power supply delivers voltage greater than the holding
voltage and current greater than the holding current. Latchup may disrupt normal circuit operation in some portion of the circuits,
and may also cause catastrophic failure due to local heating of semiconductor regions, metallizations or bond wires.
3.1.2.1 Discussion—Latchupisverysensitiveathighervoltagesandmaximumvoltage.Theobservanceoflatchupwillbeseen
readily if these operation conditions are achieved.
1
This practice is under the jurisdiction ofASTM Committee F01 on Electronics and is the direct responsibility of Subcommittee F01.11 on Nuclear and Space Radiation
Effects.
Current edition approved June 10, 2003. Published June 2003. Originally approved in 1982. Last previous edition approved in 1996 as F773M–96. DOI:
10.1520/F0773M-96R03.
Current edition approved May 1, 2010. Published June 2010. Originally approved in 1982. Last previous edition approved in 2003 as F773M–96 (2003). DOI:
10.1520/F0773M-10.
2
ForreferencedASTMstandards,visittheASTMwebsite,www.astm.org,[e-mail] Annual Book of ASTM Standards
volume information, refer to the standard’s Document Summary page on the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
1

---------------------- Page: 1 ----------------------
F773M – 10
3.1.3 dose rate response—the change that occurs in an observed characteristic of an operating linea
...