EN 60747-5-3:2001/A1:2002
(Amendment)Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
EN following parallel vote
Einzel-Halbleiterbauelemente und integrierte Schaltungen - Teil 5-3: Optoelektrische Bauelemente - Messverfahren
Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-3: Dispositifs optoélectroniques - Méthodes de mesure
Diskretni polprevodniki in integrirana vezja - 5-3. del: Optoelektronske naprave - Merilne metode - Dopolnilo A1 (IEC 60747- 5-3:1997/A1:2002)
General Information
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Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN 60747-5-3:2002/A1:2004
01-november-2004
Diskretni polprevodniki in integrirana vezja - 5-3. del: Optoelektronske naprave -
Merilne metode - Dopolnilo A1 (IEC 60747- 5-3:1997/A1:2002)
Discrete semiconductor devices and integrated circuits -- Part 5-3: Optoelectronic
devices - Measuring methods
Einzel-Halbleiterbauelemente und integrierte Schaltungen -- Teil 5-3: Optoelektrische
Bauelemente - Messverfahren
Dispositifs discrets à semiconducteurs et circuits intégrés -- Partie 5-3: Dispositifs
optoélectroniques - Méthodes de mesure
Ta slovenski standard je istoveten z: EN 60747-5-3:2001/A1:2002
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
31.260 Optoelektronika, laserska Optoelectronics. Laser
oprema equipment
SIST EN 60747-5-3:2002/A1:2004 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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EUROPEAN STANDARD EN 60747-5-3/A1
NORME EUROPÉENNE
EUROPÄISCHE NORM May 2002
ICS 31.080.99
English version
Discrete semiconductor devices and integrated circuits
Part 5-3: Optoelectronic devices -
Measuring methods
(IEC 60747-5-3:1997/A1:2002)
Dispositifs discrets à semiconducteurs Einzel-Halbleiterbauelemente
et circuits intégrés und integrierte Schaltungen
Partie 5-3: Dispositifs optoélectroniques - Teil 5-3: Optoelektrische Bauelemente -
Méthodes de mesure Messverfahren
(CEI 60747-5-3:1997/A1:2002) (IEC 60747-5-3:1997/A1:2002)
This amendment A1 modifies the European Standard EN 60747-5-3:2001; it was approved by CENELEC
on 2002-05-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations
which stipulate the conditions for giving this amendment the status of a national standard without any
alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This amendment exists in three official versions (English, French, German). A version in any other language
made by translation under the responsibility of a CENELEC member into its own language and notified to the
Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands,
Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2002 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60747-5-3:2001/A1:2002 E
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EN 60747-5-3:2001/A1:2002 - 2 -
Foreword
The text of document 47E/210/FDIS, future amendment 1 to IEC 60747-5-3:1997, prepared by
SC 47E, Discrete semiconductor devices, of IEC TC 47, Semiconductor devices, was submitted to the
IEC-CENELEC parallel vote and was approved by CENELEC as amendment A1 to
EN 60747-5-3:2001 on 2002-05-01.
The following dates were fixed:
– latest date by which the amendment has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2003-02-01
– latest date by which the national standards conflicting
with the amendment have to be withdrawn (dow) 2005-05-01
__________
Endorsement notice
The text of amendment 1:2002 to the International Standard IEC 60747-5-3:1997 was approved by
CENELEC as an amendment to the European Standard without any modification.
__________
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NORME CEI
INTERNATIONALE IEC
60747-5-3
INTERNATIONAL
1997
STANDARD
AMENDEMENT 1
AMENDMENT 1
2002-03
Amendement 1
Dispositifs discrets à semiconducteurs
et circuits intégrés –
Partie 5-3:
Dispositifs optoélectroniques –
Méthodes de mesure
Amendment 1
Discrete semiconductor devices
and integrated circuits –
Part 5-3:
Optoelectronic devices –
Measuring methods
IEC 2002 Droits de reproduction réservés Copyright - all rights reserved
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Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch Web: www.iec.ch
CODE PRIX
M
Commission Electrotechnique Internationale
PRICE CODE
International Electrotechnical Commission
Международная Электротехническая Комиссия
Pour prix, voir catalogue en vigueur
For price, see current catalogue
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60747-5-3 Amend. 1 IEC:2002 – 3 –
FOREWORD
This amendment has been prepared by subcommittee 47E:
...
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