ASTM F773M-16
(Practice)Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric) (Withdrawn 2023)
Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric) (Withdrawn 2023)
SIGNIFICANCE AND USE
5.1 There are many kinds of linear integrated circuits. Any given linear integrated circuit may be used in a variety of ways and under various operating conditions within the limits of performance specified by the manufacturer. The procedures of this practice provide a standardized way to measure the dose-rate response of a linear integrated circuit, under operating conditions similar to those of the intended application, when the circuit is exposed to pulsed ionizing radiation.
5.2 Knowledge of the responses of linear integrated circuits to radiation pulses is essential for the design, production, and maintenance of electronic systems that are required to operate in the presence of pulsed radiation environments.
SCOPE
1.1 This practice covers the measurement of the response of linear integrated circuits, under given operating conditions, to pulsed ionizing radiation. The response may be either transient or more lasting, such as latchup. The radiation source is either a flash X-ray machine (FXR) or an electron linear accelerator (LINAC).
1.2 The precision of the measurement depends on the homogeneity of the radiation field and on the precision of the radiation dosimetry and the recording instrumentation.
1.3 The test may be considered to be destructive either for further tests or for other purposes if the total radiation ionizing dose exceeds some predetermined level or if the part should latch up. Because this level depends both on the kind of integrated circuit and on the application, a specific value must be agreed upon by the parties to the test. (See 6.10.)
1.4 Setup, calibration, and test circuit evaluation procedures are included in this practice.
1.5 Procedures for lot qualification and sampling are not included in this practice.
1.6 Because response varies with different device types, the dose rate range and device upset conditions for any specific test is not given in this practice but must be agreed upon by the parties to the test.
1.7 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
WITHDRAWN RATIONALE
This practice covered the measurement of the response of linear integrated circuits, under given operating conditions, to pulsed ionizing radiation. The response may be either transient or more lasting, such as latchup. The radiation source is either a flash X-ray machine (FXR) or an electron linear accelerator (LINAC).
Formerly under the jurisdiction of F01 on Electronics, this practice was withdrawn in November 2023. This standard is being withdrawn without replacement because Committee F01 was disbanded.
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This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the
Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
Designation: F773M − 16
Standard Practice for
Measuring Dose Rate Response of Linear Integrated
1
Circuits (Metric)
This standard is issued under the fixed designation F773M; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
This standard has been approved for use by agencies of the U.S. Department of Defense.
1. Scope 1.9 This international standard was developed in accor-
dance with internationally recognized principles on standard-
1.1 Thispracticecoversthemeasurementoftheresponseof
ization established in the Decision on Principles for the
linear integrated circuits, under given operating conditions, to
Development of International Standards, Guides and Recom-
pulsed ionizing radiation.The response may be either transient
mendations issued by the World Trade Organization Technical
or more lasting, such as latchup. The radiation source is either
Barriers to Trade (TBT) Committee.
a flash X-ray machine (FXR) or an electron linear accelerator
(LINAC).
2. Referenced Documents
1.2 The precision of the measurement depends on the
2
2.1 ASTM Standards:
homogeneity of the radiation field and on the precision of the
E666Practice for CalculatingAbsorbed Dose From Gamma
radiation dosimetry and the recording instrumentation.
or X Radiation
1.3 The test may be considered to be destructive either for
E668 Practice for Application of Thermoluminescence-
further tests or for other purposes if the total radiation ionizing
Dosimetry (TLD) Systems for Determining Absorbed
dose exceeds some predetermined level or if the part should
DoseinRadiation-HardnessTestingofElectronicDevices
latch up. Because this level depends both on the kind of
E1894Guide for Selecting Dosimetry Systems for Applica-
integrated circuit and on the application, a specific value must
tion in Pulsed X-Ray Sources
be agreed upon by the parties to the test. (See 6.10.)
F526Test Method for Using Calorimeters for Total Dose
Measurements in Pulsed Linear Accelerator or Flash
1.4 Setup,calibration,andtestcircuitevaluationprocedures
X-ray Machines
are included in this practice.
1.5 Procedures for lot qualification and sampling are not
3. Terminology
included in this practice.
3.1 Definitions:
1.6 Because response varies with different device types, the
3.1.1 dose rate—energy absorbed per unit time and per unit
doseraterangeanddeviceupsetconditionsforanyspecifictest
mass by a given material from the radiation to which it is
is not given in this practice but must be agreed upon by the
exposed.
parties to the test.
3.1.2 dose rate induced latchup—Regenerative device ac-
1.7 The values stated in SI units are to be regarded as
tioninwhichaparasiticregion(e.g.,afour(4)layerp-n-p-nor
standard. No other units of measurement are included in this
n-p-n-p path) is turned on by a photocurrent generated by a
standard.
pulse of ionizing radiation and remains on for an indefinite
period of time after the photocurrent subsides. The device will
1.8 This standard does not purport to address all of the
remain latched as long as the power supply delivers voltage
safety concerns, if any, associated with its use. It is the
greater than the holding voltage and current greater than the
responsibility of the user of this standard to establish appro-
holding current. Latchup may disrupt normal circuit operation
priate safety, health, and environmental practices and deter-
insomeportionofthecircuits,andmayalsocausecatastrophic
mine the applicability of regulatory limitations prior to use.
failure due to local heating of semiconductor regions, metalli-
zations or bond wires.
1
This practice is under the jurisdiction ofASTM Committee F01 on Electronics
and is the direct responsibility of Subcommittee F01.11 on Nuclear and Space
2
Radiation Effects. For referenced ASTM standards, visit the ASTM website, www.astm.org, or
Current edition approved May 1, 2016. Published May 2016. Originally contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
approved in 1982. Last previous edition approved in 2010 as F773M–10. DOI: Standards volume information, refer to the standard’s Document Summary page on
10.1520/F0773M-16. the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1
---------------------- Page: 1 ----------------------
F773M − 16
3.1.3 dose rate response—the change that occurs in an 6. Interferences
observed characteristic of an operati
...
This document is not an ASTM standard and is intended only to provide the user of an ASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
Designation: F773M − 10 F773M − 16
Standard Practice for
Measuring Dose Rate Response of Linear Integrated
1
Circuits (Metric)
This standard is issued under the fixed designation F773M; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope
1.1 This practice covers the measurement of the response of linear integrated circuits, under given operating conditions, to
pulsed ionizing radiation. The response may be either transient or more lasting, such as latchup. The radiation source is either a
flash X-ray machine (FXR) or an electron linear accelerator (LINAC).
1.2 The precision of the measurement depends on the homogeneity of the radiation field and on the precision of the radiation
dosimetry and the recording instrumentation.
1.3 The test may be considered to be destructive either for further tests or for other purposes if the total radiation ionizing dose
exceeds some predetermined level or if the part should latch up. Because this level depends both on the kind of integrated circuit
and on the application, a specific value must be agreed upon by the parties to the test. (See 6.10.)
1.4 Setup, calibration, and test circuit evaluation procedures are included in this practice.
1.5 Procedures for lot qualification and sampling are not included in this practice.
1.6 Because response varies with different device types, the dose rate range and device upset conditions for any specific test is
not given in this practice but must be agreed upon by the parties to the test.
1.7 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory
limitations prior to use.
2. Referenced Documents
2
2.1 ASTM Standards:
E666 Practice for Calculating Absorbed Dose From Gamma or X Radiation
E668 Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in
Radiation-Hardness Testing of Electronic Devices
E1894 Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
F526 Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines
3. Terminology
3.1 Definitions:
3.1.1 dose rate—energy absorbed per unit time and per unit mass by a given material from the radiation to which it is exposed.
3.1.2 dose rate induced latchup—Regenerative device action in which a parasitic region (e.g., a four (4) layer p-n-p-n or n-p-n-p
path) is turned on by a photocurrent generated by a pulse of ionizing radiation and remains on for an indefinite period of time after
the photocurrent subsides. The device will remain latched as long as the power supply delivers voltage greater than the holding
voltage and current greater than the holding current. Latchup may disrupt normal circuit operation in some portion of the circuits,
and may also cause catastrophic failure due to local heating of semiconductor regions, metallizations or bond wires.
1
This practice is under the jurisdiction of ASTM Committee F01 on Electronics and is the direct responsibility of Subcommittee F01.11 on Nuclear and Space Radiation
Effects.
Current edition approved May 1, 2010May 1, 2016. Published June 2010May 2016. Originally approved in 1982. Last previous edition approved in 20032010 as
F773M – 96F773M – 10. (2003). DOI: 10.1520/F0773M-10.10.1520/F0773M-16.
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM Standards
volume information, refer to the standard’s Document Summary page on the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1
---------------------- Page: 1 ----------------------
F773M − 16
3.1.2.1 Discussion—
Latchup is very sensitive at higher voltages and maximum voltage. The observance of latchup will be seen readily if these
operation conditions are achieved.
3.1.3 dose rate response—the change that occurs in an observed characteristic of an operating linear integrated circui
...
NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation: F773M − 16
Standard Practice for
Measuring Dose Rate Response of Linear Integrated
1
Circuits (Metric)
This standard is issued under the fixed designation F773M; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
This standard has been approved for use by agencies of the U.S. Department of Defense.
1. Scope 1.9 This international standard was developed in accor-
dance with internationally recognized principles on standard-
1.1 This practice covers the measurement of the response of
ization established in the Decision on Principles for the
linear integrated circuits, under given operating conditions, to
Development of International Standards, Guides and Recom-
pulsed ionizing radiation. The response may be either transient
mendations issued by the World Trade Organization Technical
or more lasting, such as latchup. The radiation source is either
Barriers to Trade (TBT) Committee.
a flash X-ray machine (FXR) or an electron linear accelerator
(LINAC).
2. Referenced Documents
1.2 The precision of the measurement depends on the
2
2.1 ASTM Standards:
homogeneity of the radiation field and on the precision of the
E666 Practice for Calculating Absorbed Dose From Gamma
radiation dosimetry and the recording instrumentation.
or X Radiation
1.3 The test may be considered to be destructive either for
E668 Practice for Application of Thermoluminescence-
further tests or for other purposes if the total radiation ionizing
Dosimetry (TLD) Systems for Determining Absorbed
dose exceeds some predetermined level or if the part should
Dose in Radiation-Hardness Testing of Electronic Devices
latch up. Because this level depends both on the kind of
E1894 Guide for Selecting Dosimetry Systems for Applica-
integrated circuit and on the application, a specific value must
tion in Pulsed X-Ray Sources
be agreed upon by the parties to the test. (See 6.10.)
F526 Test Method for Using Calorimeters for Total Dose
Measurements in Pulsed Linear Accelerator or Flash
1.4 Setup, calibration, and test circuit evaluation procedures
X-ray Machines
are included in this practice.
1.5 Procedures for lot qualification and sampling are not
3. Terminology
included in this practice.
3.1 Definitions:
1.6 Because response varies with different device types, the
3.1.1 dose rate—energy absorbed per unit time and per unit
dose rate range and device upset conditions for any specific test
mass by a given material from the radiation to which it is
is not given in this practice but must be agreed upon by the
exposed.
parties to the test.
3.1.2 dose rate induced latchup—Regenerative device ac-
1.7 The values stated in SI units are to be regarded as
tion in which a parasitic region (e.g., a four (4) layer p-n-p-n or
standard. No other units of measurement are included in this
n-p-n-p path) is turned on by a photocurrent generated by a
standard.
pulse of ionizing radiation and remains on for an indefinite
period of time after the photocurrent subsides. The device will
1.8 This standard does not purport to address all of the
remain latched as long as the power supply delivers voltage
safety concerns, if any, associated with its use. It is the
greater than the holding voltage and current greater than the
responsibility of the user of this standard to establish appro-
holding current. Latchup may disrupt normal circuit operation
priate safety, health, and environmental practices and deter-
in some portion of the circuits, and may also cause catastrophic
mine the applicability of regulatory limitations prior to use.
failure due to local heating of semiconductor regions, metalli-
zations or bond wires.
1
This practice is under the jurisdiction of ASTM Committee F01 on Electronics
and is the direct responsibility of Subcommittee F01.11 on Nuclear and Space
2
Radiation Effects. For referenced ASTM standards, visit the ASTM website, www.astm.org, or
Current edition approved May 1, 2016. Published May 2016. Originally contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
approved in 1982. Last previous edition approved in 2010 as F773M – 10. DOI: Standards volume information, refer to the standard’s Document Summary page on
10.1520/F0773M-16. the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1
---------------------- Page: 1 ----------------------
F773M − 16
3.1.3 dose rate response—the change that occurs in an 6. Interferences
observed characteristic of an operating linear integrated circuit
6.1 Air Ionization—A spurious component of the signal
ind
...
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